Optical Analysis Device, Optical Analysis Method, And Program For Optical Analysis Device

Abstract: Provided is an optical analysis device 1 that analyses a component of interest by leading, to a measuring cell 4, light which has been emitted from a light source 2 and detecting, with a detector, light which has passed through the measuring cell 4, said optical analysis device 1 comprising: a moving mirror 8 that reflects the light emitted from the light source 2 while reciprocating; a moving mechanism 9 that reciprocates the moving mirror 8; a movement control unit 11a that controls the application voltage or application current to the moving mechanism 9; and a cause inference unit 11f that uses actual waveform data, which indicates the application voltage or application current to the moving mechanism 9 at each time, and reference waveform data, which indicates the application voltage or application current to the moving mechanism 9 at each time and which has been obtained in advance, to infer a cause of an anomaly which affects the moving mirror.

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