Company Information

CIN
Status
Date of Incorporation
24 April 2019
State / ROC
Hyderabad / ROC Hyderabad
Last Balance Sheet
Last Annual Meeting
Paid Up Capital
Authorised Capital

Directors

Gangavarapu Satyagita Dasika
Gangavarapu Satyagita Dasika
Director/Designated Partner
over 2 years ago
Jagrithi Buddharaju
Jagrithi Buddharaju
Director/Designated Partner
over 2 years ago

Patents

System And Method For Evaluation Of Time Of Flight Diffraction Scans For Welding Defect Detection

A system and method for evaluation of Time-of-Flight Diffraction (TOFD) scans for welding defect detection is disclosed. The system includes a receiving module (125) configured to receive a raw file from a TOFD machine. Further, the system includes a data conversion module (130) to convert the raw file into correspo...