Company Information

CIN
Status
Date of Incorporation
14 July 2016
State / ROC
Mumbai / ROC Mumbai
Industry
Sub Category
Last Balance Sheet
Last Annual Meeting
Paid Up Capital
0
Authorised Capital
0

Past Directors

Patents

System And Method For Detecting Abnormalities In X Ray And Ct Scan Images

The present invention discloses a system and method for detecting abnormalities in X-ray and CT scan images. The system integrates advanced imaging sensors, AI-driven image analysis, and IoT connectivity for accurate and efficient diagnostic processing. High-resolution image acquisition is achieved using flat-panel ...

Trademarks