The present invention is related to a learning-based surrogate model capable of predicting operating condition-dependent time and/or frequency domain waveforms at the IC pins. The model of the present invention consists of a set of discrete features that can be extracted from a time-domain waveform and can be used t...

The embodiments herein provide a system and method ensuring Electromagnetic Compatibility (EMC) of the full system to be within an acceptable limit. The method includes generating a model at the sub-system-level. Further, a system-level EMC simulation is executed using the model. Additionally, at the full system-lev...