Device And Method For Predicting Defective Rate Of Batteries

Abstract: A device for predicting defective rate may comprise: a data generation device, which restores and extracts two operation profiles by permitting duplication among a plurality of operation profiles forming original data, generates a plurality of extended operation profiles by combining the two extracted operation profiles, and generates a plurality of extended weights corresponding to the plurality of extended operation profiles; an aging simulation device for generating a plurality of capacity degradation degrees by performing, on the plurality of extended operation profiles, a life analysis simulation to which a plurality of climatic conditions are applied; and a PPM simulation device, which generates a plurality of probability weights on the basis of the plurality of extended weights and weights corresponding to the plurality of climatic conditions, and calculates a PPM value on the basis of the plurality of capacity degradation degrees and the plurality of probability weights.

Patent Information

Applicants

Inventors

Specification

Documents

Application Documents