An Integrated Hardware In The Loop (Hil) System For Testing Hardware Devices And A Method Thereof

Abstract: Disclosed herein is an integrated Hardware-in-the-Loop (HIL) system 101 and a method for testing 102 hardware devices. In an embodiment, system 101 comprises a front panel 105 which may be configured to perform one or more predefined Input/Output (I/O) operations. Further, system 101 comprises a rear panel 109 interfaced with the front panel 105 which may be configured to connect to a Device Under Test (DUT) 103. Furthermore, the system comprises a microcontroller unit 107 configured with an automated test application interface 111 which further comprises a plurality of hardware abstraction layers required for testing 102 hardware devices, wherein the hardware devices may include devices of invariant domain and invariant version. [FIG. 2A]

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