Abnormality Detection Device, Plant System, Feature Information Generation Device, Abnormality Detection Method, Feature Information Generation Method, And Program

Abstract: Provided is an abnormality detection device comprising: a process data acquisition unit that acquires process data of a process having a plurality of process characteristics; and an abnormality detection unit that detects an abnormal state of the process on the basis of an abnormality degree indicating a difference between the acquired process data and a normal state of a process represented by feature information indicating a feature of the normal process data for each process characteristic. The feature information representing the normal state of the process is optimal feature information of each of the process characteristics found by evaluating a candidate of the feature information on the basis of an error between the estimation process data calculated using the candidate of the feature information and the normal process data, said candidate of the feature information being generated for each process characteristic from the plurality of normal process data acquired when the process is in a normal state.

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