Physical Property Prediction Device, Physical Property Prediction Method, And Physical Property Prediction Program

Abstract: This physical property prediction device comprises: an actual measurement data acquisition unit that acquires actual measurement data including a first manufacturing condition for a sample and an actual measurement value obtained by actually measuring a physical property of the sample, which has been manufactured on the basis of the first manufacturing condition; a virtual data acquisition unit that acquires virtual data including a second manufacturing condition for the sample and a virtual value obtained by virtualizing a physical property of the sample that corresponds to the second manufacturing condition; and a model generation unit that generates a prediction model for the physical property on the basis of the actual measurement data acquired by the actual measurement data acquisition unit and the virtual data acquired by the virtual data acquisition unit, the prediction model having a first uncertainty for the physical property with respect to the actual measurement data and having a second uncertainty for the physical property with respect to the virtual data, and the second uncertainty for the physical property being greater than the first uncertainty for the physical property.

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