Description:PREAMBLE TO THE DESCRIPTION
The following specification particularly describes the invention and the manner in which it is to be performed.

FIELD OF INVENTION
[0001] The present disclosure generally relates quantum optics, optoelectronics, photonics, and optical detection systems and, more specifically, relates to a photo-detector with an integrated Angle-of-Incidence (AOI) alignment for sensing optical beams in an optoelectronic environment and a method thereof.
BACKGROUND
[0002] Generally, in optical detection systems using balanced detectors for quantum technologies, a precise alignment of a plurality of optical beams is crucial for achieving a high quantum efficiency. Further, a balanced photodetection is crucial in a range of quantum applications, including a quantum key distribution, a squeezed light detection, a quantum sensing, and a quantum metrology. Furthermore, the optical detection systems are highly sensitive, and even minor misalignments may significantly degrade performance of the optical detection systems. Therefore, maintaining an accurate beam alignment is a key factor in ensuring an optimal operation of the optical detection systems.
[0003] Traditionally, photodiodes with a 0° Angle-of-Incidence (AOI) are commonly used in the optical detection systems. The photodiodes are highly compatible with standard optical benches. In standard optical benches, components may be accurately aligned using a pre-defined grid of holes to form a setup. The setup simplifies a beam alignment and supports a precise positioning with a minimal complexity.
[0004] Nevertheless, emerging quantum applications may often use the photodiodes with a non-zero Angle-of-Incidence (AOI) to enhance detection sensitivity, quantum efficiency, and adapt to specific optical configurations. The integration of the photodiodes introduces several significant challenges. The standard grid layout of the standard optical benches becomes ineffective for aligning the photodiodes at the non-zero AOI. Thus, the process of alignment is made considerably more difficult. A manual alignment of optical beams to match a specified Angle-of-Incidence (AOI) is inherently error-prone. The manual alignment of optical beams also lacks an angular precision required in sensitive quantum measurements. As a result, an overall quantum efficiency decreases, which is particularly detrimental in a variety of applications such as the squeezed light detection, where efficiencies above 99% are essential. Moreover, absence of an effective alignment mechanism may mean that the process of the alignment often involves a repeated fine-tuning and a trial-and-error adjustment, which may lead to substantial delays during a setup of the optical detection systems and thereby, reduces an operational efficiency of the optical detection system.
[0005] Despite the critical importance of an angular alignment in an advanced optical system, existing solutions do not adequately resolve the aforementioned issues, particularly in scenarios, which may demand both a high angular precision and a minimal setup complexity. Moreover, traditional technologies rely on external components for an Angle-of-Incidence (AOI) alignment. Likewise, traditional solutions often compromise quantum efficiency due to errors in the manual alignment. Moreover, traditional mounts lack integration and simplicity.
[0006] FIGs. 1A-1B illustrate two different types of a traditional balanced detector 100A and 100B, according to prior art. According to FIG. 1A, the traditional balanced detector 100A includes a set of photodiodes 102A, which may be placed perpendicular to each other. Further, in FIG. 1A, the set of photodiodes 102A are arranged orthogonally, which means positioned perpendicular to each other. According to FIG. 1B, the traditional balanced detector 100B may include a set of photodiodes 102B, which may be facing parallel to each other. Further, in FIG. 1B, the set of photodiodes 102B is oriented in a parallel alignment facing the same direction. Furthermore, in FIG. 1B, a top view 104B of a photodiode and a side view 106B of the photodiode is depicted. Furthermore, in the side view 106B of the photodiode, an active area 108B of the photodiode is depicted. Furthermore, in FIGs. 1A-1B, the light must be directed at an angle to ensure the highest quantum efficiency for both detection arms in both the traditional balanced detector 100A and 100B for a specific Angle-of-Incidence (AOI). Furthermore, in FIGs. 1A-1B, when the specific AOI is required, the incident light may be directed at a corresponding angle to ensure that the incident light aligns accurately with both detection arms of both the traditional balanced detector 100A and 100B.
[0007] Currently, no existing technologies provide photodiode mounts, which may be designed specifically for non-zero Angle-of-Incidence (AOI) configurations. Moreover, the existing technologies are limited to a setup including the traditional photodiodes with the 0° AOI and a plurality of mounts requiring manual adjustments for a beam alignment. Further, the setup may often use optical bench alignment grids and a plurality of additional optical components, such as, mirrors and lenses for fine-tuning a beam path. Various existing technologies may provide a free-space balanced amplified photodetector. The free-space balanced amplified photodetector may include a photodiode mount with the 0° AOI and a quantum efficiency of less than 90%. Moreover, various other existing technologies may also provide a High Quantum Efficiency (HQE) balanced detector. However, when the HQE photodiodes are not positioned with a correct AOI inside the photodiode mount, then a beam incident perpendicular to face of the photodiode mount may not be incident at the AOI required for the highest quantum efficiency. Further, to achieve the highest quantum efficiency, the beams may have to be manually adjusted to be incident at the correct AOI, which may be external to the photo-detector.
[0008] Therefore, there is a need for an improved photo-detector with an integrated Angle-of-Incidence (AOI) alignment for sensing optical beams in an optoelectronic environment and a method thereof, which may enable a precise and an efficient alignment of optical beams with photodiodes operating at the non-zero AOI in balanced detectors used for quantum technologies.

SUMMARY
[0001] This section is provided to introduce certain objects and aspects of the present disclosure in a simplified form that are further described below in the detailed description. This summary is not intended to identify the key features or the scope of the claimed subject matter.
[0002] In an aspect, the present disclosure relates to a photo-detector with an integrated Angle-of-Incidence (AOI) alignment for sensing optical beams in an optoelectronic environment. The photo-detector includes one or more photodiodes. Further, each of the one or more photodiodes is disposed at a predefined Angle-of-Incidence (AOI) relative to incoming optical beams associated with the optoelectronic environment. Furthermore, each of the one or more photodiodes is integrated into a structure of the photo-detector at the predefined AOI in a photodiode mount. Furthermore, the photodiode mount is configured to receive the incoming optical beams in at least one of a parallel position to a grid of an optical bench and a normal position to a face of the photo-detector.
[0003] In another aspect, the present disclosure relates to a method for sensing an optical beam using a photo-detector with an integrated Angle-of-Incidence (AOI) alignment. The method includes positioning one or more photodiodes in a photodiode mount. Further, each of the one or more photodiodes is positioned at a predefined Angle-of-Incidence (AOI) relative to incoming optical beams associated with an optoelectronic environment. Furthermore, the method includes integrating each of the one or more photodiodes into a structure of the photodiode mount at the predefined AOI. Furthermore, the method includes aligning the photodiode mount for receiving the incoming optical beams in at least one of a parallel position to a grid of an optical bench and a normal position to a face of the photo-detector.
[0004] To further clarify the features of the present disclosure, a more particular description of the disclosure may follow by reference to specific embodiments thereof, which may be illustrated in the appended figures. One may appreciate that these figures depict typical embodiments of the disclosure and may therefore not to be considered limiting in scope. The disclosure may be described and explained with additional specificity and detail with the appended figures.
BRIEF DESCRIPTION OF THE ACCOMPANYING DRAWINGS
[0005] The accompanying drawings, which are incorporated herein, and constitute a part of this invention, illustrate exemplary embodiments of the disclosed methods and systems in which like reference numerals refer to the same parts throughout the different drawings. Components in the drawings are not necessarily to scale, emphasis instead being placed upon clearly illustrating the principles of the present invention. Some drawings may indicate the components using block diagrams and may not represent the internal circuitry of each component. It will be appreciated by those skilled in the art that invention of such drawings include the invention of electrical components, electronic components or circuitry commonly used to implement such components.
[0006] FIGs. 1A-1B illustrate two different types of a traditional balanced detector, according to prior art;
[0007] FIG. 2 illustrates an exemplary block diagram representation of a photo-detector with an integrated Angle-of-Incidence (AOI) alignment for sensing optical beams in an optoelectronic environment, according to an example;
[0008] FIG. 3 illustrates an exemplary block diagram representation of a photodiode mount of the photo-detector such as those shown in FIG. 2, according to an example; and
[0009] FIG. 4 illustrates an exemplary flow chart depicting an example method for sensing an optical beam in an optoelectronic environment using a photo-detector with an integrated Angle-of-Incidence (AOI) alignment, according to an example.
[0010] The foregoing shall be more apparent from the following more detailed description of the disclosure.

DETAILED DESCRIPTION OF THE INVENTION
[0011] In the following description, for the purposes of explanation, various specific details are set forth in order to provide a thorough understanding of embodiments of the present disclosure. It will be apparent, however, that embodiments of the present disclosure may be practiced without these specific details. Several features described hereafter can each be used independently of one another or with any combination of other features. An individual feature may not address all of the problems discussed above or might address only some of the problems discussed above. Some of the problems discussed above might not be fully addressed by any of the features described herein.
[0012] The ensuing description provides exemplary embodiments only, and is not intended to limit the scope, applicability, or configuration of the disclosure. Rather, the ensuing description of the exemplary embodiments will provide those skilled in the art with an enabling description for implementing an exemplary embodiment. It should be understood that various changes may be made in the function and arrangement of elements without departing from the spirit and scope of the invention as set forth.
[0013] Specific details are given in the following description to provide a thorough understanding of the embodiments. However, it will be understood by one of ordinary skill in the art that the embodiments may be practiced without these specific details. For example, circuits, systems, networks, processes, and other components may be shown as components in block diagram form in order not to obscure the embodiments in unnecessary detail. In other instances, well-known circuits, processes, algorithms, structures, and techniques may be shown without unnecessary detail in order to avoid obscuring the embodiments.
[0014] Also, it is noted that individual embodiments may be described as a process which is depicted as a flowchart, a flow diagram, a data flow diagram, a structure diagram, or a block diagram. Although a flowchart may describe the operations as a sequential process, many of the operations can be performed in parallel or concurrently. In addition, the order of the operations may be re-arranged. A process is terminated when its operations are completed but could have additional steps not included in a figure. A process may correspond to a method, a function, a procedure etc.
[0015] The word “exemplary” and/or “demonstrative” is used herein to mean serving as an example, instance, or illustration. For the avoidance of doubt, the subject matter disclosed herein is not limited by such examples. In addition, any aspect or design described herein as “exemplary” and/or “demonstrative” is not necessarily to be construed as preferred or advantageous over other aspects or designs, nor is it meant to preclude equivalent exemplary structures and techniques known to those of ordinary skill in the art. Furthermore, to the extent that the terms “includes”,” “has,” “contains,” and other similar words are used in either the detailed description or the claims, such terms are intended to be inclusive—in a manner similar to the term “comprising” as an open transition word—without precluding any additional or other elements.
[0016] Reference throughout this specification to “one embodiment” or “an embodiment” or “an instance” or “one instance” means that a particular feature, structure, or characteristic described in connection with the embodiment is included in at least one embodiment of the present disclosure. Thus, the appearances of the phrases “in one embodiment” or “in an embodiment” in various places throughout this specification are not necessarily all referring to the same embodiment. Furthermore, the particular features, structures, or characteristics may be combined in any suitable manner in one or more embodiments.
[0017] The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the singular forms “a”, “an” and “the” are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms “comprises” and/or “comprising,” when used in this specification, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof. As used herein, the term “and/or” includes any and all combinations of one or more of the associated listed items.
[0018] Examples of the present disclosure provides a photo-detector with an integrated Angle-of-Incidence (AOI) alignment for sensing optical beams in an optoelectronic environment and a method thereof. The photo-detector includes one or more photodiodes. Further, each of the one or more photodiodes is disposed at a predefined Angle-of-Incidence (AOI) relative to incoming optical beams associated with the optoelectronic environment. Further, a quantum efficiency of the one or more photodiodes is the highest when an incoming light beam is incident at the pre-defined AOI. Furthermore, the one or more photodiodes is integrated into a structure of the photo-detector at the predefined AOI in a photodiode mount. Furthermore, the photodiode mount is configured to receive the incoming optical beams in at least one of a parallel position to a grid of an optical bench and a normal position to a face of the photo-detector.
[0019] Referring now to the drawings, and more particularly to FIG. 2 through FIG. 4, where similar reference characters denote corresponding features consistently throughout the figures, there are shown preferred embodiments and these embodiments are described in the context of the following exemplary system and/or method.
[0020] FIG. 2 illustrates an exemplary block diagram representation of a photo-detector 200 with an integrated Angle-of-Incidence (AOI) alignment for sensing optical beams in an optoelectronic environment, according to an example. The photo-detector 200 includes one or more photodiodes 202. Further, each of the one or more photodiodes 202 is disposed at a predefined Angle-of-Incidence (AOI) relative to incoming optical beams (not depicted in FIG. 2) associated with the optoelectronic environment. Furthermore, the one or more photodiodes 202 is integrated into a structure 204A of the photo-detector 200 at the predefined AOI in a photodiode mount 204. Furthermore, the photodiode mount 204 is configured to receive the incoming optical beams (not depicted in FIG. 2) in at least one of a parallel position (not depicted in FIG. 2) to a grid 206A of an optical bench 206 and a normal position (not depicted in FIG. 2) to a face of the photo-detector 200.
[0021] In an exemplary embodiment, the photodiode mount 204 includes a rigid structure . Further, the rigid structure is configured to maintain the predefined AOI over time. Furthermore, the rigid structure may be typically composed using metals, such as but not limited to, aluminium, and the like.
[0022] In another exemplary embodiment, the one or more photodiodes 202 is disposed in a balanced detection configuration. Further, in the balanced detection configuration, the one or more photodiodes 202 may receive an optical beam each and a plurality of output photocurrents of the one or more photodiodes 202 are subtracted to generate a difference current.
[0023] In yet another exemplary embodiment, the photodiode mount 204 is configured to hold each of the one or more photodiodes 202 at the predefined AOI.
[0024] In yet another exemplary embodiment, the incoming optical beams (not depicted in FIG. 2) are aligned in one or more non-zero AOI configurations of the photo-detector 200. Further, for example, an AOI of, for example, 20º may maximize the quantum efficiency.
[0025] In yet another exemplary embodiment, the one or more photodiodes 202 may be defined as a semiconductor-based optoelectronic device. Further, the one or more photodiodes 202 may be constructed to convert an incident light into an electrical current. Furthermore, the one or more photodiodes 202 may operate primarily on a principle of a photoelectric effect. Furthermore, the one or more photodiodes 202 may be typically fabricated using a plurality of materials, such as, but not limited to a silicon (Si) and an indium gallium arsenide (InGaAs). Furthermore, the one or more photodiodes 202 may include a p-n junction. Furthermore, the p-n junction may become electrically active upon illumination. Furthermore, the p-n junction may then generate a photocurrent proportional to an intensity of an incident light. Furthermore, the one or more photodiodes 202 may be characterized, for example, but not limited to, by a high sensitivity, a rapid response time, a low dark current, and an excellent linearity when operated under a reverse bias condition. Furthermore, the one or more photodiodes 202 may offer various advantages, including but not limited to, a compact form factor, a low power consumption, and a high quantum efficiency. Furthermore, the one or more photodiodes 202 is highly suitable for an integration, for example, but not limited to, in an advanced optical system and a quantum system. Furthermore, the one or more photodiodes 202 may be widely employed in diverse applications, such as, but not limited to, a laser measurement system, a medical imaging device, and particularly in a quantum technology for a high-precision balanced detection. Furthermore, the high-precision balanced detection may include a squeezed light detection and a quantum key distribution receiver. Furthermore, the one or more photodiodes 202 may be categorized in different types, which may depend on specific application requirements. Furthermore, the one or more photodiodes 202 may be chosen from, such as, but not limited to, a PIN photodiode and an avalanche photodiode. Furthermore, the avalanche photodiode may be utilized to achieve an enhanced performance. Furthermore, the PIN photodiode is a type of a photodiode where an intrinsic layer, which is an undoped semiconductor layer, is sandwiched between a p-type layer and an n-type layer. Furthermore, the PIN photodiode enhances a depletion region as more efficient collection of charge carriers generated by an incident light is allowed. Furthermore, the PIN photodiode may improve speed and sensitivity of the one or more photodiodes 202.
[0026] In yet another exemplary embodiment, the photodiode mount 204 may be defined as a specially engineered mechanical fixture. Further, the photodiode mount 204 may be designed to securely hold and position the one or more photodiodes 202 within the optoelectronic environment. Furthermore, the photodiode mount 204 integrates the predefined AOI directly into the structure 204A of the photodiode mount 204 in comparison with a non-integration of the predefined AOI in a plurality of conventional mounts. Furthermore, the photodiode mount 204 integrating the predefined AOI may allow the one or more photodiodes 202 to be precisely oriented relative to the incoming optical beams (not depicted in FIG. 2). Furthermore, the photodiode mount 204 integrating the predefined AOI may not require at least one of a manual angular adjustment and a plurality of additional alignment components. Furthermore, the photodiode mount 204 is configured to ensure that each of the one or more photodiodes 202 maintains at least one of an accurate angular position and a fixed angular position. Furthermore, the photodiode mount 204 may provide at least one of an improved alignment precision and an enhanced quantum efficiency. Furthermore, the photodiode mount 204 is advantageous for various applications demanding a high optical sensitivity, such as, but not limited to, the squeezed light detection and a plurality of other quantum optical measurements. Furthermore, the photodiode mount 204 is fabricated using a high-precision manufacturing method, such as, but not limited to, a Computer Numerical Control (CNC) machining. Furthermore, the CNC machining ensures an angular accuracy within tight tolerances. Furthermore, the photodiode mount 204 may be constructed in a manner which may allow for, but not limited to, a simplified assembly, a reduced setup time, and a reliable long-term stability in a high-performance optical system.
[0027] In yet another exemplary embodiment, the optical bench 206 may be a stable and a flat platform. Further, the optical bench 206 may be used in at least one of a plurality of optical experiments and a plurality of systems for a precise mounting, an alignment, and a support of optical components. Furthermore, the optical components may, include, but not limited to, a plurality of lenses, a plurality of mirrors, a plurality of beam splitters, and the one or more photodiodes 202. Furthermore, the optical bench 206 may typically feature a rigid base with the grid 206A. Furthermore, the grid 206A may be made up of a plurality of pre-drilled threaded holes. Furthermore, the plurality of pre-drilled threaded holes may be arranged in a standardized pattern to enable a flexible and a repeatable positioning of the photodiode mount 204. Furthermore, the optical bench 206 may provide a foundational support for securing the photodiode mount 204 with the integrated AOI alignment. Furthermore, the optical bench 206 may ensure that the photodiode mount 204 remains fixed in a desired position during an operation in the optoelectronic environment. Furthermore, the optical bench 206 may allow optical paths to remain consistent and parallel to surface of the optical bench 206. Furthermore, the optical bench 206 may facilitate an accurate beam alignment. Furthermore, the optical bench 206 may minimize errors during a setup in a high-precision quantum optical application.
[0028] In yet another exemplary embodiment, the grid 206A of the optical bench 206 refers to a standardized array of at least one of a plurality of threaded holes and a plurality of positioning markers. Further, the standardized array of the at least one of the plurality of threaded holes and the plurality of positioning markers may be arranged in a regular, typically, in an orthogonal pattern on the surface of the optical bench 206. Furthermore, the grid 206A may serve as a modular platform for at least one of mounting and aligning various optical components. Furthermore, the various optical components may include, but not limited to, a plurality of lenses, a plurality of mirrors, and the one or more photodiodes 202, with a high positional accuracy and a repeatability. Furthermore, the grid 206A may facilitate a stable and a precise placement of the photodiode mount 204 with the integrated AOI alignment. Furthermore, the integrated AOI alignment may allow the incoming optical beams (not depicted in FIG. 2) to be directed along a predictable path parallel to a layout of the grid 206A. Furthermore, a consistent optical alignment may align the photodiode mount 204 according to the grid 206A without requiring complex angular adjustments. Furthermore, the consistent optical alignment may reduce setup time and ensure compatibility with an existing optical infrastructure.
[0029] FIG. 3 illustrates an exemplary block diagram representation 300 of the photodiode mount 204 of the photo-detector 200 with the integrated AOI alignment such as those shown in FIG. 2, according to an example. According to FIG. 3 , the integrated AOI alignment inherently built into the structure 204A of the photodiode mount 204 is depicted. Further, the integrated AOI alignment eliminates a requirement for a manual angular adjustment of the predefined AOI relative to the incoming optical beams 308 associated with the optoelectronic environment. Furthermore, the photo-detector 200 is constructed to ensure that the one or more photodiodes 202 are pre-aligned to a specified Angle-of-Incidence (AOI), which may facilitate an accurate beam alignment. Furthermore, the photo-detector 200 reduces a setup complexity. Furthermore, the photodiode mount 204 is configured to receive the incoming optical beams 308 in at least one of the parallel position 304 to the grid 206A of the optical bench 206 and the normal position 302 to the face of the photo-detector 200.
[0030] In an exemplary embodiment, the one or more photodiodes 202 may be mounted at the predefined AOI, depicted by ‘θ’ in the photodiode mount 204, with the incoming optical beams 308 directed at a corresponding angle to align with the photo-detector 200. Further, the photodiode mount 204 ensures that the one or more photodiodes 202 may be fixed at the normal position 302 to the face of the photo-detector 200. Furthermore, the photodiode mount 204 may allow the incoming optical beams 308 to enter at the predefined AOI without the need for the manual angular adjustment. Furthermore, the normal position 302 may be defined as a position in which the one or more photodiodes 202 are arranged orthogonally, which means positioned perpendicular to each other. Furthermore, the normal position 302 may maintain a beam symmetry and support an optimal alignment precision.
[0031] Additionally, the photodiode mount 204 is configured to receive the incoming optical beams 308 in the parallel position 304 to the grid 206A of the optical bench 206. Further, the one or more photodiodes 202 in the parallel position 304 are at the predefined AOI relative to the incoming optical beams 308. Furthermore, the predefined AOI in the parallel position 304 is built into the photodiode mount 204. Furthermore, the incoming optical beams 308 may remain aligned with the grid 206A of the optical bench 206. Furthermore, an angular displacement required for an optimal performance of the one or more photodiodes 202 may be achieved through the structure 204A of the photodiode mount 204. Furthermore, the photo-detector 200 facilitates compatibility with a plurality of standard optical bench layouts while maintaining a high angular accuracy.
[0032] Additionally, dashed lines in FIG. 3 may represent a normal 306 to a surface of the one or more photodiodes 202. Further, the normal 306 is a line, which is perpendicular, at 90°, to the surface of the one or more photodiodes 202. Furthermore, a plurality of solid arrows in FIG. 3 may be the incoming optical beams 308.
[0033] FIG. 4 illustrates an exemplary flow chart depicting an example method 400 for sensing an optical beam in an optoelectronic environment using a photo-detector 200 with an integrated Angle-of-Incidence (AOI) alignment, according to an example.
[0034] At block 402, the method 400 may include positioning one or more photodiodes 202 in a photodiode mount 204. Further, each of the one or more photodiodes 202 is positioned at a predefined Angle-of-Incidence (AOI) relative to incoming optical beams 308 associated with the optoelectronic environment.
[0035] At block 404, the method 400 may include integrating the one or more photodiodes 202 into a structure 204A of the photodiode mount 204 at the predefined AOI.
[0036] At block 406, the method 400 may include aligning the photodiode mount 204 for receiving the incoming optical beams 308 in at least one of a parallel position 304 to a grid 206A of an optical bench 206 and a normal position 302 to a face of the photo-detector 200.
[0037] In an example, the method 400 may include disposing the one or more photodiodes 202 in the photodiode mount 204. Further, disposing the one or more photodiodes 202 may include arranging each of the one or more photodiodes 202 in a detection configuration, each positioned at the predefined AOI.
[0038] The present disclosure provides a photo-detector 200 with an integrated Angle-of-Incidence (AOI) alignment for sensing optical beams in an optoelectronic environment and a method 400 thereof. Further, the photodiode mount 204 (interchangeably referred to as a balanced detector photodiode mount 204) is constructed to simplify and improve the alignment of the incoming optical beams 308 in the optoelectronic environment. Furthermore, the photo-detector 200 ensures that the one or more photodiodes 202 are precisely aligned to accommodate the specific Angle-of-Incidence (AOI) for the incoming optical beams 308. Furthermore, the one or more photodiodes 202 are mounted at the predefined Angle-of-Incidence (AOI). Furthermore, the one or more photodiodes 202 may be integrated into a structure of the photo-detector 200 using a high-precision Computer Numerical Control (CNC) machining with a tolerance below 0.1°. Furthermore, the photo-detector 200 eliminates a need for a manual beam angle adjustment during a setup. Furthermore, the incoming optical beams 308 may propagate parallel to an alignment of the grid 206A of the optical bench 206. Furthermore, the incoming optical beams 308 may propagate normal to face of the photo-detector 200. Furthermore, the photo-detector 200 ensures, including, but not limited to, a superior angular precision, a simplified optical alignment, and a quantum efficiency greater than 99%. Furthermore, the photo-detector 200 may be applied to a plurality of applications, such as, but not limited to, the squeezed light detection in quantum technologies. Furthermore, the photo-detector 200 may integrate an angular alignment directly into the photodiode mount 204. Furthermore, the photo-detector 200 overcomes a challenge associated with aligning beams in a non-zero Angle-of-Incidence (AOI) setup. Furthermore, the photo-detector 200 may provide a robust solution for achieving consistent and repeatable results in an advanced optical system. Furthermore, the balanced detector photodiode mount 204 is constructed to address a plurality of alignment challenges for the one or more photodiodes 202 with a non-zero Angle-of-Incidence (AOI). Furthermore, the photo-detector 200 integrates the non-zero AOI into the balanced detector photodiode mount 204. Furthermore, the photo-detector 200 may provide various advantages, such as but not limited to, a streamlined setup, an enhanced precision, an enhanced quantum efficiency with achieving greater than 99% quantum efficiency, and an elimination of the manual angular adjustment by aligning a beam path with the grid 206A of the optical bench 206.
[0039] The present disclosure provides the photo-detector 200 with the integrated Angle-of-Incidence (AOI) alignment for sensing optical beams in the optoelectronic environment and the method 400 thereof. Further, the photo-detector 200 provides an integrated solution for a precise angular alignment in a balanced photodetector used in quantum optical systems. Furthermore, the photo-detector 200 integrates the pre-defined AOI directly into the photodiode mount 204. Furthermore, an integration of the pre-defined AOI within a mechanical construction of the photo-detector 200, may eliminate a need for the manual angular adjustment. Furthermore, the photo-detector 200 may simplify an alignment process, Furthermore, the photo-detector 200 may significantly enhance accuracy. Furthermore, the precise angular alignment may be achieved through the high-precision CNC machining, which may ensure angular tolerances of less than 0.1°. Furthermore, the high-precision CNC machining is substantially superior to a typical precision. Furthermore, the typical precision may be attained through a conventional manual alignment technique, which may be employed in a standard optical mount. Furthermore, the photo-detector 200 maintains an exceptional alignment fidelity, which is particularly crucial for quantum applications demanding a high detection efficiency. Furthermore, the photo-detector 200 enables the incoming optical beams 308 to remain parallel to a standardized grid of holes on the optical bench 206. Furthermore, the photo-detector 200 may allow users to benefit from inherent alignment features of an optical platform without the need for at least one of an angular tuning and an iterative realignment. Furthermore, the photo-detector 200 streamlines a setup process. Furthermore, the photo-detector 200 reduces a likelihood of alignment errors. Furthermore, the photo-detector 200 maintains the specified AOI with high precision. Furthermore, the specified AOI ensures quantum efficiencies exceeding 99%, which is essential in sensitive applications, such as, but not limited to, the squeezed light detection. Furthermore, the integrated AOI design of the photo-detector 200 leads to a significant reduction in a setup time. Furthermore, the photo-detector 200 removes a need for repeated adjustments of mirrors and optical components typically required in traditional setups. Furthermore, the photo-detector 200 may be a compact, a user-friendly, and a highly efficient solution for achieving a reliable and a precise optical alignment in an advanced quantum photonic system.
[0040] The present disclosure provides the photo-detector 200 with the integrated Angle-of-Incidence (AOI) alignment for sensing optical beams in the optoelectronic environment and the method 400 thereof. Further, the photo-detector 200 may be applied in a variety of advanced applications, including but not limited, to detection of a squeezed light in quantum optical systems and quantum information technologies. Furthermore, the photo-detector 200 may also be applied to a high-precision balanced photodetection used in an optical communication system and a signal processing system. Furthermore, the photo-detector 200 may also be applied to an accurate beam alignment in interferometric setups and precision metrology instruments. Furthermore, the photodiode mount 204 may be defined as an integrated angle alignment of the photodiode mount 204. Furthermore, the photodiode mount 204 may hold the one or more photodiodes 202 at a fixed and a predefined angle to match a required Angle-of-Incidence (AOI). Furthermore, the high-precision CNC machining of the photodiode mount 204 may ensure an angular accuracy below 0.1°. Furthermore, the integrated angle alignment of the photodiode mount 204 has a rigid construction to prevent a misalignment over time. Furthermore, a predefined angular orientation minimizes reliance on external optical adjustments. Furthermore, the photodiode mount 204 functions by integrating a fixed Angle-of-Incidence (AOI) into the photodiode mount 204, which may eliminate a need for a manual beam alignment. Furthermore, the photodiode mount 204 ensures that the incoming optical beams 308 remain aligned with the grid 206A of the optical bench 206 to enhance precision. Furthermore, the photodiode mount 204, thereby, reduces a setup complexity. Furthermore, the one or more photodiodes 202 may be positioned at the predefined AOI, which may allow for an optimal quantum efficiency and a reliable detection performance.
[0041] The written description describes the subject matter herein to enable any person skilled in the art to make and use the embodiments. The scope of the subject matter embodiments is defined by the claims and may include other modifications that occur to those skilled in the art. Such other modifications are intended to be within the scope of the claims if they have similar elements that do not differ from the literal language of the claims or if they include equivalent elements with insubstantial differences from the literal language of the claims.
[0042] A description of an embodiment with several components in communication with each other does not imply that all such components are required. On the contrary, a variety of optional components are described to illustrate the wide variety of possible embodiments of the invention. When a single device or article is described herein, it will be apparent that more than one device/article (whether or not they cooperate) may be used in place of a single device/article. Similarly, where more than one device or article is described herein (whether or not they cooperate), it will be apparent that a single device/article may be used in place of the more than one device or article, or a different number of devices/articles may be used instead of the shown number of devices or programs. The functionality and/or the features of a device may be alternatively embodied by one or more other devices which are not explicitly described as having such functionality/features. Thus, other embodiments of the invention need not include the device itself.
[0043] The illustrated steps are set out to explain the exemplary embodiments shown, and it should be anticipated that ongoing technological development will change the manner in which particular functions are performed. These examples are presented herein for purposes of illustration, and not limitation. Further, the boundaries of the functional building blocks have been arbitrarily defined herein for the convenience of the description. Alternative boundaries can be defined so long as the specified functions and relationships thereof are appropriately performed. Alternatives (including equivalents, extensions, variations, deviations, etc., of those described herein) will be apparent to persons skilled in the relevant art(s) based on the teachings contained herein. Such alternatives fall within the scope and spirit of the disclosed embodiments. Also, the words "comprising," "having," "containing," and "including," and other similar forms are intended to be equivalent in meaning and be open-ended in that an item or items following any one of these words is not meant to be an exhaustive listing of such item or items or meant to be limited to only the listed item or items. It must also be noted that as used herein and in the appended claims, the singular forms “a,” “an,” and “the” include plural references unless the context clearly dictates otherwise.
[0044] Finally, the language used in the specification has been principally selected for readability and instructional purposes, and it may not have been selected to delineate or circumscribe the inventive subject matter. It is therefore intended that the scope of the invention be limited not by this detailed description, but rather by any claims that issue on an application based here on. Accordingly, the embodiments of the present invention are intended to be illustrative, but not limited, of the scope of the invention, which is outlined in the following claims.
, C , Claims:CLAIMS

1. A photo-detector (200) with an integrated Angle-of-Incidence (AOI) alignment for sensing optical beams in an optoelectronic environment, the photo-detector (200) comprising:
one or more photodiodes (202), each of the one or more photodiodes (202) is disposed at a predefined Angle-of-Incidence (AOI) relative to incoming optical beams (308) associated with the optoelectronic environment, wherein the one or more photodiodes (202) is integrated into a structure (204A) of the photo-detector (200) at the predefined AOI in a photodiode mount (204); and
wherein the photodiode mount (204) is configured to receive the incoming optical beams (308) in at least one of a parallel position (304) to a grid (206A) of an optical bench (206) and a normal position (302) to a face of the photo-detector (200).
2. The photo-detector (200) as claimed in claim 1, wherein the photodiode mount (204) comprises a rigid structure configured to maintain the predefined AOI over time.
3. The photo-detector (200) as claimed in claim 1, wherein the photodiode mount (204) is configured to hold each of the one or more photodiodes (202) at the predefined AOI.

4. The photo-detector (200) as claimed in claim 1, wherein the incoming optical beams (308) are aligned in one or more non-zero AOI configurations of the photo-detector (200).
5. A method (400) for sensing an optical beam in an optoelectronic environment using a photo-detector (200) with an integrated Angle-of-Incidence (AOI) alignment, the method (400) comprising:
positioning one or more photodiodes (202) in a photodiode mount (204), wherein each of the one or more photodiodes (202) is positioned at a predefined Angle-of-Incidence (AOI) relative to incoming optical beams (308) associated with the optoelectronic environment;
integrating the one or more photodiodes (202) into a structure (204A) of the photodiode mount (204) at the predefined AOI; and
aligning the photodiode mount (204) for receiving the incoming optical beams (308) in at least one of a parallel position (304) to a grid (206A) of an optical bench (206) and a normal position (302) to a face of the photo-detector (200).
6. The method (400) as claimed in claim 6, wherein disposing the one or more photodiodes (202) in the photodiode mount (204) comprises arranging the one or more photodiodes (202) in a detection configuration, each positioned at the predefined AOI.