Abstract: This actinic ray-sensitive or radiation-sensitive resin composition comprises: a resin having a polarity that increases due to action of an acid; an onium salt (A) including a sulfonic acid anion but not including a fluorine atom; and an onium salt (B) including a specific structure but not including a fluorine atom. This resist film is formed using the actinic ray-sensitive or radiation-sensitive resin composition. This pattern-forming method and this production method for an electronic device use the actinic ray-sensitive or radiation-sensitive resin composition.
| # | Name | Date |
|---|---|---|
| 1 | 202547084069-STATEMENT OF UNDERTAKING (FORM 3) [04-09-2025(online)].pdf | 2025-09-04 |
| 2 | 202547084069-REQUEST FOR EXAMINATION (FORM-18) [04-09-2025(online)].pdf | 2025-09-04 |
| 3 | 202547084069-PROOF OF RIGHT [04-09-2025(online)].pdf | 2025-09-04 |
| 4 | 202547084069-PRIORITY DOCUMENTS [04-09-2025(online)].pdf | 2025-09-04 |
| 5 | 202547084069-FORM 18 [04-09-2025(online)].pdf | 2025-09-04 |
| 6 | 202547084069-FORM 1 [04-09-2025(online)].pdf | 2025-09-04 |
| 7 | 202547084069-DECLARATION OF INVENTORSHIP (FORM 5) [04-09-2025(online)].pdf | 2025-09-04 |
| 8 | 202547084069-COMPLETE SPECIFICATION [04-09-2025(online)].pdf | 2025-09-04 |
| 9 | 202547084069-FORM-26 [08-09-2025(online)].pdf | 2025-09-08 |
| 10 | 202547084069-Proof of Right [12-09-2025(online)].pdf | 2025-09-12 |