Claims:WE CLAIM:
1. A cloud based evaluation system (10) to evaluate at least one electronic device comprising:
at least one first web connector (20) configured to virtually connect at least one semiconductor evaluation hardware to the cloud;
at least one second web connector (30) communicatively coupled to the at least one first web connector (20) and configured to virtually connect at least one semiconductor device to the cloud;
a cloud server (40) communicatively coupled to the at least one first web connector (20) and the at least one second web connector (30) comprising:
a processing subsystem (50) configured to:
register the at least one first web connector and the at least one second web connector;
generate a unique identification for a registered at least one first web connector and a registered at least one second web connector;
create a virtual communication channel between the at least one semiconductor evaluation hardware and the at least one semiconductor device using the at least one first web connector and the at least one second web connector;
conduct the evaluation of the at least one semiconductor device through the at least one semiconductor evaluation hardware; and
a cloud memory (60) operatively coupled to the processing subsystem (50) and configured to store a plurality of details of the at least one semiconductor evaluation hardware and the at least one semiconductor device.
2. The system (10) as claimed in claim 1, wherein the at least one first web connector (20) and the at least one second web connector (30) comprises to transmit one or more information in a bidirectional flow.
3. The system (10) as claimed in claim 1, wherein the evaluation of the at least one semiconductor device through the at least one semiconductor evaluation hardware is conducted on a browser compatible interface.
4. The system (10) as claimed in claim 1, further the at least one semiconductor evaluation hardware comprises a wireless communication technology device configured to virtually connect to the at least one first web connector (20).
5. The system (10) as claimed in claim 4, wherein the wireless communication technology comprises one or more hardware protocols like an I-squared-C, a serial peripheral interface, a bit torrent or a wireless fidelity.
6. A method (200) to evaluate at least one electronic device comprising:
registering at least one first web connector and at least one second web connector;
generating a unique identification for a registered at least one first web connector and a registered at least one second web connector;
creating a virtual communication channel between the at least one semiconductor evaluation hardware and the at least one semiconductor device using the at least one first web connector and the at least one second web connector; and
conducting the evaluation of the at least one semiconductor device through the at least one semiconductor evaluation hardware.
7. The method (200) as claimed in claim 6, wherein creating the virtual communication channel between the at least one semiconductor evaluation hardware and the at least one semiconductor device using the at least one first web connector and the at least one second web connector comprises:
requesting a plurality of details of a at least one registered first web connector;
selecting at least one specific first web connector from the at least one first connector; and
sending a request to create a virtual communication channel between a selected at least one specific first web connector and the at least one second web connector.
8. The method (200) as claimed in claim 7, wherein selecting at least one specific first web connector from the at least one first connector comprises selecting the at least one specific first web connector comprises selecting the at least one specific first web connector based on a generated unique identification.
, Description:BACKGROUND
[0001] Embodiments of a present disclosure relate to an evaluation system, and more particularly to a cloud based evaluation system and a method to evaluate at least one electronic device.
[0002] Evaluation system is an electronic circuitry which includes one or more test points, wherein the one or more test points are used to evaluate the applicability of a plurality of semiconductor devices in at least one application specific end product. One type of evaluation module includes a controller which is used to control one or more parameters of the evaluation module to represent a result.
[0003] In one approach, a system integrator who creates target applications to businesses or any customers for end products. Further, the system integrator gets a plurality of semiconductor components from one or more semiconductor companies. The system integrator further needs to purchase an evaluation module along with a controller board from the one or more semiconductor companies to evaluate the plurality of semiconductor components. Further, the system integrator must also have an application software and one or more associated driver components from the semiconductor company to wholly evaluate the plurality of semiconductor devices. However, such system for evaluating the plurality of electronic components increases the hardware requirement and hence increases the cost for evaluation. Also, the evaluation module and the controller boards further includes a plurality of other electronic components which are coupled along with the evaluation module and the controller boards which creates noise while evaluating the plurality of semiconductor components.
[0004] In another approach, a user contacts a host website for the evaluation of an electronic device and transmits all the information of the electronic device to the website which has to be evaluated. Further, the host website transmits a plurality of test vectors to the user. Further, the user tests the electronic device based on a plurality of received test vectors. Further, the user transmits a test result to a host. Further, the host generates an evaluation based on a received test result. Further the host transmits the test results to the user. However, in such system, the user does not have an option to choose an evaluation module of his/her choice.
[0005] In yet another approach, the user can directly access a company’s website and can request for information about a particular electronic device which has to be evaluated. Further, the user needs to send a plurality of parameter details of the electronic device to the company’s website. Further, the evaluation module corresponding to the plurality of details of the particular electronic device will automatically evaluate the electronic device in real-time. The evaluation result of the electronic device is sent to the user. However, in such system, the user does not have the choice to select the evaluation module of the user’s interest. Further, the user must be aware of the parameters of the electronic device to be evaluated. Also, the user is not aware about the relevant controller used for the evaluation of the electronic device.
[0006] Hence, there is a need for an improved cloud based evaluation system and a method to evaluate at least one electronic device to address the aforementioned issue.
BREIF DESCRIPTION
[0007] In accordance with one embodiment of the disclosure, a cloud based evaluation system and a method to evaluate at least one electronic device are provided. The system includes at least one first web connector configured to virtually connect at least one semiconductor evaluation hardware to the cloud. The system also includes at least one second web connector communicatively coupled to the at least one first web connector and configured to virtually connect at least one semiconductor device to the cloud. The system further includes a cloud server communicatively coupled to the at least one first web connector and the at least one second web connector. The cloud server includes a processing subsystem configured to register the at least one first web connector and the at least one second web connector. The processing subsystem is also configured to generate a unique identification for a registered at least one first web connector and a registered at least one second web connector. The processing subsystem is further configured to create a virtual communication channel between the at least one semiconductor evaluation hardware and the at least one semiconductor device using the at least one first web connector and the at least one second web connector. The processing subsystem is further configured to conduct the evaluation of the at least one semiconductor device through the at least one semiconductor evaluation hardware. The cloud server also includes a cloud memory operatively coupled to the processing subsystem and configured to store a plurality of details of the at least one semiconductor evaluation hardware and the at least one semiconductor device.
[0008] In accordance with another embodiment of the present invention, a method to evaluate at least one electronic device includes registering at least one first web connector and at least one second web connector. The method also includes generating a unique identification for a registered at least one first web connector and a registered at least one second web connector. The method further includes creating a virtual communication channel between the at least one semiconductor evaluation hardware and the at least one semiconductor device using the at least one first web connector and the at least one second web connector. The method further includes conducting the evaluation of the at least one semiconductor device through the at least one semiconductor evaluation hardware.
[0009] To further clarify the advantages and features of the present disclosure, a more particular description of the disclosure will follow by reference to specific embodiments thereof, which are illustrated in the appended figures. It is to be appreciated that these figures depict only typical embodiments of the disclosure and are therefore not to be considered limiting in scope. The disclosure will be described and explained with additional specificity and detail with the appended figures.
BRIEF DESCRIPTION OF THE DRAWINGS
The disclosure will be described and explained with additional specificity and detail with the accompanying figures in which:
[0010] FIG. 1 is a block diagram representing a cloud based evaluation system to evaluate at least one electronic device in accordance with an embodiment of the present disclosure;
[0011] FIG. 2 is a block diagram representing an exemplary embodiment of a cloud based evaluation system to evaluate at least one electronic device of FIG. 1 in accordance with an embodiment of the present disclosure; and
[0012] FIG. 3 is a process flow to evaluate at least one electronic device on a cloud based evaluation system.
[0013] Further, those skilled in the art will appreciate that elements in the figures are illustrated for simplicity and may not have necessarily been drawn to scale. Furthermore, in terms of the construction of the device, one or more components of the device may have been represented in the figures by conventional symbols, and the figures may show only those specific details that are pertinent to understanding the embodiments of the present disclosure so as not to obscure the figures with details that will be readily apparent to those skilled in the art having the benefit of the description herein.
DETAILED DESCRIPTION
[0014] For the purpose of promoting an understanding of the principles of the disclosure, reference will now be made to the embodiment illustrated in the figures and specific language will be used to describe them. It will nevertheless be understood that no limitation of the scope of the disclosure is thereby intended. Such alterations and further modifications in the illustrated system, and such further applications of the principles of the disclosure as would normally occur to those skilled in the art are to be construed as being within the scope of the present disclosure.
[0015] The terms "comprises", "comprising", or any other variations thereof, are intended to cover a non-exclusive inclusion, such that a process or method that comprises a list of steps does not include only those steps but may include other steps not expressly listed or inherent to such a process or method. Similarly, one or more devices or sub-systems or elements or structures or components preceded by "comprises... a" does not, without more constraints, preclude the existence of other devices, sub-systems, elements, structures, components, additional devices, additional sub-systems, additional elements, additional structures or additional components. Appearances of the phrase "in an embodiment", "in another embodiment" and similar language throughout this specification may, but not necessarily do, all refer to the same embodiment.
[0016] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the art to which this disclosure belongs. The system, methods, and examples provided herein are only illustrative and not intended to be limiting.
[0017] In the following specification and the claims, reference will be made to a number of terms, which shall be defined to have the following meanings. The singular forms “a”, “an”, and “the” include plural references unless the context clearly dictates otherwise.
[0018] Embodiments of the present disclosure relate to a cloud based evaluation system and a method to evaluate at least one electronic device are provided. The system includes at least one first web connector configured to virtually connect at least one semiconductor evaluation hardware to the cloud. The system also includes at least one second web connector communicatively coupled to the at least one first web connector and configured to virtually connect at least one semiconductor device to the cloud. The system further includes a cloud server communicatively coupled to the at least one first web connector and the at least one second web connector. The cloud server includes a processing subsystem configured to register the at least one first web connector and the at least one second web connector. The processing subsystem is also configured to generate a unique identification for a registered at least one first web connector and a registered at least one second web connector. The processing subsystem is further configured to create a virtual communication channel between the at least one semiconductor evaluation hardware and the at least one semiconductor device using the at least one first web connector and the at least one second web connector. The processing subsystem is further configured to conduct the evaluation of the at least one semiconductor device through the at least one semiconductor evaluation hardware. The cloud server also includes a cloud memory operatively coupled to the processing subsystem and configured to store a plurality of details of the at least one semiconductor evaluation hardware and the at least one semiconductor device.
[0019] Semiconductor company designs and fabricates semiconductor devices such as an integrated circuit which is used in a plurality of electronic systems such as hand held devices. The semiconductor devices fabricated are used by a plurality of system design houses or a plurality of system integrator wherein the plurality of semiconductor design houses create targeted application or an application specific product for a plurality of business or a plurality of end products. Further, for the plurality of system design houses to manufacture any application specific product, the fabricated electronic devices have to be evaluated to fit into the application specific product. The purpose of evaluation is to check if the fabricated semiconductor devices solve the purpose of being used in the application specific product. Further, based on the evaluation result of the fabricated semiconductor devices, the plurality of system design houses tends to procure the semiconductor devices in a large quantity.
[0020] FIG. 1 is a block diagram representing a cloud based evaluation system to evaluate at least one electronic device in accordance with an embodiment of the present disclosure. The system (10) includes at least one first web connector (20) configured to virtually connect at least one semiconductor evaluation hardware (25) to the cloud. In one embodiment, the at least one semiconductor evaluation hardware (25) may be an evaluation module configured to evaluate a plurality of integrated circuits (IC). As used herein, the evaluation module is an electronic circuit board or an electronic circuit card which provides one or more test points, wherein the one or more points can be used to evaluate an electronic semiconductor device (35) in a particular product.
[0021] The system (10) also includes at least one second web connector (30) communicatively coupled to the at least one first web connector (20) and configured to virtually connect at least one semiconductor device (35) to the cloud. In one embodiment, the at least one semiconductor device (35) may be at least one integrated circuit. In another embodiment, the at least one first web connector (20) and the at least one second web connector (30) may be a virtual connector which may virtually link the one or more semiconductor devices with the one or more semiconductor evaluation hardware. In such embodiment, the semiconductor evaluation hardware (25) may be coupled with a wireless communication technology device to virtually connect to the at least one semiconductor device (35). In another embodiment, the wireless communication technology device may be integrated with a hardware protocol such as an I-squared-C (I2C), a serial peripheral interface, a bit torrent or a wireless fidelity (Wi-Fi).
[0022] The system (10) further includes a cloud server (40) communicatively coupled to the at least one first web connector (20) and the at least one second web connector (30). As used herein, the cloud server (40) is a server built logically which is hosted using a cloud computing platform over a web or an internet. In one embodiment, the at least one first web connector (20) and the at least one second web connector (30) may be a first hardware connector and a second hardware connector which may be connected to the at least one semiconductor evaluation hardware (25) and the at least one semiconductor device (35) through a plurality of hardware connectors.
[0023] The cloud server (40) includes a processing subsystem (50) which is configured to register the at least one first web connector (20) and the at least one second web connector (30). In one embodiment, the cloud server (40) may be a remote server, a virtual server or a web server. In another embodiment, the at least one first web connector (20) and the at least one second web connector (30) may register with the cloud server (40) which may be used to make a virtual contact between the at least one semiconductor evaluation hardware (25) and the at least one semiconductor device (35).
[0024] The processing subsystem (50) is also configured to generate a unique identification for a registered at least one first web connector (20) and a registered at least one second web connector (30). In one embodiment, the unique identification may be a string of characters. In such embodiment, the string of characters may be a string of numbers, a string of alphabets or a hybrid string which may include both the string of numbers and the string of alphabets. In another embodiment, the unique identification may be generated based on the wireless communication technology.
[0025] The processing subsystem (50) is further configured to create a virtual communication channel between the at least one semiconductor evaluation hardware (25) and the at least one semiconductor device (35) using the at least one first web connector (20) and the at least one second web connector (30). In one embodiment, a user may chose the at least one at least one semiconductor evaluation hardware (25) based on the generated unique identification and may send a request to the processing subsystem (50) to create a virtual connection for a chosen at least one semiconductor evaluation hardware (25) to the at least one semiconductor device (35). In one embodiment, the cloud server (40) may create a virtual platform for the evaluation of the at least one semiconductor device (35) based on a selected at least one semiconductor evaluation hardware (25).
[0026] The processing subsystem (50) is further configured to conduct the evaluation of the at least one semiconductor device through the at least one semiconductor evaluation hardware (25). In one embodiment, the evaluation of the at least one semiconductor device (35) may be done on a browser compatible application on a user device. In another embodiment, the processing subsystem (50) may include a java script object on the user device which may be translated to a hardware specific commands which may further trigger the browser compatible application to collect a plurality of response from the at least one semiconductor evaluation hardware (25).
[0027] In one specific embodiment, the at least one semiconductor device (35) may be connected to a plurality of semiconductor evaluation hardware (25). In such embodiment, the evaluation of the at least one semiconductor device (35) may generate a plurality of evaluation test results. Further, the plurality of evaluation test results may be compared with each other to obtain a final evaluation result for the at least one semiconductor device (35). In one embodiment, the plurality of evaluation results may be obtained in real time.
[0028] In another specific embodiment, the at least one semiconductor device (35) may have a technical problem, wherein the technical problem may be identified by the user. Further, the user may select a debug option through the second web connector (30). Further, on choosing the debug option, a unique identification which may be linked to the at least one semiconductor device (35) may be identified by the first web connector (20). Further, on identifying the unique identification, the first web connector (20) may help the user to debug the identified technical problem.
[0029] FIG. 2 is a block diagram representing an exemplary embodiment of a cloud based evaluation system to evaluate at least one electronic device of FIG. 1 in accordance with an embodiment of the present disclosure. The exemplary embodiment (100) includes a system (110), wherein the system (110) includes an evaluation hardware connector (120), a user interface connector (130), a cloud user interface server (140) which is substantially similar to at least one first web connector (20), at least one second web connector (30) and a cloud server (40) of FIG. 1. The cloud user interface server (140) includes a processing subsystem (150) and a cloud memory (160) which is substantially similar to a processing subsystem (50) and a cloud memory (60) of FIG. 1.
[0030] The system (110) includes the evaluation hardware connector (120) configured to connect to a semiconductor evaluation hardware (170). The semiconductor evaluation hardware (170) is further connected to a controller hardware (180) configured to control the function of the semiconductor evaluation hardware (170) based on a plurality of parameters. In one embodiment, the plurality of parameters may be frequency, amplitude, a range of power supply, a voltage or a current.
[0031] In another embodiment, the evaluation hardware connector (120) may be connected to the semiconductor evaluation hardware (170) virtually. In yet another embodiment the semiconductor evaluation hardware (170) may be configured to evaluate one or more integrated circuits (IC’s). Further, the semiconductor evaluation hardware (170) may be integrated with a wireless communication module. In such embodiment, the wireless communication module may be a wireless fidelity (Wi-Fi) module. In one embodiment, the Wi-Fi module may be externally connected to the semiconductor evaluation hardware (170) or may be built internally in the semiconductor evaluation hardware (170) during fabrication.
[0032] Further, the system (110) includes the user interface connector (130) operatively coupled to the evaluation hardware connector (110). The user interface connector (130) is configured to connect to at least one user interface device (190), wherein the at least one user interface device (190) may be an integrated circuit. In one embodiment, the user interface connector (130) may be coupled to the at least one user interface device (190) virtually.
[0033] Further the system (110) includes a cloud user interface (UI) server (140) communicatively coupled to the evaluation hardware connector (120) and the user interface connector (130). The cloud UI server (140) is configured to create a virtual platform for the evaluation of the at least one user interface device (190). In one embodiment, the semiconductor evaluation hardware (170) may be controlled remotely through the virtual platform of the cloud UI server (140). In such embodiment, the semiconductor evaluation hardware (170) may be controlled through a web application which may use a drag and drop user interface element through a protocol which may be integrated with the controller hardware (180). In one embodiment, the protocol may be an I-squared C (I2C) protocol, a serial peripheral interface (SPI), a bit torrent (BT) a Wi-Fi or the like.
[0034] Further, the semiconductor evaluation hardware (170) and the at least one user interface device (190) are connected to the cloud UI server (140), wherein the at least one user interface device (190) includes an integrated circuit. In one embodiment, the semiconductor evaluation hardware (170) and the integrated circuit may be connected to the cloud UI server (140) through a public internet protocol of the cloud UI server (140).
[0035] Further, the at least one user interface device (190) and the semiconductor evaluation hardware (170) are registered with the cloud UI server (140) separately, wherein the at least one user interface device (190) and the semiconductor evaluation hardware (170) are not connected directly. Further, the at least one user interface device (190) sends a request to the processing subsystem (150) of the cloud UI server (140) for a list of all available semiconductor evaluation hardware (170). Further, the processing subsystem (150) of the cloud UI server (140) sends the list of all available semiconductor evaluation hardware (170) to a requested at least one user interface device (190). Further, on receiving the list of all available semiconductor evaluation hardware (170), the at least one user interface device (190) selects at least one semiconductor evaluation hardware (170). Further the at least one user interface device (190) sends a request to the cloud UI server (140) to make a connection to a selected at least one semiconductor evaluation hardware (170).
[0036] Further, on the request from the at least one user interface device (190), the cloud UI server (140) creates a virtual wiring between the selected at least one semiconductor evaluation hardware (170) and the at least one user interface device (190). In one embodiment, the selected at least one semiconductor evaluation hardware (170) and the at least one user interface device (190) may be connected through the evaluation hardware connector (120) and the user interface connector (130) respectively. In such embodiment, the evaluation hardware connector (120) and the user interface connector (130) may be web sockets.
[0037] In one embodiment, the processing subsystem (150) may create a table for representing the registration of the at least one user interface device (190) and the at least one semiconductor evaluation hardware (170). Further, as each of the at least one semiconductor evaluation hardware (1170) registers with the cloud UI server (140), an entry is made into a registration table. The registered each of the at least one semiconductor evaluation hardware (170) may be provided with a unique web socket number. Similarly when the at least one user interface device (190) registers with the cloud UI server (140), each of the at least one user interface device (190) may be provided with another unique web socket number.
[0038] In such embodiment, when the at least one user interface device (190) makes a request to the cloud UI server (140) to send the list of available semiconductor evaluation hardware (170), the processing subsystem (150) of the cloud UI server (140) sends the registration table along with a plurality of index numbers and a plurality of unique web socket number. Further, the at least one user interface device (190) selects the at least one semiconductor evaluation hardware (170) from the list of registered at least one semiconductor evaluation hardware (170). Further, the selected at least one semiconductor evaluation hardware (170) may be reserved for the requested at least one user interface device (190). Further, data or information flows between the at least one semiconductor evaluation hardware (170) and at least one user interface device (190) bidirectionally.
[0039] In another embodiment, a reverse mapping between the at least one semiconductor evaluation hardware (170) and the at least one user interface device (190) may be done. Further, the processing subsystem (150) of the cloud UI server (140) may select the web socket number of the at least one user interface device (190) and the at least one semiconductor evaluation hardware (170) which may be requested by the at least one user interface device (190) and may further create another field in the registered table which may be a remote web socket. Further, any information or data from the at least one user interface device (190) may be switched to the at least one semiconductor evaluation hardware (170). Similarly any information or data from the at least one semiconductor evaluation hardware (170) may be switched to the at least one user interface device (190). In another embodiment, a plurality of web sockets may be created by the cloud UI server (140) which may be created and deleted dynamically.
[0040] FIG. 3 is a process flow to evaluate at least one electronic device on a cloud based evaluation system. The method (200) includes registering at least one first web connector and at least one second web connector (210). In one embodiment, the at least one first web connector and the at least one second web connector (210) may register with a cloud server. In such embodiment, the at least one first web connector and the at least one second web connector may be configured to make a virtual connection for at least one semiconductor evaluation hardware and at least one semiconductor device respectively. In yet another embodiment, the at least one first web socket connector may be a virtual connector which may be configured to make a virtual connection between the at least one semiconductor evaluation hardware and the at least one semiconductor device.
[0041] The method (200) also includes generating a unique identification for a registered at least one first web connector and a registered at least one second web connector (220). In one embodiment, the unique identification may be a string of characters.
[0042] The method (200) further includes creating a virtual communication channel between the at least one semiconductor evaluation hardware and the at least one semiconductor device using the at least one first web connector and the at least one second web connector (230). In one embodiment, creating the virtual communication channel may first include requesting a plurality of details of at least one registered first web connector. Creating the virtual communication channel may also include selecting at least one specific first web connector from the at least one first connector. In such embodiment, selecting the at least one specific first web connector from the at least one first connector includes selecting the at least one specific first web connector may include selecting the at least one specific first web connector based on a generated unique identification. Creating the virtual channel may further include sending a request to create a virtual communication channel between a selected at least one specific first web connector and the at least one second web connector.
[0043] The method (200) further includes conducting the evaluation of the at least one semiconductor device through the at least one semiconductor evaluation hardware (240). In one embodiment, the conducting of the evaluation of the at least one semiconductor device may be done on a browser compatible application.
[0044] Various embodiments of the present invention reduce the use of hardware of the system and hence the system is cost effective. Further, the interference of the plurality of components during the evaluation of the semiconductor device is reduced which in turn reduces the noise of the system as the evaluation is done on a cloud platform which makes the user to evaluate the semiconductor device without the actual evaluation hardware.
[0045] Further, the system allows the user to choose one or more evaluation system of his/her choice. Also, the user need not know or remember the plurality of parameters of the electronic device to be evaluated. However, the user will be aware of the semiconductor evaluation hardware and the corresponding controller hardware which is used for evaluation.
[0046] Various embodiments of the present invention further allows the system to run a plurality of evaluation on a plurality of semiconductor evaluation hardware either sequentially or in parallel through which the consistency of the obtained evaluation result may be compared.
[0047] Also, the system has the ability to log into a plurality of comments which was executed remotely on the at least one semiconductor evaluation hardware to check for the behaviour of either the at least one semiconductor evaluation hardware for a purpose of debugging or demonstration purpose.
[0048] Further, the system makes a platform for a plurality of users to use single semiconductor evaluation hardware. Also, the system does not require any installation of application on the user interface devices.
[0049] The figures and the foregoing description give examples of embodiments. Those skilled in the art will appreciate that one or more of the described elements may well be combined into a single functional element. Alternatively, certain elements may be split into multiple functional elements. Elements from one embodiment may be added to another embodiment. For example, order of processes described herein may be changed and are not limited to the manner described herein. Moreover, the actions of any flow diagram need not be implemented in the order shown; nor do all of the acts need to be necessarily performed. Also, those acts that are not dependent on other acts may be performed in parallel with the other acts. The scope of embodiments is by no means limited by these specific examples.