FIELD OF THE DISCLOSURE
The present disclosure relates to a measuring device.
Particularly, the present disclosure relates to a gauge system for measuring a plurality
of dimensions of a work piece.
DEFINITION
Comparator gauge: A comparator gauge is a gauge used for comparative measurement
of external and internal dimensions, for determination of parallelism, evenness, runout
and the like.
BACKGROUND
A comparator is a measuring instrument used to measure a parameter with
comparatively more accuracy. Generally, a comparator is used to take a dimensional
measurement by comparing the unknown dimensions to be measured of a part with a
standard scale fitted to the comparator. The dimensional variations achieved by
comparing with a standard scale are amplified to accomplish accurate dimensions.
Generally, a comparator is robust in construction. A comparator includes a linear
scale, a magnification means to detect minute deviations, a measuring plunger and an
indicator to depict measured values.
Comparators are widely used in in industries, to check accuracies of different
measurements of a plurality of parameters of components at a very fast rate.
Comparators are used as laboratory standards based on which working or inspection
gauges are set and correlated. Further, comparators are used to inspect newly
purchased gauges. In some cases a comparator is attached to a machine to be used as a
working gauge to prevent work spoilage and to maintain the required tolerances at all
stages of the manufacturing process.
Generally, a comparator is used to measure an internal and an external diameter of
components, inner rings, outer rings, balls, rollers and the like, to check ovality and
squareness of diameter to end face, wall thickness, heights, tapers and the like. A
specific comparator is required for a specific measurement. A comparator compares
the dimension of a part to be measured with a work scale set with a master
component. A gauge employed in a comparator identifies the dimension of the part to
be measured in comparison with the master component. Usually, a single gauge1
comparator measures a single dimension of a work piece. Hence, to measure a
plurality of dimensions of a work piece, the work piece needs to be fitted to a different
gauge for each parameter. Fixing and removing of the work piece to measure different
dimensions is a strained job for an operator. Such repeated actions for the same work
piece require lot of operational time and efforts and more number of devices.
Accordingly, there is need of a gauge system that measures a plurality of dimensions
of a work piece in a single set up. Further, there is need of a gauge system that
minimizes efforts, reduces operational time and use of number of devices for
measuring a plurality of dimensions of a work piece.
OBJECTS
Some of the objects of the present disclosure aimed to ameliorate one or more
problems of the prior art or to at least provide a usehl alternative are described herein
below:
An object of the present disclosure is to provide a gauge system that measures a
plurality of dimensions of a work piece simultaneously.
Another object of the present disclosure is to provide a gauge system that eliminates
repeated operations of fixing and removing of a work piece for measuring a plurality
of dimensions of the work piece.
Yet another object of the present disclosure is to provide a gauge system that measures
a plurality of dimensions of a work piece in a single set up.
Further object of the present disclosure is to provide a gauge system that minimizes
efforts, reduces time and use of number of devices for measuring a plurality of
dimensions of a work piece.
Still another object of the present disclosure is to provide a gauge system that is easy
to operate.
Yet another object of the present disclosure is to provide a gauge system that is simple
in construction.
Yet another object of the present disclosure is to provide a gauge system that is easy to
assemble or disassemble.
Other objects and advantages of the present disclosure will be more apparent from the
following description when read in conjunction with the accompanying figures, which
are not intended to limit the scope of the present disclosure.
SUMMARY
In accordance with one aspect of the present disclosure, a gauge system for measuring
a plurality of dimensions of a work piece is disclosed. The gauge system includes a
first measurement gauge, a second measurement gauge, a height adjustment
mechanism and a linear adjustment mechanism. The first measurement gauge is
adapted to measure a first dimension of a work piece. The second measurement gauge
is adapted to measure a second dimension of a work piece. The height adjustment
mechanism is functionally connected to the first measurement gauge and the second
measurement gauge and adapted to facilitate height adjustment of the first
measurement gauge and the second measurement gauge. The linear adjustment
mechanism is functionally connected to the first measurement gauge and the second
measurement gauge and adapted to facilitate linear movement of the first
measurement gauge and the second measurement gauge.
Preferably, each of the first measurement gauge and the second measurement gauge is
a comparator gauge. *
Typically, the height adjustment mechanism includes a plurality of knobs for
facilitating height adjustment of the first measurement gauge and the second
measurement gauge.
Typically, the linear adjustment mechanism includes a plurality of knobs for
facilitating linear movement of the first measurement gauge and the second
measurement gauge.
BRIEF DESCRIPTION OF ACCOMPANYING DRAWINGS
e
The gauge system of the present disclosure will now be described with the help of
accompanying drawings, in which:
FIGURE 1 illustrates a perspective view of a prior art arrangement used to measure
one dimension of a work piece by means of a comparator gauge;
FIGURE 2 illustrates a perspective view of another prior art arrangement used to
measure another dimension of the work piece by means of a comparator gauge; and
FIGURE 3 illustrates a perspective view of a gauge system of the present disclosure,
in accordance with one embodiment.
DETAILED DISCRIPTION
A gauge system of the present disclosure will now be described with reference to the
embodiments which do not limit the scope and ambit of the disclosure. The
description provided is purely by way of example and illustration.
The embodiment herein and the various features and advantageous details thereof are
explained with reference to the non-limiting embodiment in the following description.
Description of well-known components and processing techniques are omitted so as to
not unnecessarily obscure the embodiment herein. The examples used herein are
intended merely to facilitate an understanding of ways in which the embodiment
herein may be practiced and to further enable those of skill in the art to practice the
embodiment herein. Accordingly, the example should not be construed as limiting the
scope of the embodiment herein.
The following description of the specific embodiment will so fully reveal the general
nature of the embodiment herein that others can, by applying current knowledge,
readily modify and 1 or adapt for various applications, such specific embodiments
without departing from the generic concept, and therefore, such adaptations and
modifications should and are intended to be comprehended within the meaning and
range of equivalents of the disclosed embodiment. It is to be understood that the
phraseology or terminology employed herein is for the purpose of description and not
of limitation. Therefore, while the embodiment herein has been described in terms of
the preferred embodiment, those skilled in the art will recognize that the embodiment
herein can be practiced with modification within the spirit and scope of the
embodiment as described herein.
Referring to FIGURE 1 of the accompanying drawings, a prior art arrangement 10
used to measure one dimension of a work piece 14 by means of a comparator gauge
12 is disclosed. The comparator gauge 12 includes an indicator 18. The comparator
gauge 12 is adapted to measure the outer radius track to1 and outer diameter
eccentricity of the work piece 14. The prior art arrangement 10 illustrates use of the
single comparator gauge 12 to measure the outer radius track to1 and outer diameter
eccentricity of the work piece 14. A support structure 16 is used to support the
comparator gauge 12 and the work piece 14 thereon.
Referring to FIGURE 2 of the accompanying drawings, a prior art arrangement 20
used to measure another dimension of the work piece 14 by means of a comparator
gauge 22 is disclosed. The comparator gauge 22 includes an indicator 24. The
comparator gauge 22 is adapted to measure outer radius track center of the work piece
14.
Accordingly, referring to prior art arrangements of Figures 1 and 2, for measuring two
dimensions of the work piece 14 two separate arrangements 10 and 20 are required.
Also, for measuring the two dimensions of the work piece 14, the work piece 14 needs
to be fitted to the two arrangements 10 and 20 separately. Accordingly, the prior art
arrangements 10 and 20 requires more efforts and consumes more time for measuring
e a plurality of dimensions of the work piece 14.
Referring to FIGURE 3 of the accompanying drawings, a gauge system 100 of the
present disclosure is described. The gauge system 100 includes a first measurement
gauge 102, a second measurement gauge 104, a height adjustment mechanism 106, a
linear adjustment mechanism 108 and a support structure 110. In one embodiment,
the first measurement gauge 102 and the second measurement gauge 104 are
comparator gauges. However, the present disclosure is not limited to any particular
measurement gauge. In one embodiment, the first measurement gauge 102 is provided
to measure eccentricity of a work piece 112. In another embodiment, the first
measurement gauge 102 is provided to measure the outer radius track center to1 and
outer diameter eccentricity of the work piece 112. In one embodiment, the second
measurement gauge 104 is provided to measure outer radius track center of the work
piece 112.
The height adjustment mechanism 106 is functionally connected to the first
measurement gauge 102 and the second measurement gauge 104. The height
adjustment mechanism 106 includes a plurality of knobs 114, a vertical guiding rod
116 and a plurality of clipping element 118. The height adjustment mechanism 106 is
provided for facilitating height adjustment of the first measurement gauge 102 and the
second measurement gauge 104. The vertical guiding rod 116 is coupled to the
support structure 110. The clipping elements 118 are mounted on the vertical guiding
rod 116 with the help of the plurality of knobs 114. In an event when height
adjustment of the first measurement gauge 102 and/or the second measurement gauge
104 is required, the plurality of knobs 114 are loosened and the plurality of clipping
element 118 are made to slide on the vertical guiding rod 116. Tightening and
loosening of the plurality of clipping element 118 is facilitated with the help of the
plurality of knobs 114.
Further, the linear adjustment mechanism 108 is functionally connected to the first
measurement gauge 102 and second measurement gauge 104. The linear adjustment
a mechanism 108 includes a plurality of knobs 120 and a plurality of horizontal guiding
rods 122. The linear adjustment mechanism 108 is provided for facilitating linear
movement of the first measurement gauge 102 and the second measurement gauge
104. The clipping elements 118 hold the plurality of horizontal guiding rod 122 with
the help of the plurality of knobs 120. In an event when linear movement of the first
measurement gauge 102 andlor the second measurement gauge 104 is required, the
plurality of knobs 120 are loosened and the plurality of clipping elements 118 are
made to slide on the horizontal guiding rods 122 and are tightened at a desired
position by screwing the knobs 120.
In accordance with the present disclosure, the gauge system 100 is used to measure a
plurality of parameters simultaneously (such as eccentricity and outer radius track to1
and outer diameter eccentricity) for a single work piece.
TEST DATA
1. Gauge repeatability and reproducibility values for prior art gauge system.
Study No. BB/MSA/13-14/01 Part 6207 OR Cha Track
ract Centr
erist e
ics
GAUGE NO. AGIO 1 5 91B Gua OR trk Centre MASTE
g e (NTN) RNO. &
SIZE
Dial Gauge MAKE NO. L.C Grade Tolerance ym
-[Ra= +Rb +Rc=------I /#OF OPERATORS
[Max X = -Min X= ] = Xdiff
X 1 0.43
0.467
Measurement Unit Analysis % Total
Variation (TV)
Repeatability = Equipment Variation (EV)
EV=R *Kl
= 0.25601 3
Tria
1s
2
3
K1
0.8
862
0.5
908
Reproducibility = Apraiser Variation (AV)
*AV = Sqrt ((Xdiff* ~ 2 )-' (EV'I~~))
= 0.2396
Apr
aise
rs
2
3
% EV = 100 (EV /
TV)
= 7.68%
Repeatability & Reproducibility (R&R)
GRR = Sqrt (AV' + EV')
= 0.26237
Part Variation (PV)
PV = Rp * K3 or PV = Sqrt (TV' - GRR~)
= 3.322992
n=lO,r = 3
%GRR = 1 OO(R&RITV)
= 7.871%
%PV = 100(PV/TV)
= 99.69%
K2
0.7
07 1
0.5
23 1
Total Variation (TV)
Par
ts
10
TV** = Sqrt (GRR~+ PV') or (Product Tolerancel6)
= 3.3333
**TV is taken as one sixth of product Tolerance (PV is calculated
using PV = sqrt (TV~- GRR'))
% AV =
1 00(AV/TV)
= 7.19%
K3
0.3
146
UCLR = R * D4
= 1.12
LCLR = R * Dj
= 0.00
ndc = 1.4 1 (PVIGRR)
= 17.86
Ndc is truncated yo the
integer and ought to be
greater than or equal to
5
Gauge OK? True
UCLx = X +A2 * R
= 9-.53
LCLx=X+A2*R
= 8.65
Trial
s
D4
D3
A2
2 3
3.27 2.58
0 0
1.88 1.02
3
Acceptance criteria for Guage Repeatability & Reproducibility
(%GRR)
Remark
The measurement system is acceptable
May be acceptable based upon
importance, cost of gauge, cost of repairs
etc.
Not acceptable Improvements Required
immediately
%GRR
Error
Unnder
10%
10% to
30%
Over
3 0%
IMPROVEMENT DETAILS
Gauge
status
OK
Not OK
Not OK
Graphs for above table are shown in FIGURES 4a and 4b. The graph shows a relationship
between range (Denoted on Y-axis) and average measured value.
1. when repeatability is bigger than
reproducibility
1.1 Instrument needs maintenance
1.2 The gauge may need to be more rigid
1.3 Clamping or location for gauging needs
to be improved
1.4 There is excessive within-part variation
2. Gauge repeatability and reproducibility values for gauge system of the present
2. when reproducibility is bigger
than repeatability
-
2.1 The appraiser needs to be
better trained in how to use
and read the gauge system
2.2 Calibration on the gauge dial
are not clear.
disclosure.
Q
Study No.
GAUGE NO.
Dial Gauge
First
experme
nt
Second
Experim
ent
Third
Experim
BB/MSA/13-14/03
CGIO 1 50lB
MAKE
Milutoyo
A1
A2
A3
Av
g.
Ra
nge
B1
B2
B3
AV
G.
RA
NG
E
C1
Part
Gua
g e
NO.
DG
286
7
6
6
6 0
6
0
6
6
5
5.6
7
1
6
1
14
13
13
13.3
3
1.00
13
13
13
13
0.00
13
2
14
14
13
13.67
1.00
13
13
13
13
0.00
14
63/22 OR
OR trk Centre &
trk to OD
eccentricity
9
10
8
9.3
3
1
9
9
9
9
0
10
Cha
ract
erist
ics
L.C
1p
m
1
1
0.6
7
1
1
1
1
1
0
1.0
0
Track Date 10.04.
Centr 13
e
Guage
Grade
3 4 5 6 7 8 9
5
4
4
4.3
3
1
5
5
5
5
0
5.0
0
MASTE OR Trk Centre
R NO. & Master (-6.0 pm)
SIZE
Tolerance
0.0 to 20.
0
10
10
10
10
0
10
10
9
9.6
7
1
10.
0
7
7
7
7
0
7
7
7
7
0
6
10 Ave
rage
12 9 8.7
12 9 8.6
13 9 8.4
12.3 9 Xa 8.5
3 7
1.00 0.0 Ra 0.6
0 0
12 9 8.5
12 9 8.5
12 9 8.3
12 9 Xb 8.4
3
0.00 0 Rb 0.2
0
12 10 8.7
0
ent C2 13
10 6
6
0
5.8
4 9 7 7
AV
G.
RA
NG
E
**PART
Avg(Xp)
14
-[Ra= +Rb +Rc=------I /#OF OPERATORS X 0.4
3
[Max X = -Min X= ] = Xdiff 0.133
0.0
0
0.3
3
1.0
0.6
13
0
13.1
1
Measurement Unit Analysis
10
% Total
Variation (TV)
5.0
0
4.6
7
1.0
0 0 0
4.6
14
0
13.56
6
10
0
3.4
Repeatability = Equipment Variation (EV)
EV=R *Kl
= 0.256013
10.
0
9.6
7
1.0
9.7
8
0.0
Tria
1s
2
3
6
6
0
6
3
6
7
4.0
0 0 0
K1
0.8
862
0.5
908
Reproducibility = Apraiser Variation (AV)
*AV = Sqrt ((&iff * ~ 2- ()E~V ~ I ~ ~ ) )
= 0.05 18
13
12.6
7
1.00
12.3
Apr
aise
rs
2
3
%EV= lOO(EV1
TV)
= 7.68%
Repeatability & Reproducibility (R&R)
GRR = Sqrt (AV~+ EV~)
= 0.25603
Part Variation (PV)
PV = Rp * K3 or PV = Sqrt (TV~- G RR*)
= 3.323486
9.0
9 8.6
---0
9.3 Xc 8.5
3 7
1 Rc 0.5
0
9.1 X 8.5
1 2
Ro 12.
8 9
n=lO,r = 3
%GRR = 1 OO(R&R/TV)
= 7.681%
%PV = 100(PV/TV)
= 99.70%
K2
0.7
07 1
0.5
23 1
Total Variation (TV)
Part
S
10
ndc = 1.4 1 (PVIGRR)
= 18.30
Ndc is truncated yo
the integer and ought
to be greater than or
equal to 5
TV** = Sqrt (GRR~+ PV~o)r (Product Tolerancel6)
= 3.3333
**TV is taken as one sixth of product Tolerance (PV is calculated
using PV = sqrt (TV~- GRR~))
6
% AV =
1 OO(AV1TV)
= 1.55%
K3
0.3
146
UCLR = R * D4
= 1.12
LCLR = R * DJ
= 0.00
UCLx = X +A2 * R
= 8.97
LCLx = X +A2 * R
= 8.08
13 9 8.4
0
Acceptance criteria for Guage Repeatability & Reproducibility Gauge OK? Tru
(%GRR) e
%GRR Gauge Remark Trial 2 3
Error status s
Unnder OK The measurement system is acceptable D4 3.27 2.5
10% 8
10% to Not OK May be acceptable based upon D3 0 0
30% importance, cost of gauge, cost of repairs
etc.
Over Not OK Not acceptable Improvements Required A2 1.88 1 .O
30% immediately 23
IMPROVEMENT DETAILS
1. when repeatability is bigger than 2. when reproducibility is bigger
reproducibility than repeatability
-
1.1 Instrument needs maintenance 2.1 The appraiser needs to be
1.2 The gauge may need to be more rigid better trained in how to use
1.3 Clamping or location for gauging needs and read the gauge system
to be improved 2.2 Calibration on the gauge dial
1.4 There is excessive within-part variation are not clear.
Graphs for above table are shown in FIGURES 5a and 5b. The graphs show a relationship
between range (Denoted on Y-axis) and average measured value.
3. Gauge repeatability and reproducibility values for prior art gauge system
Study No. BBlMSAl13- 14/02 Part 63/22 OR Cha Track Date 10.04.
ract Centr 13
erist e
ics
GAUGE NO. CG/0339/B Gua OR trk to MASTE
g e Eccentricity R NO. &
Gauge SIZE
0
0
Experim
ent
Third
Experim
ent
B2
B3
AV
G.
RA
NG
E
C1
C2
C3
AV
G.
RA
NG
E
ppp **PART
Avg(Xp)
2
3
2.67
1.00
2
2
3
2.33
1
2.78
-[Ra=
6
6
6
0
5
5
6
5.33
1
3 .
[Max X = -Min X= ] = XdlR 0.200
Measurement Unit Analysis % Total
Variation (TV)
6
+Rb
Repeatability = Equipment Variation (EV)
EV=R *K1
= 0.3 15093
6
6
6
0
6
6
5
5.6
1
5.5
+Rc=------I
Tria
1s
2
3
1 0 7
1 0 8
10
0 0
1 0 7
1 0 7
9
9.6
7 7 3
1
Reproducibility = Appraiser Variation (AV)
*AV = Sqrt ((Xd,ff* ~ 2- ()~ ~* / n r ) )
= 0.0874
Repeatability & Reproducibility (R&R)
GRR = Sqrt (AV~+ EV~)
= 0.31519
K1
0.8 % EV = 100 (EV /
86 TV)
2 = 9.45%
0.5
90
8
9.8
8 9 2 2
7.3
3
8
7.3
1
14
A P ~
aise
rs
2
3
7.2
/#OF
K2
0.7 % AV =
07 100(AV/TV)
1 = 2.62%
0.5
2 3
1
9
9
9
0
9
9
10
9.3
3
1
n=lO,r =
3
9.2
----
OPERATORS
5
5
5
0
5
5
5
5
0
3 5 8 6.1
2 6 8 6.3
2 5.33 8 Xb 6.2
6
7
1 1 0 Rb 0.4
0
0
3 6 9 6.2
2 6 9 6.1
3 6 9 6.4
2 6 9 Xc 6.2
3
6
7
1 0 0 Rc 0.7
4.7
8
2 5.83 8.3 X 6.1
3 6
4 R(, 7.4
4 4
R 0.5
Graphs for above table are shown in FIGURES 6a and 6b. The graphs show a relationship
between range (Denoted on Y-axis) and average measured value.
Part Variation (PV)
PV = Rp * K3 or PV = Sqrt (TV~- G RR~)
= 3.3318399
4. Gauge repeatability and reproducibility values for gauge system of the present
disclosure
Part
S
10
Study No.
GAUGE NO.
K3
0.3
146
-
%GRR = 100(R&RlTV)
= 9.456%
%PV = 100(PV/TV)
= 99.55%
Total Variation (TV)
TV** = Sqrt (GRR~+ PV~o)r (Product Tolerancel6)
= 3.3333
**TV is taken as one sixth of product Tolerance (PV is calculated
using PV = sqrt (TV~- GRR~))
BBMSN13-14/01
AGIO 1 5 9/B
UCLR = R * D4
= 1.38
LCLR = R * D3
= 0.00
ndc = 1.4 1 (PVIGRR)
= 14.85
Ndc is truncated yo
the integer and ought
to be greater than or
equal to 5
UCLx = X +A2 * R
= 6.70
LCLx = X +A2 * R
= 5.61
1. when repeatability is bigger than
reproducibility
1.1 Instrument needs maintenance
1.2 The gauge may need to be more rigid
1.3 Clamping or location for gauging needs
to be improved
1.4 There is excessive within-part variation
Part
Gua
g e
Tru
e
3
2.5
8
0
1 .O
2 3
Gauge OK?
2. when reproducibility is bigger
than repeatability
2.1 The appraiser needs to be
better trained in how to use
and read the gauge system
2.2 Calibration on the gauge dial
are not clear.
Acceptance criteria for Guage Repeatability & Reproducibility
(%GRR)
Trial
s
D4
D3
A2
6207 OR
OR trk Centre
and Trk to OD
2
3.27
0
1.88
Remark
The measurement system is acceptable
May be acceptable based upon
importance, cost of gauge, cost of repairs
etc.
Not acceptable Improvements Required
immediately
%GRR
Error
Unnder
10%
10% to
30%
Over
30%
Cha
ract
erist
ics
IMPROVEMENT DETAILS
Gauge
status
OK
Not OK
Not OK
MASTE
R NO. &
Track
Centr
e
Date 25.03.
13
Eccentricity SIZE
Gauge
Dial Gauge MAKE NO. L.C Grade Tolerance pm
Milutoyo 459 1p 0.0 to 20.
1 m 0
1 2 3 4 5 6 7 8 9 10 Ave
rage
First A1 2 4 6 4 3 9 6 5 6 8 5.3
experme A2 2 4 5 5 3 9 6 4 5 8 5.1
nt A3 2 4 6 5 3 9 6 4 5 8 5.1
Av 2 4 5.3 4.6 3 9 6 4 5.33 8 Xa 5.1
g. 3 7 7
3
3
Ra 0.00 0.00 1 1 0 0 0 1 1.00 0 Ra 0.4
nge
-[Ra= +Rb +Rc=------I /#OF OPERATORS R 0.4
7
[Max X = -Min X= ] = Xdiff 0.300
Measurement Unit Analysis % Total
Variation (TV)
Repeatability = Equipment Variation (EV) Tria K
EV=R *K1 1s 1
= 0.275707 2 0. % EV = 100 (EV 1
8 TV)
8 = 8.27%
6
2
Part Variation (PV)
PV = Rp * K3 or PV = Sqrt (TV~- GRR~)
= 3.321838
I 1 146 1 = 99.66%
Total Variation (TV)
TV** = Sqrt (GRR~+ PV~o)r (Product Tolerancel6) ndc = 1.41 ( PVIGRR)
= 3.3333 = 16.93
**TV is taken as one sixth of product Tolerance (PV is calculated
using PV = sqrt (TV~- GRR~)) Ndc is truncated yo
UCLR = R * D4 UCLx = X +A2 * R the integer and ought
= 1.2 = 5.83 to be greater than or
LCLR = R * D3 LCLx = X +A2 * R equal to 5
= 0.00 = 4.88
Acceptance criteria for Guage Repeatability & Reproducibility Gauge OK? Tru
(%GRR) e
%GRR I Gauge I Remark Trial 1 2 3
Error status s
Unnder OK The measurement system is acceptable D4 3.27 2.5
10% 8
10% to Not OK May be acceptable based upon D3 0 0
3 0% importance, cost of gauge, cost of repairs
etc.
Over Not OK Not acceptable Improvements Required A2 1.88 1 .O
30% immediately 2 3
IMPROVEMENT DETAILS
1. when repeatability is bigger than
reproducibility
Graphs for above table are shown in FIGURES 7a and 7b. The graph shows a relationship
2. when reproducibility is bigger
than repeatability
1.1 Instrument needs maintenance
1.2 The gauge may need to be more rigid
1.3 Clamping or location for gauging needs
to be improved
1.4 There is excessive within- art variation
between range (Denoted on Y-axis) and average measured value.
2.1 The appraiser needs to be
better trained in how to use
and read the gauge system
2.2 Calibration on the gauge dial
are not clear.
TECHNICAL ADVANCEMENTS AND ECONOMIC SIGNIFICANCE
The technical advancements offered by the present disclosure include the realization
of:
> a gauge system that measures a plurality of dimensions of a work piece
simultaneously;
> a gauge system that eliminates repeated operations of fixing and removing of a
work piece for measuring a plurality of dimensions of the work piece;
> a gauge system that measures a plurality of dimensions of a work piece in a
single set up;
> a gauge system that minimizes efforts, reduces time and use of number of
devices for measuring a plurality of dimensions of a work piece;
> a gauge system that is easy to operate; and
> a gauge system that is simple in construction.
Throughout this specification the word "comprise", or variations such as "comprises" or
"comprising", will be understood to imply the inclusion of a stated element, integer or
step, or group of elements, integers or steps, but not the exclusion of any other element,
integer or step, or group of elements, integers or steps.
The foregoing description of the specific embodiment will so fully reveal the general
nature of the embodiments herein that others can, by applying current knowledge,
readily modifj andlor adapt for various applications such specific embodiment
without departing from the generic concept, and, therefore, such adaptations and
modifications should and are intended to be comprehended within the meaning and
range of equivalents of the disclosed embodiment. It is to be understood that the
phraseology or terminology employed herein is for the purpose of description and not
of limitation. Therefore, while the embodiment herein have been described in terms of
preferred embodiment, those skilled in the art will recognize that the embodiment
herein can be practiced with modification within the spirit and scope of the
embodiment as described herein.

We Claim:
1. A gauge system for measuring a at least two dimensions of a work piece, said
system comprising:
a first measurement gauge adapted to measure a first dimension of a work
piece;
a second measurement gauge adapted to measure a second dimension of a
work piece;
a height adjustment mechanism functionally connected to said first
measurement gauge and said second measurement gauge and adapted to
facilitate height adjustment of said first measurement gauge and said
second measurement gauge; and
a linear adjustment mechanism functionally connected to said first
measurement gauge and said second measurement gauge and adapted to
facilitate linear movement of said first measurement gauge and said second
measurement gauge.
2. The gauge system as claimed in claim 1, wherein each of said first measurement
gauge and said second measurement gauge is a comparator gauge.
3. The gauge system as claimed in claim 1, wherein said height adjustment
mechanism comprises a plurality of knobs for facilitating height adjustment of said
first measurement gauge and said second measurement gauge.
4. The gauge system as claimed in claim 1, wherein said linear adjustment
mechanism comprises a plurality of knobs for facilitating linear movement of said
first measurement gauge and said second measurement gauge.