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A Computer Interfaced Resistance Measurement Device For Oxide Materials With Temperature Variation

Abstract: The present invention relates to a computer interfaced resistance measurement device (100) for oxide materials with temperature variation. The interfaced computer means (10) can collect the data of that oxide material and analyze the results of the same by one click. The device (100) having cylindrical furnace (1) which can generate the temperature from room temperature to 500?, its temperature can be controlled by the microcontroller through computer interfacing. The sample holder (2) can be designed and fabricated for the specific application of the DC resistivity measurement of this invention. It consists of two metal electrodes (E1& E2), holds a thermocouple probe (26), metal dishes (22), metal rectangle block (23), spring (24) and metal rods (25). The pellet (12) placed in-between two electrodes (E1, E2). The resistance of each pellet (12) can be measured for raising and falling of temperature at the gap of 5 °C. Fig. 1

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Patent Information

Application #
Filing Date
27 April 2021
Publication Number
43/2022
Publication Type
INA
Invention Field
PHYSICS
Status
Email
patent@excelonip.com
Parent Application

Applicants

RK UNIVERSITY
RK University, Bhavnagar Highway, Kasturbadham Rajkot - 360020, Gujarat, India

Inventors

1. TANNA ASHISH R.
Department of Physics, School of Science, RK University, Rajkot.
2. BHATT REEVA R.
Department of Physics, School of Science, RK University, Rajkot.

Specification

Claims:Claims:-
We claim:

1. A computer interfaced resistance measurement device (100) for oxide materials with temperature variation comprising:
a cylindrical furnace (1) to generate the temperature;
a sample holder assembly (2) consisting of:
a pair of metal electrode (E1, E2);
a ceramic beads (21) accommodated with a metal dish (22) and plurality of rods (25);
a rectangular block (23) loaded with a spring (24); and
a thermocouple probe (26) to measure the temperature;
a microcontroller (3) to control the temperature of said cylindrical furnace (1) and record the data generated;
said microcontroller (3) connected to a thermocouple amplifier circuit (4), a circuit breaker (5), LCD display (7) and a potentiometer (8);
said microcontroller (3) interfaced with computer means (10) through USB cable;
a solid state relay (6) provided as an electronic switching device to on-off the external voltage;
a temperature controller (9) to detect the temperature;
a pellet (12) of which the resistance to be measured;

wherein,
said pellet (12) placed between the electrodes (E1, E2) of the sample holder (2);
said sample holder (2) with pellet (12) placed in the furnace (1) and measure the temperature of pellet (12) with said thermocouple probe (26) and resistance of pellet (12) can be measured for various temperature.

2. The computer interfaced resistance measurement device (100) for oxide materials with temperature variation as claimed in claim 1, wherein said cylindrical furnace (1) can able to generate the temperature from room temperature to 500 ?.

3. The computer interfaced resistance measurement device (100) for oxide materials with temperature variation as claimed in claim 1, wherein the high temperature can be generated through the drawing of high power supply to the furnace (1) and that can be controlled through said microcontroller (3).

4. The computer interfaced resistance measurement device (100) for oxide materials with temperature variation as claimed in claim 1, wherein said electrode (E1) coupled with the spring (24) loaded brass and said electrode (E2) fixed at other end with ceramic bead (21).

5. The computer interfaced resistance measurement device (100) for oxide materials with temperature variation as claimed in claim 1, wherein said pellet (12) must be coated with thin layer of silver paste for good ohmic contact and then placed in between the electrodes (E1, E2).

6. The computer interfaced resistance measurement device (100) for oxide materials with temperature variation as claimed in claim 1, wherein said thermocouple (26) can be selected from J-type, K-type, N-type, T-type, E-type, R-type, S-type, B-type, C-type and more particularly the K-type thermocouple (26) used to measure the temperature.

7. The computer interfaced resistance measurement device (100) for oxide materials with temperature variation as claimed in claim 1, wherein said circuit breaker (5) further connected with said solid state relay (6) and can control and maintain the circuit supply, can prevent the peripherals from the over loading and short circuit.

8. The computer interfaced resistance measurement device (100) for oxide materials with temperature variation as claimed in claim 1, wherein said sample holder (2) with the pellet (12) may be placed horizontally into the furnace (1) to measure the temperature and resistivity.

9. The computer interfaced resistance measurement device (100) for oxide materials with temperature variation as claimed in claim 1, wherein said temperature controller (9) connected to said furnace, said thermocouple probe (26), said solid state relay (6) and then circuit which can measure the change of pellet (12) temperature and display on the LCD display (7).

Dated this 27 April, 2021
, Description:
FORM 2
THE PATENTS ACT, 1970
(39 OF 1970)
&
The Patents Rules, 2003
COMPLETE SPECIFICATION
(See section 10; rule 13)

1. Title of the invention – A COMPUTER INTERFACED RESISTANCE MEASUREMENT DEVICE FOR OXIDE MATERIALS WITH TEMPERATURE VARIATION

2. Applicant(s)

(a) NAME :RK UNIVERSITY
(b) NATIONALITY: INDIAN
(c) ADDRESS:RK University, Bhavnagar Highway, Kasturbadham Rajkot - 360020, Gujarat, India

3. PREAMBLE TO THE DESCRIPTION

The following specification particularly describes the invention and the manner in which it is to be performed.


A COMPUTER INTERFACED RESISTANCE MEASUREMENT DEVICE FOR OXIDE MATERIALS WITH TEMPERATURE VARIATION

FIELD OF THE INVENTION:

The present invention relates toa computer interfaced resistance measurement device for oxide materials with temperature variation. Particularly it relates to a study of dc electrical resistivity with respect to temperature for development of new products.

BACKGROUND OF THE INVENTION:

Electrical resistivity is one of the most sensitive indicators of changes in the nature of the chemical binding. In general, the electrical resistivity is inversely proportional to the carrier density and the carrier mobility. A change in the nature of the chemical binding primarily alters the carrier density, and the structural changes alter the carrier mobility. Very early investigation of metals showed that resistivity increases approximately by a factor of 2 at the melting point, while it decreases in silicon and germanium as they transform from semiconducting solids to conducting liquids. Electrical resistivity plays an important role in technical applications.

There is much interest at present for the study of oxide materials. Since the realization of electrical and thermal conducting properties of these materials, there have been extensive investigations in to the transport properties of these compounds. The significant progress of oxide materials has been attaching attention of a lot of scientists in various disciplines and encouraging their entry into field. The synergy of diverse scientific senses brings further spread of the study of these materials.

Oxide materials display a wide range of properties which facilitate their use in many different product areas: for example, resistance thermometers, thermoelectric power generation, space shuttle tiles, thermal barriers, high temperature glass windows, fuel cells, magnets, home electronics, microwave transducers, catalytic converters, ceramic filters, thermistors, oxygen sensors, insulators, resistors, superconductors, capacitors, ferroelectric components, microelectronic packaging, etc.

Due to the variety of applications of these materials, electrical properties are essential parameters to design various components and accessories. The temperature variation electrical resistivity measurement requires lots of efforts and human intervention for continuous change of the temperature. As well as to confirm reliability of the data, there is a need of repeat measurements. This can cause damage to equipment or wrong data measurement.

The dc electrical resistivity/conductivity of the material is calculated using simple equations. The first step in the understanding of electrical transport in any solids is whether conductivity is ionic, electronic, or mixed partially ionic and electronic. There are several ways to determine the nature of conductivity. The simplest way is to measure dc conductivity as a function of temperature using electrodes, which blocks ionic conduction. The dc electrical resistivity of a material is an intrinsic property of the material.

The conductivity of solid dielectric materials depends on the mobility of charge carriers and their concentration. The conduction however cannot occur unless the charge carriers are made available for the process through activation by some external agency. For ceramic dielectric materials, it is observed that the value of sDC varies with rise in temperature. The variation of conductivity with temperature can be expressed by the general exponential relation.

Various oxide materials conduct by raising the temperature of the specimens. As per the literature above certain temperature materials possess transition i.e., ferroelectric to paraelectric and ferromagnetic to paramagnetic, the temperature known as Curie Temperature (TC) or Transition Temperature. As well as conduction mechanism can be varied due to compositional change in the oxide materials. Under the influence of an electric field, the conduction electrons can be considered to constitute the conduction current, jumping or hopping from one ion to the next by increasing temperature.

There are many literatures that disclose various methods and systems for measuring the resistivity and temperature of the various oxide materials.

US5369372A discloses a method for measuring the resistance or conductivity between two or more conductors which are placed against a semiconductor element, wherein in order to bring the contact resistance between the conductors and the element to, to hold it at, a predetermined value during measuring, the conductors are held at a constant distance and/or under constant pressure relative to the semiconductor element.

US8326555B2 discloses a system and related method are provided for measuring conductivity/resistivity of water having high purity, including a temperature sensor and a conductivity/resistivity sensor exposed to a water source. The system further includes a computing assembly configured to receive measurement signals from the sensors and to determine change in resistivity over a change in temperature (a collected R/T slope) from the collected temperature measurements and the collected resistivity measurements. The system compares the collected R/T slope to a standardized R/T slope at a temperature value corresponding to a midpoint temperature of the temperature measurements over the prescribed time interval. Based on the comparing, the system provides providing a compensated measurement for resistivity or conductivity of the water source.

US5260668A discloses a resistivity of the surface of a semiconductor wafer is measured at different temperatures to determine the resistivity as a function of temperature. The temperature of the semiconductor wafer is varied by a heater in thermal contact with the semiconductor wafer, and the temperature is measured by a temperature sensor in thermal contact with the semiconductor. The heater is controlled by a control unit which adjusts the amount of heat provided by the heater, thereby controlling the temperature at which a measurement from a four-point resistivity probe is taken.

The dc electrical resistivity of ceramic oxides and composites has tremendous scientific significance and proven to be of practical interests for the materials researchers. The ceramic oxides are long known to be used as high-temperature electric heaters. Everyday various applications are being discovered for these materials. Therefore, study of dc electrical resistivity with respect to temperature is essential for developments of new products using these materials.

The electrical resistivity is an important physical property of dielectric crystal, required not only for practical applications but also for interpretation of various physical phenomena. The dc electrical resistivity of the material can be easily measured at room temperature by using a two-probe method. This is the problem associated with the available technologies that the resistivity of the material cannot be easily measured for variable temperature. One needs to invest time and equipment for temperature variation resistivity measurement. Therefore, the inventors of the present invention come up with a computer interfaced device for measuring the material’s dc electrical resistance with temperature variation. The interfaced computer can collect the data of that solid (oxide) material and analyze the results of the same by one click.


OBJECT OF THE INVENTION:

The principal object of the present invention is to overcome all the mentioned and existed drawbacks of the prior arts by providing a resistance measurement device.

Another object of the present invention is to provide a computer interfaced resistance measurement device for oxide materials with temperature variation.

Yet another object of the present invention is to study of dc electrical resistivity with respect to temperature for development of new products.

Another object of the present invention is to provide a computer interfaced resistance measurement device which measure dc electrical resistivity with temperature variation which is automated and therefore less human intervention needed.

Another object of the present invention is that the device recording resistance with respect to increasing and decreasing temperature, hence it generates accurate output.

Another object of the present invention is to provide a device which does not require detailed knowledge of material science and can be operated by anyone using one click of computer.

Another object of the present invention is to provide a device which interfaced with computer can collect the data of that solid (oxide) material and analyse the results of the same by one click.

Yet another object of the present invention is to provide a computer interfaced device which is cost effective, easy to operate and can be performed on any oxide material.
SUMMARY OF THE INVENTION:

In view that the prior art is not perfect for use, it is tried by the inventor to develop a resistance measuring device for oxide materials.

The present invention is all about to a computer interfaced resistance measurement device for oxide materials with temperature variation. Particularly it relates to a study of dc electrical resistivity with respect to temperature for development of new products.

Main aspect of the present invention is to provide computer interfaced resistance measurement device for oxide materials with temperature variation comprising a cylindrical furnace to generate the temperature, a sample holder assembly consisting of a pair of metal electrodes, a ceramic beads accommodated with a metal dish and plurality of rods, a rectangular block loaded with a spring and a thermocouple probe to measure the temperature, a microcontroller to control the temperature of said cylindrical furnace and record the data generated, said microcontroller connected to a thermocouple amplifier circuit, a circuit breaker, LCD display and a potentiometer, said microcontroller interfaced with computer means through USB cable, a solid state relay provided as an electronic switching device to on-off the external voltage, a temperature controller to detect the temperature, a pellet of which the resistance to be measured, wherein said pellet placed between the electrodes of the sample holder, said sample holder with pellet placed in the furnace and measure the temperature of pellet with said thermocouple probe and resistance of pellet can be measured for various temperature.

Another aspect of the present invention is to provide a computer interfaced resistance measurement device for oxide materials with temperature variation in which sample holder holds the pellet of which the resistance needs to be measured.
Another aspect of the present invention is to provide a computer interfaced resistance measurement device for oxide materials with temperature variation in which the high temperature can be generated through the drawing of high power supply to the furnace and that can be controlled through said microcontroller.

Yet another aspect of the present invention is to provide a computer interfaced resistance measurement device for oxide materials with temperature variation in which said pellet must be coated with thin layer of silver paste for good ohmic contact and then placed in between the electrodes.

BRIEF DESCRIPTION OF THE DRAWINGS:

The foregoing summary, as well as the following detailed description of the invention, is better understood when read in conjunction with the appended drawings. For the purpose of illustrating the invention, exemplary constructions of the invention are shown in the drawings. However, the invention is not limited to the specific methods and structures disclosed herein. The description of a method step or a structure referenced by a numeral in a drawing is applicable to the description of that method step or structure shown by that same numeral in any subsequent drawing herein.
FIG. 1 represents the schematic diagram of the present invention.
FIG. 2 represents the cross sectional view of the sample holder of the present invention.
FIG. 3 represents the schematic diagram of the sample holder placed horizontally in the furnace of the present invention.
FIG. 4 represents the cross sectional view of the spring and metal box mechanism to provide support to the pellet of the present invention.
FIG. 5 represents the side view of both electrodes of the present invention.
FIG. 6 represents the side view and front view of the furnace of the present invention.
FIG. 7 represents the side view and front view of ceramic bead mechanism of the present invention.
FIG.8 of the present invention represents the result graph of log ?DC versus 103/T for perovskite oxide.
FIG. 9 of the present invention represents the result graph of log ?DC versus 103/T for spinel oxide.

DETAILED DESCRIPTION OF THE INVENTION:
Detailed embodiments of the present invention are disclosed herein, however, it is to be understood that the disclosed embodiments are merely exemplary of the invention, which may be embodied in various forms. Therefore, specific functional and structural details disclosed herein are not to be interpreted as limiting, but merely as a basis for the claims and as a representative basis for teaching one skilled in the art to variously employ the present invention in virtually any appropriately detailed structure.

Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which the invention belongs.

The present invention overcomes the aforesaid drawbacks of conventional device. The objects, features, and advantages of the present invention will now be described in greater detail. Also, the following description includes various specific details and is to be regarded as merely exemplary. Accordingly, those of ordinary skill in the art will recognize that: without departing from the scope and spirit of the present disclosure and its various embodiments there may be any number of changes and modifications described herein.

It must also be noted that as used herein and in the appended claims, the singular forms "a", "an," and "the" include plural references unless the context clearly dictates otherwise. Although any systems and methods similar or equivalent to those described herein can be used in the practice or testing of embodiments of the present invention, the preferred, systems are now described.

Throughout the disclosure, a Thermocouple is a sensor used to measure temperature. Thermocouples consist of two wire legs made from different metals. The wires legs are welded together at one end, creating a junction. This junction is where the temperature is measured. When the junction experiences a change in temperature, a voltage is created.

The present invention is providing a novel approach to measure the resistivity and temperature of various oxide materials. The invention belongs to the area where oxide material used i.e. resistance thermometers, thermoelectric power generation, space shuttle tiles, thermal barriers, high temperature glass windows, fuel cells, magnets, home electronics, microwave transducers, catalytic converters, ceramic filters, thermistors, oxygen sensors, insulators, resistors, superconductors, capacitors, ferroelectric components, microelectronic packaging, etc.

The main embodiment of the present invention is to provide computer interfaced resistance measurement device for oxide materials with temperature variation. Particularly it relates to a study of dc electrical resistivity with respect to temperature for development of new products.

As per detail embodiments of the present invention, a computer interfaced resistance measurement device (100) for oxide materials with temperature variation comprising a cylindrical furnace (1) to generate the temperature, a sample holder assembly (2) consisting of a pair of metal electrode (E1, E2), a ceramic beads (21) accommodated with a metal dish (22) and plurality of rods (25), a rectangular block (23) loaded with a spring (24), and a thermocouple probe (26) to measure the temperature, a microcontroller (3) to control the temperature of said cylindrical furnace (1) and record the data generated, said microcontroller (3) connected to a thermocouple amplifier circuit (4), a circuit breaker (5), LCD display (7) and a potentiometer (8), said microcontroller (3) interfaced with computer means (10) through USB cable, a solid state relay (6) provided as an electronic switching device to on-off the external voltage, a temperature controller (9) to detect the temperature, a pellet (12) of which the resistance to be measured, wherein, said pellet (12) placed between the electrodes (E1, E2) of the sample holder (2), said sample holder (2) with pellet (12) placed in the furnace (1) and measure the temperature of pellet (12) with said thermocouple probe (26) and resistance of pellet (12) can be measured for various temperature.

As per one embodiment of the present invention, computer interfaced resistance measurement device (100) for oxide materials with temperature variation in which said cylindrical furnace (1) can able to generate the temperature from room temperature to 500 ?. High temperature can be generated through the drawing of high power supply to the furnace (1) and that can be controlled through said microcontroller (3).

As per the embodiment of the present invention, sample holder (3) is designed and fabricated for the specific application of the DC resistivity measurement of this invention. It consists of two metal electrodes (E1& E2), holds a thermocouple probe (26), metal dishes (22), metal rectangle block (23), spring (24) and metal rods (25). The sample holder (2) with the pellet (12) may be placed horizontally into the furnace (1) to measure the temperature and resistivity.

As per the embodiment of present invention, a solid state relay (SSR) (6) is an electronic switching device which is capable to switches on or off when an external voltage (AC or DC) is applied across its control terminals. It provides same function as an electromechanical relay, but has no moving parts and therefore results in a longer operational lifetime. SSRs (6) having a sensor which responds to a control signal, a solid-state electronic switching device which switches power to the load circuitry, and a coupling mechanism to enable the control signal to activate this switch without mechanical parts.

As per the embodiment of the present invention, the thermocouple (4) is an electrical device consisting of two dissimilar electrical conductors forming an electrical junction. A thermocouple (4) produces a temperature-dependent voltage as a result of See beck effect, and this voltage can be interpreted to measure temperature. Thermocouples are widely used as temperature sensors. The thermocouple (26) can be selected from J-type, K-type, N-type, T-type, E-type, R-type, S-type, B-type, C-type and more particularly the K-type thermocouple (26) used to measure the temperature, which can have range from -200 °C to 1350 °C. Thermocouples are basically made by soldering together two metals’ wires. Because of a physical effect of two joined metals, there is a slight but measurable voltage across the wires that increase with temperature. The thermocouple amplifier circuit (4) is used here to get digital output. It is connected to the microcontroller (3), thermocouple probe (26) and temperature controller (9).

As per detailed embodiment of the present invention, the temperature controller (9) used to measure the temperature. The temperature controller (9) electrically coupled with the both the electrodes (E1, E2) through the solid state relay (6) to measure the temperature of the pellet (12). The temperature controller (9) continuously measures the temperature of electrodes (E1, E2) and used to control the temperature too. The temperature controller (9) also connected to the circuit breaker. It is also connected to the furnace and displays the change of temperature of the sample.

As per detailed embodiment of the present invention, circuit breaker (5) is an automatically operated electrical switch provided to protect an electrical circuit from damage caused by excess current from an overload or short circuit. Its basic function is to interrupt current flow after a fault is detected.

As per the detailed embodiment of the present invention, microcontroller (3) is connected to thermocouple amplifier circuit (4), circuit breaker (5), LCD Display (7), potentiometer (8), and interfacing with computer by USB cable. The microcontroller (3) is capable to control all the elements and its operation within the device (100). Said microcontroller (3) helps to keep desired temperature of the furnace (1) in which the sample holder (2) holds the sample pellet (12). The microcontroller (3) being capable to record the data for the future purpose and transmit that recorded data to the computer means (10) attached in the periphery. The peripheral device attached for the interfacing can be computer, laptop, mobile etc. The microcontroller (3) is also capable to receive the command as input and perform according to it.

As per detailed embodiment of the present invention, said pellet (12) is the oxide material of which the resistivity and temperature need to be measured. The pellet (12) placed in-between the two electrodes (E1, E2) inside the sample holder (2). Said sample holder (2) accommodating the pellet (12) kept inside the cylindrical furnace (1). The sample holder (2) with the pellet (12) may be placed horizontally into the furnace (1) to measure the temperature and resistivity. The temperature of the pellet (12) continuously measured through the temperature controller (9) through the thermocouple probe (26). To measure the resistivity and temperature accurately, said pellet (12) must be coated with thin layer of silver paste for good ohmic contact and then placed in between the electrodes (E1, E2).

As per one embodiment of the present invention, resistance of a pellet can be measured by two terminal methods. The sample holder with the pellet may be placed in a horizontal electric furnace to study the change in resistivity with temperature. The temperature of the furnace can be controlled by regulating the current passing through the heater by means of the current controller. The temperature of the sample can be measured with a thermocouple. The resistance of each sample can be measured for raising and falling of temperature at the gap of 5 °C. The thickness (t) and diameter of the pellet samples can be measured by digital vernier calipers. From these observations the conductivity (s)/ resistivity (?) can be calculated using the equation (1) or (2).
?????? = ????????/??-------------(1)
?????? = ??/???????? ------------- (2)
Then, using this information one can plot the logarithm of resistivity against reciprocal of temperature (103/T). The activation energies in electron volt (eV) can be determined from the slopes of these plots.

The present invention can be more efficiently explained with the help of drawings. Referring to figure 1, the cylindrical furnace (1) kept horizontally and incorporated the sample holder (2) inside the furnace (1). The pellet (12) of which the resistance and temperature need to be measure positioned in-between of the electrodes (E1, E2). To measure the temperature the temperature controller (9) electrically coupled with the thermocouple probe (26) and with the thermocouple circuit (4). The circuit breaker (5) connected with the two electrodes (E1, E2), solid state relay (6). The microcontroller (3) connected with the temperature controller (9) through the thermocouple circuit (4), LCD display (7) through the potentiometer (8), and to the computer means (10). To carry the furnace (1) from one place to another place it provided with the handle (11).

Referring to figure 2 to 7, typical sample holder is shown in figure 2, can be designed and fabricated for the specific application of the DC resistivity measurement of this invention. It consists of two metal electrodes (E1& E2), holds a thermocouple probe, metal dishes, metal rectangle block, spring and metal rods which are shown respectively in the figures 4 to 7. The spring-loaded brass electrode (E1) and it can be pressed hard against the surface of the cylindrical pellet (sample). The brass electrode E2 is fixed at the other end with the support of ceramic bead. This sample holder assembly can be adjusted into the furnace for temperature variation measurement of the DC electrical resistivity. The assembly of sample holder with pellet in between two electrodes and furnace are shown in figure 3.

The present invention was experimented and illustrated more in details in the following example. The example describes and demonstrates embodiments within the scope of the present invention. This example was given solely for the purpose of illustration and is not to be construed as limitations of the present invention, as many variations thereof are possible without departing from spirit and scope.

Example 1
The present example performed a few experiments and recorded resistivity of the oxide’s samples using the computer interfaced temperature variation DC Resistivity measurement device. Resistivity versus temperature relation deduce from these experiments. Two graphs of resistivity versus temperatures are shown in figure 8 and 9 for perovskite oxide and spinel oxide, respectively. These graphs show the linear relation between log? versus 103/T. We can determine Curie temperatures (TC) for ferroelectric materials where the graph shows a break when it linearly fits and give ferroelectric to paraelectric transitions. Similarly, figure 9 gives the information about the ferromagnetic to paramagnetic transition temperature (TC) for ferromagnetic oxide material.

Variation of dc resistivity with temperature for present specimens suggests that the resistivity decreases with increase in temperature. This is a well-known Arrhenius behavior.

The activation Energy can be calculated using the dc resistance at different temperatures. The DC resistivity as a function of temperature for the present samples obey thermally activated behavior given as equation (3).
?? = ?????? (??/????)-------------(3)
The transition temperature and activation energy of present oxides samples are given in following Table 1.

Table 1 DC Resistivity (?dc), Transition Temperature (TC) and Activation Energy (Ea) for the perovskite and spinel oxides materials

Sample log?dc
(O cm)
(at 300 K) Transition Temperature (TC) K Activation Energy (eV)
Ef Ep ?E
Perovskite oxide 8.732 363 0.661 0.681 0.020
Spinel oxide 7.901 453 0.562 0.585 0.023

Prime objective of this invention is to design computer interfacing microcontroller devices for the measurement of DC electrical resistivity with temperature variation. The present invention have successfully designed and implemented this project. This device works on the Arrhenius principle. The behavior of the thermal variation of DC electrical resistivity plots shows Arrhenius characteristics. The activation energies are determined for both samples and the Curie temperatures also found from these measurements. These measurements are essential for oxide materials. This measurement is very useful to researchers who are working in the field of material science.

Without further description, it is believed that one of ordinary skill in the art can, using the preceding description and the illustrative examples, make and utilize the present invention and practice the claimed methods. It should be understood that the foregoing discussion and examples merely present a detailed description of certain preferred embodiments. It will be apparent to those of ordinary skill in the art that various modifications and equivalents can be made without departing from the spirit and scope of the invention.

LIST OF REFERENCE NUMERALS:

Computer interfaced resistance measurement device (100)
Cylindrical furnace (1)
Sample holder assembly (2)
Metal electrode (E1, E2)
Ceramic beads (21)
Metal dish (22)
Rectangular block (23)
Spring (24)
Rods (25)
Thermocouple probe (26)
Microcontroller (3)
Amplifier circuit (4)
Circuit breaker (5)
Current supply (5a)
Solid state relay (6)
LCD display (7)
Potentiometer (8)
Temperature controller (9)
Computer means (10)
Handle (11)
Pellet (12)

Documents

Application Documents

# Name Date
1 202121019275-STATEMENT OF UNDERTAKING (FORM 3) [27-04-2021(online)].pdf 2021-04-27
2 202121019275-PROOF OF RIGHT [27-04-2021(online)].pdf 2021-04-27
3 202121019275-POWER OF AUTHORITY [27-04-2021(online)].pdf 2021-04-27
4 202121019275-FORM 1 [27-04-2021(online)].pdf 2021-04-27
5 202121019275-FIGURE OF ABSTRACT [27-04-2021(online)].jpg 2021-04-27
6 202121019275-DRAWINGS [27-04-2021(online)].pdf 2021-04-27
7 202121019275-DECLARATION OF INVENTORSHIP (FORM 5) [27-04-2021(online)].pdf 2021-04-27
8 202121019275-COMPLETE SPECIFICATION [27-04-2021(online)].pdf 2021-04-27
9 Abstract1.jpg 2021-11-18
10 202121019275-FORM 18 [26-04-2025(online)].pdf 2025-04-26
11 202121019275-ORIGINAL UR 6(1A) FORM 26-010525.pdf 2025-05-06