DESC:TITLE OF THE INVENTION
A method of representing the expected distance between effects of an effect yarn

FIELD OF THE INVENTION
[0001] The present invention relates to the method of representing the expected distance between effects of an effect yarn and applies to the instruments meant for measurement of effect yarn properties.

CROSS-REFERENCE TO RELATED APPLICATION
[0002] The present application claims priority from the Provisional Application No. 201641041323 filed on 2nd Dec 2017, the full disclosure of which is hereby incorporated by reference herein

BACKGROUND OF THE INVENTION
[0003] Effect yarns are special kind of textile yarns meant for creating special effects on fabrics made out of it. In effect yarns, yarn faults are created intentionally to get the effects. Effects can be thick or thin compared to the base yarn. Number of effects for a given length of yarn, length of the effect, thickness of the effect, and distance between two effects are some of the important characteristics that determine the appearance of the final fabrics made out of such effect yarns.

[0004] Distance between two effects in the effect yarn can be equal throughout the length of the yarn or alternatively it can vary for a given distance range. This again creates difference in the appearance of the final fabrics. Usually, a spectrogram is a graphical representation provided by an evenness tester. Spectrogram provides information about whether the repetition of fault is periodic or not. X axis of a spectrogram represents the wavelength i.e the distance between the two faults and the Y axis of a spectrogram represents the severity of the fault. The benefit of interpreting a spectrogram applies to effect yarn also. At what distance the effects are repeating and whether the distance between effects are uniform or random can be interpreted using the spectrogram of an effect yarn.

[0005] While manufacturing effect yarns, the manufacturing machine for effect yarns will have the provision to set the various properties like number of effects, effect length, effect thickness, distance between two effects etc. Evenness testers on the other hand are used to measure such properties of effect yarns.

[0006] US5910187A explains a method of detecting yarn unevenness appearing as periodic variations of a spun yarn. First, plural yarn samples are taken. Then, k distinct spectrograms are obtained according to the number of the samples. These k spectrums are averaged to create an overall spectrogram. The height of adjacent channels in the overall spectrogram is averaged to create a reference spectrogram. Either the overall spectrogram of the distinct spectrograms are compared with the reference spectrogram of find those portions of the channels that exceed the reference spectrograms in height. These exceeding portions are displayed. Therefore, realistic defective added non-uniformities contained in the spun yarn can be easily detected. In this prior art, only the reference spectrogram is compared with the measured spectrogram. It did not provide a method for comparing the effect distance set in a manufacturing machine which is the expected distance with the actual distance between effects as represented in a spectrogram.

[0007] The present invention explains about the method of identifying whether the distance between two effects as set in the effect yarn manufacturing machine is met by the actual yarn produced which is measured in the evenness tester and this identification is done using the spectrogram result of the effect yarn tested.

OBJECTS OF THE INVENTION
[0008] The main object of the present invention is to provide a method of representing the expected distance between effects of an effect yarn in a spectrogram and compare with the actual distance between effects and the invention applies to the instruments meant for measuring the effect yarn properties.

SUMMARY OF THE INVENTION
[0009] Accordingly, the present invention relates to a method of representing the expected distance between effects of an effect yarn in a spectrogram and compare the same with the actual effect distance of the effect yarn measured by the evenness tester.

[0010] In an aspect of the present invention, the present invention provides an easier method to find whether the expected settings set in the effect manufacturing machine is achieved actually by measuring the textile material produced from the machine. Usually Spectrograms represent the periodicity of effects in an effect yarn. For example, if there is a spectrogram channel which raise significantly in height compared to other channels, it indicates that the distance between the effects is almost equal to the wavelength of the spectrogram channel which has raised up.

BRIEF DESCRIPTION OF THE DRAWINGS
[0011] The present invention is described in the detailed description and not by way of limitation, in the figures of the accompanying drawings, and in which
Figure 1 shows the method of representing the expected effect distance in a two dimensional spectrogram and comparing it with the actual effect distance.
Figure 2 shows the method of representing the expected effect distance in a three dimensional spectrogram and comparing it with the actual effect distance.

DETAILED DESCRIPTION OF THE INVENTION
[0012] For the better understanding of the object, technical solution and advantage of the present invention, the present invention will be further explained in detail with respect to embodiments and accompanying drawing below. It should be understood that the specific embodiments described herein only be used for explaining the present invention but not used to limit the present invention.

[0013] The present invention relates to a method for representing the expected effect distance in a spectrogram output of an effect yarn measured in an evenness tester and comparing it with the actual effect distance as represented by the spectrogram.

[0014] In an embodiment of the present invention, the effect yarn is tested in an evenness tester, results are analysed and outputted in numerical and graphical forms. One of the important graphical representation is a spectrogram. A spectrogram can be a two dimensional or three dimensional representations. X axis of a spectrogram indicates the wavelength and Y axis indicates the intensity. When an effect yarn is tested in an evenness tester and the spectrogram of the test result is looked into, the distance between two effects forms a significantly raised channel of a spectrogram. The wavelength of this channel represents the distance between effects.

[0015] As represented in figure 1, a two dimensional spectrogram (1) is outputted by the evenness tester whose X axis (2) is the wavelength of the effects i.e. the distance between effects and Y axis (3) is the intensity of the effects. Channels (4) indicated as a vertical bar are kept adjacent to each other. Each channel (4) refers to a wavelength. One or more expected wavelength channels (6) are highlighted in one pattern or shade. These expected wavelength channels (6) represent the expected distance between two effects. The expected wavelength can be entered by the user for the effect yarn tested in the evenness tester or the information can be retrieved from the effect yarn manufacturing machine where the effect distance is set. One or more such expected wavelength channels (6) are highlighted which indicates that a range i.e. a minimum to maximum value for expected distance between effects exists. Actual distance between two effects is identified and highlighted as actual wavelength channels (5) of the spectrogram by the evenness tester. This channel can be one or more than one. These channels are marked in a different pattern or shade.

[0016] In certain embodiments, the expected effect distance is an entry given by the user and / or can be retrieved from the effect manufacturing machine directly and / or can use any mathematical algorithm.

[0017] In another embodiment as represented in Figure 2, a three dimensional spectrogram (7) whose X axis (2) is the wavelength of the effects, Y axis (3) is the intensity of the effects and Z axis (8) is the sub sample numbers for various effect yarns tested. Each channel (4) refers to a wavelength of effect. As explained in Figure 1, here also the expected wavelength channels (6) are highlighted in a shade or pattern and the actual wavelength channels (5) are highlighted in a different shade or pattern. In this case, analysis can be done for more than one effect yarn tested in the evenness tester as the representation is three dimensional.

[0018] In certain embodiments, the different shades or patterns can be used on the channels to highlight based on whether the actual distance channels (5) falls within or outside the expected distance channels (6).
,CLAIMS:We Claim:
1. A method of representing the expected effect distance of the effect yarn in a spectrogram of an evenness tester and comparing it with the actual effect distance of the effect yarn characterized in that said method wherein the effect yarn is tested in the evenness tester and results are outputted; spectrograms are generated for the results of the effect yarns tested using channels (4); expected effect distance is highlighted in the expected distance channels (6) of the spectrogram using shade or pattern; and actual effect distance is highlighted in the actual distance channels (5) of the spectrogram using different shade or pattern.
2. The method according to claim 1 wherein the spectrogram can be a two dimensional spectrogram (1) and / or a three dimensional spectrogram (2).
3. The method according to claim 1 wherein the expected effect distance is an entry given by the user and / or can be retrieved from the effect manufacturing machine directly and / or can use any mathematical algorithm.
4. The method according to claim 1 wherein different shades or patterns can be used on the channels to highlight based on whether the actual distance channels (5) falls within or outside the expected distance channels (6).