Claims:We Claim:
1. A testing fixture for an open hybrid microcircuit, the fixture comprising:
a first part configured for housing the open hybrid microcircuit; and
a second part configured for cooperative alignment with the first part;
wherein the second part along with the first part is capable of retaining the open hybrid microcircuit in a non-contact manner.
2. The testing fixture as claimed in claim 1, wherein the first part comprises of an insulated inner surface and an extended wall configured for establishing external connection with the open hybrid microcircuit.
3. The testing fixture as claimed in claim 2, wherein the extended wall comprises of at least one elongated slot for establishing external connection with the open hybrid microcircuit.
4. The testing fixture as claimed in claim 1, wherein the fixture is formed out of a material selected from a list comprising of steel, aluminium, or an alloy thereof.
5. The testing fixture as claimed in claim 1, wherein the fixture is utilized for performing at least one test.
6. The testing fixture as claimed in claim 5, wherein the test is selected from a list comprising of a burn in test, a storage test, a moisture sensitivity level test, a thermal shock test, a mechanical vibration test, a centrifuge test, an electrical performance test, a stabilization baking test, a temperature cycling test and/or a combination thereof.

Bangalore NARENDRA BHATTA HL
31 January 2018 (INTELLOCOPIA IP SERVICES)
AGENT FOR APPLICANT

, Description:A TESTING FIXTURE FOR AN OPEN HYBRID MICROCIRCUIT

FIELD OF INVENTION
The invention generally relates to the field of testing fixtures and particularly to a testing fixture for an open hybrid microcircuit.

BACKGROUND
There are different types of tools that are known in the art for handling hybrid microcircuit. Examples of tools include but are not limited to test fixtures and tweezers.
One of the tools known in the art provides a mechanical shock test fixture for an integrated circuit. The circuit sample is completely nested into the fixture. The fixture comprises of a base and a cover plate. A positioning groove for containing the integrated circuit is formed in the middle of the base. The advantage of the test fixture is that the sample does not get affected with the outside stress or slide under the conditions of mechanical testing. The disadvantage of the test fixture is that it is suitable only for performing mechanical shock testing.
Therefore, there is a need for a handling fixture for open microcircuit that is capable of carrying out mechanical and/or electrical tests.

BRIEF DESCRIPTION OF DRAWINGS
So that the manner in which the recited features of the invention can be understood in detail, some of the embodiments are illustrated in the appended drawings. It is to be noted, however, that the appended drawings illustrate only typical embodiments of this invention and are therefore not to be considered limiting of its scope, for the invention may admit to other equally effective embodiments.
FIG.1 shows a testing fixture for an open hybrid microcircuit, according to an embodiment of the invention.
FIG.2 shows an exploded view of the testing fixture for the open hybrid microcircuit, according to an embodiment of the invention.

SUMMARY OF THE INVENTION
One aspect of the invention provides a testing fixture for an open hybrid microcircuit. The testing fixture for the open hybrid microcircuit includes a first part configured for housing the open hybrid microcircuit and a second part configured for cooperative alignment with the first part. The second part along with the first part is capable of retaining the open hybrid microcircuit in a non-contact manner.

DETAILED DESCRIPTION OF THE INVENTION
Various embodiments of the invention provide a testing fixture for an open hybrid microcircuit. The testing fixture for an open HMC includes a first part configured for housing the open hybrid microcircuit and a second part configured for cooperative alignment with the first part. The second part along with the first part is capable of retaining the open hybrid microcircuit in a non-contact manner. The fixture described herein briefly shall be explained in detail.
¬FIG.1 shows a testing fixture for an open hybrid microcircuit, according to an embodiment of the invention. The testing fixture for an open hybrid microcircuit includes a first part 1 configured for housing the open hybrid microcircuit and a second part 2 configured for cooperative alignment with the first part 1. The second part 2 along with the first part 1 is capable of retaining the open hybrid microcircuit in a non-contact manner.
FIG.2 shows an exploded view of the testing fixture for the open hybrid microcircuit, according to an embodiment of the invention. The testing fixture for an open hybrid microcircuit, hereinafter referred to as open HMC, includes a first part 1 configured for housing the open HMC. The first part 1 includes an insulated inner surface 1a having a top unit 1c, an intermediate unit 1d and a bottom unit 1e. In one example of the invention, the first part 1 is an aluminium holder. In one example of the invention, the top unit 1c, the intermediate unit 1d and the bottom unit 1e are connected by the means of a slotted groove provided on the top unit 1c and the bottom unit 1e. Further, the first part 1 includes an extended wall 1b configured for establishing external connection with the open HMC. The extended wall 1b includes at least one elongated slot 1f for establishing external connection with the open HMC. The open HMC further includes a second part 2, configured for cooperative alignment with the first part 1. The cooperative alignment of the first part 1 with the second part 2 is achieved through at least one fastening means. The fastening means described herein includes but not limited to a press fit, lock and key fit and all such means for fastening two cooperative surfaces as included under the scope of the invention and as obvious to the person skilled in the art. The second part 2 along with the first part 1 is capable of retaining the open HMC in a non-contact manner. The fixture described herein is formed out of a material that includes but is not limited to steel, aluminium, or an alloy thereof. In one embodiment of the invention, the fixture is circular in shape. But, in an alternate embodiment of the invention, the fixture can be of any shape and size in order to accommodate the HMC.
The testing fixture described herein is utilized for performing at least one test. The test described herein includes but are not limited to a burn in test, a storage test, a moisture sensitivity level test, a thermal shock test, a mechanical vibration test, a centrifuge test, an electrical performance test, a stabilization baking test, a temperature cycling test and/or a combination thereof. In one example of the invention, the fixture is used to perform burn in test at 125°C for about 168 hours.
The invention provides a testing fixture for an open HMC that offers ease of handling and thereby reduces loading and unloading time. The testing fixture as described herein and as illustrated through the accompanying drawings can be used to eliminate wire bond disturbance due to multiple handling during testing and screening of the open HMC.
The foregoing description of the invention has been set merely to illustrate the invention and is not intended to be limiting. Since modifications of the disclosed embodiments incorporating the spirit and substance of the invention may occur to person skilled in the art, the invention should be construed to include everything within the scope of the appended claims and equivalents thereof.