F O R M 2
THE PATENTS ACT, 1970
(39 of 1970)
The patent Rule, 2003
COMPLETE SPECIFICATION
(See section 10 and rule 13)
“AN INTEGRATED TEST BENCH SYSTEM AND METHOD THEREOF”
MINDA CORPORATION LIMITED of E-5/2, Chakan Industrial Area, Phase- III M.I.D.C. Nanekarwadi, Tal: Khed, Dist., Pune, Maharashtra, 410-501, India
The following specification particularly describes the invention and the manner in which it is to
be performed.

FIELD OF THE INVENTION:
[001] The present disclosure relates to testing techniques for vehicle components. More particularly, the present disclosure provides an integrated test bench system for simultaneously testing two or more components related to vehicle access and a method of testing thereof.
BACKGROUND OF THE INVENTION:
[002] Testing is the most critical phase before the deployment of any product, as it ensures the quality of the product. Improper (or) sloppy testing will cause product recalls and adversely impact the brand value of the manufacturer. Testing an automotive embedded device is indeed a challenging task, as it depends upon interworking of high-level hardware and software. It also requires a lot of effort and varied processes to encompass the validation flow of a typical product. The manual test setups possess lot of challenges as far as cycle times and the overall productivity of the tests are concerned. At present, automatic test setups have become popular, as they are capable of validating the device under test (DUT) at a faster rate than that of the manual setups.
[003] The development and production of vehicle access systems require a large variety of tests to ensure that the proper functionalities of the various components involved in vehicle access. With increase in functionality associated with vehicle access, the effective and efficient testing has become the need of hour. Conventional test systems are based on manual testing, that require high manpower and have low overall efficiency. Major drawback of conventional test systems is lack of automation and integration of multiple functionalities. While some of the conventional-art discloses remote test methods i.e., remotely controlling and monitoring tests of DUTs, said methods require manual interventions and efforts. Further, such methods lack in validation of various functionality of the devices involved in automatic vehicle access system.
[004] Therefore, there is a need of an integrated test bench system to overcome above-mentioned problems.

SUMMARY OF THE INVENTION:
[005] The present disclosure overcomes one or more shortcomings of the prior art and provides additional advantages discussed throughout the present disclosure. Additional features and advantages are realized through the techniques of the present disclosure. Other embodiments and aspects of the disclosure are described in detail herein and are considered a part of the claimed disclosure.
[006] It is to be understood that the aspects and embodiments of the disclosure described below may be used in any combination with each other. Several of the aspects and embodiments may be combined together to form a further embodiment of the disclosure.
[007] In one non-limiting embodiment of the present disclosure, an integrated test bench system is provided. The integrated test bench system includes a plurality of testing units comprising a key fob testing unit, a key fob button testing unit, an electronic steering column lock (ESCL) testing unit, and a transponder key testing unit. The integrated test bench system further includes a control unit operatively coupled with the plurality of testing units. The control unit is configured to simultaneously control two or more testing operations being performed by corresponding two or more testing units from the plurality of testing units by receiving two or more test-specific parameters corresponding to the two or more testing operations to be performed by the corresponding two or more testing units and selectively activating a set of testing components, of a plurality of testing components associated with the two or more testing units. The control unit is configured to selectively activate the two or more testing units, based on the two or more test-specific parameters in such a manner that one testing component does not conflict with another testing component of the set of testing components while performing the two or more testing operations of the two or more testing units.
[008] In another non-limiting embodiment of the present disclosure, the key fob testing unit is configured to perform testing of a key fob. The key fob testing unit includes a key fob

holding fixture, disposed over a conveyor, is capable of holding the key fob while moving over the conveyor during testing and a smart key electronic control unit (ECU). The smart key ECU is configured to receive a set of test-specific parameters from the control unit and test low frequency (LF) communication functionality of the key fob, based on the set of test-specific parameters, while moving the key fob over the conveyor at predefined positions relative to the smart key ECU, and wherein the smart key ECU is configured to be rotated in one or more directions.
[009] In another non-limiting embodiment of the present disclosure, the ESCL testing unit is configured to test lock and unlock conditions of an ESCL. The ESCL testing unit includes an ESCL holding fixture configured to hold the ESCL to be tested, wherein the ESCL comprising a protruding element, a pneumatic cylinder comprising a bolt and at least one sensor configured to monitor bolt position and protruding element position. The control unit is configured to operate the pneumatic cylinder, positioned adjacent to the ESCL to be tested, based on a set of test-specific parameters in such a manner that the bolt locks and unlocks the protruding element based on the monitoring of the bolt position and the protruding element position for testing locking and unlocking functionality of the ESCL.
[010] In another non-limiting embodiment of the present disclosure, the transponder key testing unit is configured to test transponder key authentication of a key. The transponder key testing unit includes a key holding and rotating fixture configured to hold and rotate the key to be tested, and a lock holding unit configured to fixedly hold a lockset corresponding the key. The control unit is configured to operate the key holding and rotating fixture based on a set of test-specific parameters in such a manner that the key holding and rotating fixture inserts and rotates the key within the lockset to perform the transponder key authentication testing.
[011] In another non-limiting embodiment of the present disclosure, the key fob button testing unit is configured to test operation of one or more buttons provided on a key fob to be tested. The key fob button unit includes one or more pneumatic cylinders configured to press the one or more buttons of the key fob, a key fob holding fixture configured to

fixedly hold the key fob during pressing of the one or more buttons of the key fob. The control unit is configured to operate the one or more pneumatic cylinders, based on a set of test-specific parameters, to perform the testing of the one or more buttons of the key fob.
[012] In another non-limiting embodiment of the present disclosure, a method for performing testing is disclosed. The method includes facilitating a plurality of testing units including a key fob testing unit, a key fob button testing unit, an electronic steering column lock (ESCL) testing unit, and a transponder key testing unit. The method also includes enabling a control unit to simultaneously control two or more testing operations being performed by corresponding two or more testing units from the plurality of testing units, the control unit being operatively coupled with the plurality of testing units. To perform the two or more testing operation, the method further includes receiving two or more test-specific parameters corresponding to the two or more testing operations to be performed by the corresponding two or more testing units. Also, the method includes selectively activating a set of testing components, of a plurality of testing components, associated with the two or more testing units, based on the two or more test-specific parameters in such a manner that one testing component does not conflict with another testing component of the set of testing components while performing the two or more testing operations of the two or more testing units.
[013] The foregoing summary is illustrative only and is not intended to be in any way limiting. In addition to the illustrative aspects, embodiments, and features described above, further aspects, embodiments, and features will become apparent by reference to the drawings and the following detailed description.
OBJECTS OF THE INVENTION:
[014] The main object of the present disclosure is to improve test efficiency, reduce manpower cost and space occupied by the integrated automated test setup.

[015] Another main object of the present disclosure is to design an integrated and automated test system for testing of the Electric Control Unit (ECU), ESCL, key fob and immobilizer of the vehicle.
[016] Another object of the invention is to provide an alert system including sensor assembly to avoid malfunctioning at the test system and ensure smooth and safe functioning.
BRIEF DESCRIPTION OF DRAWINGS:
[017] The accompanying drawings, which are incorporated in and constitute a part of this disclosure, illustrate exemplary embodiments and, together with the description, serve to explain the disclosed embodiments. In the figures, the left-most digit(s) of a reference number identifies the figure in which the reference number first appears. The same numbers are used throughout the figures to reference like features and components. Some embodiments of system and/or methods in accordance with embodiments of the present subject matter are now described, by way of example only, and with reference to the accompanying figures, in which:
[018] Figure 1 illustrates an integrated test bench system, according to an embodiment of the present disclosure.
[019] Figures 2A-2B illustrate a key fob testing unit of the integrated test bench system, according to an embodiment of the present disclosure.
[020] Figure 3 illustrates a key fob button testing unit of the integrated test bench system, according to an embodiment of the present disclosure.
[021] Figure 4 illustrates an electronic steering column lock (ESCL) testing unit of the integrated test bench system, according to an embodiment of the present disclosure.
[022] Figure 5 illustrates a transponder key testing unit of the integrated test bench system, according to an embodiment of the present disclosure.

[023] Figure 6 illustrates a block diagram of a control system for the integrated test bench system, according to an embodiment of the present disclosure.
[024] Figure 7 discloses a flowchart of a method for performing testing at the integrated test bench system, according to an embodiment of present disclosure.
[025] Figures 8A-8C illustrate various flowcharts relating to methods for performing key fob testing at the integrated test bench system, according to an embodiment of present disclosure.
[026] Figures 9A-9B illustrate various flowcharts relating to methods for performing key fob button testing at the integrated test bench system, according to an embodiment of present disclosure.
[027] Figures 10A-10C illustrate various flowcharts relating to methods for performing ESCL testing at the integrated test bench system, according to an embodiment of present disclosure.
[028] Figures 11A-11B illustrate various flowcharts relating to methods for performing transponder key testing at the integrated test bench system, according to an embodiment of present disclosure.
[029] It should be appreciated by those skilled in the art that any block diagrams herein represent conceptual views of illustrative systems embodying the principles of the present subject matter. Similarly, it will be appreciated that any flow charts, flow diagrams, state transition diagrams, pseudo code, and the like represent various processes which may be substantially represented in computer readable medium and executed by a computer or processor, whether or not such computer or processor is explicitly shown.
DETAILED DESCRIPTION OF DRAWINGS:

[030] In the present document, the word “exemplary” is used herein to mean “serving as an example, instance, or illustration”. Any embodiment or implementation of the present subject matter described herein as “exemplary” is not necessarily to be construed as preferred or advantageous over other embodiments.
[031] Referring now to the drawings, there is shown an illustrative embodiment of the disclosure “AN INTEGRATED TEST BENCH SYSTEM AND METHOD THEREOF”. It is understood that the disclosure is susceptible to various modifications and alternative forms; specific embodiments thereof have been shown by way of example in the drawings and will be described in detail below. It will be appreciated as the description proceeds that the disclosure may be realized in different embodiments.
[032] While the disclosure is susceptible to various modifications and alternative forms, specific embodiment thereof has been shown by way of example in the drawings and will be described in detail below. It should be understood, however that it is not intended to limit the disclosure to the particular forms disclosed, but on the contrary, the disclosure is to cover all modifications, equivalents, and alternative falling within the scope of the disclosure.
[033] The terms “comprises”, “comprising”, “include(s)”, or any other variations thereof, are intended to cover a non-exclusive inclusion, such that a setup, system or method that comprises a list of components or steps does not include only those components or steps but may include other components or steps not expressly listed or inherent to such setup or system or method. In other words, one or more elements in a system or apparatus proceeded by “comprises… a” does not, without more constraints, preclude the existence of other elements or additional elements in the system or apparatus.
[034] In the following detailed description of the embodiments of the disclosure, reference is made to the accompanying drawings that form a part hereof, and in which are shown by way of illustration specific embodiments in which the disclosure may be practiced. These embodiments are described in sufficient detail to enable those skilled in the art to practice the disclosure, and it is to be understood that other embodiments may be utilized and that

changes may be made without departing from the scope of the present disclosure. The following description is, therefore, not to be taken in a limiting sense.
[035] The terms “vehicle” or “car” may be used interchangeably throughout the description. The terms “key fob”, “fob key”, or “smart key” may be used interchangeably throughout the description. The terms “smart key unit performance testing system”, “keyless entry test bench setup” or “integrated automated test bench system” may be used interchangeably throughout the description.
[036] According to an aspect, the present disclosure provides an integrated test bench system is disclosed. The system includes plurality of testing units integrated in such a manner that a testing performed at any of the said unit does not conflict with a testing at any other testing unit. Therefore, said integration enables multiple testing to be performed simultaneously. Further, said integration of multiple testing units reduces space requirement for the system. Also, said integration reduces human efforts and thereby changes of the human error.
[037] Figure 1 illustrates an integrated test bench system 100 (hereby referred as “the system 100), according to an embodiment of the present disclosure. The system 100 includes a plurality of testing units 102. The testing units 102 may include, but not limited to, a key fob testing unit, a key fob button testing unit, an ESCL testing unit and a transponder key unit. Embodiments of the present disclosure are not restricted to any number of testing units and either cover or intend to cover any number of testing units being integrated to form the system 100.
[038] As illustrated, the system 100 may represent a long bench including multiple testing units 102 being integrated and/or attached to said bench. The system 100 may also include a conveyor belt 104 and a movable fixture 106 disposed on said conveyor belt 104. The conveyor belt 104 may be configured to enable movable fixture 106 to move longitudinally along the conveyor belt 104. The movable fixture 106 may be configured

to hold one or more components of a device under test (DUT) and move said one or more components, as per the requirement of the testing.
[039] In some embodiments, the system 100 may be covered by a transparent housing (not shown) to protect a user operating the system 100 during any malfunctioning of the system 100.
[040] Further, the system 100 may also include one or more storage cabinets 108 to store one or more components and/or the DUTs, as per the requirement. The storage cabinets 108 may be used for any other suitable purposes, as per the requirements of the user of the system 100.
[041] The system 100 may also include a control unit (now shown in Fig. 1) which may be operatively coupled with the plurality of testing units 102. The control unit may be configured to simultaneously control two or more testing operations being performed by corresponding two or more testing units from the plurality of testing units 102. For example, the control unit may be configured to simultaneously control testing operations of key fob testing unit and ESCL testing unit. In alternative embodiments, the control unit may be configured to operate any number of testing operations performed by any number of testing units.
[042] In some embodiments, the control unit may be configured to receive two or more test-specific parameters corresponding to the two or more testing operations to be performed by the corresponding two or more testing units. The test specific parameters may include, a number of cycles, a type of DUT, operating time and so forth. Further, the control unit may be configured to selectively activate a set of testing components, of a plurality of testing components, associated with the two or more testing units, based on the two or more test specific parameters, respectively. Moreover, the control unit may activate the testing components of the testing units in such a manner that one testing component does not conflict with another testing components of the set of the testing components while performing the two o more testing operations of the two or more testing units.

[043] The control unit may include any suitable components required to performs the desired functionality. For example, the control unit may include components, such as, an Input/Output interface, a processor, a memory, one or more communication units and so forth. In an embodiment, the control unit may correspond to a personal computing device such as, but not limited to, a laptop, a desktop, a tablet, and so forth.
[044] In an exemplary embodiment, the testing units 102 may integrated in such manner that overall size of the system 100 may be smaller than said units being placed individually. Thus, the system 100 may be compact and simple in structural.
[045] Figures 2A-2B illustrate a key fob testing unit 200 of the integrated test bench system 100, according to an embodiment of the present disclosure. The key fob testing unit 200 may correspond to one of the testing units 102 of the system 100. The key fob testing unit 200 may be configured to perform testing of a key fob. In an exemplary embodiment, the key fob testing unit 200 may be configured to perform testing of a plurality of functionality associated with a smart key fob. The functionality of the key fob may include, but not limited to, key fob authentication, key fob range check and so forth.
[046] The key fob testing unit 200 may include a smart key electronic control unit (ECU) 202 (hereinafter referred to as the ECU 200) which may be rotatably attached to the integrated test bench 100. The ECU 202 may be attached to the test bench 100 via rotation fixtures configured to provide a 360 degrees rotation to the ECU 202 i.e., +180 to -180 in X-Z plane and +90 to -90 in Y plane. The ECU 202 may correspond to an ECU installed in a vehicle. The key fob testing unit 200 may also include key fob holding fixture 204. The key fob holding fixture 204 may be disposed over a conveyor 206. The key fob holding fixture 204 may configured to move the key fob over the conveyor in x-axis. In an exemplary embodiment, the key fob holding fixture 204 may be configured to change the distance between the key fob and ECU during testing up to 3 meters. In some embodiments, the key fob holding fixture 204 may also be configured to rotate the key fob clock-wise or anti-clockwise to change a direction of signal transmission from the key fob. In some other embodiments, the key fob holding fixture 204 nay further include

another conveyor 208 configured to move the key fob in y-axis. Therefore, the key fob holding fixture 204 may be configured to provide all the required displacement or motion for effective and efficient testing of the key fob. Moreover, as both the ECU 202 and the key fob holding fixture 204 are configured to provide required rotation and displacement, the space required by the key fob testing unit 200 is significantly reduced as compared to other conventional key fob testing arrangements.
[047] In an exemplary embodiment, the ECU 202 may be configured receive a set of test-specific parameters from the control unit of the integrated test bench system 100. Further, the ECU 202 may be configured to test low frequency (LF) communication functionality of the key fob, based on the test specific parameters, while the key fob holding fixture 204 moves the key fob over the conveyor 206 or the conveyor 208 at predefined positions relative to the ECU 202. In an embodiment, the test specific parameters may include, but not limited to, different positional configuration of the ECU 202, different positional configuration of the key fob, number of signal transmission, number of test cycles and so forth.
[048] Figure 3 illustrates a key fob button testing unit 300 of the integrated test bench system, according to an embodiment of the present disclosure. The key fob button testing unit 300 may corresponds to one of the testing unit 102 of the integrated test bench system 100. The key fob button testing unit 300 may be configured to test operation of one or more buttons provided on a key fob 302 to be tested. The one or more test operations performed by the key fob button testing unit 300 may include button debounce check, sleep current test and so forth.
[049] The key fob button testing unit 300 may include one or more pneumatic cylinders 304 configured to press the one or more buttons of the key fob 302. The one or more pneumatic cylinders 304 may arranged in such a manner that said pneumatic cylinders 304 may be configured to support button press testing of different kind of key fobs with different button configurations. Each of the pneumatic cylinder 304 may be selectively operated by the control unit of the integrated test bench 100. Each of the pneumatic

cylinder 304 may also include a rubber cover to prevent damage to the button of the key fob 302 during testing.
[050] The key fob button testing unit 300 may include a key fob testing holding fixture 306 configured to fixedly hold the key fob during pressing of the one or more buttons of the key fob 302 by the one or more pneumatic cylinders 304.
[051] In an exemplary embodiment, the control unit of the integrated test bench system 100 may be configured to operate the one or more pneumatic cylinders 304 based on a set of test-specific parameters to perform the testing of the one or more buttons of the key fob 302. The test-specific parameters for performing the testing of the one or more buttons of the key fob 302 may include, but not limited to, a selection of pneumatic cylinders 304, a number of buttons on the key fob 302, a number of presses required to perform the testing and so forth.
[052] Figure 4 illustrates an electronic steering column lock (ESCL) testing unit 400 of the integrated test bench system, according to an embodiment of the present disclosure. The ESCL testing unit 400 may corresponding to one of the testing unit 102 of the integrated test bench system 100. The ESCL testing unit 400 may be configured to test an ESCL 402 of the vehicle. In an exemplary embodiment, the ESCL testing unit 400 may be configured to test lock and unlock condition of the ESCL 402.
[053] The ESCL testing unit 400 may include an ESCL holding fixture 404 configured to hold the ESCL 402 to be tested. The ESCL 402 may include a protruding element configured to move in and out of the ESCL 402. The ESCL holding fixture 404 may be configured to hold the ESCL 402 via mechanical fastening means such as, but not limited to, bolts, weld, holding belts, screws and so forth.
[054] The ESCL testing unit 400 may also include a pneumatic cylinder 406 including a bolt 408. The pneumatic cylinder 406 may be configured to test stuck and non-stuck condition of the protruding element of the ESCL 402. The pneumatic cylinder 406 may be disposed adjacent to the ESCL 402. Further, the pneumatic cylinder 406 may be disposed in such

a matter that the bolt 408 may fall perpendicular to the protruding element of the ESCL 402.
[055] The ESCL testing unit 400 may also include at least one sensor 410 configured to monitor at least one of bolt position and protruding element position. In an exemplary embodiment, the at least one sensor 410 may include a laser sensor. In other embodiments, the at least one sensor 410 may include any suitable sensor configured to support the desired operation of the ESCL testing unit 400.
[056] In an embodiment, the control unit of integrated test bench system 100 may be configured to operate the pneumatic cylinder 406 based on a test-specific parameters in such a manner that the bolt 408 locks and unlocks the protruding element based on the monitoring of the bolt position and the protruding element position for testing locking and unlocking functionality of the ESCL 402. The test-specific parameters for performing the ESCL testing may include, but are not limited to, a number of test cycle, a control configuration of protruding element of the ESCL and so forth.
[057] Figure 5 illustrates a transponder key testing unit 500 of the integrated test bench system, according to an embodiment of the present disclosure. The transponder key testing unit 500 may corresponds to one of the testing unit 102 of the integrated test bench system 100. The transponder key testing unit 500 may be configured to test transponder key authentication of a key 502.
[058] The transponder key testing unit 500 may include a key holding and rotating fixture 504 configured to hold and rotate the key 502 during the testing. The key holding and rotating fixture 504 may be configured to replicate manual rotation of the transponder key 502 within a lockset 508. The key holding and rotating fixture 504 may be fitted with suitable rotating means such as, but not limited to, servo motors, DC motors, gear mechanisms, brushless motors and so forth. The transponder key testing unit 500 may further includes a lock holding unit 506 configured to fixedly hold a lockset corresponding to the key during the testing. The lock holding unit 506 may include suitable fastening means configured to hold the lockset during the testing.

[059] In an exemplary embodiment, the control unit of the integrated test bench system 100 may be configured to operate the key holding and rotating fixture 504 based on a set of test-specific parameters in such a manner that the key holding and rotating fixture 504 may insert or remove the key 502 with the lockset, and also rotate the key 502 within the lockset to perform the transponder key authentication testing. The test-specific parameters for performing the transponder key authentication testing may include, but are not limited to, a position of key, a speed of rotation, a number of times the key is to be inserted or removed, a number of test cycles and so forth.
[060] Figure 6 illustrates a block diagram of a control system 600 for the integrated test bench system 602, according to an embodiment of the present disclosure. The integrated test bench system 602 may corresponds to the integrated test bench system 100, as illustrate in Figure 1.
[061] Figure 6 illustrates the keyless entry test bench system 602, a device under test (DUT) 604, a CANoe 606, a VT system 608, a main power supply 610, a programmable power supply 612, a DC power supply 614 and a workstation 616. In an exemplary embodiment, the integrated test bench system 602 may be controlled via CAN commands using CAPL script and panel and thereby reduces manual intervention while performing software and hardware testing. Further, the integrated test bench system 602 with significantly reduced manual intervention may run tests continuously for 24 x 7 and with high accuracy and maintain repeatability. In an exemplary embodiment, the test bench setup 602 may be configured to perform ESCL bolt length and bolt stuck testing, key fob LF range testing up to 3 meters in all direction of ECU, an immobilizer range test of key fob and transponder key testing, key insertion, removal, push and rotation into lockset testing, key fob Q current testing, key fob button press testing, LED output testing and battery status testing. Thus, the test bench setup 102 provides and automated and integrated test bench setup. Further, in an embodiment, the test bench setup 602 may include various functional components (as shown in Figures 2A-5), such as, but not limited to, servo

motors, pneumatic cylinders, laser sensors, 3 V power supply, and light dependent resistors (LDR).
[062] The device under test (DUT) 604 may include devices to be tested by the integrated test bench system 602. The DUT 604 may include devices such as, but not limited to, key fob, ESCL, transponder key and lockset and so forth.
[063] In an exemplary embodiment, the CAN protocol (CANoe) 606 may be used as a communication interface between the DUT 604, the integrated test bench setup 602, the workstation 616 and the VT system 608.
[064] The VT system 608 may be configured to provide required power to the DUT 604 and the test bench setup 602 using the programmable power supply 612 and the DC power supply 614. The VT system 608 may drive the desired power as per requirement from said power sources 612, 614.
[065] The system 600 also includes the main power supply 610 configured to supply required AC power to the test bench setup 602 and the workstation 616. The workstation 616 may be configured to operate the test bench setup 602 and DUT 604. The workstation 616 may be configured to monitor and store test results. Further, the workstation 616 may be configured to make suitable modification in commands to make the test bench setup 102 be adaptable to different kind of devices. In an exemplary embodiment, the workstation 616 may be configured to enable a user to provide test-specific parameters used by the testing units 102 to perform one or more testing.
[066] In an exemplary embodiment, the control unit of the integrated test bench system 100 may include at least one of the workstation 616, the CANoe 606, and the VT system 608.
[067] Figure 7 discloses a flowchart of a method 700 for performing testing at the integrated test bench system 100, according to an embodiment of present disclosure. This flowchart is merely provided for exemplary purposes, and embodiments are intended to include or

otherwise cover any methods or procedures of performing testing at the integrated test bench system 100. Fig. 7 is described in reference to Figs. 2A-5.
[068] At step 702, the method 700 includes facilitating a plurality of testing units 102 comprising a key fob testing unit 200, a key fob button testing unit 300, an electronic steering column lock (ESCL) testing unit 400, and a transponder key testing unit 500.
[069] At step 704, the method 700 includes enabling a control unit to simultaneously control two or more testing operations being performed by corresponding two or more testing units 102 from the plurality of testing units. The control unit being operatively coupled with the plurality of testing units 102.
[070] At step 706, the method 700 includes receiving two or more test-specific parameters corresponding to the two or more testing operations to be performed by the corresponding two or more testing units. Thereafter, at step 708, the method 700 includes selectively activating a set of testing components, of a plurality of testing components, associated with the two or more testing units 102, based on the two or more test-specific parameters in such a manner that one testing component does not conflict with another testing component of the set of testing components while performing the two or more testing operations of the two or more testing units 102.
[071] The above-mentioned steps of method 200, provides various technical effects or advantages such as to provide a simple, effective and efficient testing of one or more components of vehicle access system.
[072] Figures 8A-8C illustrate various flowcharts relating to methods 800a-800b for performing key fob testing at the integrated test bench system 100, according to an embodiment of present disclosure. Figures 8A-8C are described in reference to Figures. 2A-5.

[073] Figure 8A illustrates a flowchart pertaining to a method 800a for perform limited Radio Frequency (RF) Range test of a key fob. To perform the method 800a, the power and required inputs for the ECU 202 may be controlled by VT system 608.
[074] Further, the test bench control unit may be configured to control a fixture for rotating the ECU 202, a conveyor 206 and an FOB button press mechanism 304.
[075] Further, to perform the RF range test of the key fob, the testing unit 200 and 300 may operate simultaneously i.e., the unit 200 may rotate the ECU 200 in all directions and the unit 300 may press the buttons of the key fob to test RF operations.
[076] The integrated test bench system may enable RF range test of the key fob up to 3 meters.
[077] The method 800a may include supplying power to the ECU 202. Thereafter, the method 800a may include setting a position and orientation of the ECU 202. In some embodiment, the position and orientation of the ECU 202 may be controlled by the control unit of the integrated test bench system 100 based on test-specific parameters. The method 800a also include taking feedback from the control unit to ensure accurate position and orientation of the ECU 202. The method 800a also includes adjusting the position and orientation of the ECU 202 based on the feedbacks from the control unit.
[078] Next, the method 800a includes positioning the key fob at specific distance. In an embodiment, the key fob position is varied by using the conveyor 206. Further, the key fob buttons are pressed by using pneumatic pressure-based cylinders 304. Then, a feedback from at least one the ECU output or CAN messages indicate whether the operation was successful or Not.
[079] Figure 8B illustrates LF-RF authentication test using key fob. While the steps for setting the orientation and position of the ECU 202 remains same as the method 800a, the method 800b illustrated by Figure 8B, includes placing the key fob at 1.5 meter of distance from the ECU 202. Further, the ECU 202 is rotated in all directions. For LF testing, firstly a

turn ON switch is pressed at ECU. On switch press event, the ECU may send LF signal, and may search for key fob in surrounding area.
[080] On LF detection, the key fob may give RF response if it is valid key fob and also indicate whether key fob is within a communication range or not.
[081] Figure 8C illustrates LF-LF authentication test using key fob. For performing LF-LF authentication test, the key fob and the ECU 202 should be generally within a range of 3 cm. Therefore, the distance between the key fob and the ECU may be kept between 0 to 3 cm and authentication testing is performed.
[082] Overall, for all these kind of authentication methods, the integrated test bench system may provide precise positioning and orientation of both the ECU and the key fob. Further, the methods 800a-800c may be performed automatically without any manual interference.
[083] Figures 9A-9B illustrate various flowcharts relating to methods 900a-900b for performing key fob button testing at the integrated test bench system, according to an embodiment of present disclosure. Figures 9A-9C are described in reference to Figures. 2A-5.
[084] Figure 9A illustrates the method 900a for performing key fob debounce time check. The purpose of Fob debounce time check is to check debounce time of switches on the fob 302. Since, the debounce time cycles are of very short duration, the control unit provides a set precise button press using pneumatic cylinder based pressed. Debounce time may be checked by providing supply to the respective test points which may be disposed at respect buttons of the key fob 302.
[085] One more purpose of key fob debounce time check is to check the fob order management. For said testing, a power may be supplied to all the key fobs and test is performed to check which key fob is giving first RF response when all other key fobs are in range and powered.

[086] Figure 9B illustrates the method 900b for performing key fob sleep current measurement test. According to method 900b, the key fob is placed at a desired place and a power supply is provided to the key fob. In idle condition, a current drawn by the key fob may be considered as a sleep current, which is checked to in micro amp range or not.
[087] Figures 10A-10C illustrate various flowcharts relating to methods 1000a-1000c for performing ESCL testing at the integrated test bench system, according to an embodiment of present disclosure.
[088] Figure 10A illustrates the method 1000a for performing ESCL lock and unlock testing. To perform whether the ESCL is in lock state or unlock state, the system 600 may use CAN message feedback along with a laser sensor output. In an exemplary embodiment, a laser sensor may be used to measure how much length protruding element of the ESCL is out of its base position.
[089] In this Locking and unlocking operation, the method 1000a includes validating the states through CAN messages. Also, the method 1000a includes measuring distance travelled by protruding element of the ESCL. The protruding element length may be measured by using the laser sensor.
[090] Figure 10b illustrates the method 1000b for testing stuck detection of ESCL during unlock state and Figure 10c illustrates the method 1000c for testing stuck detection of ESCL during lock state. To perform stuck operation, the method 1000b and 1000c include setting required length of protruding element of the ESCL and operating state during which the stuck operation need to be performed i.e., locking to unlock or unlocking to Lock, accordingly test-specific parameters are specified.
[091] During a movement of the protruding element, the laser sensor may check the length, when the protruding element travel up to the specified length then, test bench control unit operates ESCL stuck pneumatic cylinder to stuck the ESCL.

[092] Again, in test case validation perspective, the method includes length checking by using laser sensor and feedback from CAN message feedback.
[093] Figures 11A-11B illustrate various flowcharts relating to methods 1100a-1100b for performing transponder key testing at the integrated test bench system, according to an embodiment of present disclosure.
[094] Figure 11A illustrates the method 1100a for performing transponder key authentication testing. Figure 11B illustrates the method 1100b for performing transponder key authentication testing by varying transponder key and antenna distance.
[095] The method includes performing endurance test of the key by reforming the endurance cycles, i.e., 5000 times IGN ON- IGN OFF (ignition ON and ignition OFF).
[096] The method includes precisely changing the distance between key and the antenna. As the steps illustrated in Figures 11A-11B are self-explanatory, the detailed description of the same has been omitted for the sake of the brevity.
[097] In this setup, CAN communication power supply to DUT, LED status monitoring is done by using VT. Key rotation is controlled through test bench and control unit.
[098] The illustrated steps are set out to explain the exemplary embodiments shown, and it should be anticipated that ongoing technological development will change the manner in which particular functions are performed. These examples are presented herein for purposes of illustration, and not limitation. Further, the boundaries of the functional building blocks have been arbitrarily defined herein for the convenience of the description. Alternative boundaries can be defined so long as the specified functions and relationships thereof are appropriately performed.
[099] The integrated test bench setup may also enable testing of BLE based key fob along with the LF-RF mechanism.

[100] Alternatives (including equivalents, extensions, variations, deviations, etc., of those described herein) will be apparent to persons skilled in the relevant art(s) based on the teachings contained herein. Such alternatives fall within the scope and spirit of the disclosed embodiments.
[101] Furthermore, one or more computer-readable storage media may be utilized in implementing embodiments consistent with the present disclosure. A computer-readable storage medium refers to any type of physical memory on which information or data readable by a processor may be stored. Thus, a computer-readable storage medium may store instructions for execution by one or more processors, including instructions for causing the processor(s) to perform steps or stages consistent with the embodiments described herein. The term “computer- readable medium” should be understood to include tangible items and exclude carrier waves and transient signals, i.e., are non-transitory. Examples include random access memory (RAM), read-only memory (ROM), volatile memory, nonvolatile memory, hard drives, CD ROMs, DVDs, flash drives, disks, and any other known physical storage media.
[102] Suitable processors include, by way of example, a general-purpose processor, a special purpose processor, a conventional processor, a digital signal processor (DSP), a plurality of microprocessors, one or more microprocessors in association with a DSP core, a controller, a microcontroller, Application Specific Integrated Circuits (ASICs), Field Programmable Gate Arrays (FPGAs) circuits, any other type of integrated circuit (IC), and/or a state machine.

We Claim:
1. An integrated test bench system, comprising:
a plurality of testing units comprising a key fob testing unit, a key fob button testing unit, an electronic steering column lock (ESCL) testing unit, and a transponder key testing unit; and
a control unit operatively coupled with the plurality of testing units, wherein the control unit is configured to simultaneously control two or more testing operations being performed by corresponding two or more testing units from the plurality of testing units by,
receiving two or more test-specific parameters corresponding to the two or more testing operations to be performed by the corresponding two or more testing units;
selectively activating a set of testing components, of a plurality of testing components, associated with the two or more testing units, based on the two or more test-specific parameters in such a manner that one testing component does not conflict with another testing component of the set of testing components while performing the two or more testing operations of the two or more testing units.
2. The integrated test bench system as claimed in claim 1, wherein the key fob testing unit
is configured to perform testing of a key fob, wherein the key fob testing unit comprising:
a key fob holding fixture, disposed over a conveyor, is capable of holding the key fob while moving over the conveyor during testing; and
a smart key electronic control unit (ECU) configured to:
receive a set of test-specific parameters from the control unit; and
test low frequency (LF) communication functionality of the key fob, based on the
set of test-specific parameters, while moving the key fob over the conveyor at predefined
positions relative to the smart key ECU, and wherein the smart key ECU is configured to
be rotated in one or more directions.
3. The integrated test bench system as claimed in claim 1, the ESCL testing unit is
configured to test lock and unlock conditions of an ESCL, the ESCL testing unit comprising:
an ESCL holding fixture configured to hold the ESCL to be tested, wherein the ESCL comprising a protruding element;

a pneumatic cylinder comprising a bolt; and
at least one sensor configured to monitor bolt position and protruding element position,
wherein the control unit is configured to operate the pneumatic cylinder, positioned
adjacent to the ESCL to be tested, based on a set of test-specific parameters in such a manner
that the bolt locks and unlocks the protruding element based on the monitoring of the bolt position
and the protruding element position for testing locking and unlocking functionality of the ESCL.
4. The integrated test bench system as claimed in claim 1, the transponder key testing unit
is configured to test transponder key authentication of a key, the transponder key testing unit
comprising:
a key holding and rotating fixture configured to hold and rotate the key to be tested; a lock holding unit configured to fixedly hold a lockset corresponding the key, and wherein the control unit is configured to operate the key holding and rotating fixture based on a set of test-specific parameters in such a manner that the key holding and rotating fixture inserts and rotates the key within the lockset to perform the transponder key authentication testing.
5. The integrated test bench system as claimed in claim 1, wherein the key fob button testing
unit is configured to test operation of one or more buttons provided on a key fob to be tested, the
key fob button unit comprising:
one or more pneumatic cylinders configured to press the one or more buttons of the key fob;
a key fob holding fixture configured to fixedly hold the key fob during pressing of the one or more buttons of the key fob; and
wherein the control unit is configured to operate the one or more pneumatic cylinders, based on a set of test-specific parameters, to perform the testing of the one or more buttons of the key fob.
6. A method for performing testing, comprising:
facilitating a plurality of testing units comprising a key fob testing unit, a key fob button testing unit, an electronic steering column lock (ESCL) testing unit, and a transponder key testing unit; and

enabling a control unit to simultaneously control two or more testing operations being performed by corresponding two or more testing units from the plurality of testing units, the control unit being operatively coupled with the plurality of testing units, wherein to perform the two or more testing operation, the method further comprising:
receiving two or more test-specific parameters corresponding to the two or more testing operations to be performed by the corresponding two or more testing units;
selectively activating a set of testing components, of a plurality of testing components, associated with the two or more testing units, based on the two or more test-specific parameters in such a manner that one testing component does not conflict with another testing component of the set of testing components while performing the two or more testing operations of the two or more testing units.
7. The method as claimed in claim 6, wherein the key fob testing unit comprising:
a key fob holding fixture, disposed over a conveyor, is capable of holding a key fob while moving over the conveyor during testing; and
a smart key electronic control unit (ECU), and
wherein the key fob testing unit is configured to perform testing of the key fob by: receiving a set of test-specific parameters from the control unit; and testing low frequency (LF) communication functionality of the key fob, based on
the set of test-specific parameters, while moving the key fob over the conveyor at
predefined positions relative to the smart key ECU, and wherein the smart key ECU is
configured to be rotated in one or more directions.
8. The method as claimed in claim 6, wherein the ESCL testing unit is configured to test
lock and unlock conditions of an ESCL, the ESCL testing unit comprising:
an ESCL holding fixture configured to hold the ESCL to be tested, wherein the ESCL comprising a protruding element;
a pneumatic cylinder comprising a bolt; and
at least one sensor configured to monitor bolt position and protruding element position,
wherein the control unit is configured to operate the pneumatic cylinder, positioned adjacent to the ESCL to be tested, based on a set of test-specific parameters in such a manner

that the bolt locks and unlocks the protruding element based on the monitoring of the bolt position and the protruding element position for testing locking and unlocking functionality of the ESCL.
9. The method as claimed in claim 6, the transponder key testing unit is configured to test
transponder key authentication of a key, the transponder key testing unit comprising:
a key holding and rotating fixture configured to hold and rotate the key to be tested;
a lock holding unit configured to fixedly hold a lockset corresponding the key, and wherein the control unit is configured to operate the key holding and rotating fixture based on a set of test-specific parameters in such a manner that the key holding and rotating fixture inserts and rotates the key within the lockset to perform the transponder key authentication testing.
10. The method as claimed in claim 1, wherein the key fob button testing unit is configured
to test operation of one or more buttons provided on a key fob to be tested, the key fob button
unit comprising:
one or more pneumatic cylinders configured to press the one or more buttons of the key fob;
a key fob holding fixture configured to fixedly hold the key fob during pressing of the one or more buttons of the key fob; and
wherein the control unit is configured to operate the one or more pneumatic cylinders, based on a set of test-specific parameters, to perform the testing of the one or more buttons of the key fob.