Abstract: Automatic Relay test systems are perform very effectively in huge quantity with ensure quality of production before dispatch and to helps to built confidence for the required performance quality, which resulted in final product quality. The present disclosure related to Automotive Electro-mechanical switch (Relay) test system which is generated by idea of integrating different relay testing in single stage automatic testing with : a. All relay specification confirmation with Auto-stamping b. Alternate Two stage testing c. Enhanced Rejection Box system However available test system in market is dedicated to test one or more parameter of the relay, so to confirm the required parameter quality of relay testing is to carried out in multi-stages testing, this required more man power, consumes lot of electricity, acquires more area of space in production cell. To overcome from this multi-stage complex testing method idea is generated to integrate many stages into single stage which will reduce testing manpower, energy and space.
FORM -2
THE PATENTS ACT, 1970
(39 of 1970)
&
THE PATENTS RULES, 2006
COMPLETE SPECIFICATION
(See section 10 and rule 13)
AUTOMATIC RELAY TEST MACHINE
BG LI-IN ELECTRICALS LTD.
an Indian Company of Plot No.M-137, MIDC, Waluj,
Aurangabad - 431136 Maharashtra, India.
Inventor
Mr Dnyanesh Kadam Mr Nilesh Dhamecha MrGopal Pedapalliker
The following specification particularly described the invention and the manner in which it is to be performed.
TECHNICAL FIELD
The present disclosure related to Automotive Electro-mechanical switch (RELAY) test system which, is generated by idea of integrating different relay testing stages in single stage automatic testing with-
a. All relay specification confirmation with Auto-stamping
b. Alternate Two Stage Testing
c. Enhanced Rejection Box system
BACKGROUND OF THE INVENTION
Automatic Relay test systems are perform very effectively in huge quantity with ensure quality of production before dispatch and to helps to built confidence for the required performance quality, which resulted in final product quality of OEM.
However available test system in market is dedicated to test one or more parameter of the relay, so to confirm the required parameter quality of relay testing is to carried out in muti-stages testing, this requires more man power, consumes lot of electricity, acquires more area of space in production cell.
To overcome from this multi-stage complex testing method idea is generated to integrate many stages into single stage which will reduce testing manpower, energy, and space.
SUMMARY OF THE INVENTION
During integration we have accommodated all 3 different testing stage hardware into single stage testing machine.
Regarding summery of machine working after integrated in single stage testing, to start testing user need to set Part Specification File (PSF) which is created by admin at once as per customer drawing specifications. This PSF's will available to operator in drop-down combo box list to select, to change or select this PSF user need to click on select button first then click on combo box to drop down list arrow, then click on running production part no PSF to load and then click on test button and this will be finish setting procedure at computer side on screen.
Selected part to be loaded into fixture to test and press cycle start button, which is sensed by micro-controller with, help of one or more optically isolated sensor. After getting this signal, Micro-Controller start to perform sequential parameter test which is described from testl to test 9.
During test each parameter data Micro-controller based control system collect by one or more analog input/output or digital input/output sensors and transmit to PC via serial com port. After getting this data by PC software module, it verifies that this actual value is within tolerance band width or not as per loaded PSF tolerance band width.
If received actual value by PC software module is found within spec then revert to Micro-controller based control system via serial com port with proceed to next test command and update respected spec value on monitor screen. This communication sequence will repeated between Micro-controller and PC software module till end of the specification list. After last spec confirmation PC sends tested OK command to Micro-controller based control system. Once received tested OK command Micro¬controller based control system declares that under test part is OK and provides OK quality mark with help of pen marking cylinder coil switching with visual and audio able indication to user.
If received actual value by PC software module is found out of specification then revert to Micro¬controller based control system via serial com port with test exit command. Update monitor screen value by changing color to RED with rejection pending screen blinking. So that Micro-controller based control system will exit from running test cycle. Declares under test part is NG with help of front panel mounted visual / audio able indication. Once declared NG part then set (ON) rejection box indication which indicates to user that rejection till not received and not allowed to next test cycle till not received with help of one or more analog input or digital input sensor. Once received this signal Micro-Controller based control system give acknowledgement to user by reset (OFF) rejection pending indication which mounted inside the rejection box.
BRIEF DESCRIPTION OF ACCOMPANYING DRAWINGS
The invention will now be described in relation to the accompanying drawing, in which:
Image M1 - illustrates background of invention in details by showing before multi-stage testing method by pictorial view, to overcome from this method shown claimed idea of integrating 3 different stages into single stage testing.
Image MOD-A2 - illustrates block diagram of Micro-Controller Based control system in which, we can see over all working flow of whole control system. Regarding to each module working role in control, we will discussed in part of detailed description.
Image MOD-A3 - illustrates block diagram of PC software module control system in which, we can see Run and Set mode block separately.
Image d1 - illustrates Front view of the invented testing machine system in which ,we can see visual indication from lnd-1 to lnd-6 , Power Switch-1, and buzzer indication on panel of machine. Monitor screen at top side, bottom side relay testing fixture as shown in image-d6 details.
Image d2 - illustrates Isometric view of the Invented relay testing machine in which, we can see at bottom of the right side provided rejection box interlocking system with way to put NG relay.
Image d3 - illustrates detailed left side view of the invented testing system.
Image d4 - illustrates detailed right side view of invented testing system.
Image d5 -illustrates main test page monitor screen in which, we can see at the top side of screen selected part no. of production to test. From the left side, in nearest portion 1 shown, actual measured reading fields like, Aging test, Diode Test, Start time test, Release time test, Pull ON voltage test, Coil Current Test, Coil resistance test, Drop off voltage test, contact current actual
value fields etc, after this from left side provided previous under test relay test measured for stagel & stage 2 separately. From the right side, in nearest portion 1 shown, Relay types selection and aging on off cycle setting menus for user. After this we can see Higher / lower limit fields and automatic set this all value accordingly selection of part specification file, and at the bottom side of screen provided testing productivity data counters to user.
Image d6 - illustrates mechanical fixture component details with tag numbering.
Image d7 - illustrates six direction 2D views. (Top, Bottom, Front, Back, Left & Right side view)
DETAILED DESCRIPTION
The present disclosure is related to Relay test system capable to ensure all majority of relay specification confirmation in 6 seconds max testing cycle time and provide one (Quality dot Mark) on part if passed in all specification as per loaded product specification profile (PSP) with lower-higher tolerance bandwidth to test, and which created by admin once with ref to customer drawing specification tolerance bandwidth. Once part is passed then alert to user for OK part to sorting, and if found NG then not only alert to user for NG part as well as interlock to accept next test cycle till ensure collection of that NG part with help of enhanced rejection box system.
Basically three different module is working to fulfilled above functionality:
Micro-controller based control system (MOD-A2) which, is collect all data during testing cycle with help of Testing fixture (Image-d6), one or more analog input/output or digital input/output sensors or actuators for below mentioned each test (Refer testl to test9) and send this data to PC software module (MOD-A3) via RS 232 comm port connection (COM-A) of PC to confirm tolerance bandwidth of actual data and update screen status with respected specification value and wait for PC decision reply to proceed or exit from running cycle.
During each testing cycle testing parameter sequence as followed by (MOD-A2) and (MOD-A3)
test1. Aging Test (Relay Coil ON/OFF test)
To ensure primary function of relay with user defined on/off cycle count and coil switching frequency. Used closed loop isolated ground detection method to sense relay contact ON status during test.
test2. Coil side short test.
To detect any type of shorting across relay coil for protect machine test system by using low voltage/ low current feedback method.
test3. Across relay coil diode test.
To ensure diode presence and assembly polarity across relay coil by using voltage drop sensing method according to type selected by user.
test4. Start /Release time of relay.
Customized Micro-controller logic to confirm used spring force specifications is ok or not.
tests. Relay Pull ON voltage (Contact ON voltage)
Used latest trend semiconductor chip to achieved electronic linear control to varies voltage across relay coil to detect accurate value of PV spec by gradually increasing coil voltage (OV to rated voltage) till contact make of under test relay.
test6. Relay Drop OFF voltage (Contact OFF voltage)
Used latest trend semiconductor chip to achieved electronic linear control to varies voltage across relay coil to detect accurate value of DV spec by gradually decreasing coil voltage (rated voltage to OV) till contact break of under test relay.
test7. Coil Current Test
Used current sensing method to ensure coil winding data of under test relay and to achieved this measurement test accuracy used latest trend single semiconductor chip for instrument-ion amplifier.
test8. Coil Resistance Test
On basis of coil current measurement calculate coil resistance by using standard formula (R=V/I).
test9. Contact Current Test (By Aging Test)
To ensure contact and surrounding surface area cleanness by passing 10A current through contact and prevent discontinuity due to forien (burr or dust) particles which burnt by arc generation during current passing test.
PC software module (MOD-A3) which, compare each parameter actual data with respected higher and lower limit bandwidth as per user loaded Part Specification File to test. After this comparison, if specification is passed then it gives confirmation to Micro-controller based control system (MOD-A2) by proceed to next test command, and if specification is found failed then confirmation with test exit command.
Fixture module (Image-d6) which, help to clamp part and creates connectivity between pogo pins connections and under test relay terminals. And provide auto test pass OK mark on part with help of pneumatic during testing.
CLAIM :-
1. Fixture design for alternate two stage testing which increased testing
productivity by (10-15%)
2. Rejection Bin system (MOD-A4) with interlocking'to next cycle till not collect
NG part which helps to avoid NG part mixing in any how condition. This system is
very useful where only manual loading / unloading is followed in testing system.
3. MCU (Microchip-PIC)Based Relay Testing Controller (MOD-A2) with
3a. All majority parameter confirmation with auto-stamping. (OK mark on part).
3b. Contact Test Current - 10A (Resistive)
3c. With used advanced chip to achieved required test procedure/methods.
3d. Testing facility for types of 20A family relay included into this test machine.
3e. 9 types different parameter test facility (as per testl to test9)
3f. Any casual person can operate due user friendly machine Operation.
3g. Using advance semiconductor chip to built machine hardware.
3h. Total test cycle time : 6~7 sec.
3i. Testing productivity : 3800~4000 nos/ shift.
3j. Very helpful system to define or control or maintain one or more process one or more specification on basis of relay specification wise productivity counter data.
4. List of some new features or improvements which we can add-on in future with mentioned idea in technical field of this disclosure.
4a. We can improve PC software module (MOD-A3) using vb.net development environment.
4b. We can implement live testing data storage for analysis purpose.
4c. We can generate report day, month, year wise on basis of testing data storage.
4d. We can live monitor all testing data or testing productivity counters from any remote location.
4e. We can to define or control or maintain one or more process one or more specification on basis of live data monitoring.
4f. We can live chatting with operator to put your suggestion to correct production quality.
4g. We can improve machine performance using different controller platform (MOD-A2) like 8051, Aurduino, Free-scale, Raspberry Pi, and Beagle-bone etc.
4h. If we will used Raspberry Pi or Beagle bone based controller platform (MOD-A2) with stand alone TFT with touch screen then we can eliminate desktop computer requirement in machine.
| # | Name | Date |
|---|---|---|
| 1 | 201621009469-Other Patent Document-100217.pdf | 2018-08-11 |
| 2 | 201621009469-Form 2(Title Page)-180316.pdf | 2018-08-11 |
| 3 | 201621009469-Form 2(Title Page)-100217.pdf | 2018-08-11 |
| 4 | 201621009469-Form 1-180316.pdf | 2018-08-11 |
| 5 | 201621009469-Drawing-100217.pdf | 2018-08-11 |
| 6 | 201621009469-Description(Complete)-100217.pdf | 2018-08-11 |
| 7 | 201621009469-Claims-100217.pdf | 2018-08-11 |
| 8 | 201621009469-Abstract-100217.pdf | 2018-08-11 |
| 9 | Abstract1.jpg | 2019-08-19 |
| 10 | 201621009469-Form 2-100217.pdf | 2019-08-19 |
| 11 | 201621009469-Form 18-170120.pdf | 2020-01-18 |
| 12 | 201621009469-Form 3-020621.pdf | 2021-10-18 |
| 13 | 201621009469-Form 2(Title Page)-020621.pdf | 2021-10-18 |
| 14 | 201621009469-FER.pdf | 2021-10-18 |
| 15 | 201621009469-Examination Report Reply Recieved-020621.pdf | 2021-10-18 |
| 16 | 201621009469-Drawing-020621.pdf | 2021-10-18 |
| 17 | 201621009469-Claims-020621.pdf | 2021-10-18 |
| 18 | 201621009469-Amended Pages Of Specification-020621.pdf | 2021-10-18 |
| 19 | 201621009469-Abstract-020621.pdf | 2021-10-18 |
| 20 | 201621009469-US(14)-HearingNotice-(HearingDate-02-04-2024).pdf | 2024-03-22 |
| 21 | 201621009469-Correspondence-010424.pdf | 2024-04-03 |
| 22 | 201621009469-Reply To Hearing-030524.pdf | 2024-05-06 |
| 23 | 201621009469-Form 2(Title Page)-030524.pdf | 2024-05-06 |
| 24 | 201621009469-Drawing-030524.pdf | 2024-05-06 |
| 25 | 201621009469-Claims-030524.pdf | 2024-05-06 |
| 26 | 201621009469-Amended Pages Of Specification-030524.pdf | 2024-05-06 |
| 27 | 201621009469-Abstract-030524.pdf | 2024-05-06 |
| 28 | 201621009469-US(14)-ExtendedHearingNotice-(HearingDate-01-08-2024).pdf | 2024-06-21 |
| 29 | 201621009469-Correspondence-150724.pdf | 2024-07-24 |
| 30 | 201621009469-REPLY TO HEARING-190824.pdf | 2024-08-21 |
| 31 | 201621009469-MARKED COPY-190824.pdf | 2024-08-21 |
| 32 | 201621009469-Form 2(Title Page)-190824.pdf | 2024-08-21 |
| 33 | 201621009469-Drawing-190824.pdf | 2024-08-21 |
| 34 | 201621009469-Claims-190824.pdf | 2024-08-21 |
| 35 | 201621009469-Amended Pages Of Specification-190824.pdf | 2024-08-21 |
| 36 | 201621009469-Abstract-190824.pdf | 2024-08-21 |
| 37 | 201621009469-PatentCertificate08-10-2024.pdf | 2024-10-08 |
| 38 | 201621009469-IntimationOfGrant08-10-2024.pdf | 2024-10-08 |
| 39 | 552077-FORM 30-291124.pdf | 2024-12-04 |
| 40 | 201621009469-Form 13-130125.pdf | 2025-01-29 |
| 1 | 2021-03-2612-02-38E_26-03-2021.pdf |