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"Dust Test Apparatus And Method For Electronic Instrument"
Abstract: A dust test apparatus includes a case in which dust is enclosed, a mounting table for disposing the electronic instrument in the case, a first ventilator for scattering the dust throughout the case for a first period, and a second ventilator for blowing off the dust attached to a vent hole of the electronic instrument for a second period longer than the first period. The dust with which the vent hole has been clogged is blown off periodically. Thereby, it is possible to continue a test without completely clogging the vent hole in an early stage after the test is initiated. Thus, it is possible to properly reproduce the state where the dust is attached to the vent hole after long-term use.
Notices, Deadlines & Correspondence
Patent Information
Applicants
SONY CORPORATION
Inventors
1. AKIHIRO TAKEDA
2. TAKASHI SONEHARA
3. KOUJI SONEHARA
4. TOSHIO OGUCHI
5. YOSHIMASA FURUTA
6. TAKASHI URASHIMA
7. YASUHIRO UMIGUCHI
8. TAKAFUMI KASAI
Specification
Documents
Application Documents
| # | Name | Date |
|---|---|---|
| 1 | 1543-del-2011-GPA.pdf | 2012-02-15 |
| 2 | 1543-del-2011-Form-5.pdf | 2012-02-15 |
| 3 | 1543-del-2011-Form-3.pdf | 2012-02-15 |
| 4 | 1543-del-2011-Form-2.pdf | 2012-02-15 |
| 5 | 1543-del-2011-Form-1.pdf | 2012-02-15 |
| 6 | 1543-del-2011-Drawings.pdf | 2012-02-15 |
| 7 | 1543-del-2011-Description (Complete).pdf | 2012-02-15 |
| 8 | 1543-del-2011-Correspondence-others.pdf | 2012-02-15 |
| 9 | 1543-del-2011-Claims.pdf | 2012-02-15 |
| 10 | 1543-del-2011-Abstract.pdf | 2012-02-15 |