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"Inspection Device And Inspection Method"
Abstract: Disclosed herein is an inspection device including: a grid pattern projection- section adapted to project a grid pattern onto a target; a grid pattern shifting section adapted to shift the grid pattern projected onto the target; an imaging section adapted to image the target; and a control section adapted to determine whether to classify the inspection area of interest as a two-dimensional or three-dimensional inspection area, to image the inspection area of interest at least once with the imaging section and inspect the two-dimensional shape based on a captured image, to image the inspection area of interest a plurality of times with the imaging section while at the same time projecting a grid pattern with the grid pattern projection section and shifting the position where the grid pattern is projected with the grid pattern shifting section and inspect the three-dimensional shape based on captured images.
Notices, Deadlines & Correspondence
Patent Information
Applicants
SONY CORPORATION
Inventors
1. HIROMU ONISHI
Specification
NA
Documents
Application Documents
| # | Name | Date |
|---|---|---|
| 1 | 1178-del-2011-GPA.pdf | 2011-12-22 |
| 2 | 1178-del-2011-Form-5.pdf | 2011-12-22 |
| 3 | 1178-del-2011-Form-3.pdf | 2011-12-22 |
| 4 | 1178-del-2011-Form-2.pdf | 2011-12-22 |
| 5 | 1178-del-2011-Form-1.pdf | 2011-12-22 |
| 6 | 1178-del-2011-Drawings.pdf | 2011-12-22 |
| 7 | 1178-del-2011-Description (Complete).pdf | 2011-12-22 |
| 8 | 1178-del-2011-Correspodence Others.pdf | 2011-12-22 |
| 9 | 1178-del-2011-Claims.pdf | 2011-12-22 |
| 10 | 1178-del-2011-Abstract.pdf | 2011-12-22 |
| 11 | 1178-DEL-2011-FER.pdf | 2018-03-21 |
| 12 | 1178-DEL-2011-AbandonedLetter.pdf | 2019-01-21 |
Search Strategy
| 1 | 1178DEL2011table1_06-11-2017.PDF |