Claims:

1. A jig (10) for a bi-axial testing apparatus, the jig (10) comprising:
a pair of jig brackets (1a and 1b) movably connectable to each other;
an insulator block (2a) provided in opposing surface of each of the pair of jig brackets (1a and 1b); and
a conductive block (3) accommodated in a slot (11) defined in the insulator block (2a) provided in one of the pair of jig brackets (1a and 1b), the conductive block (3) is defined with an extension (3a) extending through the insulator block (2a) and one of the pair of jig brackets (1a and 1b), wherein the extension (3a) is configured to form an electrical contact with an external power source,
wherein, the jig (10) is configured to grip an arm of a cruciform specimen (101) and the conductive block (3) of the jig (10) is configured to resistively heat the cruciform specimen (101) during biaxial testing.

2. The jig (10) as claimed in claim 1, wherein the pair of jig brackets (1a and 1b) includes a L-grip (1a) and a flat grip (1b).

3. The jig (10) as claimed in claim 2, wherein the L-grip (1a) is defined with a threaded hole (6) to assemble the jig (10) to the bi-axial testing apparatus (100).

4. The jig (10) as claimed in claim 1, wherein a provision (7) defined in the pair of jig brackets (1a and 1b) is a cavity (7) and the insulator block (2a) is flush fitted into the cavity.

5. The jig (10) as claimed in claim 1 and 4, wherein depth of the slot (7) is lower than the thickness of the insulator block (2a).

6. The jig (10) as claimed in claim 1, wherein the jig brackets (1a and 1b) is defined with one or more bolt holes (8) and tap holes (2d).

7. The jig (10) as claimed in claim 1 comprises an insulator cover (2b) provided on the insulator block (2a).

8. The jig (10) as claimed in claim 7, wherein the insulator cover (2b) is integrally defined with the insulator block (2a).

9. The jig (10) as claimed in claim 1, wherein the insulator block (2a) is accommodated in a provision defined in each jig bracket of the pair of jig brackets (1a and 1b)

10. The jig (10) as claimed in claim 1, wherein the insulator block (2a) is defined with a cylindrical extension (2c) at a substantially central portion of the insulator block (2a), the cylindrical extension (2c) is defined with a through hole which is configured to accommodate the extension (3a) of the conductive block (3).

11. The jig (10) as claimed in claim 10, wherein the cylindrical extension (2c) is structured to provide insulation between the extension (3a) defined on the conductive block (3) and the pair of jig brackets (1a and 1b).

12. The jig (10) as claimed in claim 7, wherein the insulator cover (2b) is structured to provide electrical insulation between the cruciform specimen (101) and the pair of jig brackets (1a and 1b).

13. The jig (1) as claimed in claim 1, wherein the conductive block (3) comprises a conductive grip (3b) and the cylindrical extension (3a) extending from substantially central portion of the conductive grip (3b).

14. The jig (1) as claimed in claim 13, wherein the conductive grip (3b) is defined with one or more dowel pin holes (3c).

15. The jig (1) as claimed in claim 14, wherein the dowel pin holes (3c) is structured to receive dowel pins to support the cruciform specimen (101) in the jig (10).

16. A bi-axial testing apparatus (100) comprising:
a base;
at least one actuator positioned on a cruciform track defined on the base; and
a plurality of jigs (10), wherein each jig of the plurality of jigs (10) is connectable to the at least one actuator, one or more jigs of the plurality of jigs (10) comprises:
a pair of jig brackets (1a and 1b) movably connectable to each other;
an insulator block (2a) provided in opposing surface of each of the pair of jig brackets (1a and 1b); and
a conductive block (3) accommodated in a provision defined in the insulator block (2a) provided in one of the pair of jig brackets (1a and 1b), the conductive block (3) is defined with an extension (3a) extending through the insulator block (2a) and one of the pair of jig brackets (1a and 1b), wherein the extension (3a) is configured to form an electrical contact with an external power source,
wherein, the jig (10) is configured to grip an arm of a cruciform specimen (101) and the conductive block (3) of the jig (10) is configured to resistively heat the cruciform specimen (101) during biaxial testing.

17. The apparatus (100) as claimed in claim 16 comprises a load cell (LC) associated with the at least one of the actuators.

18. The apparatus (100) as claimed in claim 17, wherein the load cell (LC) is communicatively coupled to a processing module (PM) associated with the apparatus (100), the processing module (PM) is communicatively coupled to a control module (CM), the control module (CM) is configured to receive signals corresponding to at least one of loading and strain measurement from the processing module (PM) and subsequently generate forming limit diagram (FLD) during biaxial testing.

19. The apparatus (100) as claimed in claim 18 comprises a display unit (D) associated with the control module (CM), wherein the control module (CM) is configured display the FLD through the display unit (D).

20. A method for conducting a bi-axial testing on a cruciform specimen, the method comprising:
securing each arms of the cruciform specimen (101) to one of the plurality of jigs (10) provided in the bi-axial testing apparatus (100), wherein, each of the plurality of jigs (10) is configured to grip a cruciform specimen (101) resistively heat the cruciform specimen (101) during biaxial testing;
actuating, by a control module (CM), each jig of the plurality of jigs (10), wherein actuating the at least one actuator displaces each jig of plurality of jigs (10) in respective axes and imparts axial load on the cruciform specimen (101),
wherein a processing module (PM) communicatively coupled to a load cell which associated the bi-axial testing apparatus (100) is configured to process signals corresponding to at least one of the loading and strain measurement from the at least one actuator received from the load cell and send the processed signals to a control module (CM) and subsequently generate forming limit diagram (FLD) during biaxial testing.

21. The method as claimed in claim 20, wherein the control module (CM) is configured display the FLD through the display unit (D).
, Description:TECHNICAL FIELD
[0001] Present disclosure relates in general to a field of testing apparatus. Particularly, but not exclusively, the present disclosure relates to a bi-axial testing apparatus. Further embodiments of the present disclosure disclose a configuration of a jig for the bi-axial testing apparatus.
BACKGROUND

[0002] Sheet metals are generally manufactured by processing or rolling metallic slabs. Metallic slabs may be manufactured by processes such as casting including but not limiting to continuous casting, and then the metal is formed into various shapes depending on the application. One such application is converting metallic slabs into sheet metal by series of metal forming processes. During forming of the metallic sheet from metallic slabs, processes such as hot rolling and cold rolling are carried out.
[0003] Generally, hot rolling may be performed in a Hot Strip Mill (HSM). The primary objective of HSM is to make sheets from slabs and acquire intended properties in the sheets. The sheets may be used for producing various products like cutting saws, automotive structural parts, body panels and other components driven and disc plate, gardening tools, surgical blade, springs, measuring devices. Similarly, the cold rolled steel sheets are used in automotive skin panels, white good appliances etc., Said products are formed after performing necessary test on the steel sheets for successful stamping process, which is normally performed at room temperature. However, the stamping at elevated temperatures is also performed on difficult to form grades and also to avoid formability issues. Initial testing of the sheets requires generation of advanced material properties testing.
[0004] Before processing the sheet metal into the required product as described above, the sheet metal may be tested for various mechanical properties including tensile test, elongation test, etc. A bi-axial tensile test is one such test carried out on the sheet metal for recording various stress and strain paths, which in turn is used to develop forming limit diagram (FLD). The bi-axial tensile test is conducted to understand the plastic behavior of the sheet metal under these stress and strain paths and to design the formed component accordingly. Various tests are performed to evaluate constitutive parameters for various material models required for forming load prediction in press shop, strain distribution in various components during forming processes, necking, failure prediction and accurate prediction of spring back. Specifically, plastic anisotropy of sheet metals could influence forming processes and related defects. Generally, the FLD generation is common practice at room temperatures, however following the increased demand of hot stamping applications, the generation of FLD elevated temperature is required. For the purpose, a cruciform shaped sample is cut from the formed sheet metal and is heated up to elevated temperatures in a furnace before conducting the test. The process involves shifting the sample from furnace to bi-axial test setup, thus leading to drop of temperature levels. Hence, it becomes very difficult to maintain the sample at the desired levels. The drop-in temperatures will affect the bi-axial testing of the specimen and also may lead to inaccurate forming limit diagram generation which is not desirable.
[0005] The present disclosure is directed to overcome one or more limitations stated above or any other limitations associated with the conventional arts using an inbuilt insulator cum conducting grip arrangement in a standard bi-axial testing equipment. This avoids the complicated arrangements in existing practices for achieving the same.

SUMMARY OF THE DISCLOSURE

[0006] One or more shortcomings of the conventional arts are overcome by an apparatus and a method as claimed and additional advantages are provided through the provision of system and method as claimed in the present disclosure.
[0007] Additional features and advantages are realized through the techniques of the present disclosure. Other embodiments and aspects of the disclosure are described in detail herein and are considered a part of the claimed disclosure.
[0008] In one non-limiting embodiment of the disclosure, a jig for a bi-axial testing apparatus is disclosed. The jig includes a pair of jig brackets movably connectable to each other. An insulator block is provided in opposing surface of each of the pair of jig brackets. The jig further includes a conductive block accommodated in a provision defined in the insulator block provided in one of the pair of jig brackets. The conductive block is defined with an extension extending through the insulator block and one of the pair of jig brackets, wherein the extension is configured to form an electrical contact with an external power source. The jig is configured to grip an arm of cruciform specimen and the conductive block of the jig is configured to resistively heat the cruciform specimen during bi-axial testing.
[0009] In an embodiment of the disclosure, the pair of jig brackets includes a L-grip and a flat grip. The L-block is defined with a threaded hole to assemble the jig to the bi-axial testing apparatus.
[0010] In an embodiment of the disclosure, the provision defined in the pair of jig brackets is a cavity, and the insulator block is flush fitted into the slot. Further, depth of the slot is lower than the thickness of the insulator
[0011] In an embodiment of the disclosure, the jig brackets are defined with one or more bolt holes and tap holes.
[0012] In an embodiment of the disclosure, the jig comprises an insulator cover provided on the insulator block. The insulator cover is integrally defined with the insulator block. The insulator block is accommodated in a provision defined in each jig bracket of the pair of jig brackets. The insulator block is defined with a cylindrical extension at a substantially central portion of the conductive block. The cylindrical extension is defined with a through hole which is configured to accommodate the extension of the conductive block. The cylindrical extension is structured to provide insulation between extension defined on the conductive block and the pair of jig brackets.
[0013] In an embodiment of the disclosure, the insulator cover is structured to provide electrical insulation between the cruciform specimen and the pair of jig brackets.
[0014] In an embodiment of the disclosure, the conductive block comprises a conductive grip and the cylindrical extension extending from substantially central portion of the conductive grip. The conductive grip is defined with one or more dowel pin holes. The dowel pin holes are structured to receive dowel pins to support cruciform specimen.
[0015] In yet another non-limiting embodiment of the disclosure, a bi-axial testing apparatus is disclosed. The bi-axial testing apparatus includes a base, at least one actuator positioned on a cruciform track defined on the base. The apparatus includes a plurality of jigs, each jig of the plurality of jigs connectable to the at least one actuator. The one or more jigs of the plurality of jigs include a pair of jig brackets movably connectable to each other. An insulator block is provided in opposing surface of each of the pair of jig brackets. The jig further includes a conductive block accommodated in a provision defined in the insulator block provided in one of the pair of jig brackets. The conductive block is defined with an extension extending through the insulator block and one of the pair of jig brackets, wherein the extension is configured to form an electrical contact with an external power source. The jig is configured to grip an arm of cruciform specimen and the conductive block of the jig is configured to resistively heat the cruciform specimen during bi-axial testing.
[0016] In an embodiment of the disclosure, wherein the load cell is communicatively to a processing module associated with the apparatus. The processing module is communicatively coupled to a control module, the control module is configured to receive signals corresponding to at least one of loading and strain measurements from the processing module and subsequently generate forming limit diagram during biaxial testing.
[0017] In yet another non-limiting embodiment of the disclosure, a method for conducting a bi-axial testing on a cruciform specimen is disclosed. The method includes securing each arms of the cruciform specimen to one of the plurality of jigs provided in the bi-axial testing apparatus. Each of the plurality of jigs is configured to grip a cruciform specimen and resistively heat the cruciform specimen during biaxial testing. The method further includes steps of actuating by a control module, each jig of the plurality of jigs., wherein actuating the at least one actuator displaces each jig of plurality of jigs in respective axes and imparts axial load on the cruciform specimen. wherein a processing module (PM) communicatively coupled to a load cell which associated the bi-axial testing apparatus (100) is configured to process signals corresponding to at least one of the loading and strain measurement from the at least one actuator received from the load cell and send the processed signals to a control module (CM) and subsequently generate forming limit diagram (FLD) during biaxial testing.
[0018] It is to be understood that the aspects and embodiments of the disclosure described above may be used in any combination with each other. Several of the aspects and embodiments may be combined to form a further embodiment of the disclosure.
[0019] The foregoing summary is illustrative only and is not intended to be in any way limiting. In addition to the illustrative aspects, embodiments, and features described above, further aspects, embodiments, and features will become apparent by reference to the drawings and the following detailed description.
BRIEF DESCRIPTION OF THE ACCOMPANYING FIGURES

[0020] The novel features and characteristics of the disclosure are set forth in the appended claims. The disclosure itself, however, as well as a preferred mode of use, further objectives, and advantages thereof, will best be understood by reference to the following detailed description of an illustrative embodiment when read in conjunction with the accompanying figures. One or more embodiments are now described, by way of example only, with reference to the accompanying figures wherein like reference numerals represent like elements and in which:
[0021] FIG.1a illustrates a schematic view of a bi-axial testing apparatus including one or more jigs, in accordance with an embodiment of the present disclosure;
[0022] FIG.1b illustrates a schematic side view of the bi-axial testing apparatus of FIG.1a;
[0023] FIG.2 is an exploded view of one jig of the one or more jigs used in the bi-axial testing apparatus of FIG.1, in accordance with an embodiment of the present disclosure;
[0024] FIG.3 illustrates a schematic view of the jig of FIG. 2 in assembled condition;
[0025] FIGS.4a and 4b illustrates a schematic view of the pair of jig brackets of the jig of FIG. 2, in accordance with an embodiment of the present disclosure;
[0026] FIG.5 illustrates a schematic view of an insulator block used in the jig of FIG. 2, in accordance with an embodiment of the present disclosure; and
[0027] FIG.6 illustrates a schematic view of a conductive block used in the jig of FIG. 2, in accordance with an embodiment of the present disclosure.
[0028] The figures depict embodiments of the disclosure for purposes of illustration only. One skilled in the art will readily recognize from the following description that alternative embodiments of the structures and methods illustrated herein may be employed without departing from the principles of the disclosure described herein.
DETAILED DESCRIPTION

[0029] The foregoing has broadly outlined the features and technical advantages of the present disclosure in order that the detailed description of the disclosure that follows may be better understood. Additional features and advantages of the disclosure will be described hereinafter which form the subject of the claims of the disclosure. It should be appreciated by those skilled in the art that the conception and specific embodiments disclosed may be readily utilized as a basis for modifying or designing other structures for carrying out the same purposes of the present disclosure. It should also be realized by those skilled in the art that such equivalent processes do not depart from the scope of the disclosure as set forth in the appended claims. The novel features which are believed to be characteristics of the disclosure, both as to its organization and method of operation, together with further objects and advantages will be better understood from the following description when considered in connection with the accompanying figures. It is to be expressly understood, however, that each of the figures is provided for the purpose of illustration and description only and is not intended as a definition of the limits of the present disclosure. It will be readily understood that the aspects of the present disclosure, as generally described herein, and illustrated in the figures, can be arranged, substituted, combined, and designed in a wide variety of different configurations, all of which are explicitly contemplated and make part of this disclosure.
[0030] Embodiments of the present disclosure discloses a jig for a bi-axial testing apparatus. The jig according to the present disclosure ensures better gripping of a cruciform specimen. The jig according to the present disclosure may be configured to resistively heat the cruciform specimen to hot stamping condition during the bi-axial testing. The jig may be configured to directly supply the electric power to the cruciform specimen through its arms thereby achieving the joule heating at the center of the suitably designed sample. The biaxial testing apparatus may include a plurality of jigs which are connectable to at least one actuator positioned on a cruciform track defined on the base. Each jig of the plurality of jigs includes a pair of jig brackets movably connectable to each other. The pair of jig brackets may include a L-grip and a flat grip. In an embodiment, the L-grip is defined with a threaded hole to assemble the jig to the bi-axial testing apparatus. The pair of jig brackets is defined with a provision such as a cavity. The provision defined on the pair of jig brackets may be configured to accommodate an insulator block. In an embodiment, the insulator block may be provided in opposing surface of each of the pair of jig brackets and the insulator block may be flush fitted into the cavity. In some embodiments, the depth of the slot may be lower than the thickness of the insulator block to ensure ease of assembling. The insulator block is defined with an insulator cover and the insulator cover may be integrally defined with the insulator block. The insulator cover is structured to provide electrical insulation between the extension of the cruciform specimen and the pair of jig brackets. The insulator block is defined with a cylindrical extension at a substantially central portion and a through hole is defined through the cylindrical extension.
[0031] Further, the insulator block may be defined with a provision which may be configured to accommodate a conductive block. In an embodiment, the conductive block may be accommodated in both the insulator blocks provided in the opposing faces of the pair of jig brackets or may be provided within one of the insulator blocks. The conductive block comprises a conductive grip and a cylindrical extension extending from substantially central portion of the conductive grip. The extension extends through the cylindrical extension of the insulator block and one of the pair of the jig brackets. The extension is configured to form an electrical contact with an external power source. The cylindrical extension may be structured to provide insulation between the extension defined on the conductive block and the pair of jig brackets. Further, the conductive grip of the conductive block is defined with one or more dowel pin holes which may be structured to receive dowel pins to support the cruciform specimen in the jig. The jig as described above is configured to grip an arm and the conductive block is configured to resistively heat the cruciform specimen during bi-axial testing. In an embodiment, a load cell may be associated with the at least one of the actuators and may be communicatively coupled to a processing module associated with the biaxial testing apparatus. The processing module receives signals corresponding to load along with strain measurement data and sends the processed signals to a control module. The control module is configured to receive signals corresponding to loading along with strain measurement data from the processing module and subsequently generate forming limit diagram [FLD] during bi-axial testing. In an embodiment, a display unit which may be associated with the control module is configured to display the FLD through the display unit. In an embodiment, the display unit may be an individual display unit or may be a display unit integrated with the processing module or control module such as laptop.
[0032] The terms “comprises…. a”, “comprising”, or any other variations thereof used in the specification, are intended to cover non-exclusive inclusions, such that system that comprises a list of components or steps does not include only those components or steps but may include other components or steps not expressly listed or inherent to such setup or method. In other words, one or more elements in the system proceeded by “comprises… a” does not, without more constraints, preclude the existence of other elements or additional elements in the assembly.
[0033] Henceforth, the present disclosure is explained with the help of one or more figures of exemplary embodiments. However, such exemplary embodiments should not be construed as limitation of the present disclosure.
[0034] The following paragraphs describe the present disclosure with reference to FIG(s) 1a to 6. In the figures, the same element or elements which have similar functions are indicated by the same reference signs. For the purposes of promoting an understanding of the principles of the disclosure, reference will now be made to specific embodiments illustrated in the drawings and specific language will be used to describe the same. It will nevertheless be understood that no limitation of the scope of the disclosure is thereby intended, such alterations and further modifications in the illustrated methods, and such further applications of the principles of the invention as illustrated therein being contemplated as would normally occur to one skilled in the art to which the invention pertains.
[0035] The following detailed description is merely exemplary in nature and is not intended to limit application and uses. Furthermore, there is no intention to be bound by any theory presented in the preceding background or summary or the following detailed description. It is to be understood that the disclosure may assume various alternative orientations and step sequences, except where expressly specified to the contrary. It is also to be understood that the specific devices or components illustrated in the attached drawings and described in the following specification are simply exemplary embodiments of the inventive concepts defined in the appended claims. Hereinafter, preferred embodiments of the present disclosure will be described referring to the accompanying drawings. While some specific terms directed to a specific direction will be used, the purpose of usage of these terms or words is merely to facilitate understanding of the present disclosure referring to the drawings. Accordingly, it should be noted that the meanings of these terms or words should not improperly limit the technical scope of the present disclosure.
[0036] FIG.1a and 1b is an exemplary embodiment of the present disclosure, illustrating a biaxial testing apparatus that may be configured to perform testing such as tensile test by stretching a cross-shaped test specimen in four directions along two axes perpendicular to each other. The biaxial testing apparatus is depicted by referral numeral “100” in the corresponding figures. The cross shaped test specimen may hereinafter be referred to as a cruciform specimen depicted by (101) in the corresponding figures. In an embodiment, the bi-axial testing apparatus (100) may be independent functioning apparatus having in-built actuators and load sensors. In some embodiments, the bi-axial testing apparatus (100) may be used by assembling the apparatus to an axial tensile testing device but not limiting to the same. In an embodiment, the biaxial testing apparatus (100) may be defined with a base (not shown). The base of the biaxial testing apparatus (100) may be defined with a track along a major surface of the base in a cruciform shape. That is the track may be cross shaped along two axes perpendicular to each other. Each end of the track may be coupled with at least one actuator. The at least one actuator may be coupled to respective jigs of a plurality of jigs (10). Each actuator may be configured to pull the respective jig of the plurality of jigs (10) towards the actuator along the respective axes
[0037] Each jig of the plurality of jigs (10) according to embodiments of the present disclosure may be designed to significantly improve gripping of the cruciform specimen (101). Also, the jig (10) is structured to resistively heat the cruciform specimen (101) to hot stamping conditions. The configuration of the jig (10) will be elucidated in detail hereinafter. As apparent from FIG.2, the jig (10) includes one or more components which will be in detail explained with respective diagrams. The jig (10) may include one or more functional components including a pair of jig brackets, securing pins, securing bolts/nuts, and the like. Hereinafter, the configuration of the jig (10) may be explained with the aid of FIG(s) 3 to 6.
[0038] As apparent from FIG.2, the jig (10) may among other components include the pair of jig brackets (1a, 1b), an insulator block (2a), a conductive block (3) and the like. The configuration of each component may be elucidated further reference to FIG.3 and FIG(s) 4a and 4b, which illustrate the pair of jig brackets (1a and 1b) for the jig (10). The pair of jig brackets (1a and 1b) may be movably connected and structured to move relative to each other in the jig (10). The pair of jig brackets (1a and 1b) may be made of metallic material such as but not limiting to steel. In an embodiment, the pair of jig brackets (1a and 1b) may include a L-grip (1a) and a flat grip (1b). The L-grip (1a) of the pair of grips (1a and 1b) may be defined with a threaded hole (6). The threaded hole (6) in the L-grip (1a) may be designed to enable the pair of grips (1a and 1b) to be connected to the bi-axial testing apparatus (100). In another embodiment, the pair of jig brackets (1a and 1b) each may be defined with a provision (7). The provision (7) may be defined on the opposing major surface of the pair of jig brackets (1a and 1b). That is the provision (7) is defined on the major surface (7a) of the L-grip (1a) and on the major surface (7b) of the flat-grip (1b) [refer FIG.4a and FIG.4b]. In an embodiment, the provision (7) may be a cavity and may be trapezoidal in shape but not limiting to the same. Further, a substantially central portion of the provision (7) in each of the pair of jig brackets (1a and 1b) may be defined with a through hole [TH] and the purpose of which may be elucidated in forthcoming embodiments of the present disclosure. Further, the pair of jig brackets (1a and 1b) may be defined with one or more bolt holes (8) and tap holes (2d). The one or more bolt holes (8) and the tap holes (2d) may facilitate the engagement and disengagement of each of the pair of jig brackets (1a and 1b) relative to each other.
[0039] Referring to FIG.5, which illustrates the insulator block (2a) assembled in each of the pair of jig brackets (1a and 1b). In an embodiment, the insulator block (2a) provided in opposing surface of each of the pair of jig brackets (1a and 1b). The provision (7) defined in the pair of jig brackets (1a and 1b) may be configured to accommodate the insulator block (2a). In an embodiment, the depth of the provision (7) may correspond to the thickness of the insulator block (2a). In this case, the insulator block (2a) may be flush fitted into the provisions defined in each of the pair of jig brackets (1a and 1b). In some embodiments, the depth of the provision (7) may be lower than the thickness of the insulator block (2a) and this aids in ease of assembling of the insulator block (2a) to each of the pair of jig brackets (1a and 1b). The insulator block (2a) may be ingressed into the provision (7) defined in each of the pair of jig brackets (1a and 1b). Further, an insulator cover (2b) may be provided along the insulator block (2a). In an embodiment, the insulator cover (2b) may be integrally defined with the insulator block (2a). In another embodiment, the insulator cover (2b) may be assembled on the insulator block (2a) at a predefined position by at least one of mechanical joining or thermal joining methods. The insulator cover (2b) may be structured to provide electrical insulation to each of the pair of jig brackets (1a and 1b).
[0040] As evident from FIG.5, the insulator block (2a) may be defined with a slot (11) on one of the major surface and a cylindrical extension (2c) at a substantially central portion of other major surface. The slot (11) may extend up to a pre-determined depth from the one of the major surface of the insulator block (2a). Further, the cylindrical extension (2c) may be defined with a through hole which may extend to the entire length of the cylindrical extension (2c). In an embodiment, the cylindrical extension (2c) of the insulator block (2a) may be accommodated in the through hole defined on the pair of jig brackets (1a and 1b) when assembled. Also, the cylindrical extension (2c) may extend beyond the pair of jig brackets (1a and 1b) through the through hole defined in the pair of jig brackets (1a and 1b). In an embodiment, the insulator block (2a) may be made of materials such as epoxy resin and the like.
[0041] As described above, the insulator block (2a) may be configured to accommodate a conductive block (3). In an embodiment, the conductive block (3) may be accommodated in the slot (11) defined in the insulator block (2a). Referring to FIG.6, which depicts an exemplary schematic view of the conductive block (3). In an embodiment, the conductive block (3) may be made of electrically conductive materials such as copper, aluminum, and the like. The conductive block (3) may be defined comprise a conductive grip (3b) and an extension (3a) that may extend from a substantially central portion of the conductive grip (3b). The conductive grip (3b) may be accommodated in the slot (11) defined in the insulator block (2a), and the extension defined on the conductive grip (3b) may be configured to be inserted through the cylindrical extension (2c) defined on the insulator block (2a). The cylindrical extension (3a) may be configured to provide insulation between the extension (3a) defined on the conductive grip (3b) of the conductive block (3) and the pair of jig brackets (1a and 1b) when assembled to form the jig (10). In some embodiments, the conductive grip (3b) may be defined with one or more dowel pin holes (3c). The one or more dowel pin holes (3c) may be structured to receive dowel pins. Hereinafter, the assembly procedure of the above-described components will be elucidated.
[0042] The assembly of the above-described components may be initiated by securing the L-grip (1a) of the pair of jigs (1a and 1b) to the bi-axial testing apparatus (100) via the threaded hole (6). The mechanism is independent of the bi-axial testing apparatus (100) and may be varied to suit the assembly requirement. Further, the insulator block (2a) is fitted in the provision (7) defined in the L-grip (1a). The cylindrical extension (2c) may be ingressed through the through hole defined in the L-grip (1a) of the pair of grips (1a and 1b). Once the insulator block (2a) is secured to the L-grip (1a), the insulator cover (2b) may be fitted onto the L-grip (1a) in case the insulator cover (2b) is manufactured separately. Further, the conductive block (3) may be ingressed into the slot (11) defined in the insulator block (2a). The extension (3a) may be ingressed through the cylindrical extension (2c) by positioning the conductive block (3) in a suitable position. Further, dowel pins may be inserted into the one or more dowel in holes (3c). The above-described assembly procedure illustrates assembly of components into L-grip (1a) of the pair of grips (1b). Similar to the assembly of components into the L-grip (1a), the components may be arranged in the flat grip (1b) of the one or more grip brackets (1a and 1b). In some embodiments, the conductive block (3) may be provided in the flat grip (1b) during assembly. In another embodiment, the conductive block (3) may be provided only in L-grip (1a) and may be refrained from provision in the flat grip (1b) and the same does not deviate the scope of the present invention. In an embodiment, the L-grip (1a) and the flat grip (1b) may be assembled with the aid of bolts and nuts (4 and 5) and sufficient pre-tension may be applied to the bolts. Above-described assembly process is only an exemplary illustration and should not be construed as a limitation.
[0043] Once the jig (10) is secured to the bi-axial testing apparatus (100), the extension (3a) may be electrically coupled to an external power source [not shown]. The conductive block (3) may be configured to resistively heat the cruciform specimen (101) during bi-axial testing. The method of conducting a bi-axial testing on the cruciform specimen (101) includes securing the cruciform specimen (101) to one of the plurality of jigs (10) provided in the bi-axial testing apparatus. Each of the plurality of jigs (10) may be configured to grip the cruciform specimen (101). Once the cruciform specimen (101) is secured to the plurality of jigs (10) on the bi-axial testing apparatus (100), the cruciform specimen (101) may be heated to a hot stamping condition to perform bi-axial testing. In a preferred embodiment, a processing module (PM) may be associated with the bi-axial testing apparatus (100). The processing module (PM) may be communicatively coupled to the load cell (LC). In another embodiment, a load cell (LC) may be associated with the at least one of the actuators. The load cell (LC) may be coupled to the processing module (PM) and may be configured to receive signals corresponding to loading along with appropriate strain measurement from the actuator and subsequently send the signal to the processing module (PM). The processing module (PM) may be configured to receive signals corresponding to load and/or strain measurement on the cruciform specimen when subjected to bi-axial testing. The at least one actuator may be actuated by the processing module (PM)) to displace each of the plurality of jigs in respective axes and impart axial load on the cruciform specimen (101). In an embodiment, the at least one actuator may be actuated by the control module (CM). The control module (CM) may be communicatively coupled to the processing module (PM) of the bi-axial testing apparatus (100). The control module (CM) may be configured to receive processed signals corresponding to loading along with appropriate strain measurement from the processing module (PM). Further, the control module (CM) may be configured generate FLD based on the processed signals. In some embodiments, the FLD may be generated by the processing module (PM) of the bi-axial testing apparatus (100) itself. In an embodiment, the FLD may be generated based on the strain measurement data. In another embodiment, the forming limit diagram (FLD) is generated by the control module (CM) based on the load signals along with appropriate strain measurement received by the control module (CM) from the processing module (PM) associated with the apparatus (100). The load cell detects at least one of the load and/or strain imparted on each arm of the cruciform specimen (101) by the respective jigs of the plurality of jigs (10). The FLD curve may be generated by the control module (CM) based on the load along with strain measurement imparted by respective arms held by the respective jigs of the plurality of jigs (10). As the bi-axial testing may be required to be performed under hot stamping condition, the conductive block (3) in the plurality of jigs (10) may enable heating the cruciform specimen (101). Thus, the cruciform specimen (101) may be maintained at hot stamping condition during bi-axial testing phase which was not possible in the convention bi-axial test setup. The forming limit diagram (FLD), also known as a forming limit curve, is used in sheet metal forming for predicting failure limits of sheet metal under different loading conditions. The diagram attempts to provide a graphical description of material failure limits, such as a punched dome test. In a preferred embodiment, the FLD may be displayed on a display unit (D) associated with the control module (CM). In an embodiment, the display unit (D) may be individual display unit (D) such as a monitor. In some embodiments, the display unit (D) may be an integrated along with the processing module (PM) or control module such as but not limiting to laptop. The FLD generation may be important and may be frequently generated to understand the sheet metal formability in various strain conditions to design components at room temperature. The use of bi-axial testing apparatus (100) as described in the above embodiments is not limited to FLD generation, determination of FLD based on loading along with strain measurements is one such application. The bi-axial testing apparatus (100) may also be used to determine mechanical properties, characterize anisotropic behavior and the like.
[0044] The jig (10) according to the present disclosure ensures better gripping of a cruciform specimen (101). The jig (10) according to the present disclosure may be configured to resistively heat the cruciform specimen (101) to hot stamping condition during the bi-axial testing. As the configuration of the jig (10) according to the present disclosure is capable of heating the specimen (101), it becomes relatively easy to maintain the cruciform specimen (101) at the elevated temperatures. The jig may be configured to directly supply the electric power to the cruciform specimen (101) through its arms thereby achieving the joule heating at the center of the suitably designed sample.
[0045] In an embodiment of the disclosure, the control module (CM) may be a centralized control unit, or a dedicated control unit associated with the system. The control module (CM) may be comprised of a processing unit. The processing unit may comprise at least one data processor for executing program components for executing user- or system-generated requests. The processing unit may be a specialized processing unit such as integrated system (bus) controllers, memory management control units, floating point units, graphics processing units, digital signal processing units, etc. The processing unit may include a microprocessor, such as AMD Athlon, Duron or Opteron, ARM’s application, embedded or secure processors, IBM PowerPC, Intel’s Core, Itanium, Xeon, Celeron, or other line of processors, etc. The processing unit may be implemented using a mainframe, distributed processor, multi-core, parallel, grid, or other architectures. Some embodiments may utilize embedded technologies like application-specific integrated circuits (ASICs), digital signal processors (DSPs), Field Programmable Gate Arrays (FPGAs), etc.
[0046] In some embodiments, the processing unit may be disposed in communication with one or more memory devices (e.g., RAM, ROM etc.) via a storage interface. The storage interface may connect to memory devices including, without limitation, memory drives, removable disc drives, etc., employing connection protocols such as serial advanced technology attachment (SATA), integrated drive electronics (IDE), IEEE-1394, universal serial bus (USB), fiber channel, small computing system interface (SCSI), etc. The memory drives may further include a drum, magnetic disc drive, magneto-optical drive, optical drive, redundant array of independent discs (RAID), solid-state memory devices, solid-state drives, etc.
[0047] It is to be understood that a person of ordinary skill in the art may develop a system and a method of similar configuration without deviating from the scope of the present disclosure. Such modifications and variations may be made without departing from the scope of the present disclosure. Therefore, it is intended that the present disclosure covers such modifications and variations provided they come within the ambit of the appended claims and their equivalents.

Equivalents

[0048] With respect to the use of substantially any plural and/or singular terms herein, those having skill in the art can translate from the plural to the singular and/or from the singular to the plural as is appropriate to the context and/or application. The various singular/plural permutations may be expressly set forth herein for sake of clarity.
[0049] It will be understood by those within the art that, in general, terms used herein, are generally intended as "open" terms (e.g., the term "including" should be interpreted as "including but not limited to," the term "having" should be interpreted as "having at least," the term "includes" should be interpreted as "includes but is not limited to," etc.). It will be further understood by those within the art that if a specific number of an introduced claim recitation is intended, such an intent will be explicitly recited in the claim, and in the absence of such recitation no such intent is present. For example, as an aid to understanding the description may contain usage of the introductory phrases "at least one" and "one or more" to introduce claim recitations. However, the use of such phrases should not be construed to imply that the introduction of a claim recitation by the indefinite articles "a" or "an" limits any particular claim containing such introduced claim recitation to inventions containing only one such recitation, even when the same claim includes the introductory phrases "one or more" or "at least one" and indefinite articles such as "a" or "an" (e.g., "a" and/or "an" should typically be interpreted to mean "at least one" or "one or more"); the same holds true for the use of definite articles used to introduce claim recitations. In addition, even if a specific number of an introduced claim recitation is explicitly recited, those skilled in the art will recognize that such recitation should typically be interpreted to mean at least the recited number (e.g., the bare recitation of "two recitations," without other modifiers, typically means at least two recitations, or two or more recitations). Furthermore, in those instances where a convention analogous to "at least one of A, B, and C, etc." is used, in general such a construction is intended in the sense one having skill in the art would understand the convention (e.g., "a system having at least one of A, B, and C" would include but not be limited to systems that have A alone, B alone, C alone, A and B together, A and C together, B and C together, and/or A, B, and C together, etc.). In those instances where a convention analogous to "at least one of A, B, or C, etc." is used, in general such a construction is intended in the sense one having skill in the art would understand the convention (e.g., "a system having at least one of A, B, or C" would include but not be limited to systems that have A alone, B alone, C alone, A and B together, A and C together, B and C together, and/or A, B, and C together, etc.). It will be further understood by those within the art that virtually any disjunctive word and/or phrase presenting two or more alternative terms, whether in the description, or drawings, should be understood to contemplate the possibilities of including one of the terms, either of the terms, or both terms. For example, the phrase "A or B" will be understood to include the possibilities of "A" or "B" or "A and B."
[0050] While various aspects and embodiments have been disclosed herein, other aspects and embodiments will be apparent to those skilled in the art. The various aspects and embodiments disclosed herein are for purposes of illustration and are not intended to be limiting, with the true scope and spirit being indicated in the description.

Referral Numerals:

Referral numeral Description
100 Bi-axial testing apparatus
101 Cruciform specimen
10 One or more jigs
1a and 1b A pair of brackets
2a Insulator block
2b Insulator cover/cap
2c Cylindrical extension
2d Tap hole
3 Conductive block
3a Extension
3b Conductive grip
3c Dowel pin holes
4 Bolts
5 Nuts
6 Threaded hole
7 Cavity in the jig brackets
7a Major surface of L-grip
7b Major surface of flat grip
8 Bolt hole
11 Slot in the insulator block
LC Load cell
CM Control module
D Display unit
PM Processing module