Method And System For Bitmap Analysis For High Speed Testing Of Memories

Abstract: The invention provides a Bit Map Analysis System (BMAS) for high-speed memory testing. The solution provided throught this strategy is a worty using inside the embedded memories irrespective of whether they are asynchronous or synchronous, static or dynamic, volatile or non-volatile as reduces the amount of data transaction between the BIST and the tester. The tester clock cycle reduces drastically, resulting in reduced diagnostic process time.

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