Method And System For Improving Parameter Measurement

Abstract: Parameter measurement systems including improved sensor calibration are provided herein. The measurement system includes a first sensor with a first output signal including a plurality of output characteristics, at least one output characteristic being deficient for measuring a desired parameter and at least one output characteristic being suitable for measuring the desired parameter. The measurement system also includes a second sensor with a second output signal comprising at least some of the plurality of output characteristics, the at least one deficient characteristic of the first output signal being suitable in the second output signal for measuring the desired parameter. The measurement system further includes a processor programmed to calibrate the first output signal using the second output signal to generate a third output signal including the at least one suitable characteristic of the first output signal and the at least one suitable characteristic of the second output signal.

Patent Information

Applicants

Inventors

Specification

Documents