METHOD AND SYSTEM FOR INSPECTION OF COMPONENTS

BACKGROUND

[0001] The present invention relates, generally, to the field of component inspection, and specifically, to a method and system for inspection of components.

[0002] Industrial components of varied shapes and sizes are inspected with sensing probes that emit energy onto the surface of the components. The sensing probes are also utilized to capture a response of the components to the emitted energy. Components such as airfoils, turbine blades, and bellows, for example, have varied shapes and are manufactured in different sizes. To inspect such components, the sensing probes have to be aligned at different orientation angles to emit energy and receive responses from the components. Sensing probes such as ultrasound probes and eddy current probes are used extensively in the field of non-destructive testing (NDT) for these components.

[0003] In practical NDT applications, components are passed through an array of sensing probes placed in a particular order to cover the object through various angles. Every region of interest is passed through this configuration of sensing probes to receive responses to the energy transmitted from the sensing probes. Owing to the variation in size and shapes of components, the sensing probe arrangements are different for different components. Rearranging the sensing probe is a cumbersome process and hence is rarely used in the inspection of components. Hence, a particular component is generally inspected using particular inspection systems that have sensing probes aligned according to the geometry of the component.

[0004] Many components are also inspected using visual inspection systems that include a camera to scan the surface of the component. However, visual inspection systems only provide for a surface level examination of the components and do not provide any insight into defects that may be present on the inner surfaces of the components. Further, visual inspection systems provide limited instruction regarding exact locations of defects in the component.

[0005] In order to be able to utilize sensing probes to cover large areas of the component under inspection, and also to enable inspection of components of varied shapes and sizes through one inspection system automated arm based structures have been employed at many inspection sites. The automated arms are configured to move the component and/or the sensing probe in different directions to be able to allow inspection of the components by the sensing probes from various orientation angles. Due to different form factors, however, the construction of the automated arm is often complicated and expensive.

Also, when the components are being inspected using ultrasound sensing probes or eddy current sensing probes the automated arm is required to be able to handle minute changes in the surface of the component under inspection. To be able to achieve such sensitivity, the programs that are executed to operate the automated arm are required to be more and more complex, thus adding to the time consumed in conducting inspection rounds for different components.

[0006] Hence, there is a need for a method and system to predict a change in orientation required for inspection of different parts of components under inspection and to adjust the components and/or the sensing probe accordingly.

BRIEF DESCRIPTION

[0007] In one embodiment, a system for inspection of components is provided. The system includes at least one sensing probe to inspect geometric features of the component. The sensing probe and/or the component experience movement relative to each other at defined intervals. The system further includes at least one adjustable element coupled with the component or the sensing probe or both the component and the sensing probe. Furthermore, the system includes a processing sub-system configured to determine a difference between a defined orientation angle of the sensing probe with respect to the component at every position at the defined interval along the component and an anticipated orientation angle of the sensing probe with respect to the component at every position at defined interval along the component. The anticipated orientation angle is calculated based on a volumetric representation of the component. The system also includes a control unit electrically coupled with the adjustable element. The control unit is configured to adjust at least one of the adjustable elements such that the difference between the defined orientation angle for the sensing probe at every position along the component and the anticipated orientation angle for the sensing probe at every corresponding position is zero.

[0008] In another embodiment, a method for inspecting a component is provided. The method includes calculating anticipated orientation angles of at least one sensing probe with respect to the component at defined spatial intervals. The anticipated orientation angles are calculated based on a volumetric representation of the component. The method further includes comparing the anticipated orientation angles of the at least one sensing probe with a corresponding defined orientation angle for the at least one sensing probe with respect to the component. Furthermore, the method includes adjusting at least one adjustable elements when the anticipated orientation angle of the at least one sensing probe is different from the corresponding defined orientation angle of the at least one sensing probe with respect to the component.

DRAWINGS

[0009] The present invention will be better understood from reading the following description of non-limiting embodiments, with reference to the attached drawings, wherein below:

[0010] FIG 1 illustrates an exemplary embodiment of a system for inspection of components;
[0011] FIG 2 illustrates a system for inspection of components according to one embodiment of the present invention;

[0012] FIG 3 illustrates a system for inspection of components according to another embodiment of the present invention;

[0013] FIG 4 illustrates a system for inspection of components according to yet another embodiment of the present invention; and

[0014] FIG 5 illustrates a method for inspection of a component, according to one embodiment of the present invention.

DETAILED DESCRIPTION

[0015] Reference will be made below in detail to exemplary embodiments of the invention, examples of which are illustrated in the accompanying drawings. Wherever possible, the same reference numerals used throughout the drawings refer to the same or like parts.

[0016] Embodiments of the invention described herein relate to a method and a system for inspection of components. During inspection, a component is exposed to energy that is emitted by one or more sensing probes. Geometric features in the component generate responses to the energy incident on the component. The responses generated by the geometric features are collected by sensing probes, and are then analyzed to determine the nature of geometric features in the component. Sensing probes such as ultrasound probes, or eddy current probes are used to produce the energy that is emitted onto a region of interest of the component being inspected. The sensing probes and the component experience relative motion with respect to each other in such a way that relevant geometry of the component is exposed to energy emitted by the sensing probes.
The sensing probes move along the component at defined spatial intervals and are disposed at different positions along the component. Depending on the nature of the geometric feature being inspected in the component, the sensing probes are expected to be aligned at different defined orientation angles with respect to different positions on the component. For example, during ultrasound inspection of the component, it may be desirable to align the sensing probes at 90 degrees with respect to one position on the component, whereas it may be desirable to align the sensing probes at 60 degrees with respect to another position on the component. In certain embodiments, the defined orientation angles of the sensing probe as measured with respect to the component are set to be the same at every position at defined spatial intervals along the component. In certain other embodiments, the defined orientation angles are set to be different at different positions along the component. The component or the sensing probes or both the component and the sensing probe are placed on adjustable elements. Based on a volumetric representation of the component, a processing sub-system determines an
anticipated orientation angle of the sensing probes at every position along the component that the sensing probes are configured to encounter during inspection. The anticipated orientation angle for the sensing probes along the component at different spatial intervals is dependent on a change in geometry experienced by the sensing probes between a prior position and a next position. From the volumetric representation of the component, a change in geometry of the component from an earlier position to a new position that is spaced away at a defined spatial interval is determined. When the sensing probes are displaced from the earlier position to the new position, they are aligned at the defined orientation angle with respect to the earlier position. A change in the orientation angle of the sensing probes with respect to the new position along the component is determined based on the change in geometry observed from the earlier position to the new position. The orientation angle of the sensing probes with respect to the new position of the component is the anticipated orientation angle of the sensing probes with respect to the new position along the component. The anticipated orientation angle for every position is compared with the corresponding defined orientation angle. When the anticipated orientation angle is different from the defined orientation angle, at least one adjustable element is adjusted to cause a change in orientation of the sensing probes with respect to the component. The adjustable elements are changed to ensure that the anticipated angle is equal to the defined angle for each position. During inspection, the sensing probes are moved from one position to another corresponding to defined spatial intervals, and the adjustable elements are adjusted according to the processing sub-systems calculations pertaining to the difference between the anticipated orientation angle and the defined orientation angle. The response from the geometric features of the component are collected by the sensing probes in the form of amplitude and time of flight and are processed to determine the location of geometric features in the component.

[0017] To control the adjustable elements, the processing sub-system uses the volumetric representation of the component to determine a change in the geometry of the component from one position to another. The processing sub-system also uses the orientation angle of the sensing probe with respect to the component at a prior position to determine the anticipated orientation angle at a new position that is a defined spatial interval away from the prior position. When the sensing probe oriented at a particular angle with respect to one position is moved from that position to a new position that is geometrically different, the anticipated orientation angle of the sensing probe with respect to the component at the new position may be different from the defined orientation angle for the new position. This difference is utilized to control the adjustable elements to properly orient the sensing probe with respect to every position along the component. The foregoing is described in greater detail in the subsequent paragraphs with the help of accompanied drawings.

[0018] FIG. 1 illustrates an exemplary embodiment of a system 100 for inspecting components. The inspection system 100 is configured to inspect regions of interest of a component 102 through energy emitted by a plurality of sensing probes 104. Examples of the component 102 include, but are not limited to, turbine blades, bellows, nozzles, and other airfoil components. The geometric features being inspected through the inspection system 100 may include, but are not limited to, anomalies in the component 102, cracks, welds, defects in welds, porosity, corrosion, and slag. Further, the component 102 may also be subjected to inspection energy to inspect coating on the component 102, and the coating thickness. The sensing probes 104 are arranged in configurations suitable to expose the component 102 with energy required for inspection from various angles. The sensing probes 104 can be unidirectional probes or bi-directional probes. Examples of sensing probes include, but are not limited to, ultrasound probes, and eddy current probes.

[0019] The inspection system 100 further includes a platform 106 to support the component 102 being inspected. The platform 106 is selected such that the component 102, when placed on it, does not experience any instability. The platform 106, according to certain embodiments, may be fixed to a level surface with the help of appropriate fixing mechanisms. The platform 106, according to certain embodiments, may be configured to allow for movement of the component 102 in such a way that the sensing probes can scan the entire geometry of the component 102. Examples of configurations that allow for movement of the component 102 on the platform 106 include, but are not limited to, a plurality of wheels or a movable train. Further, the inspection system 100 includes a socket 108 to hold the sensing probe 104. The socket 108 is placed away from the platform 106 such that the component 102 can be placed without inhibiting the movement of the socket 108 or the platform 106. The socket 108 is disposed in different configurations with respect to the platform 106 depending on the shape and size of the component 102. In certain embodiments, the socket 108 is fixed to a platform (not shown) that is disposed parallel to the platform 106. In certain embodiments, a plurality of linear actuators are coupled to the socket 108 to move the socket 108 along the length as well as breadth of the component 102. In certain other embodiments, the socket 108 is fixed to a rail 110 that is disposed parallel to the platform 106. The socket 108 with the sensing probe 104 may be disposed on the rail 110 such that it is movable along the component 102 that is placed on the platform 106. The rail 110 is configured to enable the socket 108 to move along the length as well as the breadth of the component 102. Further, the socket 108 may also include spring loaded arrangements to enable physical contact between the component 102 and the sensing probes 104.

[0020] In certain embodiments, the sensing probes 104 may be disposed on a movable robotic arm (not shown) that is configured to move along the length and breadth of the component 102. The component 102 may be fixed to the robotic arm for inspection purposes. The robotic arm is communicably coupled with a processor that is configured to execute programming instructions to enable the arm to move across the length and breadth of the component 102. In addition, the component 102 may also be disposed on linear arms that are disposed independent of the rail 110 on which the socket 108, carrying sensing probes 104, is disposed.

[0021] In an inspection run, the sensing probes 104 transmit energy that is incident on the component 102. In certain embodiments, when different regions of the component 102 are being inspected, the socket 108 holding the sensing probes 104 is moved along the component 102 at defined spatial intervals. In certain other embodiments, the platform 106 may be moved (e.g., by way of a movable train assembly) to move the component 102 such that the sensing probes 104 disposed in the socket 108 cover the relevant regions of interest of the component 102. In certain embodiments, the socket 108 and the platform 106 are moved in opposite directions to ensure that the relevant regions of interest of the component 102 are exposed to energy transmitted by the sensing probes 104. In certain other embodiments, the socket 108 and the platform 106 are moved at different speeds to cover the relevant geometry of the component 102.

[0022] In an inspection run, the sensing probe 104 is disposed along the component 102 at a particular orientation angle with respect to a position along the component 102. For example, the sensing probe 104 at a first position along the component 102 may be disposed normally with respect to the first position. The component 102 and the sensing probe 104 experience relative motion with respect to each other such that the sensing probe 104 is located at a new position along the component 102. That is, either the sensing probe 104 may be moved with respect to the component 102, or the component 102 may be moved with respect to the sensing probe 104, or the sensing probe 104 and the component 102 may be moved with respect to each other. The new position may be located at a defined spatial interval away from the first position. The defined spatial intervals, according to one embodiment, may be defined along the length of the component 102. According to certain embodiments, the length of the component 102 may divided into equal parts. According to another embodiment, an operator of the inspection system 100 may define the spatial intervals and provide them as an input to a processing system that controls the movement of the sensing probes 104 and/or the component 102. The sensing probe 104, being adjusted so as to be aligned according to the defined orientation angle for the first position, may or may not be aligned at the defined orientation angle for the new position along the component. According to certain embodiments, the processing sub-system 204 and the control unit 206 as illustrated in FIG. 2 are utilized to align the sensing probes 104 at the defined orientation angle for each position along the component.

[0023] FIG. 2 illustrates an exemplary embodiment of a component inspection system 200 according to one embodiment. The component inspection system 200 includes sensing probes 104, the platform 106, the socket 108, and the rail 110. Further, the component inspection system 200 includes at least one adjustable element 202, a processing sub-system 204, and a control unit 206. When the sensing probe 104, and the component 102 experience relative movement with respect to each other, the position of the sensing probe 104 with respect to the component 102 changes such that the sensing probe 104 is positioned to perform an inspection at another position along the component 102.

[0024] The adjustable element 202 is mechanically coupled with the sensing probe 104 or the component 102, or both the sensing probe 104, and the component 102. The adjustableelements 202, according to one embodiment, include a pin-like structure that can move linearly based on actuation signals. The actuation signals, in certain embodiments, may be provided by a motor. The adjustable elements 202, according to certain embodiments, are linear actuators. Examples of the linear actuators include hydraulic actuators, pneumatic actuators, piezoelectric actuators, moving-coil actuators, and electro-mechanical actuators. The adjustable elements 202 are fitted appropriately along the platform 106 or the rail 110. In certain embodiments, the adjustable elements 202 may be coupled to the platform 106 as well as the rail 110. In certain embodiments, when the component 102 is not placed on a platform for inspection, the adjustable elements 202 may be coupled directly to the component 102. The adjustable elements 202 are coupled with the platform 106, or the rail 110 or both in such a way that the orientation angle of the sensing probe 104 with respect to the component 102 can be changed. As illustrated in FIG. 2, the adjustable elements 202 are coupled to the platform 106 at four corners of the platform 106. One end of each of the adjustable elements 202, according to certain embodiments, is mechanically coupled with the platform 106 or the rail 110. In certain other embodiments, one end of each of the adjustable elements 202 is magnetically coupled to the platform 106 or the rail 110. The other end of the adjustable elements 202 is electrically coupled with the control unit 206. The control unit 206, according to certain embodiments, is electrically coupled with an actuating element of the adjustable elements 202. The control unit 206, according to certain embodiments, is a motion controller such as a programmable logic controller (PLC). The control unit 206 is also coupled with the processing sub-system 204. The processing sub-system 204 is configured to receive, as input, a volumetric representation of the component 102 and transmit control signals to the control unit 206 that pertain to adjustments to the adjustable elements 202.

[0025] The processing sub-system 204, in certain embodiments, may comprise a central processing unit (CPU) such as a microprocessor, or may comprise any suitable number of application specific integrated circuits (ASICs). The processing sub-system 204 may include memory that can be an electronic, a magnetic, an optical, an electromagnetic, or an infrared system, apparatus, or device. Common forms of memory include CD-ROMs, hard disks, magnetic tape, flash memory, Random Access Memory (RAM), a Programmable Read Only Memory (PROM), and Electronically Erasable Programmable Read Only Memory (EEPROM), and a portable compact disc read-only memory (CDROM). The processing sub¬system 204 is capable of executing program instructions, such as generating control signals that are transmitted to the control unit 206, and functioning in response to those instructions or other activities that may occur in the course of inspecting the component 102. Such program instructions typically comprise a listing of executable instructions for implementing logical functions. The listing can be embodied in any computer-readable medium for use by or in connection with a computer-based system that can retrieve, process, and execute the instructions. Alternatively, some or all of the processing may be performed remotely by additional processing sub-systems 204. Furthermore, the processing sub-system 204 can also receive user input instructions to perform certain functions or modify instructions.

[0026] In certain embodiments, the processing sub-system 204 and the control unit 206 are a part of a single control system. In other embodiments, the processing sub-system 204 and the control unit 206 are communicably coupled by means of a wired or a wireless communication channel. The communication channels between the processing sub-system 204 and the control unit 206 may include, but are not limited to, coaxial cables, fiber optic cables, Bluetooth™, Wi-Fi™, WiMAX®, General Packet for Radio Service (GPRS), Global System for Communications (GSM), Near Field communication channels, Radio Frequency Identification (RFID) communication channels, and personal area network communication channels such as Zigbee®.
[0027] The processing sub-system 204 utilizes volumetric representations of the component 102 to generate the control signals to be transmitted to the control unit 206. According to one embodiment, the volumetric representation of the component 102 is a 3-dimensional Computer Assisted Design (CAD) of the component 102. The volumetric representation of the component 102 may be generated by the processing sub-system 204 based on a plurality of component parameters. The component parameters include, but are not limited to, component thickness, component diameter, component geometry and component length. Component geometry includes, but is not limited to, details pertaining to shape of the component 102, angles of curvatures, cone angles, and bends observed in the component 102. Based on the available geometric information of the component 102, the processing sub-system 204 reconstructs the component 102 to generate a 3-dimensional image of the component 102. The 3-dimensional image, in certain embodiments, is generated by the processing sub-system 204 by utilizing 3-dimensional modeling software such as AutoCAD™, developed by Autodesk Inc., San Rafael, California, and CATIA™, developed by Dassault Systemes, France. In certain other embodiments, the processing sub-system 204 receives the volumetric representation of the component 102 as an input in the form of computer aided design files such as DXF files, or DWF files developed for usage on AutoCAD™, or CAT files developed for usage on CATIA™. The files can be provided to the processing sub-system 204 through a data repository that is communicably coupled with the processing sub-system 204. In some other embodiments, the volumetric representation files may be provided to the processing sub-system 204 through a user interface, where an operator uploads the representation file that is then received by the processing sub-system 204.

[0028] In certain embodiments, the processing sub-system 204 creates a matrix of positions along the component 102 that the sensing probe 104 will traverse to inspect the component 102. The matrix of positions along the component 102 reflects positions of the sensing probe 104 along the component 102 at defined spatial intervals. The processing sub¬system 204 is configured to calculate the anticipated orientation angle at each position in the matrix of positions along the component 102. According to certain embodiments, the processing sub-system 204 may be configured to assume that the orientation angle of the sensing probe 104 with respect to the component 102 at a first position in the matrix of positions is equal to the defined orientation angle for the first position. The processing sub¬system 204 is further configured to calculate the anticipated orientation angle for every other position along the component 102. The processing sub-system 204, from the volumetric representation of the component 102, determines a change in geometry of the component 102 from an earlier position to a new position that is spaced away at a defined spatial interval from the earlier position. For example, when the sensing probes 104 are displaced from the first position along the component 102 to a second position along the component 102, the processing sub-system 204 is configured to determine a change in the geometry of the component 102 from the first position to the second position. The change in geometry may be determined in terms of a change in angle of curvature of the component 102 with respect to a reference plane along the component 102. When the sensing probes 104 are displaced from the first position to the second position, they are aligned at the defined orientation angle with respect to the first position. The processing sub-system 204 is configured to determine a change in the orientation angle of the sensing probes 104 with respect to the second position along the component 102, based on the change in geometry observed from the first position to the second position along the component 102. The orientation angle of the sensing probes 104 with respect to the second position of the component 102, as determined by the processing sub-system 204, is the anticipated orientation angle of the sensing probes 104 with respect to the second position along the component 102. The processing sub-system 204 is configured to determine anticipated orientation angles for the sensing probes 104 with respect to every position along the component 102 from the matrix of positions. The difference between the anticipated orientation angle and the defined orientation angle for each position is used to calculate a change required in orientation of the component 102, or the sensing probes 104, or both the component 102 and the sensing probe 104 to align the sensing probes 104 at the defined orientation angle with respect to that position along the component 102. The processing sub-system 204 generates control signals pertaining to the required change in orientation of the component 102, or the sensing probe 104. When the anticipated orientation angle of the sensing probes 104 with respect to a particular position along the component 102 matches the defined orientation angle for that position, the processing sub-system 204 does not change the orientation of the component 102 or the sensing probes 104.

[0029] The processing sub-system 204 is configured to determine, from the volumetric representation of the component 102, direction cosines of a normal plane to the surface of the component 102 at every position along the component 102. Based on the direction cosines of the normal plane to the surface of the component 102 at every position, the orientation angle of the position with respect to the normal plane can be determined. For example, when the volumetric representation of the component 102 is a CAD model, known CAD programming languages like Creo™ elements/pro™, or NX Urographies are used to determine the direction cosines. Once the angle of orientation of the position on the component 102 with respect to the normal plane is determined, the anticipated orientation angle of the sensing probe 104 with every position along the component 102 is determined.

[0030] During inspection of the component 102, when the position of the component 102 that is being inspected by the sensing probes 104 changes from one position to a different position along the component 102, the processing sub-system 204 transmits to the control unit 206 control signals pertaining to the new position of the sensing probe 104 along the component 102. Based on the control signals transmitted by the processing sub-system 204, the control unit 206 controls the actuation signal provided to the adjustable elements 202. The actuation signal, according to certain embodiments, may be a voltage provided to the adjustable elements 202. The adjustable elements 202, based on the control signals, experience linear movement and hence change orientation of the component 102 with respect to the sensing probes 104. For example, when the control signal pertains to reducing the length of one of the adjustable elements 202, the component 102 tilts on the side of the adjustable element 202 that is reduced in length.

[0031] The component inspection system 200, according to certain embodiments includes a data repository to store inspection data pertaining to the geometric features of the component 102 that is collected by the sensing probe 104. The processing sub-system 204 is configured to determine the location of the inspection data on the volumetric representation of the component 102. According to one embodiment, the location of the inspection data on the volumetric representation of the component 102 is displayed on a display that is communicably coupled with the processing sub-system 204.

[0032] FIG 3 illustrates a component inspection system 300 according to another embodiment. The component inspection system 300 includes a plurality of sensing probes 104, the platform 106, the socket 108, the rail 110, the adjustable elements 202, the processing sub-system 204, and the control unit 206. The sensing probes 104 can be unidirectional probes or bi-directional probes. Examples of sensing probes include, but are not limited to, ultrasound probes, and eddy current probes. The sensing probes 104 are available in different shapes and sizes. According to the embodiment illustrated in FIG. 3, the sensing probes 104 are pencil probes. The sensing probes 104, as illustrated in FIG. 3, are physically coupled to the socket 108. The sensing probes 104 may be coupled with the socket 108 through insertion into slots made in the socket 108. The adjustable elements 202 are coupled with the socket 108. The adjustable elements 202 are also electrically coupled with the control unit 206. The processing sub-system 204, based on a determination of the anticipated orientation angle of the sensing probes 104 at different positions along the component 102, generates control signals that are processed by the control unit 206. The processing sub-system 204 is configured to compare the anticipated orientation angle of the sensing probes 104 at every position along the component 102 with the defined orientation angle for the sensing probes 104 at each respective position. The control signal generated by the processing sub-system 204 is based on the difference between the anticipated orientation angle and the defined orientation angle for a position. The control unit 206 controls the actuation signal to the adjustable elements 202 to tilt the socket 108 in such a way that the probes 104 are aligned at the defined orientation angle at every position along the component 102.

[0033] In certain embodiments, when the probes 104 are expected to maintain physical contact with the component 102 during inspection, the processing sub-system 204 determines whether the physical contact at a new position along the component 102 is lost or not. The processing sub-system 204 then generates control signals that move the adjustable elements 202 such that the physical contact between the probes 104 and the component 102 is maintained.

[0034] FIG. 4 illustrates a component inspection system 400 according to yet another embodiment. The component inspection system 400 includes the platform 106, a printed sensing array probe 402, the rail 110, the adjustable elements 202, processing sub-system 204, and the control unit 206. According to one embodiment, the printed sensing array probe 402 includes eddy current probes that are disposed on a flexible substrate. The printed sensing array probe 402 is configured to scan the surface of the component 102 and receive responses from the geometric features in the component 102. In the exemplary embodiment, the printed sensing array probe 402 is placed between the component 102 and the adjustable elements 202. Further, as illustrated in FIG. 4, the adjustable elements 202 are coupled with the rail 110 to cause movement of the printed sensing array probe 402 with respect to the surface of the component 102. To inspect the component 102, either the platform 106 is moved, or the adjustable elements 202 are moved along the rail 110 to cause movement of the printed sensing array probe 402. In some embodiments, both the platform 106 and the adjustable elements 202 are moved in opposite directions to cause the printed sensing array probe 402 to move from one position on the component 102 to another that is located at a defined spatial interval from the earlier position.

[0035] When the sensing probes 104 are in the format of the printed sensing array probe 402, the processing sub-system 204 is configured to determine a control signal pertaining to maintaining physical contact of the printed sensing array probe 402 with the component 102. The control signals generated by the processing sub-system 204 control actuation signals provided to the adjustable elements such that the printed sensing array probe 402 is kept in physical contact with the component 102.

[0036] In certain embodiments, the adjustable elements 202 may be coupled with the platform 106 that holds the component 102. In such an embodiment, the printed sensing array probe 402 may be held at a position on the component 102 with the help of an array of support pins that are coupled with the rail 110. The control unit 206 actuates the adjustable elements 202 when the printed sensing array probe 402 is expected to lose contact with the surface of the component 102 and ensures that the printed sensing array probe 402 retains contact with the component 102.

[0037] FIG. 5 illustrates a method for inspection of the component 102 according to one embodiment. At 502, the method includes calculating anticipated orientation angles of the sensing probes 104 with respect to the component 102 at defined spatial intervals based on the volumetric representation of the component 102. According to one embodiment, the sensing probes 104 are disposed at an initial position along the component 102 oriented at the defined orientation angle with respect to the initial position on the component 102. During inspection, either the sensing probes 104, or the component 102, or both the component 102 and the sensing probes 104 are moved such that the sensing probes 104 inspect the component 102 at defined spatial intervals. At each position spaced a defined spatial interval away from the earlier position, an orientation angle that the sensing probes 104 are expected to maintain with respect to the component 102 is defined. At 504, the anticipated orientation angles of the at least one sensing probe for every position along the component is compared with the corresponding defined orientation angle for each respective position. At 506, at least one of the adjustable elements 202 is adjusted at each position of the sensing probe 104 along the component 102 where the anticipated orientation angle of the sensing probe 104 at that position along the component 102 is different from the corresponding defined orientation angle of the sensing probe 104 at that position. According to certain embodiments, the method includes receiving a volumetric representation of the component 102 as an input to determine the anticipated orientation angle of the at least one sensing probe 104 at every position along the component 102. The anticipated orientation angle is calculated based on a change in geometry of the component 102 at every position with respect to a previous position of the sensing probe 104 along the component 102. Control signals are generated based on a difference between the anticipated orientation angle and the corresponding defined orientation angle. The control signals, according to certain embodiments, are transmitted by the processing sub-system 204 to the control unit 206. The control unit 206 is coupled with the adjustable elements 202, and is configured to provide actuation signals to the actuating element of the adjustable elements 202 based on the control signals transmitted by the processing sub-system 204. The control unit 206 is thus configured to orient the probes 104 at the defined orientation angle corresponding for every position with respect to the component 102.

[0038] According to certain embodiments, printed sensing array probe 402 is disposed on the component 102. The printed sensing array probe 402 is physically coupled with the component 102 and scans the surface of the component 102 to generate information pertaining to the geometric features of the component 102. The method, according to certain embodiments, includes maintaining the physical coupling between the printed sensing probe array 402 with the component 102 based on a change in geometry of the component 102 at defined spatial intervals.

[0039] Various embodiments described above thus provide for a method and a system for inspection of the component 102. The above-described embodiments of the system and method provide for an inexpensive way of adjusting the orientation angle of the sensing
probes 104 with respect to the component 102. The system also saves time and costs involved in changing the orientation configuration of the sensing probes based on the change in the component geometry. Further, the system can be used for components of different shapes and sizes without having to make any modifications to the structure of the inspection system 100. The system also ensures that contact inspection techniques like usage of printed sensing array probe 402 are able to cover substantial portion of the component 102.

[0040] It is to be understood that the above description is intended to be illustrative, and not restrictive. For example, the above-described embodiments (and/or aspects thereof) may be used in combination with each other. In addition, many modifications may be made to adapt a particular situation or material to the teachings of the invention without departing from its scope. While the dimensions and types of materials described herein are intended to define the parameters of the invention, they are by no means limiting and are exemplary embodiments. Many other embodiments will be apparent to those of ordinary skill in the art upon reviewing the above description. The scope of the invention should, therefore, be determined with reference to the appended claims, along with the full scope of equivalents to which such claims are entitled. In the appended claims, the terms "including" and "in which" are used as the plain-English equivalents of the respective terms "comprising" and "wherein." Moreover, in the following claims, the terms "first," "second," etc. are used merely as labels, and are not intended to impose numerical or positional requirements on their objects. Further, the limitations of the following claims are not written in means-plus-function format and are not intended to be interpreted based on 35 U.S.C. § 112, sixth paragraph, unless and until such claim limitations expressly use the phrase "means for" followed by a statement of function void of further structure.

[0041] This written description uses examples to disclose several embodiments of the invention, including the best mode, and also to enable any person of ordinary skill in the art to practice the embodiments of invention, including making and using any devices or systems and performing any incorporated methods. The patentable scope of the invention is defined by the claims, and may include other examples that occur to those of ordinary skill in the art. Such other examples are intended to be within the scope of the claims if they have structural elements that do not differ from the literal language of the claims, or if they include equivalent structural elements with insubstantial differences from the literal languages of the claims.

[0042] As used herein, an element or step recited in the singular and proceeded with the word "a" or "an" should be understood as not excluding plural of said elements or steps, unless such exclusion is explicitly stated. Furthermore, references to "one embodiment" of the present invention are not intended to be interpreted as excluding the existence of additional embodiments that also incorporate the recited features. Moreover, unless explicitly stated to the contrary, embodiments "comprising," "including," or "having" an element or a plurality of elements having a particular property may include additional such elements not having that property.

[0043] Since certain changes may be made in the above-described method and system for inspection of components, without departing from the spirit and scope of the invention herein involved, it is intended that all of the subject matter of the above description or shown in the accompanying drawings shall be interpreted merely as examples illustrating the inventive concept herein and shall not be construed as limiting the invention.

CLAIMS

What is claimed is:

1. A system for inspection of a component, the system comprising:
at least one sensing probe to inspect geometric features of the component, wherein the at least one sensing probe and the component experience relative movement at defined spatial intervals; at least one adjustable element coupled with the component or the sensing probe, or both the component and the sensing probe;a processing sub-system configured to determine a difference between a defined orientation angle of the at least one sensing probe with respect to the component at every defined spatial interval along the component and a corresponding anticipated orientation angle of the at least one sensing probe with respect to the component at every defined spatial interval along the component, wherein the anticipated orientation angle is determined based on a volumetric representation of the component; and
a control unit electrically coupled with the at least one adjustable element and configured to adjust the component, the sensing probe, or the component and the sensing probe such that the difference between the defined orientation angle and the anticipated orientation angle is zero at each defined spatial interval.

2. The system as recited in claim 1, further comprises a movable platform configured to support the component, wherein the movable platform is configured to move the component at defined intervals.

3. The system as recited in claim 1, further comprises a rail configured to support the at least one sensing probe, wherein the rail is configured to move the at least one sensing probe at defined spatial intervals.

4. The system as recited in claim 1, wherein the processing sub-system is configured to: calculate, at every position along the component, the anticipated orientation angle of the sensing probe from an anticipated position of the sensing probe on the volumetric representation of the component, wherein positions along the component are located at defined spatial intervals on the component; and
transmit a control signal to the control unit to adjust at least one of the at least one adjustable element for positions along the component where the anticipated orientation angle is different from the defined orientation angle.

5. The system as recited in claim 1, wherein the control unit is configured to establish physical contact between the at least one sensing probe and the component by adjusting at least one of the at least one adjustable element.

6. The system as recited in claim 1, further comprising
a printed sensing probe array disposed on the component, wherein the printed sensing probe array comprises a flexible substrate.

7. The system as recited in claim 6, wherein the at least one adjustable element is disposed on the printed sensing probe array to physically couple the printed sensing probe array with the component.

8. The system as recited in claim 7, wherein the control unit is configured to adjust the at least one adjustable element to keep the printed sensing probe array physically coupled with the component.

9. The system as recited in claim 1, further comprising a data repository to store inspection data pertaining to geometric features that is collected by the at least one sensing probe.

10. The system as recited in claim 9, wherein the processing sub-system is further configured to determine location of inspection data on the volumetric representation of the component.

11. The system as recited in claim 10, further comprising a display configured to display the volumetric representation of the component with inspection data at determined locations on the component.

12. The system as recited in claim 1, wherein the at least one sensing probe is a pencil probe.

13. The system as recited in claim 1, wherein the component is an airfoil.

14. A method for inspecting a component, the method comprising:
calculating anticipated orientation angles of at least one sensing probe with respect to the component at defined spatial intervals based on a volumetric representation of the component;

comparing the anticipated orientation angles of the at least one sensing probe with a corresponding defined orientation angle for the at least one sensing probe with respect to the component; and adjusting at least one adjustable elements when the anticipated orientation angle of the at least one sensing probe is different from the corresponding defined orientation angle of the at least one sensing probe with respect to the component.

15. The method as recited in claim 14, further comprising receiving a volumetric representation of the component as an input to determine the anticipated orientation angle of the at least one sensing probe at defined spatial intervals along the component.
16. The method as recited in claim 15, further comprising calculating the anticipated orientation angle based on a change in geometry of the component with respect to a previous position of the at least one sensing probe on the component.

17. The method as recited in claim 14, further comprising coupling a control unit to the at least one adjustable element.

18. The method as recited in claim 17, further comprising transmitting a control signal to the control unit to adjust at least one of the at least one adjustable element when the anticipated orientation angle at a position is different from the corresponding defined orientation angle.

19. The method as recited in claim 14, further comprising disposing a printed sensing probe array on the component, wherein the printed sensing probe array comprises a flexible substrate.

20. The method as recited in claim 19, further comprising disposing the at least one adjustable element on the printed sensing probe array to physically couple the printed sensing probe array with the component.