METHOD, SYSTEM AND APPARATUS FOR DETECTING AN ANOMALY IN A PIPE BACKGROUND [0001 ] Embodiments of the present invention relate generally to inspection technologies and, more particularly, to a method, system and apparatus for identifying an anomaly in a pipe assembly. [0002] Many industries, such as the chemical industry or petroleum industry, use pipeline systems for various purposes. One such purpose may be the transportation of materials such as chemicals or fuel. These pipeline systems may be laid underwater, under soil, or on land. In many cases, pipes in the pipeline systems are insulated and/or shielded (hereinafter interchangeably referred to as "shielded") to protect the pipes from corrosion, physical damages, and the like (hereinafter interchangeably referred to as "anomaly"). Despite the shielding, one or more anomalies may occur in the pipes due to various reasons including damages in shielding, environmental factors, prior existence of corrosion factors within the shielding, and external forces, among others. The anomalies may eventually degrade and ultimately damage the pipes. The damage may cause leakage in the pipes leading to production loss, environmental damage and/or safety issues. It may be necessary to periodically inspect the pipes for the anomalies. [0003] Detecting the anomalies in shielded pipes may be extremely cumbersome. The shielding may have to be removed to visually check for the presence of the anomalies. In some cases, removing the shielding to check for anomalies may not be possible due to the environment in which they may be situated (for example, under water, closely clustered pipelines, underground). Also, removing the shielding to visually check for the anomalies in pipe is time consuming and expensive. Furthermore, removing the shielding may damage the pipes or expose the pipes to environmental factors, such as, moisture, that may eventually cause anomalies. Similar problems may also arise with elongated cylindrical metallic structures (for example, metallic tanks) which are shielded. [0004] Conventional approaches for detecting the anomalies include using visual and ultrasound thickness gauging of the pipe after manual removal of insulation, long range ultrasound testing (LRUT), Lixi® X-ray profiler, pulsed eddy current (PEC), digital radiography, and infrared imaging of the pipe, among others. These conventional approaches may not provide adequate coverage for identifying different types of anomalies. Moreover, these approaches are less reliable as they may have low detectability, provide false calls, and quantifications. Furthermore, speed of inspection and shortage of skilled technicians for evaluating the anomalies may also be a challenge. Other conventional approaches for detecting the anomalies include detecting anomaly insulation and moisture entrapment. However, these approaches may not provide reliable information about the location and/or type of the anomalies. [0005] Therefore, there is a need for a more efficient and more accurate method, system and/or apparatus for detecting anomalies in the pipe assembly. BRIEF DESCRIPTION [0006] The above and other drawbacks/deficiencies may be overcome or alleviated by embodiments presented herein. [0007] According to one embodiment, a method of identifying an anomaly in a region of interest of a pipe assembly having a pipe length is disclosed. The method includes positioning along the pipe length, at least a first probe at a first location. In addition, the method includes positioning along the pipe length, at least a second probe at a second location. The method also includes transmitting first electromagnetic waves from the first probe toward at least the second probe. The method includes receiving at least a portion of the first electromagnetic waves at the first probe or second probe. The method also includes transmitting second electromagnetic waves from the second probe toward at least the first probe. In addition, the method includes receiving at least a portion of the second electromagnetic waves at the second probe or the first probe. The method also includes detecting an anomaly in the region of interest based on the received electromagnetic waves. [0008] According to another embodiment, a system for identifying an anomaly in a region of interest of a pipe assembly having a pipe length is disclosed. The system includes at least a first probe positioned at a first location. The at least first probe is configured to transmit and receive first electromagnetic waves. In addition, the system includes at least a second probe positioned at a second location. The at least second probe is configured to transmit and receive second electromagnetic waves. The system also includes at least one processor coupled to the first and second probe. The at least one processor is configured to cause the first probe to transmit the first electromagnetic waves. In addition, the at least one processor is configured to cause the second probe to transmit the second electromagnetic waves. The at least one processor is also configured to detect the anomaly in the region of interest based on the first electromagnetic waves received at the first and second probes and the second electromagnetic waves received at the second and first probes. DRAWINGS [0009] FIG. 1 is a schematic block diagram of a system for detecting an anomaly in a pipe assembly, according to one embodiment; [0010] FIG. 2 is a schematic block diagram of a system having three probes for detecting an anomaly in the pipe assembly, according to one embodiment; [0011 ] FIG. 3 illustrates various examples of distribution of one or more probe elements in a probe, according to one embodiment; [0012] FIG. 4 is a schematic block diagram of a system for detecting an anomaly in the pipe, according to one embodiment; [0013] FIG. 5 is an exemplary experimental setup for detecting anomalies in the pipe assembly, according to one embodiment; [0014] FIG. 6 is an exemplary plot of reflection amplitudes corresponding to received electromagnetic waves against frequency, according to one embodiment; [0015] FIG. 7 is an exemplary plot of the reflection amplitudes corresponding to received electromagnetic waves in time domain, according to one embodiment; [0016] FIG. 8 is an exemplary plot of the reflection amplitudes within a region of interest in time domain, according to one embodiment; [0017] FIG. 9 is an exemplary plot of the reflection amplitudes presented in semilog scale, according to one embodiment; [0018] FIG. 10 is an exemplary plot of the reflection amplitudes after applying a high resolution spectral estimation technique, according to one embodiment; [0019] FIG. 11 is an exemplary plot illustrating the normalized reflection amplitudes, according to one embodiment; [0020] FIG. 12 is an exemplary signature associated with a corrosion anomaly, according to one embodiment; [0021] FIG. 13 is an exemplary signature associated with a casing anomaly, according to one embodiment; [0022] FIG. 14 is an exemplary signature associated with moisture, according to one embodiment; [0023] FIG. 15 is a set of exemplary signatures associated with different volumes of moisture in an insulation layer, according to one embodiment; [0024] FIG. 16 is an exemplary signature associated with a support anomaly, according to one embodiment; [0025] FIG. 17 is an exemplary experimental setup for detecting anomalies in a pipe, according to one embodiment; [0026] FIG. 18 illustrates exemplary reflection amplitudes in time domain, obtained at first port, according to one embodiment; [0027] FIG. 19 illustrates exemplary reflection amplitudes in time domain, obtained at second port, according to one embodiment; [0028] FIG. 20 illustrates exemplary reflection measurement data in time domain, obtained at second port, according to one embodiment; [0029] FIG. 21 illustrates exemplary transmission measurement data in time domain, obtained at second port, according to one embodiment; [0030] FIG. 22 is flow chart of an exemplary process for detecting the anomaly in a pipe assembly, according to one embodiment; [0031] FIG. 23 is a schematic block diagram of a system for detecting the anomaly in a pipe, according to one embodiment; and [0032] FIG. 24 is flow chart of an exemplary process for detecting the anomaly in the pipe assembly, according to one embodiment. DETAILED DESCRIPTION [0033] A system, method and apparatus for identifying one or more anomalies in an elongated coaxial structure such as shielded insulated pipe assembly are disclosed. The system may be implemented, without limitation, for a pipe alone, a pipe with an insulation layer and/or a pipe with an insulation layer and casing. The system may also be implemented for identifying anomalies in large elongated cylindrical metallic structures, such as, shielded storage tanks. An example system implemented for a section of a pipe assembly 102 is illustrated in FIG. 1. Although, the following description is provided for a pipe assembly having a pipe, an insulation layer and a casing, it will be appreciated that certain embodiments presented herein are equally applicable for other types of pipe assemblies, for example, a pipe without the insulation layer and casing, or a pipe having the insulation layer, but not the casing. An embodiment of system 100 includes a first probe 110, a second probe 112, and a processor 116. First probe 110 and second probe 112 may be antennas that transmit and receive electromagnetic waves. Pipe assembly 102 may include a pipe 104 under test. In one embodiment, pipe 104 may be a metallic pipe. Pipe 104 may be disposed in a casing 108 and insulated using an insulation layer 106. Insulation layer 106 may encompass pipe 104 and fill a space between casing 108 and pipe 104. Insulation layer 106 may be made of a material such as, for example, mineral wool, glass wool, rock wool, and the like, to provide uniform impedance. Alternatively, insulation layer 106 may be made of a combination of one or more insulating materials. Casing 108 is used for shielding insulation layer 106 covering pipe 104 to prevent leakage of moisture into insulation layer 106. Casing 108 may provide structural strength to pipe assembly 102 and prevent damages from external forces. [0034] As illustrated in FIG. 1, first probe 110 is positioned along pipe assembly 102 at a first location. Second probe 112 is positioned along pipe assembly 102 at a second position. In one embodiment, one end of each of first probe 110 and second probe 112 may be attached to casing 108 and the other ends may be suspended in insulation layer 106. In another embodiment, one end of each of first probe 110 and second probe 112 may be attached to pipe 104 and the other ends may be suspended in insulation layer 106. Other ways of placing first probe 110 and second probe 112 in insulation layer 106 are contemplated herein. First probe 110 and second probe 112 may be separated by a distance. For exemplary purposes, the space between first probe 110 and second probe 112 may be a region of interest to check for a presence of one or more anomalies. The term "anomaly" broadly refers to corrosion, presence of moisture, defects in the pipe, defects in the casing, wall thinning, gaps in the insulation layer, weld, joint, support defect, and the like. [0035] First probe 110 and second probe 112 may be communicatively coupled to a transceiver unit 114. Transceiver unit 114 may be communicatively coupled to processor 116. A database 118 may be communicatively coupled to processor 116. Processor 116 controls transceiver unit 114 to generate and receive electromagnetic waves through first probe 110 and/or second probe 112. [0036] Processor 116 causes first probe 110 to transmit first electromagnetic waves toward at least second probe 112. When electromagnetic waves are said to be transmitted toward at least a particular probe, this means that electromagnetic waves may be transmitted in a unidirectional, bidirectional or omnidirectional manner where all or a portion of the transmitted electromagnetic waves reach the particular probe. In one embodiment, processor 116 may cause a signal generator (not shown in FIG. 1) to generate the first electromagnetic waves and send the first electromagnetic waves to transceiver unit 114. Transceiver unit 114 may then transmit the first electromagnetic waves to first probe 110. In another embodiment, processor 116 may cause transceiver unit 114 to transmit a control signal to a signal generator coupled to first probe 110 to generate the first electromagnetic waves and send the generated first electromagnetic waves to first probe 110. In one exemplary implementation, the first electromagnetic waves are transmitted to and from the probes through insulation layer 106. In one embodiment, the first electromagnetic waves may comprise continuous frequencies. For example, the first electromagnetic waves may be a chirp wave having a continuous wave of varying frequencies with respect to time. In another embodiment, the first electromagnetic waves may comprise discrete frequencies. For example, the first electromagnetic waves may be a series of electromagnetic waves, with each wave having a different frequency. In yet another embodiment, the first electromagnetic waves may comprise both continuous and discrete frequencies. [0037] Second probe 112 receives at least a portion of the first electromagnetic waves transmitted from first probe 110. The portion as described herein may be any percentage of the first electromagnetic waves. In the current embodiment, the received first electromagnetic waves may be modified first electromagnetic waves. The modification may be because of a change in impedance at least due to the presence of an anomaly 120 within pipe assembly 102. [0038] First probe 110 may also receive at least a portion of the first electromagnetic waves due to reflection of the transmitted first electromagnetic waves. The reflection may be caused by the boundary between pipe 104 and insulation layer 106, anomaly 120, or the boundary between insulation layer 106 and casing 108, for example. First probe 110 may transmit the received portion of the first electromagnetic waves to transceiver unit 114. Similarly, second probe 112 may transmit the received portion of the first electromagnetic waves to transceiver unit 114. Transceiver unit 114 may then send these received portions (hereinafter collectively referred to as the "received first electromagnetic waves") to processor 116. [0039] Processor 116 may cause second probe 112 to transmit second electromagnetic waves toward at least first probe 110. In one embodiment, processor 116 may cause a signal generator (not shown in FIG. 1) to generate the second electromagnetic waves and send the second electromagnetic waves to transceiver unit 114. Transceiver unit 114 may then transmit the second electromagnetic waves to second probe 112. In another embodiment, processor 116 may cause transceiver unit 114 to transmit a control signal to the signal generator coupled to second probe 112 to generate the second electromagnetic waves and send the generated second electromagnetic waves to second probe 112. In one embodiment, the second electromagnetic waves may comprise continuous frequencies. In another embodiment, the second electromagnetic waves may comprise discrete frequencies. In yet another example, the second electromagnetic waves may comprise both continuous and discrete frequencies. In one embodiment, the first electromagnetic waves and the second electromagnetic waves may be radio frequency (RF) waves or microwave waves or any other suitable high frequency waves, for example, in a frequency range of about 10 MHz to about 4 GHz. [0040] First probe 110 receives at least a portion of the transmitted second electromagnetic waves. The received second electromagnetic waves may be modified second electromagnetic waves. The modification may be because of a change in impedance caused at least due to the presence of anomaly 120. Second probe 112 may also receive a portion of second transmitted waves due to reflection of second electromagnetic waves. The reflections may be caused by the boundary between pipe 104 and insulation layer 106, anomaly 120, or the boundary between insulation layer 106 and casing 108, for example. Second probe 112 may transmit the received portion of the second electromagnetic waves to transceiver unit 114. Similarly, first probe 110 may transmit the received portion of the second electromagnetic waves to transceiver unit 114. Transceiver unit 114 may send these received portions (hereinafter collectively referred to as the "received second electromagnetic waves") to processor 116. [0041] The received first electromagnetic waves and the received second electromagnetic waves may include signal components associated with a variety of reflections including reflections that are from outside of the region of interest, components due to reflections at interface between probe and pipe (start and end point components), reflection from anomalies (for example, pipe, casing, support), etc. [0042] Assuming that there are 'K' reflections, the received first or second electromagnetic waves measured at a probe may be written as: [0043] Where ' Ak{co)' is a signature of the 'k*' interface; %' is the k* interface location,' 2) symmetrically positioned on the first location and the second location as illustrated in FIG. 4. The blind source separation technique is now described in reference to FIG. 4 as an example. It is contemplated that the blind source separation technique may be applied to any system having probes with equal number of probe elements symmetrically positioned on opposite sides. [0078] Processor 416 may excite each probe element of first probe array 402 through transceiver unit 414 to sequentially transmit the first electromagnetic signals. For example, processor 416 may excite probe element 402A followed by 402B followed by 402C and so on, to transmit the first electromagnetic waves. Probe elements of second probe array 404 may receive the first electromagnetic waves transmitted by first probe array 402. Processor 416 may obtain the first electromagnetic waves from each of the probe elements of second probe array 404 through transceiver unit 414. Similarly, processor 416 may excite each probe element of second probe array 404 through transceiver unit 414 to sequentially transmit the second electromagnetic signals. Probe elements of first probe array 402 may receive the second electromagnetic waves transmitted by second probe array 404. Processor 416 through transceiver unit 414 may obtain the second electromagnetic waves at each of the probe element of first probe array 402. Processor 416 may process the observations to detect and extract responses due to anomaly 410. Processor 416 may apply the BSS technique to obtain unique responses associated with anomaly 410. The BSS technique may enable processor 416 to identify and filter non-anomaly responses and redundant responses associated with anomaly 410. [0079] FIG. 5 - FIG. 8 illustrate an example case study of anomaly identification for a pipe. FIG. 5 illustrates an experimental setup 500 for the example case study. In the current example, a pipe assembly 502 of length 6 meter (m) is considered. The pipe assembly 502 includes pipe 504 insulated with insulation layer 506. Pipe 504 with insulation layer 506 is shielded using a casing 508. Pipe assembly 502 comprises four anomalies 520-526 including one casing defect 520 and three corrosions 522-526. Casing defect 520 may be a disjoint of 2cm in the casing located at approximately 2.5m from first port 530 of pipe assembly 502. Three corrosions 522-526 are wall thinning anomalies located at approximately 1.5 m, 2 m and 4m respectively from first port 530 as shown. Set-up 500 includes a first probe 510, and a second probe 512, and a processor (not shown). First probe 510 and second probe 512 may be placed at first port 530 and a second port 532, respectively of pipe assembly 502. As described before, first and second electromagnetic waves are transmitted using first probe 510 and second probe 512, respectively. Portions of the first and second electromagnetic waves are received through first probe 510 and second probe 512. An example processing of reflection amplitudes obtained at first port 530 due to transmission of the first electromagnetic waves at first port 530 is described below. [0080] FIG. 6 illustrates frequency domain data, reflection data (Su) 600 in the current example, acquired from the first electromagnetic waves transmitted and received at first probe 510 of pipe assembly 502. The nomenclature "Sm„" is used herein to refer to scattering parameters (S), where 'm' represents the receiving port and 'n' represents the source port. For example, Su represents the reflected data at port 1 where the electromagnetic waves are sent from port 1 and received at port 1. FIG. 6 plots the magnitudes of the frequency domain data at discrete samples. Each sample corresponds to a discrete frequency given by bandwidth and number of sample points. [0081] FIG. 7 illustrates time domain data as a result of application of an inverse Fourier transform on frequency domain 700. Plot 700 illustrates reflection amplitudes corresponding to the received electromagnetic waves against distance (e.g., in the time domain). The X-axis represents the distance from the starting point and the Y-axis represents amplitude of the signal. Also shown in FIG. 7 is time domain data relevant to a region of interest 706. The length of region of interest 706, in this example, is equal to the distance between first port 530 and second port 532 (6 m). The time domain data may include a start point component, and components associated with the piping anomalies and the casing anomaly, and an end point component. Reflection components from beyond the region of interest are filtered using a band-pass filter. Time domain data as a result of band pass filtering is shown in FIG. 8. [0082] FIG. 8 illustrates a magnified view 800 of time domain data corresponding to the received electromagnetic waves against distance (time domain). The time domain data corresponding to region of interest 706 is shown in an amplitude vs. distance plot. The X-axis of the plot represents distance from the starting point and the Y-axis represents amplitude of the signal. Also, the time domain data 800 shows start point and end point components 802-804 at approximately 0.5 m and at 5.8 m, respectively. The components associated with the anomalies have low signal to noise ratio and thus are buried within the noise. Thus, the components associated with anomalies are not visible. FIG. 9 illustrates a magnified view 900 of the reflection amplitudes corresponding to the received electromagnetic waves against distance in a semilog scale. The components associated with the piping anomalies and the casing anomalies are not visible even in the FIG. 9. Also shown in FIG. 9 is start point and end point components 802-804 at approximately 0.5 m and at 5.8 m, respectively. [0083] The processor may apply a high resolution spectral estimation technique on the time domain data to improve the signal to noise ratio and to determine components associated with the anomalies. On application of the high resolution spectral estimation technique (for example, MUSIC), location of components associated with the anomalies are identified. Result 1000 of the high resolution spectral estimation technique is shown in FIG. 10. The amplitudes of the components are plotted in amplitude vs. distance plot. Here, the amplitudes of the components are plotted in a semi-log scale for better readability. FIG. 10 also illustrates the components, such as start point components 802 (two components) at approximately 0 m and 0.5 m, end point component 804 at approximately at 6 m, components 806 associated with corrosion 522-526 (three components) at approximately at 1.4 m, 3 m and 4 m, and component 808 associated with casing defect 520 at approximately 2.4 m. [0084] FIG. 11 illustrates normalized peaks of components 802-808 associated with anomalies 520-526. Similar to FIG. 10, the normalized peaks represent start point components 802 at approximately 0 m and 0.5 m, end point component 804 at approximately at 6 m, components 806 associated with corrosions 522-526 at approximately at 1.4 m, 3 m and 4 m, and component 808 associated with casing defect 520 at approximately 2.5 m. Further, components 802-808 may be optimized using techniques such as PCA and ICA, for example. The optimization may include identifying and removing repeated or duplicate components associated with anomalies 520-526 and start and end components 802-804. In the current example, one of the components associated with the start point reflections is filtered to optimize the component set. [0085] Further, the processor may compare components 806-808 associated with corrosions 522-526 with signatures stored in a database to particularly identify the one or more anomalies. A signature may be a particular pattern or waveform shape associated with an anomaly which is unique to that particular anomaly and can be defined by features such as number of peaks, number of valleys and their sequence. In one embodiment, ANN or SVM or any other technique may be used for signature identification by cross correlating the identified defect signature with the database of signatures. If the cross correlation coefficient is above a certain threshold, the signature is classified as of particular anomaly type. Results of comparison yield the identifications of the anomalies in the pipe. The identified anomalies in reference to their corresponding components are illustrated in FIGS. 10-11. Some exemplary signatures corresponding to anomalies are presented in FIGS. 12-16. [0086] FIGS. 12-16 illustrate exemplary signatures that may correspond to various anomalies. The signatures are derived from a pipe under test. FIG. 12 illustrates an example signature 1200 resulting from corrosion/wall thinning in a test pipe assembly. Signature 1200 from corrosion/wall thinning is characterized by one peak followed by one valley. FIG. 13 represents an example signature 1300 due to a casing defect in the test pipe assembly. Signature 1300 due to the casing defect may be characterized by a single peak and no valleys. FIG. 14 illustrates an example signature 1400 from a pipe support in the test pipe assembly. Signature 1400 from pipe support is characterized by a single valley followed by a single peak. FIG. 15 shows an example signature 1500 due to moisture content in the test pipe assembly. Signature 1500 due to the moisture content may be characterized by a single valley followed by a first peak and a second peak in sequence. The second peak has smaller amplitude than that of the first peak. FIG. 16 illustrates signatures 1600 associated with moisture content at different volumes. Similar to signature 1500, signatures 1600 are also characterized by a single valley followed by two peaks. As shown, the amplitude of the valley and the amplitudes of the peaks vary depending upon the volume of moisture content. [0087] Although the process of identifying one or more anomalies is described using the reflection measurement (Sn), the identification of the one or more anomalies in pipe assembly 502 may also be achieved by processing transmission measurements and/or other reflection measurements. An advantage of processing more than one measurement is that any false calls or reflection components associated with non-existing anomalies may be identified by comparison of transmission measurements and reflection measurements. An example is provided below that describes identifying components or false calls that are associated with the false anomalies by processing multiple transmission and reflection measurements. [0088] FIG. 17 describes an experimental setup 1700 where a 6 m pipe 1702 is used. Pipe 1702 has two ports, for example, a first port 1730 and a second port 1732. A first probe 1710 is placed at first port 1730 and a second probe 1712 is placed at second port 1732. In this example, pipe 1702 has a wall thinning defect 1720 at 1 m from first probe 1710. Also, pipe 1702 has moisture 1722 trapped at 1 m from second probe 1712. A pipe 1704 is supported using supports 1724 placed at 2 m and 4 m from first port 1730. As described above, steps of transmission and obtaining electromagnetic waves are performed and transmission and reflection measurements are obtained. [0089] FIGS. 18-21 illustrate the transmission and reflection measurements for the pipe assembly of FIG. 17. In particular, FIG. 18 illustrates reflection measurement (Su) 1800 obtained by transmitting and receiving electromagnetic waves at first port 1730. FIG. 19 illustrates transmission measurement (Sn) 1900 obtained by transmitting electromagnetic waves at second port 1732 and receiving the electromagnetic waves at first port 1730. FIG. 20 illustrates reflection measurement (S22) obtained by transmitting and receiving the electromagnetic waves at second port 1732. FIG. 21 illustrates reflection measurement (S2i) obtained by transmitting electromagnetic waves at first port 1730 and receiving the electromagnetic waves at second port 1732. In FIGS. 18-21, the X-axis represents distance from the port at which the measurement is carried out. For example, in FIG. 18, the X-axis represents the distance from first port 1730, whereas in FIG. 21, the X-axis represents the distance from second port 1732. FIGS. 18-21 also illustrate amplitudes of components corresponding to start point component 1802, component 1804 associated with wall thinning defect 1720, components 1806 associated with support 1724, component 1808 associated with moisture 1722 and end point component 1810. [0090] FIGS. 18-21 illustrate that components 1806 from supports 1724 are significant and components 1804 from wall thinning defect 1720 and moisture 1722 are almost buried in noise. Also, FIGS. 18-21 illustrate that the amplitude of components gradually attenuate with distance. This may be one of the reasons as to why anomalies appear almost invisible in S12 and S22- FIG. 18 (Sit) illustrates components 1804-1808 associated with moisture 1722, wall thinning defect 1720 and supports 1724, respectively. It can be seen that component 1808 associated with moisture 1722 has a low signal to noise ratio. FIG. 19 (S]2) illustrates components 1806 associated with wall thinning defect 1720 and supports 1724, respectively. The component 1808 has a low signal to noise ratio and is buried in noise. FIG. 20 (S22) clearly illustrates the component 1808 associated with moisture 1722. Component 1808 may have caused attenuation of other reflection parameters. It can be observed that signal to noise ratio of components 1806 associated with supports 1724 is low due to the attenuation. Component 1804 associated with wall thinning defect 1720 is almost invisible. FIG. 21 (S2i) illustrates observations where components 1808 and 1804 associated with moisture 1722 and wall thinning defect 1720, respectively are almost buried. [0091] FIGS. 18-21 illustrate that component 1804 associated with wall thinning defect 1720 near to first port 1730 has better signal to noise ratio in Su and S12 data, whereas components associated with moisture 1722 has better signal to noise ratio in S22 and S21 data as the moisture content is trapped closer to the second port 1732. Component 1804 in Su and S12 data confirms the presence of wall thinning defect 1720 in setup 1700. Similarly, component 1808 in S22 and S21 data confirms the presence of trapped moisture 1722 in setup 1700. Component 1708 in Sn, S12, S22 and S21 data confirms the presence of supports 1724 in setup 1700. If other additional components in any one of the S11, S12, S22 and S21, not associated with abovementioned anomalies were detected, then that component would be a false call or false anomaly. Such false anomalies may be filtered by the processor. The aforementioned transmission and/or reflection measurements may be further processed using high resolution spectral estimation technique (for example, MUSIC) to suppress noise and to increase signal to noise ratio of components. [0092] Referring now to FIG. 22, a flow chart of an exemplary process 2200 for identifying an anomaly in a region of interest of a pipe assembly is described. In step 2202, first probe 110 may be positioned at a first location along a pipe. In step 2204, second probe 112 may be positioned at a second location along the pipe. In step 2206, first electromagnetic waves may be transmitted from first probe 110 toward at least second probe 112. In step 2208, at least a portion of the first electromagnetic waves may be received at first probe 110 or second probe 112. In step 2210, second electromagnetic waves may be transmitted from second probe 112 toward at least first probe 110. In step 2212, at least a portion of the second electromagnetic waves may be received at second probe 112 or first probe 110. In step 2214, anomaly 120 may be detected in the region of interest based on the received electromagnetic waves. [0093] Although, the abovementioned description describes the use of at least two probes at different sides of the region of interest for detecting anomaly, in one example implementation, an anomaly may be identified using the at least two probes positioned at the same side of the region of interest. FIG. 23 describes an exemplary embodiment of a system 2300 where first probe 2310 and second probe 2312 are used for detecting an anomaly 2320 in a region of interest. First probe 2310 and second probe 2312 may be positioned at a first location, along the circumference of pipe assembly 2304 at a first horizontal position along the pipe length, for example, as illustrated in FIG. 23. [0094] Processor 2316 may excite first probe 2310 to transmit first electromagnetic waves at a first phase and first amplitude. In one example, the first electromagnetic waves may comprise continuous frequencies. In another example, the first electromagnetic waves may comprise discrete frequencies. In yet another example, the first electromagnetic waves may comprise continuous frequencies and discrete frequencies. [0095] Similarly, processor 2316 may excite second probe 2312 to transmit second electromagnetic waves at a second phase and second amplitude. In one example, the second electromagnetic waves may comprise continuous frequencies. In another example, the second electromagnetic waves may comprise discrete frequencies. In yet another example, the second electromagnetic waves may comprise continuous frequencies and discrete frequencies. [0096] In one example, first probe 2310 and second probe 2312 may be excited sequentially with a predefined relation between first probe 2310 and second probe 2312. In another example, first probe 2310 and second probe 2312 may be excited simultaneously with a predefined relation between first probe 2310 and second probe 2312. In one embodiment, the first phase may differ from the second phase and the first amplitude may be the same as the second amplitude. In another embodiment, the first phase may be the same as the second phase, while the first amplitude may differ from the second amplitude. In yet another embodiment, the first phase may differ from the second phase and the first amplitude may differ from the second amplitude. In another embodiment, the first phase may be the same as the second phase and the first amplitude may be the same as the second amplitude. Processor 2316 may use any of or all of the excitation patterns to detect the anomaly. These specific excitation patterns may lead to specific electromagnetic field patterns in pipe assembly 2302 that aid in better localization of the anomaly 2320. [0097] First probe 2310 and second probe 2312 may receive at least a portion of the first electromagnetic waves and the second electromagnetic waves. First probe 2310 and second probe 2312 may receive the first electromagnetic waves before the second electromagnetic waves. Processor 2316 coupled to first probe 2310 and second probe 2312 may obtain the portions of the first electromagnetic waves and the second electromagnetic waves received by first probe 2310 and second probe 2312. Similar to the process of detecting anomalies as described above, processor 2316 may process the received first electromagnetic waves and the second electromagnetic waves to detect an anomaly 2320. Processor 2316 may also localize the anomaly based on the processing. In addition, processor 2316 may classify anomaly 2320 by comparing signatures of anomaly 2320 with signatures in database 2318. The processor 2316 may also generate an anomaly image of region of interest. [0098] [0001]Referring now to FIG. 24, a flow chart of an exemplary process 2400 for identifying an anomaly in a region of interest of a pipe assembly is described. In step 2402, at least two probes may be positioned on a first side of the region of interest to be inspected. In step 2404, first electromagnetic waves may be transmitted from a first of the at least two probes at a first phase and first amplitude. In step 2406, second electromagnetic waves may be transmitted from a second of the at least two probes at a second phase and a second amplitude. In one embodiment, the first phase differs from the second phase or the first amplitude differs from the second amplitude. In step 2408, at least a portion of the first electromagnetic waves and the second electromagnetic waves may be received at the first probe and second probe. In step 2410, an anomaly may be detected in the region of interest based on the received electromagnetic waves. [0099] Although, the systems described herein are implemented for pipes, the systems can also be implemented in optical fiber cables or any other applicable field. [0100] The present invention has been described in terms of several embodiments solely for the purpose of illustration. Persons skilled in the art will recognize from this description that the invention is not limited to the embodiments described, but may be practiced with modifications and alterations limited only by the spirit and scope of the appended claims. CLAIMS: What is claimed is: 1. A method of identifying an anomaly in a region of interest of a pipe assembly having a pipe length, the method comprising: positioning along the pipe length, at least a first probe at a first location; positioning along the pipe length, at least a second probe at a second location; transmitting first electromagnetic waves from the first probe toward at least the second probe; receiving at least a portion of the first electromagnetic waves at the first probe or the second probe; transmitting second electromagnetic waves from the second probe toward at least the first probe; receiving at least a portion of the second electromagnetic waves at the second probe or the first probe; and detecting an anomaly in the region of interest based on the first electromagnetic waves received at the first and second probes and the second electromagnetic waves received at the second and first probes 2. The method of claim 1, wherein detecting further comprises localizing anomalies based on the received first and second electromagnetic waves. 3. The method of claim 1, wherein detecting further comprises classifying anomalies based on the received first and second electromagnetic waves. 4. The method of claim 1, wherein the first electromagnetic waves or the second electromagnetic waves comprise discrete frequencies. 5. The method of claim 1, wherein the first electromagnetic waves or the second electromagnetic waves comprise continuous frequencies. 6. The method of claim 1, wherein the first probe further comprises a plurality of first probe elements coupled in a first array positioned circumferentially around the pipe at the first position along the pipe length. 7. The method of claim 6, wherein each of the first array of probe elements transmit electromagnetic waves having a different phase or amplitude as compared to electromagnetic waves transmitted from each other of the first array of probe elements. 8. The method of claim 1, wherein the second probe further comprises a plurality of second probe elements coupled in a second array positioned circumferentially around the pipe at the second position along the pipe length. 9. The method of claim 8, wherein each of the second array of probes are configured to transmit electromagnetic waves using a different phase or amplitude as compared to electromagnetic waves transmitted from each other of the second array of probe elements. 10. A system for identifying an anomaly in a region of interest of a pipe assembly having a pipe length, the system comprising: a first probe positioned at a first location and configured to transmit and receive first electromagnetic waves; a second probe positioned at a second location and configured to transmit and receive second electromagnetic waves; and at least one processor coupled to the first and second probe and configured to cause the first probe to transmit the first electromagnetic waves; cause the second probe to transmit the second electromagnetic waves; and detect the anomaly in the region of interest based on the first electromagnetic waves received at the first and second probes and the second electromagnetic waves received at the second and first probes.