Multi-aperture imaging device with low sensitivity to false light, imaging system and method for providing a multi-aperture imaging device

description

The present invention relates to a multi-aperture imaging device, an imaging system, and a method for providing a multi-aperture imaging device. The present invention further relates to a multi-aperture imaging device and a multi-aperture imaging system with a possibly flexible diaphragm on a device for switching the viewing direction.

Conventional cameras have an imaging channel that maps the entire object field. The cameras have adaptive components that enable a relative lateral, two-dimensional shift between the lens and the image sensor to implement an optical image stabilization function.

Multi-aperture imaging systems with a linear channel arrangement consist of several imaging channels, each of which only records a part of the object and contains a deflecting mirror. The Umlenkspiegei can be rotatably mounted and, among other things, enable a switching of the viewing direction, so that the same camera can look in different viewing directions. B. form an angle of 180 °.

Concepts for multi-channel acquisition of object areas or visual fields that would enable high-quality image acquisition would be desirable.

The object of the present invention is therefore to create a multi-aperture imaging device, an imaging system and a method for providing a multi-aperture imaging device which enable image acquisition with a high image quality.

This object is achieved by the subject matter of the independent claims.

One finding of the present invention is to have recognized that by arranging an additional diaphragm structure to close a gap between a beam deflecting device and an array of optical channels, entry of false light from a direction in which the multi-aperture imaging device is not currently looking is reduced or even reduced can be prevented, so that a high quality of the image recording can be obtained based on a low degree of false light.

According to one exemplary embodiment, a multi-aperture imaging device comprises an array of optical channels, each optical channel comprising an optical system for imaging a partial field of view of an overall field of view onto an image sensor area of ​​an image sensor. The multi-aperture imaging device comprises a beam deflection device for deflecting a beam path of the optical channels in a viewing direction of the multi-aperture imaging device. The multi-aperture imaging device further comprises a diaphragm structure which is arranged to at least partially close a gap between the array and the beam deflection device.

Further exemplary embodiments relate to an imaging system and to a method for providing a multi-aperture imaging device.

Further advantageous embodiments are the subject of the dependent claims.

Preferred embodiments of the present invention are explained below with reference to the accompanying drawings. Show it:

1 shows a schematic perspective view of an aperture imaging device according to an exemplary embodiment;

2 shows a schematic side sectional view of a multi-aperture imaging device according to an exemplary embodiment in which an array of optical channels is formed in one line;

3 shows a schematic side sectional view of a multi-aperture imaging device according to an exemplary embodiment, in which the beam deflection device is designed to carry out a rotational movement about an axis of rotation;

advantageous configurations of a beam deflection device according to exemplary embodiments;

5a shows a schematic view of a multi-aperture imaging device according to an exemplary embodiment in a first rotational position of the

Beam deflection device in which a diaphragm structure closes a gap;

5a shows a schematic view of the multi-aperture imaging device from FIG. 5a in the second position of the beam deflection device, the diaphragm structure closing a gap at another location;

5a shows a schematic view of the ultimate aperture imaging device from FIG. 5a in an optional intermediate position between the first position and the second position;

is a schematic side sectional view of a multi-aperture imaging device according to an embodiment which has an optical image stabilizer;

a schematic perspective view of a multi-aperture imaging device according to an embodiment, which has transparent structures that are arranged along the viewing directions of the multi-aperture imaging device starting from the beam deflection device;

3 shows a schematic side sectional view of a multi-aperture imaging device according to an exemplary embodiment, which can optionally comprise the transparent structures, but can also be carried out without them without further ado;

a schematic representation of an overall field of view according to an embodiment, as can be detected for example with a multi-aperture imaging device described above;

10 is a schematic perspective view of an imaging system having a housing and at least a first and a second multi-aperture imaging device;

11 shows a schematic structure comprising a first multi-aperture imaging device and a second multi-aperture imaging device, as may be arranged, for example, in the imaging system from FIG. 10, according to an exemplary embodiment; and

12 shows a schematic flow diagram of a method for providing a

Multi-aperture imaging device, according to an embodiment.

Before exemplary embodiments of the present invention are explained in more detail below with reference to the drawings, it is pointed out that identical, functionally identical or functionally equivalent elements, objects and / or structures in the different figures are provided with the same reference symbols, so that those in different Described embodiments of the description of these elements is interchangeable or can be applied to each other.

1 shows a schematic perspective view of a multi-aperture imaging device 10 according to an exemplary embodiment. The ultimate aperture imaging device 10 comprises an image sensor, an array of optical channels 16a-h, a beam deflection device 18 and an aperture structure 22. Each optical channel 16a-h comprises an optical system 64a-h for imaging a partial field of view of an overall field of view onto an image sensor region 24a-h of the image sensor 12. The optical channels 16a-h can be understood as a course of beam paths 26a-h. The beam paths 26a-h can be influenced by the respective optics 64a-h arranged in the array 14, for example by scattering or bundling. The individual optical channels 16a-h can each form or comprise complete imaging optics and have at least one optical component or Optics, such as a refractive, diffractive or hybrid lens and can image a section of the overall object recorded with the multi-aperture imaging device. This means that one, several or all of the optics 64a-h can also be a combination of optical elements. An aperture diaphragm can be arranged with respect to one, several or all of the optical channels 16a-h.

The image sensor areas 24a-h can, for example, each be formed from a chip which comprises a corresponding pixel array, wherein the image sensor areas 24a-h can be mounted on a common substrate or a common circuit carrier, such as a common circuit board or a common flexboard. Alternatively, it would of course also be possible for the image sensor regions 24a-h to be formed in each case from a part of a common pixel array which extends continuously over the image sensor regions 24a-h, the common pixel array being formed, for example, on a single chip. For example, only the pixel values ​​of the common pixel array in the image sensor areas 24a-h are then read out. Different mixtures of these alternatives are of course also possible, such as. B. the presence of a chip for two or more optical channels and another chip for yet other optical channels or the like. In the case of several chips of the image sensor 12, these can be mounted, for example, on one or more circuit boards or circuit carriers, such as, for. B. all together or in groups or the like.

The beam deflection device 18 is designed to deflect the beam paths 26a-h of the optical channels 16a-h. For this purpose, the beam deflection device 18 can have, for example, a reflective main side which faces the optics 64a-h or the array 14 and is inclined in this respect. The inclination allows the beam paths 26a-h to be deflected into a viewing direction 27, the viewing direction 27 being able to describe a relative direction with respect to the multi-aperture imaging device 10, along which the object region to be detected is arranged.

Arranged at a distance from the beam deflection device, the array can have a carrier for holding the optics, a housing of the array or and / or a transparent structure which is designed to at least partially reduce the entry of particles to the beam deflection device, the Distance forms the gap. A gap 29, ie a distance, is arranged between the array 14 and the beam deflection device 18. The multi-aperture imaging device 10 is designed such that the aperture structure 22 at least partially closes the gap 29. As shown, the diaphragm structure 22 can overlap with the array 14 or a carrier 47 and / or the beam deflection device 18. That means, the aperture structure 22 can be in mechanical contact with the array 14 and / or the beam deflection device 18 and can be arranged outside a region or volume that is spatially arranged between the beam deflection device 18 and the array 14. As an alternative to the mechanical contact with the array 14, the diaphragm structure 22 can be in mechanical contact with a transparent structure, for example a transparent structure 42, which is explained in connection with FIG. 7. Alternatively, the diaphragm structure 22 can be arranged on the array 14 and / or the beam deflection device 18 such that the diaphragm structure is located spatially between the array 14 and the beam deflection device 18. In both cases, the gap 29 between the array 14 and the beam deflection device 18 is at least partially, that is,

A plurality or a plurality of partial fields of view of an overall field of view can be detectable by the optical channels, each partial field of view being detectable by at least one optical channel 16a-h. A partial field of view can thus be assigned to each optical channel, which is captured with the optical channel. Starting from the multi-aperture imaging device 10 and / or the beam deflection device 18, a direction can be assigned to each partial field of view, in which the respective beam path 26a-h of the optical channel 16a-h is deflected with the beam deflection device 18. The aperture structure 22 can be designed to prevent or at least partially reduce the entry of light, in particular from a direction that is different from the directions, which are assigned to the partial fields of view of the currently set viewing direction. By arranging the diaphragm structure 22 at an end of the carrier 47 and / or the beam deflection device 18 lying or arranged opposite to the viewing direction 27, the entry of false light from the direction opposite to the viewing direction 27 can be at least partially reduced. If the gap 29 is completely closed and the diaphragm structure 22 is designed to be completely opaque, a circumference of the false light, for example from the direction opposite to the viewing direction or even further directions, can even be completely reducible. With an increasing degree of reduction of the false light, an increasing degree of the image quality can be obtained. By arranging the diaphragm structure 22 at an end of the carrier 47 and / or the beam deflection device 18 lying or arranged opposite to the viewing direction 27, the entry of false light from the direction opposite to the viewing direction 27 can be at least partially reduced. If the gap 29 is completely closed and the diaphragm structure 22 is designed to be completely opaque, a circumference of the false light, for example from the direction opposite to the viewing direction or even further directions, can even be completely reducible. With an increasing degree of reduction of the false light, an increasing degree of the image quality can be obtained. By arranging the diaphragm structure 22 at an end of the carrier 47 and / or the beam deflection device 18 lying or arranged opposite to the viewing direction 27, the entry of false light from the direction opposite to the viewing direction 27 can be at least partially reduced. If the gap 29 is completely closed and the diaphragm structure 22 is designed to be completely opaque, a circumference of the false light, for example from the direction opposite to the viewing direction or even further directions, can even be completely reducible. With an increasing degree of reduction of the false light, an increasing degree of the image quality can be obtained.

FIG. 2 shows a schematic side sectional view of a multi-aperture imaging device 20 according to an exemplary embodiment in which the array 14 is formed in one line, which means that, in contrast to the two-line array from FIG. 1, only one line of optics 64 can be arranged.

The aperture structure 22 can be mechanically firmly connected to at least one of the array 14 and / or the beam deflection device 18 and thus held by this element

become. A loose or also firm mechanical contact can be obtained on the other element in order to close the gap 29.

3 shows a schematic side sectional view of a multi-aperture imaging device 30 according to a further exemplary embodiment, in which the beam deflection device 18 is designed to carry out a rotational movement 38 about an axis of rotation 44, a first position and a second position of the beam deflection device being based on the rotational movement 38 18 can be obtained. The beam deflecting device 18 is designed to steer the beam paths 26 in a first viewing direction 27i in the first position. The beam deflection device 18 is also designed to, in a second position, which is represented by dash-dotted lines, the beam paths 26 in a second viewing direction 27 2redirect. The beam deflection device 18 can have, for example, two opposite and reflective main sides 174a and 174b, different reflective main sides 174a or 174b facing the optics 64 in the different positions. This means that in the different positions, the beam deflection device 18 deflects the beam paths 26 with different main sides.

Based on positions between which the rotary movement 38 can be used to switch, a first gap 29i can be at least partially closed by a diaphragm structure 22i in a first position, as described, for example, in connection with the multi-aperture imaging device 20. Based on the rotational movement 38, the gap 29i can change in its dimension along a direction x, which runs parallel to a direction starting from the image sensor 12 to the beam deflection device 18 and parallel to a line extension direction of the array 14. In the second position, the gap 29 2 can be closed by the diaphragm structure 22 2 in order to prevent false light from entering from the unused viewing direction 27 i.

According to some requirements for multi-aperture imaging devices, a low or even minimal height of the multi-aperture imaging device is desired along a direction perpendicular to the x-direction and perpendicular to the line extension direction, for example along a y-direction, which can also be referred to as the thickness direction. Due to the diagonal arrangement of the beam deflecting device 18 with respect to the image sensor 12 and / or the array 14, an area dimension of the beam deflecting device 18 can be comparatively larger than an area of ​​the image sensor 12 in order to enable complete imaging and / or redirection of the beam path 26. That is

indicates that the beam deflecting device 18 would be inclined such that the main sides 174a and / or 174b are arranged parallel to the y direction, the beam deflecting device 18 would possibly protrude beyond the array 14 and / or the exposure sensor 12, which contradicts the aim of the minimum overall height ,

To switch between the two illustrated positions, it is also possible to control the beam deflection device 18 in such a way that the main sides 174a and / or 174b run parallel to the x-direction in a position between the first and second positions. In this case, sides of the beam deflecting device 18 can approach and / or move away from the array 14 during the movement, so that the size of the gap 29i and / or 292 is variable. At the same time, however, a finite distance between the beam deflection device 18 and the array 14 is required in order to enable the corresponding movement. This distance leads to the columns 29 · and / or 29 2, which can be closed by the described aperture structures 22i and / or 222, in order to at least partially prevent the entry of false light through the corresponding column.

In other words, it may be necessary to set a distance between a front edge of the mirror (beam deflection device) and the subsequent array of imaging optics so that the deflection mirror can rotate. This gap is transparent and therefore translucent. This can disadvantageously penetrate light into the structure from a direction that does not correspond to the intended viewing direction of the camera and which thus deteriorates the image quality. This effect can be counteracted with the aperture structures 22i and / or 22 2 .

A diaphragm made of opaque and / or flexible material can be arranged on the side / edge of the beam deflecting device of the multi-aperture imaging device with a linear channel arrangement and extends over the entire extent of the beam deflecting device and thus extends over the entire width of the array objective. This can, for example, resemble a sealing lip.

Before further details on the multi-aperture imaging devices described herein are explained, a preferred embodiment of the beam deflection device 18 will be discussed. Although this can also be formed as a planar mirror or as a double-sided mirror, a space-saving implementation can be obtained based on a wedge-shaped shape. Furthermore, several wedges in the

Beam deflection device 18 may be arranged and each form a facet thereof, each optical channel of the multi-aperture imaging device being assigned to one facet. Due to different inclinations of the facets to a reference position of the beam deflection device, the beam paths can be deflected in different directions, which enables a divergence of the direction deflection, ie a different direction deflection or a difference between two direction deflections, so that different partial areas of the overall object area can be detected.

4a-f, advantageous configurations of the beam deflection device 18 are described. The explanations show a number of advantages, which can be carried out individually or in any combination with one another, but are not intended to be restrictive.

4a shows a schematic side sectional view of a beam deflecting element 172 which can be used in the beam deflecting devices described here as one of the beam deflecting regions 46. The beam deflecting element 72 can be effective for one, a plurality or all of the optical channels 16a-d and have a polygonal cross-section. Although a triangular cross section is shown, it can also be any other polygon. As an alternative or in addition, the cross section can also have at least one curved surface, in particular in the case of reflecting surfaces an at least sectionally flat design can be advantageous in order to avoid imaging errors. The two main sides 174a and 174b can be inclined to one another by an angle δ. The angle δ can have a value between 1 ° and 89 °, preferably has a value between 5 ° and 60 ° and particularly preferably a value between 10 ° and 30 °. The main sides 174a and 174b are therefore preferably inclined to one another at an angle of at most 60 °.

The beam steering element 172 has, for example, a first side 174a, a second side 174b and a third side 174c. At least two sides, for example sides 174a and 174b, are designed to be reflective, so that the beam steering element 172 is designed to be reflective on both sides. Pages 174a and 174b can be main pages of the beam steering element 172, that is, pages the area of ​​which is larger than page 174c.

In other words, the beam steering element 172 can be wedge-shaped and reflective on both sides. A further surface can be arranged opposite the surface 174c, that is to say between the surfaces 174a and 174b, which is, however, considerably smaller than the surface 174c. In other words, the wedge formed by the surfaces 174a, 174b and 174c does not run to an arbitrary point, but is provided with a surface on the pointed side and is therefore truncated.

4b shows a schematic side sectional view of the beam deflecting element 172, in which a suspension or a displacement axis 176 of the beam deflecting element 172 is described. The displacement axis 176 can be, for example, the axis of rotation 44. The displacement axis 176, about which the beam deflecting element 172 can be rotated and / or translationally movable in the beam deflecting device 18, can be displaced eccentrically with respect to an area center of gravity 178 of the cross section. The center of area can alternatively also be a point which describes the half dimension of the beam deflecting element 172 along a thickness direction 182 and along a direction 184 perpendicular thereto.

The main page 174a may have a surface normal 175a, while the main page 174b may have a surface normal 175b. If a rotary movement about the displacement axis 176 is used in order to switch between the first position and the second position of the beam deflection device, the rotary movement of the beam deflection device can be carried out in such a way that an orientation according to which one of the main sides 174a or 174b corresponds to the two positions Array 14 is completely facing, is avoided, as described in connection with FIG. 3. This can also be understood that during a change between the first and the second operating state or position due to the rotary movement, the surface normal 175a and the surface normal 175b of the second main side always have an angle of at least 10 ° with respect to a direction towards the image sensor and possibly parallel to one Have surface normals of the image sensor. It can thus be avoided that one of the angles is 0 ° or 180 °, which can mean a high or approximately maximum extension of the beam deflection device along the thickness direction.

The displacement axis 176 can, for example, remain unchanged along a thickness direction 182 and have any offset in a direction perpendicular to it. Alternatively, an offset along the thickness direction 182 is also conceivable. The displacement can take place, for example, in such a way that when the beam deflecting element 172 rotates about the displacement axis 176, a higher adjustment path is obtained than when rotating around the area center of gravity 178. Thus, the displacement, by the displacement of the displacement axis 176

that the edge between the sides 174a and 174b is moved during a rotation with the same angle of rotation compared to a rotation around the centroid 178. The beam deflecting element 172 is preferably arranged such that the edge, that is to say the pointed side of the wedge-shaped cross section, faces the image sensor between the sides 174a and 174b. By means of slight rotational movements, a respective other side 174a or 174b can thus deflect the beam path of the optical channels. It is clear here that the rotation can be carried out in such a way that a space requirement of the beam deflecting device along the thickness direction 182 is small, since a movement of the beam deflecting element 172 such that a main side is perpendicular to the image sensor is not necessary.

The side 174c can also be referred to as the secondary side or as the rear side. A plurality of beam deflecting elements can be connected to one another in such a way that a connecting element is arranged on the side 74c, or runs through the cross section of the beam deflecting elements, that is to say is arranged in the interior of the beam deflecting elements, for example in the region of the displacement axis 176. In particular, the holding element can do so be arranged so that it does not protrude, or only to a small extent, ie, at most 50%, at most 30% or at most 10%, beyond the beam deflecting element 172 along direction 182, so that the holding element does not increase the extent of the overall structure along direction 182 or certainly. The extent in the thickness direction 182 can alternatively be determined by the lenses of the optical channels, ie

The beam deflecting element 172 can be formed from glass, ceramic, glass ceramic, plastic, metal or a combination of these materials and / or other materials.

In other words, the beam deflecting element 172 can be arranged such that the tip, ie the edge between the main sides 174a and 174b, faces the image sensor. The beam deflecting elements can be held in such a way that they only take place on the back or inside the beam deflecting elements, ie the main sides are not covered. A common retaining or connecting element can extend over the rear 174c. The axis of rotation of the beam deflecting element 172 can be arranged eccentrically.

FIG. 4c shows a schematic perspective view of a multi-aperture imaging device 40 which comprises an image sensor 12 and a single-line array 14 of optical channels 16a-d arranged next to one another. The beam deflection device 18 comprises a number of beam deflection elements 172a-d, which can correspond to the number of optical channels. Alternatively, a smaller number of beam deflection elements can be arranged, for example if at least one beam deflection element is used by two optical channels. Alternatively, a higher number can also be arranged, for example if the deflection direction of the beam deflection device 18 is switched by a translatory movement. Each beam deflecting element 172a-d can be assigned to an optical channel 16a-d. The beam deflecting elements 172a-d can be formed as a plurality of elements 172. Alternatively, at least two, several or all of the beam deflecting elements 172a-d can be formed in one piece with one another.

4d shows a schematic side sectional view of the beam deflecting element 172, the cross section of which is formed as a free-form surface, which means that it does not necessarily correspond to a simple triangle or quadrilateral. Thus, the side 174c can have a recess 186 which enables a holding element to be fastened, the recess 186 also being able to be formed as a projecting element, for example as a tongue of a tongue and groove system. The cross section also has a fourth side 174d, which has a smaller surface area than the main sides 174a and 174b and connects the same to one another.

4e shows a schematic side sectional view of a first beam deflecting element 172a and a second beam deflecting element 172b lying behind it in the direction of illustration. The recesses 186a and 186b can be arranged such that they are essentially congruent, so that an arrangement of a connecting element in the recesses is made possible.

FIG. 4f shows a schematic perspective view of the beam deflection device 18, which comprises, for example, four beam deflection elements 172a-d, which are connected to a connecting element 188. The connecting element can be usable in order to be moved by an actuator in a translatory and / or rotary manner. The connecting element 188 can be formed in one piece and run on or in the beam deflection elements 172a-d over an extension direction, for example the y direction. Alternatively, the connecting element 188 can also be connected only to at least one side of the beam deflection device 18, for example if the beam deflection elements 172a-d are formed in one piece. Alternatively, a connection to an actuator and / or a connection of the beam deflection elements 172a-d can also be made in any other way, for example by means of gluing, Starting or soldering. The beam deflecting elements 172a-d can be formed with a small spacing or even directly adjacent to one another, so that no or the smallest possible gaps are implemented between the beam deflecting elements 172a-d.

This means that the beam deflection device 18 can be formed as an array of facets arranged next to one another, each optical channel being assigned to one of the facets. The aperture structure can extend over the array of facets.

The beam deflection device can have a first and a second reflecting main side 174a and 174b, wherein the main sides can be inclined with respect to one another at an angle δ of 60 ° or less.

5a-5c, a multi-aperture imaging device 50 is explained below, which comprises the rotationally movable beam deflection device 18, which comprises the wedge-shaped facets according to FIGS. 4a-4f. For example, optics 64 of the array 14 are each formed as multi-part lens combinations. The multi-aperture imaging device 50 comprises the diaphragm structure 22, which can be mechanically fastened, for example, on a connecting edge between the main sides 174a and 174b or on the secondary side 174d. The optics 64 can be arranged in a housing 31. Optionally, the image sensor 12 can also be arranged in the housing 31. Although the following explanations relate to a housing in which the optics 64 are arranged, the same statements apply without restrictions to an array of optical channels, which has, for example, a carrier as described for the carrier 47. The optics 64 can be arranged on the possibly transparent support 47 directly or indirectly via holder structures. The housing 31 can, for example, have main sides 311 and 312, the main side 311 being characterized in that it is arranged facing the beam deflection device 18 and provides a side of the housing 31 that is adjacent to the beam deflection device 18. If, for example, FIG. 1 is considered, the carrier 47 can likewise have a main side which is arranged facing the beam deflection device 18 and a main side which is arranged facing the image sensor 12. Side pages 313 and 3I 4 can connect the two main pages 311 and 312 to one another. At least the main side 311 of the housing 31 can also be understood as a main side of the array.

5a shows the multi-aperture imaging device 50 with a first position of the beam steering device 18, in which the diaphragm structure 22 closes the gap 29i.

5b shows the multi-aperture imaging device 50 in the second position of the beam steering device 18, the diaphragm structure 22 closing the gap 29 2 . In the first position shown in FIG. 5 a, the diaphragm structure can make mechanical contact as far as possible outside, that is, adjacent to the secondary side 314, that is, the main side 311 adjacent to the secondary side 314 or, as shown for example in FIG. 1 is, the side 31 4 . 5b shows a situation in which the diaphragm structure 22 mechanically contacts the housing 31 or the array adjacent to the secondary side 313.

5c shows the multi-aperture imaging device 50 in an optional intermediate position between the first position and the second position. In this third position, the diaphragm structure 22 points to a region between the secondary sides 313 and 314. Based on the illustration according to FIGS. 5a and 5b, the diaphragm structure 22 can be elastic or flexible and, for example, provide a flexible diaphragm or sealing lip. For this purpose, the panel structure 22 can comprise elastic materials, such as silicone, polyurethane or other elastomers. While switching between the first and second positions, the aperture structure 22 can sweep over the main side 311. However, as shown in Fig. 5c, Based on a variable distance between the beam steering device 18 and the array 14 or the housing 31, a situation can also be obtained in which the diaphragm structure 22 is contactless with the array 14 or the housing 31. For this purpose, the multi-aperture imaging device 50 can comprise, for example, an actuator which is designed to translate the beam steering device 18 and / or the array 14 in order to temporarily increase a distance between the array and the beam steering device 18. This means that the multi-aperture imaging device 50 can be designed to provide a translatory movement between the array 14 and the aperture structure 22 during the rotational movement of the beam steering device,

In other words, an aperture extending over all facets of the mirror and thus over the entire width of the array objective is preferred on one side / edge of the beam steering device of the multi-aperture imaging device with a linear channel arrangement

arranged from a flexible material. This resembles a sealing lip. The flexible aperture is in the two use states, i.e. the first and the second position, either above or below the array lens and closes the gap between the array lens and the beam deflection device, so that false light is not or to a lesser extent can penetrate the camera. In a third state, in which the camera is not used, and in which the beam deflection device is parked in an intermediate position, the flexible diaphragm cannot rest either above or below the array lens.

6 shows a schematic side sectional view of a multi-aperture imaging device 60 according to an exemplary embodiment. Compared to the multi-aperture imaging device 50, the multi-aperture imaging device 60 has an optical image stabilizer 34 which is designed to exert a force on the array 14 or the housing 31 and / or the beam deflection device 18. The force generated can be used to obtain a relative movement between the image sensor 12, the array 14 and the beam deflection device 18, for example by translationally displacing the array 14 along one or both of the image axes of an image provided by the image sensor 12. Alternatively or additionally, a translational relative movement of the beam deflection device 18, approximately along the y direction and / or a rotational movement about the axis 176 in order to obtain optical image stabilization. Optical image stabilization can be advantageous if the multi-aperture imaging device 60 is moved relative to the object region whose visual field is captured during an acquisition process, during which partial visual fields or the overall visual field is captured. The optical image stabilizer 34 can be designed to at least partially counteract this movement in order to reduce or prevent blurring of the image. The optical image stabilizer 34 can be designed for the optical image stabilization along a first image axis 36, which can for example be arranged parallel to the line extension direction z. to generate a first relative movement between the image sensor 12, the array 14 and the beam deflection device 18. The optical image stabilizer 34 can be designed for the optical image stabilization along a second image axis 38 arranged perpendicular thereto, in order to generate a second relative movement between the image sensor 12, the array 14 and the beam deflection device 18. For the first relative movement, the optical image stabilizer 34 can be designed to translate the array 14 or the image sensor 12 along the image axis 36 in a translatory manner. Alternatively or additionally, the optical image stabilizer 34 can be designed to generate a translatory movement of the beam deflection device 18 along the image axis 36. The optical image stabilizer 34 is configured here that it executes the movements of the components such that the corresponding relative movement occurs between the image sensor 12, the array 14 and the beam deflection device 18. The relative movement can be carried out parallel to the line extension direction z and perpendicular to the beam paths. However, it can be advantageous to set the array 14 in a translatory movement with respect to the image sensor 12, for example in order to mechanically or to little load an electronic connection of the image sensor 12 to other components.

To generate the second relative movement, the optical image stabilizer 34 can be designed to generate or enable a rotational movement of the beam deflection device 18 and / or to have a translational relative movement between the image sensor 12 and the array 14 along the image axis 38 and / or a translational relative movement between to provide the array 14 and the beam deflecting device 18, wherein appropriate actuators can be arranged for this. For the generation of the rotational movement, for example parallel to the rotational movement 38 or as part thereof, the optical image stabilizer 34 can comprise, for example, an actuator which is designed to generate the rotational movement 38. Although the optical image stabilizer 34 is designed in such a way to maintain the optical image stabilization, that it controls the first and second relative movement as a translatory relative movement, it can be advantageous to design the second relative movement as a rotational movement 38, since in this case a translatory movement of components along the second image axis 38 can be avoided. This direction can lie parallel to a thickness direction of the multi-aperture imaging device 60, which according to some embodiments is intended to be kept as small as possible. Such a goal can be achieved by the rotational movement. since in this case a translational movement of components along the second image axis 38 can be avoided. This direction can lie parallel to a thickness direction of the multi-aperture imaging device 60, which according to some embodiments is intended to be kept as small as possible. Such a goal can be achieved by the rotational movement. since in this case a translational movement of components along the second image axis 38 can be avoided. This direction can lie parallel to a thickness direction of the multi-aperture imaging device 60, which according to some embodiments is intended to be kept as small as possible. Such a goal can be achieved by the rotational movement.

If FIG. 6 is now considered and the rotational movement 38 and / or a translatory movement of the array 14 along the z direction, which can be triggered by the optical image stabilizer 34, can be based on the elasticity of the aperture structure 22 or Stiffness of the diaphragm structure and the mechanical contact between the diaphragm structure 22 and the array 14 or the beam deflection device 18 a restoring force can be obtained if the respective relative movement is generated by the optical image stabilizer 34, since the diaphragm structure 22 is deformed based on the relative movement. As an alternative or in addition, such a restoring force can also be obtained at least partially by means of separate spring structures, for example elastic connecting elements.

In other words, the flexible diaphragm 22 itself or additionally inserted or attached elements can serve as spring elements for the beam deflection device and thus, for example when using the latter for optical image stabilization, have a resetting effect.

FIG. 7 shows a schematic perspective view of a multi-aperture imaging device 70 according to an exemplary embodiment, which has transparent structures 42a and 42b, which extend along the viewing directions 27i and 27 2are arranged starting from the beam deflecting device 18. The transparent structures 42a and 42b can be designed in order to prevent dirt or particles from entering the housing 31, the beam deflection device 18 or other components. Alternatively or additionally, touching the beam deflecting device 18, for example by a finger of a user or the like, can be prevented or made more difficult. The multi-aperture imaging device 70 has, for example, two viewing directions and two transparent structures 42a and 42b, each of the transparent structures 42a and 42b each having one of the viewing directions 27i and 27 2may be associated. If, for example, the multi-aperture imaging device 10 is viewed, which can be designed to have only one viewing direction, the multi-aperture imaging device can also be designed with only one transparent structure 42.

The transparent structures 42a can comprise, for example, a glass material and / or a polymer material and can be made essentially transparent for the electromagnetic radiation to be detected by the multipurpose imaging device 70, it also being conceivable for filters to be incorporated into the transparent structure. The transparent structures 42a and / or 42b can have a surface roughness that is low, which means that the transparent structures 42a and / or 42b can be made smooth.

An exemplary, but not restrictive value of a roughness R a for the transparent structures 42a and / or 42b can, for example, at most 0.03 μm, at most

0.005 μm or at most 0.0005 μm. The aperture structure 22 can have a roughness, the roughness value of which is comparatively greater than the roughness of the transparent structures 42a and / or 42b. This makes it more difficult or even possible to prevent the aperture structure 22 from adhering to a transparent structure 42a and / or 42b in the event of mechanical contact between the same. This means that, as an alternative to the mechanical contact with the array 14, the diaphragm structure 22 can be in mechanical contact with the transparent structure 42a and / or 42b, for example alternately in time. In the first position and in the second position, the diaphragm structure can be in mechanical contact with the array 14 or one of the transparent structures 42a and 42b on the one hand and with the beam deflection device 18 on the other hand.

In other words, the flexible screen 22 can have a rough surface, so that the screen does not adhere to smooth surfaces such as cover glasses 42a and / or 42b and / or even at low forces that can be applied by the beam deflection device, can be detached from the surface. This means that even if adherence is successful, the rotary structure can easily detach the panel structure 22 from the transparent structures 42a and / or 42b.

FIG. 8 shows a schematic side sectional view of a multi-aperture imaging device 80, which can optionally include the transparent structures 42a and 42b, but can also be implemented without them without further ado. The multi-aperture imaging device 80 comprises an aperture structure 22 ′, which can be formed similarly to the aperture structure 22, but can additionally comprise a magnetic or magnetizable material, such as ferromagnetic or paramagnetic materials. These materials can, for example, be introduced into the material of the panel structure 22 as particles, chips, sawdust or grinding chips. This means that the aperture structure 22 'can comprise magnetic materials. Adjacent to the housing 31 and / or the transparent structures 42a and / or 42b and thus adjacent to the diaphragm structure 22, a magnetic field-providing element 44a and / or 44b can be arranged, that is to say a magnetic field source. The elements 44a and / or 44b which provide the magnetic field can preferably be elements which provide a comparatively strong and a comparatively weak or no magnetic field in alternation over time. For example, the magnetic field sources 44a and 44b can be electromagnets. As an alternative or in addition, it is also conceivable that the magnetic field sources comprise, for example, permanent magnets and with a variable offset. The elements 44a and / or 44b which provide the magnetic field can preferably be elements which provide a comparatively strong and a comparatively weak or no magnetic field in alternation over time. For example, the magnetic field sources 44a and 44b can be electromagnets. As an alternative or in addition, it is also conceivable that the magnetic field sources comprise, for example, permanent magnets and with a variable offset. The elements 44a and / or 44b which provide the magnetic field can preferably be elements which provide a comparatively strong and a comparatively weak or no magnetic field in alternation over time. For example, the magnetic field sources 44a and 44b can be electromagnets. As an alternative or in addition, it is also conceivable that the magnetic field sources comprise, for example, permanent magnets and with a variable offset.

Stand to the aperture structure 22 'are arranged to provide a comparatively large magnetic field at a small distance and a comparatively low magnetic field at a high distance.

Magnetic fields of the magnetic field sources 44a and 44b can be configured such that an attractive force is exerted on the diaphragm structure 22 'based on the magnetic field, so that the attractive force executes or at least supports the rotational movement of the beam deflecting device 18. Alternatively or additionally, it is also conceivable that, after the rotational movement of the beam deflection device 18, a part of the diaphragm structure 22 ′ which may remain in the field of view of the array 14 is moved out of this field of view by the attractive force, that is to say is pulled out.

In other words, above and below the array objective, electromagnets can be formed from a coil and possibly an additional core, which attract the flexible diaphragm in addition to the rotary movement of the beam deflecting device 18, so that the diaphragm has an even better light-sealing effect.

The arrangement of a diaphragm structure described above makes it possible to improve false light suppression in multi-aperture imaging devices. Such multi-aperture imaging devices and / or multi-aperture imaging systems can be used in concepts with a linear channel arrangement and the smallest size.

According to exemplary embodiments, a focusing device can be provided, which is designed to provide a focus of the multi-aperture imaging device 80 or another multi-aperture imaging device, such as the multi-aperture imaging device 10, 20, individually for two or more, possibly all optical channels. 30, 40, 50, 60 or 70 to change. An actuator can be used for this, for example to change a distance between the array 14 and the image sensor 12. This can lead to a variable distance between the array 14 and the beam deflecting device 18, for example if the optics of the optical channel, ie the lens, are moved axially. The gap between the array 14 and the beam deflecting device 18 can remain closed by means of a flexible or elastic diaphragm,

tion of the same, compression / extension or deformation of the aperture structure 22 'can keep the gap closed.

9 shows a schematic representation of an overall field of view 71, as can be detected, for example, with a previously described multi-aperture imaging device, such as the multi-aperture imaging device 10, 20, 30, 40, 50, 60, 70 or 80. Although the ultimate aperture imaging devices described herein are described in this way If, for example, they have four optical channels for capturing four partial visual fields 72a-72d of the total visual field, it should be pointed out that the multi-aperture imaging devices described herein can also be formed with a different number of optical channels, for example with a number of at least 2, at least 3, at least 4, at least 10, at least 20 or an even higher value. It should also be noted that it is conceivable that some of the partial fields of view 72a-72d are captured with a number of more than one optical channel. The beam paths of the optical channels of the multi-aperture imaging devices can be steerable to partial field of view 72a-d that are different from one another, wherein a partial field of view 72a-d can be assigned to each optical channel. For example, the partial fields of view 72a-d overlap with one another in order to enable individual partial images to be joined together to form an overall image. If the multi-aperture imaging device has a number of optical channels different from 4, the overall field of view 71 can have a number of partial fields of view different from 4. Alternatively or additionally, at least one partial field of view 72a-d can be captured by a second or a higher number of optical channels with a higher number of modules (multi-aperture imaging devices) in order to form stereo, trio, quattro cameras or higher quality cameras. The individual modules can be shifted by fractions of a pixel and can be designed to implement methods of super resolution. A number of optical channels and / or a number of multi-aperture imaging devices and / or a number of partial visual fields is / are arbitrary, for example. to implement methods of super resolution. A number of optical channels and / or a number of multi-aperture imaging devices and / or a number of partial visual fields is / are arbitrary, for example. to implement methods of super resolution. A number of optical channels and / or a number of multi-aperture imaging devices and / or a number of partial visual fields is / are arbitrary, for example.

10 shows a schematic perspective view of an imaging system 100 which has a housing 73 and a first multi-aperture imaging device 10a and a second multi-aperture imaging device 10b which are arranged in the housing 73. The imaging system 100 is designed to stereoscopically capture the entire field of view 71, at least partially, approximately in the overlap area of ​​the detection areas of the multi-aperture imaging devices 10a and 10b, using the multi-aperture imaging devices 10a and 10b. The overlap area can be part of the total

Form field of view 71, but can also cover the entire field of view 71 almost completely or completely, ie, in a proportion of at least 95%, at least 97% or at least 99%. The overall field of view 71 is arranged, for example, on a main side 74b of the housing 73 facing away from a main side 74a. For example, the multi-aperture imaging devices 10a and 10b can cover the entire field of view 71 through transparent areas 68a and 68c, respectively, with diaphragms 78a and 78c arranged in the main side 74b being at least partially transparent. Apertures 78b and 78d arranged in the main side 74a can comprise transparent areas 78b and 78d, which at least partially optically close the transparent areas 68b and 68d, so that a circumference of false light from a side facing the main side 74a,

Although the multi-aperture imaging devices 10a and 10b are shown spaced apart from one another, the multi-aperture imaging devices 10a and 10b can also be spatially adjacent or combined. For example, the arrays of imaging devices 10a and 10b can be arranged next to one another or parallel to one another. The arrays can be formed in one line and can form lines arranged with respect to one another, wherein each multi-aperture imaging device 10a and 10b has a single-line array. The multi-aperture imaging devices 10a and 10b can have a common beam deflection device and / or a common carrier 47 and / or a common image sensor 12. As an alternative or in addition to the multi-aperture imaging device 10a and / or 10b, at least the multi-aperture imaging device 20, 30, 40, 50, 60, 70 and / or 80 can be arranged and / or a further multi-aperture imaging device 10. The common elements described above, such as the Beam deflection device 18 or the array 14 can be used by a common optical image stabilizer, since, for example, a movement of the beam deflection device can act jointly for optical channels of several modules, which enables a common optical image stabilization. Accordingly, the optical image stabilizer can also be implemented jointly for several modules and / or a common reference channel can be used for several modules. 70 and / or 80 and / or a further multi-aperture imaging device 10. The above-described common elements, such as the beam deflection device 18 or the array 14, can be used by a common optical image stabilizer, since, for example, a movement of the beam deflection device is common to several modules for optical channels can act, which enables a common optical image stabilization. Accordingly, the optical image stabilizer can also be implemented jointly for several modules and / or a common reference channel can be used for several modules. 70 and / or 80 and / or a further multi-aperture imaging device 10. The above-described common elements, such as the beam deflection device 18 or the array 14, can be used by a common optical image stabilizer, since, for example, a movement of the beam deflection device is common to several modules for optical channels can act, which enables a common optical image stabilization. Accordingly, the optical image stabilizer can also be implemented jointly for several modules and / or a common reference channel can be used for several modules. since, for example, a movement of the beam deflection device for optical channels of several modules can act together, which enables a common optical image stabilization. Accordingly, the optical image stabilizer can also be implemented jointly for several modules and / or a common reference channel can be used for several modules. since, for example, a movement of the beam deflection device for optical channels of several modules can act together, which enables a common optical image stabilization. Accordingly, the optical image stabilizer can also be implemented jointly for several modules and / or a common reference channel can be used for several modules.

The transparent areas 68a-d can additionally be equipped with a switchable diaphragm 78a-d, which covers the optical structure in the case of non-use. The bezels 78a-d may include a mechanically moving part. The movement of the mechanically moved part can take place using an actuator, as can also be provided for other movements, for example. The diaphragms 78a-d can alternatively or additionally be electrically controllable and comprise an electrochromic layer or an electrochromic layer sequence, ie, they can be formed as an electrochromic diaphragm.

1 1 shows a schematic structure comprising a first multi-aperture imaging device 10a and a second multi-aperture imaging device 10b, as may be arranged in the imaging system 100, for example. The arrays 14a and 14b can be formed in one line and can form a common line. The image sensors 12a and 12b can be marked on a common substrate or on a common circuit carrier, such as a common circuit board or a common flexboard. Alternatively, the image sensors 12a and 12b can also comprise substrates different from one another. Different mixtures of these alternatives are of course also possible, such as multi-aperture imaging devices comprising a common image sensor, a common array and / or a common beam deflection device 18 and further multi-aperture imaging devices which have separate components. An advantage of a common image sensor, a common array and / or a common beam deflection device is that movement of the respective components can be obtained with great precision by controlling a small number of actuators, and synchronization between actuators can be reduced or avoided. Furthermore, high thermal stability can be obtained. Alternatively or additionally, other and / or mutually different multi-aperture imaging devices can have a common array, a common image sensor and / or a common beam deflection device. which have separate components. An advantage of a common image sensor, a common array and / or a common beam deflection device is that movement of the respective components can be obtained with great precision by controlling a small amount of actuators and synchronization between actuators can be reduced or avoided. Furthermore, high thermal stability can be obtained. Alternatively or additionally, other and / or mutually different multi-aperture imaging devices can have a common array, a common image sensor and / or a common beam deflection device. which have separate components. An advantage of a common image sensor, a common array and / or a common beam deflection device is that movement of the respective components can be obtained with great precision by controlling a small amount of actuators and synchronization between actuators can be reduced or avoided. Furthermore, high thermal stability can be obtained. Alternatively or additionally, other and / or mutually different multi-aperture imaging devices can have a common array, a common image sensor and / or a common beam deflection device. that a movement of the respective components can be obtained with great precision by controlling a small amount of actuators, and synchronization between actuators can be reduced or avoided. Furthermore, high thermal stability can be obtained. Alternatively or additionally, other and / or mutually different multi-aperture imaging devices can have a common array, a common image sensor and / or a common beam deflection device. that a movement of the respective components can be obtained with great precision by controlling a small amount of actuators, and synchronization between actuators can be reduced or avoided. Furthermore, high thermal stability can be obtained. Alternatively or additionally, other and / or mutually different multi-aperture imaging devices can have a common array, a common image sensor and / or a common beam deflection device.

FIG. 12 shows a schematic flow diagram of a method 1200 for providing a multi-aperture imaging device, such as the multi-aperture imaging device 10.

The method 1200 comprises a step 1210, in which an array of optical channels is provided, so that each optical channel comprises an optical system for imaging a partial field of view of an overall field of view onto an image sensor area of ​​an image sensor. In a step 1220, a beam deflection device is arranged for deflecting a beam path of the optical channels in a viewing direction of the multi-aperture imaging device. In step 1230, a diaphragm structure is arranged in order to at least partially close a gap between the array and the beam steering device.

Although some aspects have been described in connection with a device, it goes without saying that these aspects also represent a description of the corresponding method, so that a block or a component of a device is also to be understood as a corresponding method step or as a feature of a method step , Analogously, aspects that have been described in connection with or as a method step also represent a description of a corresponding block or details or feature of a corresponding device.

The above-described embodiments are merely illustrative of the principles of the present invention. It is to be understood that modifications and variations in the arrangements and details described herein will be apparent to those skilled in the art. Therefore, it is intended that the invention be limited only by the scope of the following claims and not by the specific details presented with reference to the description and explanation of the exemplary embodiments herein.

claims

Multi-aperture imaging device with:

an array (14) of optical channels (16a-h), each optical channel (16a-h) an optical system (64a-h) for imaging a partial field of view (72a-d) of an overall field of view (71) onto an image sensor area (24a h) an image sensor (12);

a beam deflection device (18) for deflecting a beam path (26a-h) of the optical channels (16a-h) into a bending direction (27- or 27 2 ) of the multi-aperture imaging device; and

a diaphragm structure (22; 22 ') which is arranged to at least partially close a gap (29i, 29 2 ) between the array (14) and the beam deflecting device (18).

Multi-aperture imaging device according to Claim 1, in which each partial field of view (72-d) is assigned a direction in which a beam path (26a-h) of an optical channel (16a-h) is deflected with the beam deflection device (18), the diaphragm structure (22 ; 22 ') is designed to at least partially reduce the entry of light from a direction which differs from the directions assigned to the partial facial areas along the viewing direction (27i, 272).

Multi-aperture imaging device according to Claim 1 or 2, in which the array (14) is arranged at a distance from the beam deflection device (18), a carrier (47) for holding the optics (64a-h), a housing (31) of the array (14) or has a transparent structure (42a, 42b) which is designed to at least partially reduce the entry of particles to the beam deflecting device (18), the distance forming the gap (29i, 29 2 ).

A multi-aperture imaging device according to claim 3, wherein the aperture structure (22; 22 ') closes the gap by mechanical contact with the carrier (47), the housing (31) or the transparent structure (42a, 42b) on the one hand and the beam deflecting device (18) on the other ,

Multi-aperture imaging device according to one of the preceding claims, in which the diaphragm structure (22; 22 ') is arranged along a direction along which the beam paths (26a-h) of the optical channels (16a-h) between the array (14) and the steel deflection device ( 18) run.

Multi-aperture imaging device according to one of the preceding claims, in which the beam deflection device (18) is designed to steer the beam paths (26a-h) in a first viewing direction (27i) in a first position and to steer the beam paths (26a-) in a second position. h) to be deflected in a second viewing direction (27 2 ), the beam deflection device (18) being mounted so as to be rotatable and rotatable between the first position and the second position

Multi-aperture imaging device according to Claim 6, in which the diaphragm structure (22; 22 ') is mechanically connected to the beam deflection device (18) and is movable with the beam deflection device (18).

Multi-aperture imaging device according to one of claims 6 or 7, wherein the diaphragm structure (22; 22 ') in the first position and in the second position in mechanical contact with the one hand the array (14) or a transparent structure (42a, 42b), which are formed in order to at least partially reduce the entry of particles to the jet deflecting device (18) and, on the other hand, to the jet deflecting device (18).

Multi-aperture imaging device according to one of claims 6 to 8, in which the diaphragm structure (22; 22 ') is in the first position adjacent to a first secondary side (314) of the array (14) with the same in mechanical contact and in the second position adjacent to one opposite second side (313) of the array (14) is in mechanical contact and in which the beam deflecting device (18) has a third position, which is arranged rotationally between the first position and the second position and in which the diaphragm structure (22; 22 ') is spaced from the first and second secondary sides (313, 314) of the array (14).

Multi-aperture imaging device according to claim 9, which is designed to translational movement between during the rotational movement

the array (14) and the panel structure (22; 22 ') to temporarily increase a distance between the array (14) and the panel structure (22; 22').

1 1. Multi-aperture imaging device according to one of the preceding claims, wherein the diaphragm structure is designed to at least with the array (14) or a transparent structure (42a, 42b), which is designed to at least an entry of particles to the beam deflection device (18) partially reduce, and on the other hand to be in mechanical contact with the beam deflecting device (18) when the beam paths (26a-h) are deflected, the diaphragm structure (22; 22 ') having a mechanical stiffness which occurs during a relative movement between the array ( 14) and the beam deflection device (18) for optical image stabilization generates a restoring force which is configured to reset at least 30% of a maximum relative movement.

12. Multi-aperture imaging device according to one of the preceding claims, in which the diaphragm structure (22 ') comprises a magnetic material and in which a magnetic field-providing element (44a, 44b) is arranged adjacent to the diaphragm structure (22') and is formed around the To tighten panel structure (22 ').

13. Multi-aperture imaging device according to one of the preceding claims, in which a transparent structure (42a, 42b) is arranged along a direction along which the beam paths are deflected and is designed to at least partially admit particles to the beam deflection device (18) reduce, wherein a surface roughness of the panel structure (22; 22 ') is greater than a surface roughness of the transparent structure (42a, 42b).

14. Multi-aperture imaging device according to one of the preceding claims, in which the beam deflection device (18) is formed as an array of facets (172a-d) arranged next to one another, each optical channel (16a-d) being assigned to one of the facets (172a-d) , wherein the diaphragm structure (22; 22 ') extends over the array of facets (172a-d).

15. Multi-aperture imaging device according to one of the preceding claims, in which the diaphragm structure (22; 22 ') is formed elastically.

Multi-aperture imaging device according to one of the preceding claims, in which the diaphragm structure (22; 22 ') is partially or completely opaque.

A multi-aperture imaging device according to any one of the preceding claims, wherein the beam deflecting means (18) has a first reflective main face (174a) and a second reflective main face (174b), the first and second reflective main faces (174a, 174b) at an angle (δ) of are inclined at most 60 ° to each other.

Multi-aperture imaging device according to one of the preceding claims, in which the array (14) has a transparent support (47) through which the optical channels (16a-h) run and to which the optics (64a-h) are attached.

Multi-aperture imaging device according to one of the preceding claims with a focusing device for adjusting a focus of the multi-aperture imaging device, by changing a distance between the array (14) and the beam deflection device (18).

Imaging system with a first module comprising a multi-aperture imaging device according to one of the claims 1 to 16 and a second module comprising a multi-aperture imaging device according to one of the claims 1 to 14, wherein the first and the second module are designed to at least stereoscope the total field of view (71) capture.

The imaging system of claim 20, wherein the first module (10a) and the second module (10b) comprise at least one of a common array (14), a common beam deflector (18), and a common image sensor (12).

Method (1200) for providing a multi-aperture imaging device comprising the following steps:

Providing (1210) an array (14) of optical channels, so that each optical channel comprises an optical system for imaging a partial field of view of an overall field of view onto an image sensor area of ​​an image sensor;

Arranging (1220) a beam deflecting device for deflecting a beam path of the optical channels in a viewing direction of the multi-aperture imaging device; and

Arranging (1230) a diaphragm structure to at least partially close a gap between the array and the beam steering device.