CLIAMS:1. A plug and play cable for a simulation test kit for testing of an electronic trip unit of an air circuit breakers comprising:
a DC to DC converter,
a voltage divider; and
an operational amplifier, wherein said cable is configured to be coupled between said simulation test kit and said electronic trip unit of said air circuit breaker and further configured to test said electronic trip unit irrespective of the type of said electronic trip unit and original configuration of said simulation test kit.

2. The cable of claim 1, wherein said DC to DC convertor is configured to provide a proportionate analog DC signal by controlling V sense through low signal from DAC switch of said simulation test kit.

3. The cable of claim 1, wherein said signal from DAC switch is received at inverting terminal of said operational amplifier, and wherein said DC to DC convertor adjusts its output to desired voltage based on said signal from said DAC switch and output from said voltage divider.

4. The cable of claim 1, wherein DAC switch of said simulation test kit is programed to provide desired test signal from said cable.

5. The cable of claim 1, wherein said cable further comprises a capacitor and a resistor for tuning of response time for input to output transition of said operational amplifier.

6. The cable of claim 1, wherein said cable further comprises a free-wheeling diode.

7. The cable of claim 1, wherein said cable further comprises a LC filter.

8. The cable of claim 1, wherein said cable is configured with D-sub connectors on both ends for electrical connectivity with said simulation test kit and said electronic trip unit.
9. The cable of claim 8, wherein said cable incorporates various electronic/electrical items and is implemented on a PCB, wherein said PCB is located in one of said D-sub connectors.

10. A universal simulation test kit for testing an electronic trip units of an air circuit breaker comprising:
a simulation test kit for testing of said electronic trip units of said air circuit breakers;
a plug and play cable, wherein said universal simulation test kit is configured to be coupled with said electronic trip unit of said air circuit breaker and further configured to test said electronic trip unit irrespective of type of said electronic trip unit and original configuration of said simulation test kit; and wherein said plug and play cable comprises:
a DC to DC converter,
a voltage divider and;
an Operational amplifier, wherein said DC to DC convertor is configured to provide a proportionate analog DC signal by controlling V sense through low signal from DAC switch of said simulation test kit, wherein said DAC switch of said simulation test kit is programed to provide desired test signal from said plug and play cable.
,TagSPECI:TECHNICAL FIELD
[0001] The present disclosure generally pertains to the technical field of low and medium power supply systems. In particular, the present disclosure relates to a portable plug and play cable for simulation test kits for testing of Electronic Trip Units.

BACKGROUND
[0002] The background description includes information that may be useful in understanding the present disclosure. It is not an admission that any of the information provided herein is prior art or relevant to the presently claimed invention, or that any publication specifically or implicitly referenced is prior art.
[0003] Circuit breakers are provided in electrical circuits to interrupt the power supply while carrying out different maintenance routines and to protect various equipments, connected in circuit, from damage because of power surges such as over current and during short circuiting. Circuit breakers in turn are provided with a trip unit each, which can sense the surges in the power supply and actuate the circuit breaker. Air circuit breakers are provided with Electronic Trip Units (ETU) that can sense the fault in the power distribution system and trip the breaker with a set time delay. ETUs are therefore an important part of the air circuit breakers. Improper functioning of ETU can result in either frequent interruption of power supply or damage to connected equipments (in case ETU fails to actuate or operate the air circuit breaker after a surge in power supply). Therefore, it is a normal practice necessity to check and test ETUs for their proper operation before putting them use or even periodically depending on application. Test kits and simulation kits for testing of ETUs are known in the art. These test kits and simulation kits are generally designed for specific ETUs and can test ETUs operating within certain fixed current range.
[0004] Two parameters are mainly important for actuation of the ETUs, namely, over-current and set time delay. ETU(s) utilize a microprocessor to detect various types of over-current/over-voltage trip conditions and provide various protection functions, such as, for example, long time delay trip, short time delay trip, instantaneous trip, and/or ground fault trip. The long delay ETU function protects the load served by the protected electrical system from overloads and/or over-currents. The short delay ETU function can be used to coordinate tripping of downstream circuit breakers in a hierarchy of circuit breakers. The instantaneous ETU function protects the electrical conductors to which the circuit breaker is connected from damaging over-current conditions, such as short circuits and the ground fault trip function protects the electrical system from faults to ground. Therefore, appropriate setting of ETU in accordance with fault current level and load pattern performs a crucial role in the entire protection system.
[0005] Electronic programmable simulation kits are used for checking health and performance of ETUs by simulating fault conditions. However, different types of simulating signals are required for simulating different fault conditions in different ETUs. Therefore, dedicated simulation kits are designed for testing/simulating test conditions for a particular type of ETU. Thus, there have to be as many simulation test kits as the types of ETUs.
[0006] Under the above scenario, availability of a device that can allow for selective generation of simulating voltage over a wide range in accordance with ETU type, can allow for same test kit or same simulation kit to be used for checking of ETUs of different air circuit breakers. This will enable the user to configure the simulation kit according to ETU type and check performance of the ETU. It can be of further help to users if existing simulation kits could be used for testing of different types of ETUs irrespective of the configuration of the simulation kit.
[0007] There is therefore a need for a device that can allow configuration of existing dedicated simulation kits according to the ETU type, and allow for testing/checking of different types of ETUs with the same simulation kit.
[0008] All publications herein are incorporated by reference to the same extent as if each individual publication or patent application were specifically and individually indicated to be incorporated by reference. Where a definition or use of a term in an incorporated reference is inconsistent or contrary to the definition of that term provided herein, the definition of that term provided herein applies and the definition of that term in the reference does not apply.
[0009] In some embodiments, the numbers expressing quantities of ingredients, properties such as concentration, reaction conditions, and so forth, used to describe and claim certain embodiments of the invention are to be understood as being modified in some instances by the term “about.” Accordingly, in some embodiments, the numerical parameters set forth in the written description and attached claims are approximations that can vary depending upon the desired properties sought to be obtained by a particular embodiment. In some embodiments, the numerical parameters should be construed in light of the number of reported significant digits and by applying ordinary rounding techniques. Notwithstanding that the numerical ranges and parameters setting forth the broad scope of some embodiments of the invention are approximations, the numerical values set forth in the specific examples are reported as precisely as practicable. The numerical values presented in some embodiments of the invention may contain certain errors necessarily resulting from the standard deviation found in their respective testing measurements.
[00010] As used in the description herein and throughout the claims that follow, the meaning of “a,” “an,” and “the” includes plural reference unless the context clearly dictates otherwise. Also, as used in the description herein, the meaning of “in” includes “in” and “on” unless the context clearly dictates otherwise.
[00011] The recitation of ranges of values herein is merely intended to serve as a shorthand method of referring individually to each separate value falling within the range. Unless otherwise indicated herein, each individual value is incorporated into the specification as if it were individually recited herein. All methods described herein can be performed in any suitable order unless otherwise indicated herein or otherwise clearly contradicted by context. The use of any and all examples, or exemplary language (e.g. “such as”) provided with respect to certain embodiments herein is intended merely to better illuminate the invention and does not pose a limitation on the scope of the invention otherwise claimed. No language in the specification should be construed as indicating any non-claimed element essential to the practice of the invention.
[00012] Groupings of alternative elements or embodiments of the invention disclosed herein are not to be construed as limitations. Each group member can be referred to and claimed individually or in any combination with other members of the group or other elements found herein. One or more members of a group can be included in, or deleted from, a group for reasons of convenience and/or patentability. When any such inclusion or deletion occurs, the specification is herein deemed to contain the group as modified thus fulfilling the written description of all Markush groups used in the appended claims.

OBJECTS OF THE INVENTION
[00013] It is an object of the present disclosure to provide a simulation kit that can be used for testing of various types of ETUs.
[00014] It is an object of the present disclosure to prevent modification of any hardware of simulation kit and ETU while providing a simulation kit that can be used for testing of various types of ETUs.
[00015] It is an object of the present disclosure to provide an attachment for simulation kits so that any of the existing simulation kits, irrespective of their original configuration can be used for testing of various types of ETUs.
[00016] It is an object of the present disclosure to provide a portable plug and play cable that can be coupled to an existing simulation kit for testing of ETUs and allows the same simulation kit to simulate varying fault conditions for different ETUs.
[00017] It is an object of the present disclosure to provide a circuit diagram for the portable plug and play cable that can allow use of any of the existing simulation kit to simulate varying fault conditions for different ETUs.

SUMMARY
[00018] Aspects of the present disclosure pertain to simulation test kits used for testing Electronic Trip Units (ETUs) of air circuit breakers. In an aspect, the present disclosure provides a device that, when used with any existing simulation test kit can allow the kit to be used for testing of any type of Electronic Trip Units irrespective of its original configuration. In an aspect, the disclosed device is a plug and play cable that can incorporate the desired circuit and can be configured between a simulation testing kit and ETU being tested.
[00019] In an aspect of the disclosure, the circuit incorporated in the plug and play cable improves usage of DC to DC converter of the simulation kit and varies output voltage linearly by controlling the feedback voltage with the help of DAC, analog switch and op-amp integrator. This can allow user to use variable and controllable output voltage of DC to DC convertor to simulate fault condition while testing Electronic Trip Unit (ETU) of a Air Circuit Breaker (ACB). Since different parameters for the fault conditions can be selectively generated with same simulation kit, the invention of present disclosure can allow for testing/simulation of fault conditions for ETU(s) of different specification with the same simulation kit wherein no modification for such testing need to be done either on the simulation kit side or on the ETU side.
[00020] In an embodiment of the present disclosure, the circuit design for simulating the fault conditions can be embedded in a PCB and such PCB can include a DC to DC converter operating on a fixed 18V DC supply, a V sense signal that can be controlled through any Operational amplifier (referred to as Op amp hereinafter) circuitry that can be driven by voltage dividers and DAC signal coming from test kit and wherein the output of second DC to DC converter can be used as fault signal for ETU actuation/ACB release.
[00021] In another embodiment of the present disclosure, a PCB incorporating circuit for simulating condition can be housed in the portable plug and play cable, wherein one end of the portable plug and play cable can be operatively and electrically coupled with simulation kit and other end can be operatively and electrically coupled with ETU under testing. Such configuration of simulation kit coupled with plug and play cable can allow use of a single simulation kit to carry out testing of different types of ETUs of ACB making the simulation test kit universal.
[00022] Various objects, features, aspects and advantages of the inventive subject matter will become more apparent from the following detailed description of preferred embodiments, along with the accompanying drawing figures in which like numerals represent like components.

BRIEF DESCRIPTION OF THE DRAWINGS
[00023] The accompanying drawings are included to provide a further understanding of the present disclosure, and are incorporated in and constitute a part of this specification. The drawings illustrate exemplary embodiments of the present disclosure and, together with the description, serve to explain the principles of the present disclosure.
[00024] FIG. 1 illustrates an exemplary test set up 100 in accordance with an embodiment of the present disclosure.
[00025] FIG. 2 illustrates an exemplary circuit diagram of disclosed plug and play cable in accordance with embodiments of the present disclosure.

DETAILED DESCRIPTION
[00026] The following is a detailed description of embodiments of the disclosure depicted in the accompanying drawings. The embodiments are in such detail as to clearly communicate the disclosure. However, the amount of detail offered is not intended to limit the anticipated variations of embodiments; on the contrary, the intention is to cover all modifications, equivalents, and alternatives falling within the spirit and scope of the present disclosure as defined by the appended claims.
[00027] Each of the appended claims defines a separate invention, which for infringement purposes is recognized as including equivalents to the various elements or limitations specified in the claims. Depending on the context, all references below to the "invention" may in some cases refer to certain specific embodiments only. In other cases it will be recognized that references to the "invention" will refer to subject matter recited in one or more, but not necessarily all, of the claims.
[00028] Various terms as used herein are shown below. To the extent a term used in a claim is not defined below, it should be given the broadest definition persons in the pertinent art have given that term as reflected in printed publications and issued patents at the time of filing.
[00029] Embodiments of the present disclosure pertain to simulation test kits used for testing Electronic Trip Units (ETUs) of air circuit breakers. In an embodiment, the present disclosure provides a device that, when used with any existing simulation test kit, can allow the kit to be used for testing of any type of Electronic Trip Units irrespective of its original configuration. In an aspect, the disclosed device is a plug and play cable that can incorporate the desired circuit and can be configured between a simulation testing kit and ETU being tested.
[00030] In an embodiment of the present disclosure, usage of DC-to-DC converter of the simulation kit can be improved to vary the output voltage linearly by controlling the feedback voltage with the help of DAC, analog switch and op-amp integrator. This can allow the user to use variable and controllable output voltage of DC to DC convertor to simulate the fault condition while testing Electronic Trip Unit (ETU) of a Air Circuit Breaker (ACB). Since different parameters for the fault conditions can be simulated with same simulation kit, the disclosed plug and play cable can allow testing/simulation of fault conditions for ETU(s) of different specification with the same simulation kit without any modification of either the simulation kit side or on the ETU.
[00031] In an embodiment of the present disclosure, circuit design for simulating the fault conditions can be embedded in a PCB and such PCB can include a DC to DC converter operating on a fixed 18V DC supply, a V sense signal that can be controlled through any Op amp circuitry, and which can be driven by voltage dividers and DAC signal coming from test kit. The output of second DC to DC converter can be used as fault signal for ETU actuation/ACB release.
[00032] In another embodiment of the present disclosure, a PCB incorporating circuit design for simulating condition can be housed in a portable plug and play cable, and wherein one end of portable plug and play cable can be operatively and electrically coupled with simulation kit, and the other end can be operatively and electrically coupled with ETU under testing. Such configuration allows use of a single simulation kit to carry out testing for different types of ETUs making the simulation test kit universal.
[00033] FIG. 1 illustrates an exemplary test set up 100 in accordance with embodiments of the present disclosure. The test set up 100 includes a simulation kit 102 having a D-sub connector 104, a portable plug and play cable 110, wherein one end of cable 110 can include D-sub connector 106, and the other end can include a D-sub connector 112, and ETU 116 under testing. ETU 116 can also include a D-sub connector 114. D-sub connectors can be used for providing electrical connectivity between various units of the test set up. D-sub connector 106 of cable 110 can be used to provide physical and electrical connectivity of the simulation kit 102 through D-sub connector 104. Similarly, D-sub connector 112 can be used to provide physical and electrical connectivity through D-sub connector 114 between ETU 116. PCB 108 configured with various electronic/electrical items of the circuit (disclosed in subsequent paragraphs) can be located in D-sub connector 106 of cable 110 such that when D-sub connector 104 and D-sub connector 106 are in mated position, electrical connectivity can be established between simulation kit 102 and the PCB 108. Thus, in the test set up 100, simulation parameters programmed in simulation kit 102 can be available at D-sub connector 104 and through D-sub connector 104 to PCB 108. PCB 108 can process the input signal from simulation kit 102 and produce desired output signal through D-sub connector 112 of cable 110 to D-sub connector 114 of ETU 116. The instant of actuation/tripping of ETU 116 can then be monitored/recorded and displayed on simulation kit 102 for further analysis.
[00034] FIG. 2 illustrates an exemplary circuit diagram 200 in accordance with embodiments of the present disclosure. The exemplary circuit 200 can include an 18V input signal 202, a DC to DC converter 204, inductance L1 206, output DC to DC converter 208, free-wheeling diode 210, capacitors 212 and 222, resistors 214 and 216 (together forming a voltage divider), resistor 220, DAC switch 218, and Op amp 224. Values for all the components used in this circuit can be selected to get the desired output. It is further to be understood that the circuit design 200 shown is an exemplary design and has been shown only to illustrate the features of present disclosure and such circuit design can be realized through many other methods and all of them are well within the scope of the present disclosure.
[00035] In an embodiment, DC-to-DC convertor 204 can be configured to provide a proportionate analog DC signal by controlling V sense through low signal from DAC switch 218 of a simulation test kit. Signal from the DAC switch 218 of a simulation test kit can be received at inverting terminal of Op amp 224, and DC-to-DC convertor 204 adjusts its output to desired voltage based on signal from DAC and output from voltage divider formed by resistors 214 and 216.
[00036] A fixed 18 V input supply 202 can be given to input terminal of DC to DC converter 204. V sense signal 226 can be controlled by Op amp circuitry 224 and which itself can be driven by voltage divider consisting of resistor 214 and resistor 216 and DAC variable signal coming from test kit. Output of the DC-to-DC converter 208 can be the desired voltage output that can be used as fault signal for ACB release/actuation of ETU. During the initial stage, 18V input supply can be available to DC-to-DC converter 204. Output of DC to DC converter 208 can vary according to input at inverting terminal of Op amp 224 and as given by DAC switch 218 in conjunction with divider circuitry 214 and 216. DAC 218 output can be programmed in the test kit in accordance with test parameters and can be varied from 0 to 1.5 volts. Response time for input to output transition of Op amp 224 can be improved by proper tuning of capacitor 222 and resistor 220.
[00037] During the testing/checking of an ETU, test parameters pertaining to the ETU can be programmed in simulation kit 102. When the test cycle is actuated on the simulation kit 102, programmed DAC signal would appear at the inverting terminal of the Op amp 224. DC to DC convertor 204 would adjust the output 208 to desired voltage based on DAC signal and output of voltage divider 214 and 215. This output of DC-to-DC convertor 204 can be fed to ETU for further processing and accordingly the ETU would issue trip command. The trip time would get captured in the simulation kit and displayed on the screen.
[00038] Since the output of DC to DC converter 204 can be varied and controlled through programming of DAC 28 output, the invention of the present disclosure can allow use of any of the existing simulation kit 102 coupled with portable plug and play cable 110 to be used as a universal simulation kit for testing of different types of ETUs.
[00039] It should be appreciated that embodiments described are all exemplary and such method can easily be implemented as desired/ configured through any other circuit design, all of which are completely within the scope of the present disclosure.
[00040] While the foregoing describes various embodiments of the invention, other and further embodiments of the invention may be devised without departing from the basic scope thereof. The scope of the invention is determined by the claims that follow. The invention is not limited to the described embodiments, versions or examples, which are included to enable a person having ordinary skill in the art to make and use the invention when combined with information and knowledge available to the person having ordinary skill in the art.

ADVANTAGES OF THE INVENTION
[00041] The present disclosure provides a simulation kit that can be used for testing of various types of ETUs.
[00042] The present disclosure prevents modification of any hardware of simulation kit and ETU while providing a simulation kit that can be used for testing of various types of ETUs.
[00043] The present disclosure provides an attachment for simulation kits so that any of the existing simulation kits, irrespective of their original configuration can be used for testing of various types of ETUs.
[00044] The present disclosure provides a portable plug and play cable which can be coupled to an existing simulation kit for testing of ETUs and allows the same simulation kit to simulate varying fault conditions for different ETUs.
[00045] The present disclosure provides a circuit diagram for the portable plug and play cable that can allow use of any of the existing simulation kit to simulate varying fault conditions for different ETUs.