DESC:TECHNICAL FIELD
[0001] The present disclosure relates to the field of electronic testing systems and, more particularly, relates to an arrangement or protocol for testing various electronic equipment.
BACKGROUND
[0002] This section is intended to introduce the reader to various aspects of art that may be related to various aspects of the present disclosure, which are described below. This disclosure is believed to be helpful in providing the reader with background information to facilitate a better understanding of the various aspects of the present disclosure. Accordingly, it should be understood that these statements are to be read in this light, and not just as admissions of prior art.
[0003] In today’s world, electronic devices and equipment are an essential part of our lives, and they are used in almost every aspect of our daily routine. The efficient functioning of these devices depends on their proper testing and maintenance, which can be a time-consuming and complicated process. Testing each piece of equipment requires a different set of protocols and procedures, which can be challenging, especially when it comes to a wide range of electronic equipment such as single-phase inverters/UPS, transformers, printed circuit boards (PCBs) of power backup systems, solar panels, and electric vehicles (EVs).
[0004] To address this issue, there is a need for a protocol that can provide a standardized testing method for all electronic equipment. This would streamline the testing process and make it more efficient. A protocol would also reduce the time and resources required for testing, allowing manufacturers to produce equipment more quickly and cost-effectively. Additionally, a protocol could be developed for each category of equipment, such as inverters or solar panels, to ensure that each type of equipment is tested thoroughly and accurately.
[0005] The use of a testing protocol would benefit both manufacturers and consumers. Manufacturers would be able to produce equipment more quickly and cost-effectively, which would ultimately lead to lower prices for consumers. Consumers would also benefit from having equipment that is tested more thoroughly and accurately, ensuring that it functions properly and safely.
[0006] In conclusion, the development of a testing protocol would be a significant step towards streamlining the testing process for electronic equipment. By providing a standardized set of procedures that can be adapted to different types of equipment, a protocol would make testing more efficient and effective, ultimately benefiting both manufacturers and consumers.
SUMMARY
[0007] The present disclosure describes an arrangement or protocol for testing various electronic equipment, including single phase inverters/UPS, transformers, printed circuit boards of power backup systems, solar panels, and electric vehicles. The arrangement is designed to determine the appropriate testing parameters for each specific device and then check whether the device is functioning properly based on those parameters.
[0008] In an embodiment, the arrangement or protocol can identify the specific device that is being tested and determine the appropriate testing parameters for that device. For example, if a single phase inverter/UPS is connected for testing, the arrangement will figure out the testing parameters that apply specifically to that type of device. The arrangement will then check the operating readings of the device against predetermined values to ensure that it is functioning properly.
[0009] In an embodiment, the arrangement or protocol is designed to test all of the functional parameters associated with each device, including low battery conditions, high battery output voltage, different battery voltages and load conditions, overload and short circuit accuracy, and low cut and high cut on the mains mode. In addition, the arrangement can also test solar parameters such as MPPT efficiency and other relevant parameters.
[00010] In an embodiment, the arrangement or protocol is designed to test all of the functional parameters associated with each device, including low battery conditions, high battery output voltage, different battery voltages and load conditions, overload and short circuit accuracy, and low cut and high cut on the mains mode. This ensures that the devices are fully tested for their intended functionality, which increases the overall reliability and safety of the equipment.
[00011] The technical effect of the invention is to provide an arrangement or protocol that can streamline the testing process for all of these different devices. The arrangement is able to identify the specific device being tested and determine the appropriate testing parameters for that device, which eliminates the need for separate testing protocols. This simplifies the testing process and reduces the amount of time and resources required to test each device.
[00012] The invention aims to efficiently and effectively test various electronic equipment, including those mentioned above, by using a common set of protocols and procedures. This means that the process of testing different pieces of equipment becomes faster and more streamlined, which can lead to significant cost savings and increased productivity.
[00013] The invention could have a significant impact on the industry as a whole, as it could simplify and accelerate the process of testing various types of electronic equipment. This could lead to more efficient and effective testing, which would ultimately result in better products and services for consumers.
[00014] The invention may also have an impact on the development of new electronic equipment, as it could make the testing process faster and more efficient. This could encourage more innovation in the industry, leading to the development of new and improved products that are more reliable, efficient, and cost-effective.
[00015] Overall, the invention described in the present disclosure has the potential to revolutionize the testing of electronic equipment, making it faster, more efficient, and more cost-effective. With the increasing demand for electronic products and services, this invention could have a significant impact on the industry as a whole, benefiting both consumers and businesses alike.
[00016] In summary, the present disclosure describes an arrangement or protocol for testing various electronic equipment that is able to determine the appropriate testing parameters for each specific device and then check whether the device is functioning properly based on those parameters.
BRIEF DESCRIPTION OF THE DRAWINGS
[00017] To further clarify advantages and features of the present disclosure, a more particular description of the disclosure will be rendered by reference to specific embodiments thereof, which is illustrated in the appended drawings. It is appreciated that these drawings depict only typical embodiments of the disclosure and are therefore not to be considered limiting of its scope. The disclosure will be described and explained with additional specificity and detail with the accompanying drawings in which:
[00018] Figure 1(a) illustrates a user interface displaying hardware configuration of UPS when invertor is off;
[00019] Figure 1(b) illustrates a user interface displaying system and user configurations of UPS when invertor is off;
[00020] Figure 2(a)-(c) illustrates a user interface displaying parameters and status of UPS when invertor is off;
[00021] Figure 3(a) illustrates a user interface displaying hardware configuration of UPS when invertor is on;
[00022] Figure 3(b) illustrates a user interface displaying system and user configurations of UPS when invertor is on;
[00023] Figure 4 illustrates a method for testing electronic devices according to an embodiment of the invention;
[00024] Figure 5 illustrates an analytic report detailing UPS on/off time, duration, and average load over the past few days;
[00025] Figure 6 illustrates a smart factory dashboard indicating the status of PCB transformer, inverter, and PCB; and
[00026] Figure 7 displays various devices connected for testing and monitoring.
DETAILED DESCRIPTION
[00027] It will be understood by those skilled in the art that the foregoing general description and the following detailed description are exemplary and explanatory of the disclosure and are not intended to be restrictive thereof.
[00028] Reference throughout this specification to “an embodiment”, “another embodiment”, “an implementation”, “another implementation” or similar language means that a particular feature, structure, or characteristic described in connection with the embodiment is included in at least one embodiment of the present disclosure. Thus, appearances of the phrase “in an embodiment”, “in another embodiment”, “in one implementation”, “in another implementation”, and similar language throughout this specification may, but do not necessarily, all refer to the same embodiment.
[00029] The terms “comprises”, “comprising”, or any other variations thereof, are intended to cover a non-exclusive inclusion, such that a process or method that comprises a list of steps does not include only those steps but may include other steps not expressly listed or inherent to such process or method. Similarly, one or more devices or sub-systems or elements or structures proceeded by “comprises a” does not, without more constraints, preclude the existence of other devices or other sub-systems or other elements or other structures or additional devices or additional sub-systems or additional elements or additional structures.
[00030] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure belongs. The apparatus, system, and examples provided herein are illustrative only and not intended to be limiting.
[00031] The terms “a” and “an” herein do not denote a limitation of quantity, but rather denote the presence of at least one of the referenced items.
[00032] The present disclosure presents an arrangement or protocol for testing various types of electronic equipment, including single-phase inverters/UPS, transformers, printed circuit boards of power backup systems, solar panels, and electric vehicles. The arrangement or protocol is designed to identify the specific device being tested and determine the appropriate testing parameters for that device. The invention is expected to increase the overall reliability and safety of the equipment by testing all the functional parameters associated with each device.
[00033] For testing single-phase inverters/UPS. The arrangement or protocol can identify the specific inverter/UPS being tested and determine the appropriate testing parameters for that device. All of the functional parameters associated with the inverter/UPS are tested, including low battery conditions, high battery output voltage, different battery voltages and load conditions, overload and short circuit accuracy, and low cut and high cut on the mains mode. This ensures that the inverter/UPS is fully tested for its intended functionality, which increases the overall reliability and safety of the equipment.
[00034] Figures 1-3 depict various user interfaces that display the hardware configuration, system and user configurations, parameters, and status of a UPS when the inverter is both on and off. Figure 1(a)-(b) show the user interfaces displaying the hardware and system/user configurations when the inverter is off, while Figures 2(a)-(c) illustrate the user interface displaying the parameters and status when the inverter is off. Figures 3(a)-(b) show the user interfaces displaying the hardware and system/user configurations when the inverter is on.
[00035] For testing transformers, the arrangement or protocol can identify the specific transformer being tested and determine the appropriate testing parameters for that device. All of the functional parameters associated with the transformer are tested, including input and output voltage, current, and frequency, winding resistance, insulation resistance, and impedance. This ensures that the transformer is fully tested for its intended functionality, which increases the overall reliability and safety of the equipment.
[00036] For testing the printed circuit boards of power backup systems, the arrangement or protocol can identify the specific printed circuit board being tested and determine the appropriate testing parameters for that device. All of the functional parameters associated with the printed circuit board are tested, including input and output voltage, current, and frequency, resistance, capacitance, and inductance. This ensures that the printed circuit board is fully tested for its intended functionality, which increases the overall reliability and safety of the equipment.
[00037] For testing solar panels, the arrangement or protocol can identify the specific solar panel being tested and determine the appropriate testing parameters for that device. All of the functional parameters associated with the solar panel are tested, including maximum power point tracking (MPPT) efficiency, open circuit voltage, short circuit current, maximum power output, and temperature coefficient. This ensures that the solar panel is fully tested for its intended functionality, which increases the overall reliability and safety of the equipment.
[00038] For testing electric vehicles, the arrangement or protocol can identify the specific electric vehicle being tested and determine the appropriate testing parameters for that device. All of the functional parameters associated with the electric vehicle are tested, including battery capacity, charging time, charging efficiency, range, and speed. This ensures that the electric vehicle is fully tested for its intended functionality, which increases the overall reliability and safety of the equipment.
[00039] Figure 4 illustrates a method for testing electronic devices, encompassing identification of the device, determination of testing parameters, examination of operating readings, and comparison with predefined values or ranges. The method is versatile, applicable to various electronic devices including single phase inverters/UPS, transformers, printed circuit boards of power backup systems, solar panels, and electric vehicles. It evaluates functional parameters like battery conditions, voltage outputs, load conditions, and mains mode performance, ensuring thorough assessment. Moreover, it incorporates testing of solar-specific parameters such as Maximum Power Point Tracking (MPPT) efficiency, enhancing its utility across renewable energy systems. The method facilitates efficient quality control and maintenance, ensuring optimal performance of electronic devices. Each steps of the testing method are described in detail below.
[00040] Identification of Electronic Device: The method initiates with the identification of the electronic device connected for testing. This step ensures that the testing procedure is tailored to the specific device under evaluation, enabling precise assessment of its functionality.
[00041] Determination of Testing Parameters: Upon identification, the method determines one or more testing parameters pertinent to the particular electronic device. These parameters are crucial indicators of device performance and may vary depending on the device type. By establishing these parameters, the testing process is streamlined and focused on key aspects of device operation.
[00042] Examination of Operating Readings: Once the testing parameters are defined, the method proceeds to check the operating readings of the device concerning the determined testing parameters. This step involves collecting real-time data regarding the device's performance, such as voltage, current, temperature, or other relevant metrics.
[00043] Comparison with Predetermined Values/Ranges: The collected operating readings are then compared with predetermined values or ranges corresponding to the testing parameters. These predetermined values serve as benchmarks for evaluating the device's performance. Deviations from these values indicate potential issues or discrepancies requiring attention.
[00044] Displaying Device Status: Based on the comparison results, the method displays the status of the device. If the operating readings fall within the predetermined ranges, the device is indicated as working properly, signifying its operational integrity and compliance with quality standards.
[00045] Comprehensive Testing: In addition to basic functionality assessment, the method extends to comprehensive testing of various functional parameters associated with each device category. For instance, in the case of inverters/UPS, it evaluates factors such as low battery conditions, high battery output voltage, overload accuracy, and mains mode performance.
[00046] Solar Parameter Testing: Recognizing the significance of renewable energy technologies, the method incorporates testing of solar-specific parameters for devices like solar panels. This includes assessing parameters like MPPT efficiency, which is critical for optimizing energy conversion in solar systems.
[00047] Quality Control and Maintenance: By encompassing a wide range of testing parameters and device categories, the method facilitates robust quality control and maintenance practices. It enables early detection of faults or inefficiencies, allowing for timely interventions to ensure optimal device performance and longevity.
[00048] The proposed method offers a systematic and comprehensive approach to electronic device testing, catering to diverse device types and functionalities. By integrating advanced testing parameters and accommodating renewable energy technologies, it addresses the evolving landscape of electronic device technologies. This methodology serves as a valuable tool for quality assurance, facilitating efficient maintenance practices and enhancing overall reliability of electronic devices.
[00049] Figure 5 illustrates an analytic report detailing UPS on/off time, duration, and average load over the past few days. Additionally, Figure 6 showcases a smart factory dashboard indicating the status of PCB transformer, inverter, and PCB, while Figure 7 displays various devices connected for testing and monitoring, enhancing visibility and control over the testing process.
[00050] The invention presented in the disclosure provides an arrangement or protocol for testing various types of electronic equipment, including single-phase inverters/UPS, transformers, printed circuit boards of power backup systems, solar panels, and electric vehicles. The invention can identify the specific device being tested and determine the appropriate testing parameters for that device. The invention can test all the functional parameters associated with each device, which increases the overall reliability and safety of the equipment. Each embodiment has its own specific testing parameters that ensure the equipment.
[00051] The technical effect of the invention is to provide an arrangement or protocol that can streamline the testing process for all of these different devices. The arrangement is able to identify the specific device being tested and determine the appropriate testing parameters for that device, which eliminates the need for separate testing protocols. This simplifies the testing process and reduces the amount of time and resources required to test each device.
[00052] The invention addresses the technical problem of inefficient and complicated testing procedures for various electronic equipment. With this invention, a common set of protocols and procedures can be used to efficiently and effectively test various electronic equipment, including those mentioned above. This means that the process of testing different pieces of equipment becomes faster and more streamlined, which can lead to significant cost savings and increased productivity.
[00053] Furthermore, the invention could have a significant impact on the industry as a whole. By simplifying and accelerating the process of testing various types of electronic equipment, the invention could lead to more efficient and effective testing, which would ultimately result in better products and services for consumers. This could also have an impact on the development of new electronic equipment, as it could make the testing process faster and more efficient. This could encourage more innovation in the industry, leading to the development of new and improved products that are more reliable, efficient, and cost-effective.
[00054] In conclusion, the invention described in the present disclosure has the potential to revolutionize the testing of electronic equipment, making it faster, more efficient, and more cost-effective. With the increasing demand for electronic products and services, this invention could have a significant impact on the industry as a whole, benefiting both consumers and businesses alike.
[00055] Benefits, other advantages, and solutions to problems have been described above with regard to specific embodiments. However, the benefits, advantages, solutions to problems, and any component(s) that may cause any benefit, advantage, or solution to occur or become more pronounced are not to be construed as a critical, required, or essential feature or component of any or all the claims.
[00056] While specific language has been used to describe the disclosure, any limitations arising on account of the same are not intended. As would be apparent to a person in the art, various working modifications may be made to the apparatus in order to implement the inventive concept as taught herein.

,CLAIMS:WE CLAIM:
1. A method for testing one or more electronic devices, comprising:
identifying (401) electronic device connected for testing;
determining (402) one or more testing parameters for the determined electronic device;
checking (403) the operating readings of the device for the determined testing parameters;
comparing (404) the operating readings with the predetermined values/ranges for the determined testing parameter;
displaying (405) the device as working properly when the operating readings are within the predetermined ranges.

2. The method as claimed in Claim 1, further comprising displaying the device as not working properly when the operating readings are outside the predetermined ranges.

3. The method as claimed in Claim 1, wherein the electronic devices include one or more of single phase inverters/UPS, transformers, printed circuit boards of power backup systems, solar panels, and electric vehicles.

4. The method as claimed in claim 1, wherein the method comprises testing one or more of the functional parameters associated with each device, including low battery conditions, high battery output voltage, different battery voltages and load conditions, overload and short circuit accuracy, and low cut and high cut on the mains mode.

5. The method as claimed in claim 1, further comprising testing solar parameters such as MPPT efficiency and other relevant parameters.