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"Simplified Checking Bench For Telescopes And Auto Checkable Telescopes"

Abstract: The general field of the invention is that of the optical checking of optical instruments of telescope type. The instrument (100) comprises an optical objective (110), a photo-detection housing (120) arranged at the focus of said optical objective and at least one light source (121) arranged in the vicinity of said photo-detection housing, the optical pupil of the optical objective having a first diameter. The checking means essentially comprise a plane mirror (130) having a second diameter that is smaller than the first diameter and means making it possible to arrange this plane mirror in such a way that the image of the light source given by the optical objective and reflected by said plane mirror is focused on the photo-detection housing, means for analyzing said image received making it possible to determine the optical quality of the telescope. The plane mirror may be associated with an autonomous checking bench. It may also form part of the telescope and be incorporated into the protection hood (140) for the optic.

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Notices, Deadlines & Correspondence

Patent Information

Application #
Filing Date
23 February 2012
Publication Number
23/2015
Publication Type
INA
Invention Field
PHYSICS
Status
Email
Parent Application
Patent Number
Legal Status
Grant Date
2023-06-08
Renewal Date

Applicants

THALES
45 RUE DE VILLIERS, 92200 NEUILLY-SUR-SEINE, FRANCE

Inventors

1. GUILLAUME PERRIN
7 PLACE DE GAULLE, 06400 LA COLLE SUR LOUP, FRANCE
2. ARNAUD LIOTARD
81 CHEMIN DE POISSONIERS, DOMAINE DE L'ORME, VILLA 23, 06130 GRASSE, FRANCE
3. HERVE BENARD
342 CHEMIN DES CHAUMETTES, 83440, MONTAUROUX, FRANCE

Specification

Simplified checking bench for telescopes and auto-checkable telescopes The field of the invention is that of the checking and measurement of the optical quality of optical instruments comprising optical elements of large dimension, of telescope type. The measurement of optical performance is the key point of the program of tests of a telescope after its assembly. More exactly this entails carrying out a set of measurements before and after a certain number of trials in vibratory or thermal environments so as to check the variations in the optical performance of the instrument when it undergoes diverse constraints. The optical quality of the instrument is characterized by a wavefront phase error, also called the "WFE", the acronym standing for "Wave-Front Error". This WFE takes into account the aberrations of the mirrors of the telescope, and also the various defects of alignment of the mirrors constituting the telescope or of the detector with respect to the telescope. Knowing the WFE, the Optical Transfer Function of the telescope, also denoted OTF, is deduced therefrom. This function is linked to the former by a conventional auto-correlation relation. Knowing the optical transfer function OTF, the Modulation Transfer Function MTFof the instrument is then calculated by switching to the modulus of the optical transfer function. The defects of alignment between the various components of the instrument not being predictable, measurement of the MTF is indispensable for characterizing the instrument. Currently, measurement of the MTF of a telescope requires the use of very precisely adjusted optical components of high optical quality, of diameter at least equal to that of the telescope and arranged in a thermally and mechanically stabilized vacuum enclosure in order to filter the vibrations. Such measurement is therefore extremely expensive, the hardware required comprising at least one optical collimator of large dimension and a stabilized vacuum enclosure together equals several million euros. This cost becomes prohibitive when dealing with checking a large telescope outside of its manufacturing unit in operational use. Indeed, it 2 becomes impossible to envisage a conventional iVITF measurement at the end customer, in the course of programs of tests with a checl

Documents

Application Documents

# Name Date
1 519-del-2012-GPA (09-07-2012).pdf 2012-07-09
2 519-del-2012-Correspondence others- (09-07-2012).pdf 2012-07-09
3 Abstract.jpg 2012-10-17
4 519-del-2012-Form-5.pdf 2012-10-17
5 519-del-2012-Form-3.pdf 2012-10-17
6 519-del-2012-Form-2.pdf 2012-10-17
7 519-del-2012-Form-1.pdf 2012-10-17
8 519-del-2012-Drawings.pdf 2012-10-17
9 519-del-2012-Description (Complete).pdf 2012-10-17
10 519-del-2012-Correspondence-others.pdf 2012-10-17
11 519-del-2012-Claims.pdf 2012-10-17
12 519-del-2012-Abstract.pdf 2012-10-17
13 Form 3 [15-05-2017(online)].pdf 2017-05-15
14 Other Patent Document [16-05-2017(online)].pdf 2017-05-16
15 519-DEL-2012-FORM 3 [26-02-2018(online)].pdf 2018-02-26
16 519-DEL-2012-FER.pdf 2018-11-12
17 519-DEL-2012-PETITION UNDER RULE 137 [31-01-2019(online)].pdf 2019-01-31
18 519-DEL-2012-OTHERS-010219.pdf 2019-02-08
19 519-DEL-2012-Correspondence-010219.pdf 2019-02-08
20 519-DEL-2012-Retyped Pages under Rule 14(1) (MANDATORY) [10-05-2019(online)].pdf 2019-05-10
21 519-DEL-2012-OTHERS [10-05-2019(online)].pdf 2019-05-10
22 519-DEL-2012-FORM-26 [10-05-2019(online)].pdf 2019-05-10
23 519-DEL-2012-FER_SER_REPLY [10-05-2019(online)].pdf 2019-05-10
24 519-DEL-2012-CLAIMS [10-05-2019(online)].pdf 2019-05-10
25 519-DEL-2012-2. Marked Copy under Rule 14(2) (MANDATORY) [10-05-2019(online)].pdf 2019-05-10
26 519-DEL-2012-Power of Attorney-140519.pdf 2019-05-24
27 519-DEL-2012-Correspondence-140519.pdf 2019-05-24
28 519-DEL-2012-FORM 3 [14-11-2019(online)].pdf 2019-11-14
29 519-DEL-2012-FORM 3 [23-09-2020(online)].pdf 2020-09-23
30 519-DEL-2012-FORM 3 [20-08-2021(online)].pdf 2021-08-20
31 519-DEL-2012-FORM 3 [04-07-2022(online)].pdf 2022-07-04
32 519-DEL-2012-FORM 3 [13-03-2023(online)].pdf 2023-03-13
33 519-DEL-2012-PatentCertificate08-06-2023.pdf 2023-06-08
34 519-DEL-2012-IntimationOfGrant08-06-2023.pdf 2023-06-08

Search Strategy

1 searchstrategy_14-12-2017.pdf

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