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System And Method For Testing A Plurality Of Circuit Breakers

Abstract: The present disclosure provides a system for testing for a plurality of circuit breakers, said system including: a plurality of electronic trip units (ETU) corresponding with the plurality of circuit breakers, each of the plurality of ETUs operatively coupled with a central server; a simulation test kit operatively coupled to the central server, said simulation test kit configured with data pertaining to electrical power having predefined parameters to trip each of the plurality of ETUs; and a control unit operatively coupled with the central server, the control unit comprising a processor operatively coupled with memory, said memory storing instruction executable by the processor to: receive, from a selected any of the plurality of ETUs, corresponding data pertaining to the electrical power having predefined parameters to trip the selected any of the plurality of ETUs. The simulation test kit is configured to transmit, to the selected any of the plurality of ETUs, a set of first signals corresponding to the electrical power having predefined parameters to trip the selected any of the plurality of ETUs, and, in in response to tripping of the selected any of the plurality of ETUs upon receiving the set of first signals, the selected any of the plurality of ETUs transmits a set of second signals to the central server.

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Notices, Deadlines & Correspondence

Patent Information

Application #
Filing Date
26 August 2020
Publication Number
09/2022
Publication Type
INA
Invention Field
ELECTRICAL
Status
Email
info@khuranaandkhurana.com
Parent Application
Patent Number
Legal Status
Grant Date
2023-06-15
Renewal Date

Applicants

Larsen & Toubro Limited
L&T House, Ballard Estate, P.O Box No. 278, Mumbai - 400001, Maharashtra, India.

Inventors

1. GARG, Anil Kumar
Larsen & Toubro Limited, Electrical & Automation, EDDG, Level-3, TC-2, Tower B, L&T Business Park, Gate No. 5, Saki Vihar Road, Powai, Mumbai - 400072, Maharashtra, India.
2. CHAUDHARI, Hrudaynath
Larsen & Toubro Limited, Electrical & Automation, EDDG, Level-3, TC-2, Tower B, L&T Business Park, Gate No. 5, Saki Vihar Road, Powai, Mumbai - 400072, Maharashtra, India.

Specification

Claims:1. A system for testing for a plurality of circuit breakers, said system comprising:
a plurality of electronic trip units (ETU) corresponding with the plurality of circuit breakers, each of the plurality of ETUs operatively coupled with a central server;
a simulation test kit operatively coupled to the central server, said simulation test kit configured with data pertaining to electrical power having predefined parameters to trip each of the plurality of ETUs; and
a control unit operatively coupled with the central server, the control unit comprising a processor operatively coupled with memory, said memory storing instruction executable by the processor to:
receive, from a selected any of the plurality of ETUs, corresponding data pertaining to the electrical power having predefined parameters to trip the selected any of the plurality of ETUs,
wherein the simulation test kit is configured to transmit, to the selected any of the plurality of ETUs, a set of first signals corresponding to the electrical power having predefined parameters to trip the selected any of the plurality of ETUs, and
wherein in response to tripping of the selected any of the plurality of ETUs upon receiving the set of first signals, the selected any of the plurality of ETUs transmits a set of second signals to the central server.
2. The system as claimed in claim 1, wherein the each of the plurality of ETUs is configured with a communications device to establish communicative coupling with the central server.
3. The system as claimed in claim 1, wherein the simulation test kit is configured with a communications device to establish communicative coupling with the central server.
4. The system as claimed in claim 1, wherein the central server is a cloud server.
5. The system as claimed in claim 1, wherein said set of first signals corresponds to electrical power comprising any or combination of overload (OL), short circuit (SC), earth fault (EF), and instantaneous (INST).
6. The system as claimed in claim 5, wherein said set of second signals corresponds to one or more trip records of said selected any of the plurality of ETUs in response to said set of first signals.
7. The system as claimed in claim 6, wherein said one or more trip records are stored in the memory of said simulation test kit.
8. The system as claimed in claim 1, wherein said air circuit breaker is configured to receive a multi-phase electrical supply from one or more electrical power source.
9. The system as claimed in clam 1, wherein said predefined parameter comprises any or combination of current, voltage, and frequency.
10. A method for testing for a plurality of circuit breakers, using a simulation test kit operatively coupled to a central server, said simulation test kit configured with data pertaining to electrical power having predefined parameters to trip each of the plurality of ETUs, said method comprising:
receiving, at a computing device from a selected electronic trip unit (ETU) of a plurality of ETUs corresponding to the plurality of circuit breakers, corresponding data pertaining to the electrical power having predefined parameters to trip the selected any of the plurality of ETUs,
wherein the simulation test kit is configured to transmit, to the selected any of the plurality of ETUs, a set of first signals corresponding to the electrical power having predefined parameters to trip the selected any of the plurality of ETUs, and
wherein in response to tripping of the selected any of the plurality of ETUs upon receiving the set of first signals, the selected any of the plurality of ETUs transmits a set of second signals to the central server.

, Description:TECHNICAL FIELD
[0001] The present disclosure relates to the field of simulation test kit and more particularly the present invention relates cloud based fault simulation and test data logging.

BACKGROUND
[0002] The background description includes information that may be useful in understanding the present invention. It is not an admission that any of the information provided herein is prior art or relevant to the presently claimed invention, or that any publication specifically or implicitly referenced is prior art.
[0003] Conventionally, simulation test kits are widely used in electrical and automation to test different protections. The simulation test kits are used to check performance of a device under different conditions to increase reliability and performance of the device. While testing the device number of records can be saved in a memory for later use. The simulation test kits are coupled to the device such as circuit breakers using connection serial communication cables such as RS232 and RS485, which needs to be done manually. Simulation test kit generally generates analog signals that give input to air circuit breaker (ACB) release to power ON and requires a maintenance person to physically go to each release and connect the simulation test kit to the release, for testing.
[0004] The simulation test kits are configured to run test scrip on the air circuit breaker that needs to be tested. The test scripts include signals with predefined current and voltage values. The test script is so selected that it causes a fault condition in the air circuit breaker in response to which the air circuit breaker trips. For this purpose, the test script current and voltage values are kept equal to or greater than the maximum and minimum current and voltage ratings of the air circuit breaker. Also, if there are hundreds of air circuit breakers that are need to be tested, in that case selecting each test script to be run on all the air circuit breakers, manually corresponding to their maximum and minimum current and voltage rating values (also referred as rating values, herein) is tedious and very much time consuming.
[0005] Therefore, it is desired to have a simulation test kit that can select the test script automatically based on the maximum and minimum current and voltage ratings of the air circuit breakers without manual intervention.

OBJECTS OF THE DISCLOSURE
[0006] A general objective of the present disclosure is to provide a simulation test kit capable of selecting a set of first signals (also referred as test script, herein) for testing the different air circuit breakers.
[0007] A general objective of the present disclosure is to provide a simulation test kit capable of selecting a set of first signals (also referred as test script, herein) automatically.

SUMMARY
[0008] The present disclosure relates to the field of simulation test kit and more particularly the present invention relates cloud based fault simulation and test data logging.
[0009] In an aspect, the present disclosure provides a system for testing for a plurality of circuit breakers, said system including: a plurality of electronic trip units (ETU) corresponding with the plurality of circuit breakers, each of the plurality of ETUs operatively coupled with a central server; a simulation test kit operatively coupled to the central server, said simulation test kit configured with data pertaining to electrical power having predefined parameters to trip each of the plurality of ETUs; and a control unit operatively coupled with the central server, the control unit comprising a processor operatively coupled with memory, said memory storing instruction executable by the processor to: receive, from a selected any of the plurality of ETUs, corresponding data pertaining to the electrical power having predefined parameters to trip the selected any of the plurality of ETUs. The simulation test kit is configured to transmit, to the selected any of the plurality of ETUs, a set of first signals corresponding to the electrical power having predefined parameters to trip the selected any of the plurality of ETUs, and, in in response to tripping of the selected any of the plurality of ETUs upon receiving the set of first signals, the selected any of the plurality of ETUs transmits a set of second signals to the central server.
[0010] In an embodiment, the each of the plurality of ETUs can be configured with a communications device to establish communicative coupling with the central server.
[0011] In another embodiment, the simulation test kit can be configured with a communications device to establish communicative coupling with the central server.
[0012] In another embodiment, the central server can be a cloud server.
[0013] In another embodiment, the set of first signals can correspond to electrical power comprising any or combination of overload (OL), short circuit (SC), earth fault (EF), and instantaneous (INST).
[0014] In another embodiment, the set of second signals can correspond to one or more trip records of said selected any of the plurality of ETUs in response to said set of first signals.
[0015] In another embodiment, the one or more trip records can be stored in the memory of said simulation test kit.
[0016] In another embodiment, said air circuit breaker can be configured to receive a multi-phase electrical supply from one or more electrical power source.
[0017] In another embodiment, said predefined parameter can include any or combination of current, voltage, and frequency.
[0018] In an aspect, the present disclosure provides a method for testing for a plurality of circuit breakers, using a simulation test kit operatively coupled to a central server, said simulation test kit configured with data pertaining to electrical power having predefined parameters to trip each of the plurality of ETUs, said method including: receiving, at a computing device from a selected electronic trip unit (ETU) of a plurality of ETUs corresponding to the plurality of circuit breakers, corresponding data pertaining to the electrical power having predefined parameters to trip the selected any of the plurality of ETUs. The simulation test kit is configured to transmit, to the selected any of the plurality of ETUs, a set of first signals corresponding to the electrical power having predefined parameters to trip the selected any of the plurality of ETUs, and, in response to tripping of the selected any of the plurality of ETUs upon receiving the set of first signals, the selected any of the plurality of ETUs transmits a set of second signals to the central server.
[0019] Various objects, features, aspects and advantages of the inventive subject matter will become more apparent from the following detailed description of preferred embodiments, along with the accompanying drawing figures in which like numerals represent like components.

BRIEF DESCRIPTION OF THE DRAWINGS
[0020] The accompanying drawings are included to provide a further understanding of the present invention and are incorporated in and constitute a part of this specification. The drawings illustrate exemplary embodiments of the present invention and, together with the description, serve to explain the principles of the present invention.
[0021] FIG. 1 illustrates exemplary network architecture in which or with which proposed system can be implemented, in accordance with an embodiment of the present disclosure.
[0022] FIG. 2 illustrates exemplary network architecture in which or with which proposed system can be implemented in accordance with an embodiment of the present disclosure.
[0023] FIG. 3 illustrates system level application block diagram of testing system, in accordance with an embodiment of the present disclosure.
[0024] FIG. 4 illustrates block diagram of smart fault simulation test kit, in accordance with an embodiment of the present disclosure.
[0025] FIG. 5 illustrates a method of testing air circuit breaker, in accordance with an embodiment of the present disclosure.
[0026] FIG. 6 and FIG. 7 illustrate firmware logics flowcharts, in accordance with an embodiment of the present disclosure.

DETAILED DESCRIPTION
[0027] In the following description, numerous specific details are set forth in order to provide a thorough understanding of embodiments of the present invention. It will be apparent to one skilled in the art that embodiments of the present invention may be practiced without some of these specific details.
[0028] If the specification states a component or feature “may”, “can”, “could”, or “might” be included or have a characteristic, that particular component or feature is not required to be included or have the characteristic.
[0029] As used in the description herein and throughout the claims that follow, the meaning of “a,” “an,” and “the” includes plural reference unless the context clearly dictates otherwise. Also, as used in the description herein, the meaning of “in” includes “in” and “on” unless the context clearly dictates otherwise.
[0030] Exemplary embodiments will now be described more fully hereinafter with reference to the accompanying drawings, in which exemplary embodiments are shown. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. These embodiments are provided so that this invention will be thorough and complete and will fully convey the scope of the invention to those of ordinary skill in the art. Moreover, all statements herein reciting embodiments of the invention, as well as specific examples thereof, are intended to encompass both structural and functional equivalents thereof. Additionally, it is intended that such equivalents include both currently known equivalents as well as equivalents developed in the future (i.e., any elements developed that perform the same function, regardless of structure).
[0031] While embodiments of the present invention have been illustrated and described, it will be apparent that the invention is not limited to these embodiments only. Numerous modifications, changes, variations, substitutions, and equivalents will be apparent to those skilled in the art, without departing from the spirit and scope of the invention, as described in the claim.
[0032] The present disclosure relates to the field of simulation test kit and more particularly the present invention relates to simulation test kit with integrated Wi-Fi module.
[0033] In an aspect, the present disclosure provides a system for testing for a plurality of circuit breakers, said system including: a plurality of electronic trip units (ETU) corresponding with the plurality of circuit breakers, each of the plurality of ETUs operatively coupled with a central server; a simulation test kit operatively coupled to the central server, said simulation test kit configured with data pertaining to electrical power having predefined parameters to trip each of the plurality of ETUs; and a control unit operatively coupled with the central server, the control unit comprising a processor operatively coupled with memory, said memory storing instruction executable by the processor to: receive, from a selected any of the plurality of ETUs, corresponding data pertaining to the electrical power having predefined parameters to trip the selected any of the plurality of ETUs. The simulation test kit is configured to transmit, to the selected any of the plurality of ETUs, a set of first signals corresponding to the electrical power having predefined parameters to trip the selected any of the plurality of ETUs, and, in in response to tripping of the selected any of the plurality of ETUs upon receiving the set of first signals, the selected any of the plurality of ETUs transmits a set of second signals to the central server.
[0034] In an embodiment, the each of the plurality of ETUs can be configured with a communications device to establish communicative coupling with the central server.
[0035] In another embodiment, the simulation test kit can be configured with a communications device to establish communicative coupling with the central server.
[0036] In another embodiment, the central server can be a cloud server.
[0037] In another embodiment, the set of first signals can correspond to electrical power comprising any or combination of overload (OL), short circuit (SC), earth fault (EF), and instantaneous (INST).
[0038] In another embodiment, the set of second signals can correspond to one or more trip records of said selected any of the plurality of ETUs in response to said set of first signals.
[0039] In another embodiment, the one or more trip records can be stored in the memory of said simulation test kit.
[0040] In another embodiment, said air circuit breaker can be configured to receive a multi-phase electrical supply from one or more electrical power source.
[0041] In another embodiment, said predefined parameter can include any or combination of current, voltage, and frequency.
[0042] In an aspect, the present disclosure provides a method for testing for a plurality of circuit breakers, using a simulation test kit operatively coupled to a central server, said simulation test kit configured with data pertaining to electrical power having predefined parameters to trip each of the plurality of ETUs, said method including: receiving, at a computing device from a selected electronic trip unit (ETU) of a plurality of ETUs corresponding to the plurality of circuit breakers, corresponding data pertaining to the electrical power having predefined parameters to trip the selected any of the plurality of ETUs. The simulation test kit is configured to transmit, to the selected any of the plurality of ETUs, a set of first signals corresponding to the electrical power having predefined parameters to trip the selected any of the plurality of ETUs, and, in response to tripping of the selected any of the plurality of ETUs upon receiving the set of first signals, the selected any of the plurality of ETUs transmits a set of second signals to the central server.
[0043] FIG. 1 illustrates exemplary network architecture in which or with which proposed system can be implemented, in accordance with an embodiment of the present disclosure.
[0044] As illustrated, in a network implementation 100, simulation test kit 102 can be communicatively coupled with a plurality of remote electronic trip units 106-1, 106-2…106-N (collectively referred to as electronic trip units 106 and individually referred to as electronic trip unit 106 hereinafter) through network 104. The simulation test kit 102 can be implemented using any or a combination of hardware components and software components such as a server 110, a computing system, a computing device, a security device and the like.
[0045] Further, the simulation test kit 102 can interact with remote users 108-1, 108-2…108-N (collectively referred to as input devices 108, and individually referred to as input device 108 herein after), through the electronic trip units 106 or through applications residing on the electronic trip units 106. In an implementation, the simulation test kit 102 can be accessed by applications residing on any operating system, including but not limited to, AndroidTM, iOSTM, and the like. In a preferred embodiment, the electronic trip units 106 are associated with respective input devices 108.
[0046] In an embodiment, the simulation test kit 102 can be coupled to multiple electronic trip units 106 associated with air circuit breaker, and multiple electronic trip units 106 can be coupled with corresponding simulation test kits 102. The electronic trip unit 106 can be operatively configured with an air circuit breaker (also referred as circuit breaker, herein). The simulation test kit 102 can be used to test the electronic trip unit 106. The simulation test kit 106 can be communicatively coupled with the electronic trip unit 106 using but without limiting to an Ethernet/RS485.
[0047] In an embodiment, once the wireless connection between the simulation test kit 102 and the electronic unit 106 is established, the simulation test kit 102 can transmit a set of first signals (also referred as test script, herein) to the electronic trip unit 106. The set of first signals can correspond to an electrical power having predefined parameters to trip the electronic trip unit 106 that can be configured with air circuit breaker. The set of first signals can be selected on the basis of protection parameters of the air circuit breaker. The simulation test kit 102 can be communicatively coupled with the server 112 using a communication module that can be but not limited to a Wi-Fi unit. The protection parameters can be stored in the server 112 (also referred as cloud 112, herein). The tripping of the electronic trip unit 106 can cause tripping of the air circuit breaker. In response to tripping of the electronics trip unit 106 on receiving the set of first signals, the electronic trip unit 106 can transmit a set of second signals (also referred as trip feedback signals, herein), to the simulation test kit 102. The set of second signals can correspond to one or more trip records of the electronic trip unit 106 in response to the set of first signals. The set of second signals can correspond to one or more trip records of the electronic trip unit 106 in response to the set of first signals.
[0048] In an embodiment, the one or more trip records can be stored in a memory that can be operatively configured with the simulation test kit 102, and from the memory the trip records can be stored in the server 112. The trip records stored in the memory can be received from one or more electronic trip units 106. The set of first signals can correspond to electrical power comprising any or combination of overload (OL), short circuit (SC), earth fault (EF), and instantaneous (INST). The simulation test kit 102 can be communicatively coupled with the electronic trip unit 106 using a secure wireless link. The data security can be ensured by making the wireless link password protected.
[0049] FIG. 2 illustrates an exemplary module diagram of simulation test kit for testing air circuit breaker, in accordance with an embodiment of the present disclosure.
[0050] As illustrated, an exemplary module diagram 200 of the proposed simulation test kit 102 that include one or more processor(s) 202. The one or more processor(s) 202 can be implemented as one or more microprocessors, microcomputers, microcontrollers, digital signal processors, central processing units, logic circuitries, and/or any devices that manipulate data based on operational instructions. Among other capabilities, the one or more processor(s) 202 are configured to fetch and execute computer-readable instructions stored in a memory 206 of the system simulation test kit 102. The memory 102 can store one or more computer-readable instructions or routines, which may be fetched and executed to create or share the data units over a network service. The memory 102 can include any non-transitory storage device including, for example, volatile memory such as RAM, or non-volatile memory such as EPROM, flash memory, and the like. The module diagram 200 can include a communication module 218 that can be used to couple the simulation test kit 102 with the electronic trip unit.
[0051] The simulation test kit 102 can also include an interface(s) 204. The interface(s) 204 can comprise a variety of interfaces, for example, interfaces for data input and output devices, referred to as I/O devices, storage devices, battery charging and the like. The interface(s) 204 can facilitate communication of simulation test kit 102 with the air electronic trip. The interface(s) 204 can also provide a communication pathway for one or more components of the simulation test kit 102. Examples of such components include, but are not limited to, processing engine(s) 208 and data 210.
[0052] The processing engine(s) 208 can be implemented as a combination of hardware and programming (for example, programmable instructions) to implement one or more functionalities of the processing engine(s) 208. In examples described herein, such combinations of hardware and programming may be implemented in several different ways. For example, the programming for the processing engine(s) 208 can be processor executable instructions stored on a non-transitory machine-readable storage medium and the hardware for the processing engine(s) 208 can comprise a processing resource (for example, one or more processors), to execute such instructions. In the present examples, the machine-readable storage medium can store instructions that, when executed by the processing resource, implement the processing engine(s) 208. In such examples, the simulation test kit 102 can comprise the machine-readable storage medium storing the instructions and the processing resource to execute the instructions, or the machine-readable storage medium may be separate but accessible to simulation test kit 102 and the processing resource. In other examples, the processing engine(s) 208 can be implemented by electronic circuitry.
[0053] The data 210 can comprise data that is either stored or generated as a result of functionalities implemented by any of the components of the processing engine(s) 208 the simulation test kit 102. The present disclosure relates to simulation test kit 102 for testing a plurality of air circuit breakers (also can be referred as circuit breaker). In order perform the above-mentioned verification, the simulation test kit 102 can include a comparison engine 212, which can be configured to select a set of first signals (also referred as test script, herein) for the electronic trip units (ETU) 106 that can be configured with the air circuit breakers. The set of first signals can have a predefined parameter values for but not limited to current, voltage, power, and frequency. The set of first signals can be selected on the basis of a comparison of the predefined parameter values with the protection parameter values of the air circuit breakers. The protection parameter values can be but not limited to current, voltage, power, and frequency, and the protection parameter values (also referred as protection parameters, herein) can be saved in a server 112 (also referred as a mobile computing device 112, herein). The mobile computing device 112 can be a remote server or cloud. The predefined parameter values of the set of first signals can be so chosen that they are greater than or equal to minimum and maximum protection parameter values of the air circuit breakers. The set of first signals can correspond to electrical power comprising any or combination of overload (OL), short circuit (SC), earth fault (EF), and instantaneous (INST).
[0054] The set of first signals can be transmitted to the electronic trip units using a transmission engine 214. The simulation test kit can be communicatively coupled with electronic trip units using a cable RS485/Ethernet. In an embodiment, the set of first signals can be run on the electronic trip units (ETU) 106 and the electronic trip units (ETU) 106 can generate a set of second signals (also referred as trip feedback signal, herein). The set of second signals can be generated in response to the set of first signals and can be received by the simulation test kit 102 using a receiving engine 216. The set of second signals can correspond to one or more trip records of the electronic trip unit 106 in response to the set of first signals. The one or more trip records can include tripping timings of the electronic trip units 102, and can be saved in the memory that can be associated with the simulation test kit 102 from the trip records can later be save in the remote server 112 from the memory.
[0055] FIG. 3 illustrates system level application block diagram of testing system, in accordance with an embodiment of the present disclosure.
[0056] As illustrated, in an embodiment, the proposed testing system 300 can include air circuit breaker 302 (also referred as circuit breaker 302, herein). An electronic trip unit (ETU) 106 can be installed in the air circuit breaker 102. A three phase supply (318, 320) can be connected to the electronic trip unit 106 through a current and voltage sensor 312, and a signal conditioning unit 310. The air circuit breaker 302 can include protection parameters values that correspond to minimum and maximum current and voltage ratings (also referred as rating values, herein). The protection parameter values are provided by a manufacturer of the air circuit breakers for protecting the air circuit breakers from ay faulty input. If an input applied to the air circuit breaker does not comply with the protection parameter values of the air circuit breaker than the air circuit breaker 302 can trip or stop working in order to protect its damage. The protection parameter value of the air circuit breaker 312 can be stored in a remote server 112.
[0057] In an embodiment, the simulation test kit 102 can be communicatively coupled with the remote server 112 through communication module 218 that can be but not limited to a wireless connection, and the simulation test kit 102 can access the protection parameter values of the air circuit breaker 302. The simulation test kit 102 and electronic trip unit 106 can be coupled to the communication module 218 using but without limiting to an RS485/Ethernet 324. Afterward, the simulation test kit 102 can automatically selects and send a set of first signals 322 to the signal conditioning unit 310 for varying the three phase supply to the electronic trip unit 106. The three phase input (318, 320) is adjusted such that it is made greater than or equal to the protection parameter values of the air circuit breaker 302. The signal conditioning unit 310 can send a tripping signal 330 to the electronic trip unit 106, and the tripping signal can trip the air circuit breaker 302. The electronic trip unit 106 can include protection logic unit 306 and a metering unit 308. The protection logic unit 306 can send a set of second signals to the simulation test kit 102, which represent the trip record of the air circuit breaker 302. The trip record can be saved in a memory 206 associated with the simulation test kit 102, and finally the trip records can be saved in the server 112. The current and voltage sensor 312, and a signal conditioning unit 310, and the electronic trip unit 106 can be powered with but without limiting to a battery 314. The proposed testing system 300 can include a display unit 316 for displaying information related to the protection parameters and air circuit breaker 302.
[0058] FIG. 4 illustrates block diagram of smart fault simulation test kit, in accordance with an embodiment of the present disclosure.
[0059] As illustrated, in an embodiment, the simulation test kit 102 can include a digital to analog converter (DAC) 418, display 316, RS485/Ethernet communication 324, trip record storage 412, memory 402, communication module 218 (also referred as a communication unit 218, herein), and power supply 314. The simulation test kit 102 can read protection parameter values by a protection setting unit 406 and a release unit 420 configuration. The release unit 420 can be associated with an air circuit breaker 302. The display 316 can be used to visually show the protection parameter values and configuration of the release unit 420 to a user. Then the user can select set of first signals using the information displayed on the display and can write a configuration in the simulation test kit 102. The simulation test kit 102 can configure the digital to analog converter (DAC) 418 with equivalent voltage and current with respect of the set of first signals. The DAC 418 can provide inputs to the release unit 420. The simulation test kit 102 can include a communication interface 408 and a second communication module 404 that facilitates the communicative coupling of the simulation test kit 102 with the server 110. The second communication module can be but without limiting to a Wi-Fi module.
[0060] In an embodiment, if protection parameter values of current and voltage for the air circuit breaker is 4 amperes and 150 volts, respectively, the set of first signals are selected such that the current values of the set of first signal is 4 ampere or more and voltage of the set of first signal is 150 volts or more, to meet a fault condition for the air circuit breaker. In response to the set of first signals, the electronic trip unit 106 can send a trip record in the form a set of second signals to the simulation test kit 102. The trip record can include tripping time of the air circuit breaker, which can represents that time after which the air circuit breaker tripped in response to receiving the set of first signals. The trip records of the air circuit breaker can store in a memory associated with the simulation test kit from where it can be stored in the remote server.
[0061] FIG. 5 illustrates a method of testing air circuit breaker, in accordance with an embodiment of the present disclosure. The method 500 includes,
• 502 - receiving, at a computing device from a selected electronic trip unit (ETU) of a plurality of ETUs corresponding to the plurality of circuit breakers, corresponding data pertaining to the electrical power having predefined parameters to trip the selected any of the plurality of ETUs;
• 504 - transmitting, to the selected any of the plurality of ETUs, a set of first signals corresponding to the electrical power having predefined parameters to trip the selected any of the plurality of ETUs; and
• 506 - transmitting, by the selected any of the plurality of ETUs, in response to tripping of the selected any of the plurality of ETUs upon receiving the set of first signals, a set of second signals to the central server.
[0062] As illustrated, the present disclosure relates to a method for testing one or more air circuit breaker, associated with one or more electronic trip units, using a testing system may have a simulation test kit. At step 501, the method can include selecting a set of first signals by comparing it with protection settings stored at a mobile computing device. The set of first signals can be selected on the basis of a comparison of the predefined parameter values with the protection parameter values of the air circuit breakers 302. The protection parameter values can be but not limited to current, voltage, power, and frequency, and can be saved in a remote server (also referred as a mobile computing device, herein). The mobile computing device can be a remote server or cloud. The predefined parameter values of the set of first signals can be so chosen that they are greater than or equal to minimum and maximum protection parameter values of the air circuit breakers. At step 502, the set of first signals can be transmitted to an electronic trip unit 106. The simulation test kit 102 can be communicatively coupled to the electronic trip unit using but without limiting to an RS485/Ethernet 324. The set of first signals can be run on the electronic trip units (ETU) 106, and the electronic trip units (ETU) 106 can generate a set of second signals (also referred as trip feedback signal, herein). At step 503, the set of second signals can be generated in response to the set of first signals and can be received by the simulation test kit 102. The set of second signals can correspond to one or more trip records of the electronic trip unit 106 in response to the set of first signals. At step 504, the one or more trip records can include tripping timings of the electronic trip units 106, and can be saved in the memory 206 that can be associated with the simulation test kit 102, from the trip records can later be save in the server 110 from the memory 206.
[0063] FIG. 6 and FIG. 7 illustrate firmware logics flowcharts, in accordance with an embodiment of the present disclosure.
[0064] Thus, it will be appreciated by those of ordinary skill in the art that the diagrams, schematics, illustrations, and the like represent conceptual views or processes illustrating systems and methods embodying this invention. The functions of the various elements shown in the figures may be provided through the use of dedicated hardware as well as hardware capable of executing associated software. Similarly, any switches shown in the figures are conceptual only. Their function may be carried out through the operation of program logic, through dedicated logic, through the interaction of program control and dedicated logic, or even manually, the particular technique being selectable by the entity implementing this invention. Those of ordinary skill in the art further understand that the exemplary hardware, software, processes, methods, and/or operating systems described herein are for illustrative purposes and, thus, are not intended to be limited to any particular named.
[0065] As used herein, and unless the context dictates otherwise, the term "coupled to" is intended to include both direct coupling (in which two elements that are coupled to each other contact each other) and indirect coupling (in which at least one additional element is located between the two elements). Therefore, the terms "coupled to" and "coupled with" are used synonymously. Within the context of this document terms "coupled to" and "coupled with" are also used euphemistically to mean “communicatively coupled with” over a network, where two or more devices are able to exchange data with each other over the network, possibly via one or more intermediary device.
[0066] It should be apparent to those skilled in the art that many more modifications besides those already described are possible without departing from the inventive concepts herein. The inventive subject matter, therefore, is not to be restricted except in the spirit of the appended claims. Moreover, in interpreting both the specification and the claims, all terms should be interpreted in the broadest possible manner consistent with the context. In particular, the terms “comprise” and “comprising” should be interpreted as referring to elements, components, or steps in a non-exclusive manner, indicating that the referenced elements, components, or steps may be present, or utilized, or combined with other elements, components, or steps that are not expressly referenced. Where the specification claims refer to at least one of something selected from the group consisting of A, B, C …. N, the text should be interpreted as requiring only one element from the group, not A plus N, or B plus N, etc.
[0067] While the foregoing describes various embodiments of the invention, other and further embodiments of the invention may be devised without departing from the basic scope thereof. The scope of the invention is determined by the claims that follow. The invention is not limited to the described embodiments, versions or examples, which are included to enable a person having ordinary skill in the art to make and use the invention when combined with information and knowledge available to the person having ordinary skill in the art.

ADVANTAGES OF THE DISCLOSURE
[0068] The present disclosure provides a simulation test kit capable of selecting a set of first signals (also referred as test script, herein) for testing the different air circuit breakers.
[0069] The present disclosure provides a simulation test kit capable of selecting a set of first signals (also referred as test script, herein) automatically.

Documents

Application Documents

# Name Date
1 202021036777-IntimationOfGrant15-06-2023.pdf 2023-06-15
1 202021036777-STATEMENT OF UNDERTAKING (FORM 3) [26-08-2020(online)].pdf 2020-08-26
2 202021036777-PatentCertificate15-06-2023.pdf 2023-06-15
2 202021036777-REQUEST FOR EXAMINATION (FORM-18) [26-08-2020(online)].pdf 2020-08-26
3 202021036777-FORM 18 [26-08-2020(online)].pdf 2020-08-26
3 202021036777-ABSTRACT [09-09-2022(online)].pdf 2022-09-09
4 202021036777-FORM 1 [26-08-2020(online)].pdf 2020-08-26
4 202021036777-CLAIMS [09-09-2022(online)].pdf 2022-09-09
5 202021036777-DRAWINGS [26-08-2020(online)].pdf 2020-08-26
5 202021036777-CORRESPONDENCE [09-09-2022(online)].pdf 2022-09-09
6 202021036777-DRAWING [09-09-2022(online)].pdf 2022-09-09
6 202021036777-DECLARATION OF INVENTORSHIP (FORM 5) [26-08-2020(online)].pdf 2020-08-26
7 202021036777-FER_SER_REPLY [09-09-2022(online)].pdf 2022-09-09
7 202021036777-COMPLETE SPECIFICATION [26-08-2020(online)].pdf 2020-08-26
8 202021036777-FORM-26 [28-10-2020(online)].pdf 2020-10-28
8 202021036777-FER.pdf 2022-03-10
9 202021036777-Proof of Right [13-01-2021(online)].pdf 2021-01-13
9 Abstract1.jpg 2021-10-19
10 202021036777-8(i)-Substitution-Change Of Applicant - Form 6 [03-02-2021(online)].pdf 2021-02-03
10 202021036777-PA [03-02-2021(online)].pdf 2021-02-03
11 202021036777-ASSIGNMENT DOCUMENTS [03-02-2021(online)].pdf 2021-02-03
12 202021036777-8(i)-Substitution-Change Of Applicant - Form 6 [03-02-2021(online)].pdf 2021-02-03
12 202021036777-PA [03-02-2021(online)].pdf 2021-02-03
13 202021036777-Proof of Right [13-01-2021(online)].pdf 2021-01-13
13 Abstract1.jpg 2021-10-19
14 202021036777-FER.pdf 2022-03-10
14 202021036777-FORM-26 [28-10-2020(online)].pdf 2020-10-28
15 202021036777-COMPLETE SPECIFICATION [26-08-2020(online)].pdf 2020-08-26
15 202021036777-FER_SER_REPLY [09-09-2022(online)].pdf 2022-09-09
16 202021036777-DECLARATION OF INVENTORSHIP (FORM 5) [26-08-2020(online)].pdf 2020-08-26
16 202021036777-DRAWING [09-09-2022(online)].pdf 2022-09-09
17 202021036777-CORRESPONDENCE [09-09-2022(online)].pdf 2022-09-09
17 202021036777-DRAWINGS [26-08-2020(online)].pdf 2020-08-26
18 202021036777-CLAIMS [09-09-2022(online)].pdf 2022-09-09
18 202021036777-FORM 1 [26-08-2020(online)].pdf 2020-08-26
19 202021036777-FORM 18 [26-08-2020(online)].pdf 2020-08-26
19 202021036777-ABSTRACT [09-09-2022(online)].pdf 2022-09-09
20 202021036777-REQUEST FOR EXAMINATION (FORM-18) [26-08-2020(online)].pdf 2020-08-26
20 202021036777-PatentCertificate15-06-2023.pdf 2023-06-15
21 202021036777-STATEMENT OF UNDERTAKING (FORM 3) [26-08-2020(online)].pdf 2020-08-26
21 202021036777-IntimationOfGrant15-06-2023.pdf 2023-06-15

Search Strategy

1 SearchStrategy_202021036777E_09-03-2022.pdf

ERegister / Renewals

3rd: 12 Sep 2023

From 26/08/2022 - To 26/08/2023

4th: 12 Sep 2023

From 26/08/2023 - To 26/08/2024

5th: 12 Sep 2023

From 26/08/2024 - To 26/08/2025

6th: 03 Jul 2025

From 26/08/2025 - To 26/08/2026