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System And Methods Of Identifying Types Of Faults

Abstract: A computing device (120) includes a communication interface (230) for receiving a plurality of signals from a first probe (110) positioned on a first observation plane (111) of a machine component (104) and a second probe that is positioned on a second observation plane (112) of the machine component, wherein the plurality of signals are representative of data from the machine component. A processor (214) coupled to the communication interface is programmed to combine the signals received from the first and second probes to generate a plurality of displacement responses that correspond to a plurality of frequencies of a speed of the machine component. The processor is also programmed to transform the signals to eliminate a plurality of split resonance effects. The processor may also generate data representative of an output of the data received from the signals to identify a type of at least one fault within the machine component.

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Patent Information

Application #
Filing Date
21 February 2013
Publication Number
03/2015
Publication Type
INA
Invention Field
COMPUTER SCIENCE
Status
Email
Parent Application

Applicants

GENERAL ELECTRIC COMPANY
1 RIVER ROAD, SCHENECTADY, NEW YORK 12345, USA.

Inventors

1. GRANT, JOHN WESLEY
1631 BENTLY PARKWAY SOUTH, MINDEN, NEVADA 89423, USA.
2. HATCH CHARLES TERRANCE
1631 BENTLY PARKWAY SOUTH, MINDEN, NEVADA 89423, USA

Specification

BACKGROUND OF THE INVENTION
The field of the invention relates generally to systems that
include machines and, more particularly, to a computing device that enables
identifying types of faults, such as shaft cracks, within machine components.
At least some known systems, such as power systems, include
machines, such as turbines. The machines include components, such as bearings,
gears, and/or rotating shafts. The components may wear or fatigue over time resulting
in damage or faults, such as a crack within the component and/or a misalignment of
the component. Continued operation of machines having damaged components may
cause damage to other components or may lead to a premature failure of the
component.
To detect damage within a machine, the operation of at least
some known machines is maintained with a monitoring system. For example, at least
some known monitoring systems use sensors to measure vibration characteristics of at
least some components of the machine. Displacement, proximity, and/or vibration
measurements can be performed using eddy current sensors, magnetic pickup sensors,
microwave sensors, and/or capacitive sensors. The data detected by these sensors are
analyzed by the monitoring system and then transmitted to a display device. An
output of the analysis may be presented to a user to enable a user to identify any
damage, such as shaft cracks, within the machine or component. The data may
include measurements and/or various variables that are summed together and/or
collated to determine if there is damage.
However, such monitoring systems are unable to distinguish
the types of damage that are detected. As a result, a user may be required to manually
sift through large amounts of data to ascertain whether the damage detected is actually
a crack within the component, as opposed to a different type of damage. Shaft cracks,
2
in particular, are considered one of the most difficult faults to diagnose accurately and
to distinguish from other types of faults. For example, for a rotor shaft, the data
representative of a shaft crack are shared with many other malfunctions of the shaft,
and therefore additional data and/or testing is required to ascertain the presence of the
shaft crack. Such methodology may be time-consuming and tedious.
BRIEF DESCRIPTION OF THE INVENTION
In one embodiment, a computing device is provided. The
computing device includes a communication interface configured to receive a
plurality of signals from two probes that are each positioned on an observation plane
of a machine component, wherein the plurality of signals are representative of data
from the machine component. A processor is coupled to the communication interface
and programmed to combine the signals received from the first probe and the second
probe to generate a plurality of displacement responses that correspond to a plurality
of frequencies of a speed of the machine component. The processor is also
programmed to transform the plurality of signals received from each of the first probe
and the second probe to eliminate a plurality of split resonance effects. The processor
may also generate data representative of a graphical output of the data received from
the signals to identify a type of at least one fault within the machine component.
In another embodiment, a system is provided. The system
includes at least one machine that includes a component and a monitoring system that
includes two probes that are each positioned on an observation plane of the
component, wherein the plurality of signals are representative of data from the
component. A computing device is coupled to the monitoring system, the computing
device includes a communication interface that is configured to receive a plurality of
signals from the first probe and the second probe, wherein the plurality of signals are
representative of data from the component. A processor is coupled to the
communication interface and programmed to combine the plurality of signals received
from the first probe and the second probe to generate a plurality of displacement
responses that correspond to a plurality of frequencies of a speed of the component.
3
The processor is also programmed to transform the plurality of signals received from
each of the first probe and the second probe to eliminate a plurality of split resonance
effects. Processor may also generate data representative of a graphical output of the
data received from the plurality of signals to identify a type of at least one fault within
the component.
In yet another embodiment, a method for identifying a type of
at least one fault within a machine component is provided. A plurality of signals are
received, via a communication interface, from two probes that are each positioned on
an observation plane of a machine, wherein the plurality of signals ar.e representative
of data from the machine component. The plurality of signals received from the first
probe and the second probe are combined, via a processor, to generate a plurality of
displacement responses that correspond to a plurality of frequencies of a speed of the
machine component. The plurality of signals received from each of the first probe
and the second probe are transformed, via the processor, to eliminate a plurality of
split resonance effects. Data representative of a graphical output of the data received
from the plurality of signals is generated, via the processor, to identify a type of at
least one fault within the machine component.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a block diagram of an exemplary system; and
FIG. 2 is a block diagram of an exemplary computing device
that may be used with the system shown in FIG. 1.
DETAILED DESCRIPTION OF THE INVENTION
The exemplary systems and methods described herein enable
a user to readily identify a type of damage within a machine component, such as a
crack within a rotor shaft of a turbine. More specifically, the embodiments described
herein provide a computing device. The computing device includes a communication
interface configured to receive a plurality of signals from two probes that are each
positioned on different observation planes of a machine component, wherein the
4
plurality of signals are representative of data from the machine component. A
processor is coupled to the communication interface. The processor is programmed to
combine the signals received from the first probe and the second probe and the
processor generates a plurality of displacement responses that correspond to a
plurality of frequencies of a speed of the machine component. The processor is also
programmed to transform the plurality of signals received from each of the first probe
and the second probe to eliminate a plurality of split resonance effects. The processor
may also generate data representative of a graphical output of the data received from
the signals to identify a type of at least one fault within the machine component. The
processor is also programmed to calculate a peak amplitude frequency and/or a peak
amplitude value for the peak. The processor is further programmed to identify a
change in the peak amplitude frequency and/or a change in the peak amplitude value
to identify a type of at least one fault within the machine component. For example, a
decrease in the peak amplitude frequency is representative of a crack within the
machine component and an increased and/or a constant peak amplitude frequency is
representative of a different type of damage, such as a misalignment, or rub, of the
machine component. Accordingly, not only can damage be detected within the
component, but a user can readily identify whether the damage detected is a crack,
such as a shaft crack, or a different type of damage.
FIG. 1 illustrates a system 100 that, includes at least one
/
machine 102. More specifically, system 100, in the exemplary embodiment, is a
power system 100. While the exemplary embodiment illustrates a power system, the
present disclosure is not limited to power systems and may be used in or with any
other type of system. In the exemplary embodiment, machine 102 is a variable speed
machine, such as a wind turbine, a hydroelectric steam turbine, and/or any other
machine that operates with a variable speed. Alternatively, machine 102 may be a
synchronous fixed speed machine. Machine 102 includes at least one machine
component 104. In the exemplary embodiment, component 104 is a drive shaft and is
coupled to a load 108, such as a generator. It should be noted that, as used herein, the
term "couple" is not limited to a direct communicative, mechanical, magnetic, and/or
5
an electrical connection between components, but may also include an indirect
communicative, mechanical, magnetic, and/or electrical connection between multiple
components.
In the exemplary embodiment, component 104 is at least
partially supported by one or more bearings (not shown) housed within machine 102
and/or within load 108. Alternatively or additionally, the bearings may be housed
within a separate support structure (not shown), such as a gearbox, or any other
structure that enables power system 100 to function as described herein.
Power system 100 also includes a monitoring system 109 that
includes at least one sensor or probe 110 coupled to component 104. More
specifically, in the exemplary embodiment, power system 100 includes two probes
110 that are mounted to directly sense, detect, or monitor component 104 such that
one probe 110 is located on an x observation plane 111 and the other probe 110 is
located on a y observation plane 112 at some angular difference from the x probe, but
usually orthogonal. Each x observation plane III and y observation plane 112 can be
rotated to any angular orientation. More specifically, in the exemplary embodiment,
each probe 110 is an eddy current displacement probe that measures various
parameters related to component 104. For example, each probe 110 may measure
and/or monitor a displacement (not shown) between component 104 and each probe
110 in order to detect damage, such as a crack within component 104 and/or a
misalignment of component 104. Each probe 110 may also measure and/or monitor a
speed of component 104. For example, since component 104 is a shaft, each probe
110 measures the rotational speed of component 104 in revolutions per minute.
Alternatively, each probe 110 may be any other type of probe, sensor, or transducer
that is able to detect damage within component 104 by measuring and/or monitoring
any other parameters of component 104, and that enables system 100 to function as
described herein. This timing of this displacement may be measured relative to a
third probe 110 that is used to generate a once per rotation timing signal.
6
In the exemplary embodiment, monitoring system 109 also
includes a diagnostic system 116 that is coupled to probes 110. Diagnostic system
116 processes and/or analyzes one or more signals generated by probes 110. As used
herein, the term "process" refers to performing an operation on, adjusting, filtering,
buffering, and/or altering at least one characteristic of a signal. In the exemplary
embodiment, probes are coupled to diagnostic system 116 via a data conduit 117 or a
data conduit 118. Alternatively, probes 110 may be wirelessly coupled to diagnostic
system 116. In the exemplary embodiment, data conduit 117 and data conduit 118 are
each fabricated from a metallic wire. Alternatively, conduits 117 and 118 may be
fabricated from any other substance or compound that enables system 100 to function
as described herein. In the exemplary embodiment, each conduit 117 and 118 is an
electrical conductor and enables the connection between diagnostic system 116 and
probes 110. Alternatively, other connections may be available between diagnostic
system 116 and probes 110, including a low-level serial data connection, such as
Recommended Standard (RS) 232 or RS-485, a high-level serial data connection,
such as Universal Serial Bus (USB) or Institute of Electrical and Electronics
Engineers (IEEE®) 1394, a parallel data connection, such as IEEE® 1284 or IEEE®
488, a short-range wireless communication channel such as BLUETOOTH®, and/or a
private (e.g., inaccessible outside power generation system 100) network connection,
whether wired or wireless. IEEE is a registered trademark of the Institute of
Electrical and Electronics Engineers, Inc., of New York, New York. BLUETOOTH
is a registered trademark of Bluetooth SIG, Inc. of Kirkland, Washington.
A computing device 120 is coupled to diagnostic system 116
via a data conduit 122. Alternatively, computing device 120 may be wirelessly
coupled to diagnostic system 116. In the exemplary embodiment, data conduit 122 is
fabricated from a metallic wire. Alternatively, conduit 122 may be fabricated from
any other substance or compound that enables system 100 to function as described
herein. In the exemplary embodiment, conduit 122 is an electrical conductor and
enables the connection between computing device 120 and diagnostic system 116.
Alternatively, other connections may be available between computing device 120 and
7
diagnostic system 116, including a low-level serial data connection, such as
Recommended Standard (RS) 232 or RS-485, a high-level serial data connection,
such as Universal Serial Bus (USB) or Institute of Electrical and Electronics
Engineers (IEEE®) 1394, a parallel data connection, such as IEEE® 1284 or IEEE®
488, a short-range wireless communication channel such as BLUETOOTH®, and/or a
private (e.g., inaccessible outside power generation system 100) network connection,
whether wired or wireless.
In the exemplary embodiment, as explained in more detail
below, computing device 120 is configured to process and/or analyze data received
from diagnostic system 116 and present an output of the data to a user, such as an
operator of system 100. In the exemplary embodiment, computing device 120 is
configured to present historical and/or real-time data to the user.
During operation, in the exemplary embodiment, because of
damage within component 104, for example, component 104 may change positions
with respect to probes 110 resulting in a displacement (not shown) of each probe 110
with respect to component 104. In the exemplary embodiment, each probe 110
measures the displacement of component 104 with respect to each probe 110 in order
to detect damage within component 104, such as a crack within component 104 and/or
a misalignment of component 104. Each probe 110 may also measure the speed of.
component 104. Alternatively, each probe 110 may measure any other parameter of
component 104 that enables system 100 to function as described herein.
Each probe 110 transmits at least one signal representative of
the data received from component 104 to diagnostic system 116. In the exemplary
embodiment, each probe 110 transmits a signal representative of the displacement
between each probe 110 from component 104 and/or a signal representative of a
speed of component 104 to diagnostic system 116. Diagnostic system 116 analyzes
and/or processes the signals.
As explained In more detail below, the signals are then
transmitted to computing device 120 for further analysis and/or processing, and for
8
presentation of an output of the data to a user. In the exemplary embodiment,
computing device 120 provides an output that includes a graphical and/or a textual
representation of the data. For example, in the exemplary embodiment, computing
device 120 provides a graphical representation of the data such that damage within
component 104 and/or a type of damage within component 104 may be identified by
computing 120 and/or a user of computing device. If the damage is determined to be
a crack within component 104, then computing device 120 may transmit a signal to a
control system (not shown) to stop operation of machine 102. Alternatively, the user
may manually stop operation of machine 102.
FIG. 2 is a block diagram of computing device 120. In the
exemplary embodiment, computing device 120 includes a user interface 204 that
receives at least one input from a user. In the exemplary embodiment, user interface
204 includes a keyboard 205 that enables the user to input pertinent information. In
the exemplary embodiment, user interface 204 also includes a pointing device 206
and a mouse 207. Alternatively, user interface 204 may include, for example, a
stylus, a touch sensitive panel (e.g., a touch pad or a touch screen), a gyroscope, an
accelerometer, a position detector, and/or an audio input interface (e.g., including a
microphone).
Moreover, in the exemplary embodiment, computing device
120 includes a presentation interface 208 that presents information, such as input
events, data output, and/or validation results, to the user. In the exemplary
embodiment, presentation interface 208 includes a display adapter 209 that is coupled
to at least one display device 210. More specifically, in the exemplary embodiment,
display device 210 is a visual display device, such as a cathode ray tube (CRT), a
liquid crystal display (LCD), an organic LED (OLEO) display, and/or an "electronic
ink" display. Alternatively, presentation interface 208 may include an audio output
device (e.g., an audio adapter and/or a speaker) and/or a printer.
Computing device 120 also includes a processor 214 and a
memory device 218. In the exemplary embodiment, processor 214 is coupled to user
9
..
interface 204, presentation interface 208, and to memory device 218 via a system bus
220. In the exemplary embodiment, processor 214 communicates with the user, such
as by prompting the user via presentation interface 208 and/or by receiving user
inputs via user interface 204. Moreover, in the exemplary embodiment, processor 214
is programmed by encoding an operation using one or more executable instructions
and providing the executable instructions in memory device 218. For example, in the
exemplary embodiment, processor 214 is programmed to combine the plurality of
signals received from the probe 110 (shown in FIG. 1) that is located on x observation
plane 111 (shown in FIG. 1) and the probe 110 that is located on y observation plane
112 (shown in FIG. 1) to generate a plurality of displacement responses that
correspond to a plurality of frequencies of a speed of machine component 104, such
as, for example, lx, 2x ... nx of the running operational speed of component 104.
Processor 214 may also be programmed to identify a first displacement response of
the plurality of displacement responses that corresponds to an operational speed of the
machine component 104 and programmed to identify a second displacement response
of the plurality of displacement responses that corresponds to a non-operational speed
of the machine component.
Processor 214 may also be programmed to transform the
signals from each of the probes 110 to eliminate a plurality of split resonance effects
such that the data may be graphically plotted. For example, an orbit (not shown) can
be constructed from a pair of forward and reverse vectors that rotate in opposite
directions at a filter frequency, w. The forward vector rotates in the same direction as
component 104 (i.e., rotor) rotation. It is known that at speeds well below the
resonance, the forward response may point towards a heavy spot, making it a valuable
tool for balancing. The forward/reverse transform starts with a pair of vibration
vectors, Xim! and y that correspond to probe 110 that is positioned on x observation . illS!
plane 111 and probe 110 that is positioned on y observation plane 112, respectively,
to generate a plurality of displacement responses. The vibration vectors are first
converted to the mathematical convention (positive phase lead and zero-to-peak
10
amplitude). These vectors can be expressed in rotating form as shown in Equation
(A5-5) below.
x = Ae)(....H·(l)
..l' = Be)(·.:l+d}
(AS-5)

In Equation (A5-5), A, B, n, and ~ are the amplitudes and
phases of the vibration vectors in mathematical convention and n is measured relative
to the X transducer axis, and ~ is measured relative to the Y transducer axis. Thus, the
physical coordinates of the rotor centerline on the filtered orbit are (x, y), where, as
shown in Equation (A5-6) below,
x= Acos(wt +0:)
Y = Bcos(wt +;3)
(AS-6)
The transform to forward and reverse uses the identity shown
in Equation (A5-7) below.
e)f) +e-)O
cosO=----
2
(A5-7)
This identity IS substituted into Equation A5-6 to obtain
Equation (A5-8) below.
x = .!.A [ej(wt+O) + e-)(wt+-o:)1
2
Y=.!.S[e)(wt+J3) +e-j(wt+I3)]
2
(AS-B)
It should be noted that the exponential expressions contain
terms that represent vectors that are rotating in the mathematically positive direction,
l!wt, which is equivalent to forward precession, and the negative direction, e-jwt
, which
is equivalent to reverse precession. Now the second equation in (A5-8) can be
II
multiplied by j, and the two equations can be added together, and combine forward
and reverse parts to obtain Equation (A5-9) below.
The sum of these four complex, rotating vectors represents
the instantaneous position of a rotor centerline (not shown) in the filtered orbit. The
orbit exists in what is now a complex plane (X+ jf) with the real axis aligned with the
X transducer. The two vectors in the left bracket rotate in the forward direction (+ro)
and the two in the right bracket are reverse (-<0). Setting t= 0 provides the filtered
position at a reference event (i.e., the Keyphasor event) in terms of the measured
vibration vectors, as shown in Equation (A5-1 0) below.
(
1..J 1 . .J
x + iv) _ = -(AeJo +JBeP )+-(Ae-JO + jB('- J: )
..' /-0 2' . 2 .
Equations (A5-9) and (A5-10) can be used in a computer
program, such as MATLAB, that supports complex numbers in this form. However,
it may be necessary to find expressions for the amplitude and phase of the forward
and reverse vectors. Equation (A5-9) can be described by the sum of two forward and
reverse rotating vectors, as shown in Equation (A5-IO) below.
(A5-10)
(A5-1I)I
In Equation (A5-II), where AF and AR are the amplitudes of
the forward and reverse vectors, and tPF and tPR are the phases, both measured relative
to the X axis. The right sides of Equations (A5-9) and (A5-II) at t = 0 can be
compared, as shown in Equations (A5-I2) below.
12
Apl.jOI = ..!..(AeJ(t + jBeJ3 )
2
AJle- )<)fI = ~ (Ae-)O: + jBe-)3)
(A5-12)
The exponential functions can be expanded into trigonometric
functions using Euler's identity, as shown in Equation (A5-13) below.
efi = cosO + j sin0 (A5-13)
Applying Euler's identity to the right sides of Equations (A512),
and, after iterations, such as some algebra and a trigonometric identity or two, the
following can be obtained:
Ap = ~[A2 +B2 +2ABsin(a-,B)t.5
AR =.!.[A2 +B2 -2ABsin(a- t))t.5
2
and
, . ( Asino + BCOS.,8] OF = arctan
, Acosa- Bsin,8
, [A sino - BCOS,8]
Oil = arctan
, Acoso+BsinB
(A5-14)
(A5-]5)
..
The phase angles may be calculated using the arctangent2
function to yield angles between ±180° (which can be reduced mod 360 if desired),
and the data may be unwrapped to prevent jump discontinuities. It is important to
note that these expressions are based on a mathematical convention where both of the
phase angles are measured relative to the X (real) axis, which is aligned with the X
transducer sensitive axis, and ¢F is measured in the positive (counterclockwise)
13
direction. However, as a result of the phase angle definition in Equation (AS-8) for
the reverse vector, positive rPR is measured in the clockwise direction, which is the
reverse of the known convention. Before plotting, the forward and reverse vectors
should be converted to the instrumentation convention (the negative of the
mathematical phase) to be consistent with other data plots. When plotted on a polar
plot (not shown), as the phase lag of the forward response increases (the mathematical
phase decreases), it will move in a direction opposite to rotation (the same as standard
vibration vectors). On a Bode plot (not shown), it will move downward.
As the phase lag of the reverse response increases, it will
move in the same direction as rotation on the polar plot, and, if plotted on the Bode
plot together with the forward response, it will move upward. A full spectrum may
also be calculated using the same algorithm.
Processor 214 may be programmed to generate data
representative of a graphical output of the data received from the signals that are
transmitted from diagnostic system 116 (shown in FIG. 1). The graphical output may
include at least one peak (not shown). Processor 214 is also programmed to calculate
a peak amplitude frequency and/or a peak amplitude value for the peak. Processor
214 may be programmed to identify a change in the peak amplitude frequency and/or
a change in the peak amplitude value to identify a type of damage within component
104 (shown in FIG. 1). Processor 214 may be further programmed to calculate a
phase lag value at the peak amplitude frequency and a slope of the phase lag at the
peak amplitude frequency. In the exemplary embodiment, processor 214 may also be
programmed to calculate a quality factor based at least in part by the slope, wherein
the quality factor may also be used to identify the type of the damage.
The term "processor" refers generally to any programmable
system including systems and microcontrollers, reduced instruction set circuits
(RISC), application specific integrated circuits (ASIC), programmable logic circuits
(PLC), and any other circuit or processor capable of executing the functions described
14
herein. The above examples are exemplary only, and thus are not intended to limit in
any way the definition and/or meaning of the term "processor."
In the exemplary embodiment, memory device 218 includes
one or more devices that enable information, such as executable instructions and/or
other data, to be stored and retrieved. Moreover, in the exemplary embodiment,
memory device 218 includes one or more computer readable media, such as, without
limitation, dynamic random access memory (DRAM), static random access memory
(SRAM), a solid state disk, and/or a hard disk. In the exemplary embodiment,
memory device 218 stores, without limitation, application source code, application
object code, configuration data, additional input events, application states, assertion
statements, validation results, and/or any other type of data. More specifically, in the
exemplary embodiment, memory device 218 stores input data received by a user via
user interface 204, and/or information received from other components of power
system 100, such as data received from diagnostic system 116.
Computing device 120, in the exemplary embodiment, also
includes a communication interface 230 that is coupled to processor 214 via system
bus 220. Moreover, in the exemplary embodiment, communication interface 230 is
coupled to diagnostic system 116 via data conduit 122 (shown in FIG. 1) and is
configured to receive signals from diagnostic system 116.
During operation, in the exemplary embodiment, after
diagnostic system 116 analyzes and/or processes the signals received from each of the
probes 110 located on x observation plane 111 and on y observation plane 112, the
signals are transmitted to computing device 120 for further analysis and/or processing,
and for presentation of an output of the data to a user. More specifically,
communication interface 230 receives the signals and transmits the data to processor
214. Processor 214 combines the plurality of signals received from the probe 110 that
is located on x observation plane 111 and the probe 110 that is located on y
observation plane 112 to generate a plurality of displacement responses that
correspond to a plurality of frequencies of a speed of machine component 104, such
15

as, for example, Ox, lx, 2x ... nx of the running operational speed of component 104.
Processor 214 may identify a first displacement response of the plurality of
displacement responses that corresponds to an operational speed of the machine
component 104 and identify a second displacement response of the plurality of
displacement responses that corresponds to a non-operational speed of the machine
component.
Processor 214 may also transform the signals from each of the
probes 110 to eliminate a plurality of split resonance effects such that the data may be
graphically plotted. Processor 214 then generates a graphical output of the data,
wherein the graphical output includes at least one peak. The graphical output of the
peak may be presented to a user via display device 210 within presentation interface
208. When the graphical output of the peak is presented to the user, a standard
graphical output of another machine component (not shown) without any damage may
also be presented such that the graphical output may be compared with the standard
graphical output and any variations may be identified.
Processor 214 also calculates a peak amplitude frequency
and/or a peak amplitude value for the peak. The peak amplitude frequency, and/or the
peak amplitude value may be presented to a user via display device 210 within
presentation interface 208. Processor 214 further identifies a change in the peak
amplitude frequency and/or a change in the peak amplitude value to identify a type of
damage within component 104. For example, a crack within component 104 is
identified when the peak amplitude frequency decreases. A misalignment of
component 104 is identified when the peak amplitude frequency remains constant
and/or the peak amplitude frequency increases. A textual and/or graphical
representation of the type of damage may be presented to the user via display device
210. Alternatively, the user may also visually identify the change in the peak
amplitude frequency and/or the change in the peak amplitude value from the graphical
output that is presented to the user via display device 210 to identify the type of
damage within component 104.
16

In the exemplary embodiment, processor 214 may also
calculate a phase lag value at the peak amplitude frequency and a slope of the phase
lag at the peak amplitude frequency. Processor 214 then calculates a quality factor
based at least in part by the slope, wherein the quality factor may also be used to
identify the type of the damage. For example, if the damage within component 104 is
a crack, then the quality factor would have a relatively high standard deviation when
compared with a quality factor resulting from the standard graphical output.
As compared to known systems and methods that are used to
identify damage within machine components, the exemplary systems and methods
described herein enable a user to readily identify a type of damage within a machine
component, such as a crack within a rotor shaft of a turbine. More specifically, the
embodiments described herein provide a computing device. The computing device
includes a communication interface configured to receive a plurality of signals from a
first probe positioned on a first observation plane of a machine component and a
second probe that is positioned on a second observation plane of the machine
component, wherein the plurality of signals are representative of data from the
machine component. A processor is coupled to the communication interface and
programmed to combine the signals received from the first probe and the second
probe to generate a plurality of displacement responses that correspond to a plurality
of frequencies of a speed of the machine component. The processor is also
programmed to transform the plurality of signals received from each of the first probe
and the second probe to eliminate a plurality of split resonance effects. The processor
may also generate data representative of a graphical output of the data received from
the signals to identify a type of at least one fault within the machine component. The
processor is also programmed to calculate a peak amplitude frequency and/or a peak
amplitude value for the peak. The processor is further programmed to identify a
change in the peak amplitude frequency and/or a change in the peak amplitude value
to identify a type of at least one fault within the machine component. For example, a
decrease in the peak amplitude frequency is representative of a crack within the
machine component and an increased and/or a constant peak amplitude frequency is
17

representative of a different type of fault, such as a misalignment of the machine
component. Accordingly, not only can a fault be detected within the component, but
a user can readily identify whether the fault detected is a crack, such as a shaft crack,
or a different type of fault.
A technical effect of the systems and methods described
herein includes at least one of: (a) receiving, via a communication interface, a
plurality of signals from a first probe positioned on a first observation plane of a
machine component and a second probe that is positioned on a second observation
plane of the machine component, wherein the plurality of signals are representative of
data from the machine component; (b) combining, via a processor, a plurality of
signals received from a first probe and a second probe to generate a plurality of
displacement responses that correspond to a plurality of frequencies of a speed of a
machine component; (c) transforming, via a processor, a plurality of signals received
from each of a first probe and a second probe to eliminate a plurality of split
resonance effects; and (d) generating, via a processor, data representative of a
graphical output of data received from a plurality of signals to identify a type of at
least one fault within a machine component.
Exemplary embodiments of the systems and methods are
described above in detail. The systems and methods are not limited to the specific
embodiments described herein, but rather, components of the systems and/or steps of
the methods may be utilized independently and separately from other components
and/or steps described herein. For example, the system may also be used in
combination with other apparatus, systems, and methods, and is not limited to practice
with only the system as described herein. Rather, the exemplary embodiment can be
implemented and utilized in connection with many other applications.
Although specific features of various embodiments of the
invention may be shown in some drawings and not in others, this is for convenience
only. In accordance with the principles of the invention, any feature of a drawing
18

may be referenced and/or claimed in combination with any feature of any other
drawing.
This written description uses examples to disclose the
invention, including the best mode, and also to enable any person skilled in the art to
practice the invention, including making and using any devices or systems and
performing any incorporated methods. The patentable scope of the invention is
defined by the claims, and may include other examples that occur to those skilled in
the art. Such other examples are intended to be within the scope of the claims if they
have structural elements that do not differ from the literal language of the claims, or if
they include equivalent structural elements with insubstantial differences from the
literal language of the claims.


We Claim:
1. A computing device (120) comprising:
a communication interface (230) configured to receive a plurality of
signals from a first probe (110) positioned on a first observation plane (111) of a
machine component (104) and a second probe that is positioned on a second
observation plane (112) of the machine component, wherein the plurality of signals
are representative of data from the machine component; and
a processor (214) coupled to said communication interface and
programmed to:
combine the plurality of signals received from the first probe
and the second probe to generate a plurality of displacement responses that
correspond to a plurality of frequencies of a speed of the machine component;
transform the plurality of signals received from each of the first
probe and the second probe to eliminate a plurality of split resonance effects;
and
generate an output of the data received from the plurality of
signals to identify a type of at least one fault within the machine component.
2. A computing device (120) in accordance with Claim 1, wherein
said processor (214) is further programmed to:
generate data representative of a graphical output of the data received
from the plurality of signals;
identify at least one peak in a graphical output;
calculate at least one of a peak amplitude frequency and a peak
amplitude value for the at least one peak; and
20
identify at least one of a change in the peak amplitude frequency and a
change in the peak amplitude value to identify the type of the at least one fault within
the machine component (104).
3. A computing device (120) in accordance with Claim 2, wherein
said processor (214) is programmed to identify a decrease in the peak amplitude
frequency such that a crack within the machine component (104) is identified.
4. A computing device (120) in accordance with Claim 2, wherein
said processor (214) is programmed to identify when at least one of the peak
amplitude frequency remains constant and the peak amplitude frequency increases
such that a misalignment of the machine component (104) is identified.
5. A computing device (120) in accordance with Claim 2, wherein
said processor (214) is further programmed to calculate at least one of a phase lag
value at the peak amplitude frequency and a slope of the phase lag at the peak
amplitude frequency.
6. A computing device (120) in accordance with Claim 5, wherein
said processor (214) is further programmed to calculate a quality factor based at least
in part by the slope, wherein the quality factor is used to identify the type of at least
one fault.
7. A computing device (120) in accordance with Claim 1, wherein
said processor (214) is further programmed to:
identify a first displacement response of the plurality of displacement
responses that corresponds to an operational speed of the machine component (104);
and
identify a second displacement response of the plurality of
displacement responses that corresponds to a non-operational speed of the machine
component.
21
8. A system (100) comprising:
at least one machine (102) comprising a component;
a monitoring system (109) comprising a first probe (110) positioned on
a first observation plane (Ill) of said component and a second probe that is
positioned on a second observation plane (112) of said component, wherein the
plurality of signals are representative ofdata from said component (104); and
a computing device (120) coupled to said monitoring system, said
computing device (120) comprising:
a communication interface (230) configured to receive a
plurality of signals from said first probe and said second probe, wherein the
plurality of signals are representative ofdata from said component; and;
a processor (214) coupled to said communication interface and
programmed to:
combine the plurality of signals received from said first
probe and said second probe to generate a plurality of displacement
responses that correspond to a plurality of frequencies of a speed of
said component;
transform the plurality of signals received from each of
said first probe and said second probe to eliminate a plurality of split
resonance effects; and
generate an output of the data received from the
plurality of signals to identify a type of at least one fault within said
component.
9. A system (100) in accordance with Claim 8, wherein said
processor (214) is further programmed to:
22
generate data representative of a graphical output of the data received
from the plurality of signals;
identify at least one peak in the graphical output;
calculate at least one of a peak amplitude frequency and a peak
amplitude value for the at least one peak; and
identify at least one of a change in the peak amplitude frequency and a
change in the peak amplitude value to identify the type of the at least one fault within
said component (104).
10. A system (100) in accordance with Claim 9, wherein said
processor (214) is programmed to identify a decrease in the peak amplitude frequency
such that a crack within said component (104) is identified.

Documents

Application Documents

# Name Date
1 497-del-2013-Abstract.pdf 2013-08-20
1 497-del-2013-Assignment-(27-02-2013).pdf 2013-02-27
2 497-del-2013-Correspondence-Others-(23-04-2013).pdf 2013-04-23
2 497-del-2013-Assignment.pdf 2013-08-20
3 497-del-2013-GPA.pdf 2013-08-20
3 497-del-2013-Claims.pdf 2013-08-20
4 497-del-2013-Correspondence-others.pdf 2013-08-20
4 497-del-2013-Form-5.pdf 2013-08-20
5 497-del-2013-Form-3.pdf 2013-08-20
5 497-del-2013-Description(Complete).pdf 2013-08-20
6 497-del-2013-Form-2.pdf 2013-08-20
6 497-del-2013-Drawings.pdf 2013-08-20
7 497-del-2013-Form-1.pdf 2013-08-20
8 497-del-2013-Form-2.pdf 2013-08-20
8 497-del-2013-Drawings.pdf 2013-08-20
9 497-del-2013-Form-3.pdf 2013-08-20
9 497-del-2013-Description(Complete).pdf 2013-08-20
10 497-del-2013-Correspondence-others.pdf 2013-08-20
10 497-del-2013-Form-5.pdf 2013-08-20
11 497-del-2013-Claims.pdf 2013-08-20
11 497-del-2013-GPA.pdf 2013-08-20
12 497-del-2013-Correspondence-Others-(23-04-2013).pdf 2013-04-23
12 497-del-2013-Assignment.pdf 2013-08-20
13 497-del-2013-Assignment-(27-02-2013).pdf 2013-02-27
13 497-del-2013-Abstract.pdf 2013-08-20