DESC:FORM – 2

THE PATENTS ACT, 1970
(39 of 1970)
&
THE PATENTS RULES, 2003

COMPLETE SPECIFICATION
[SEE SECTION 10, RULE 13]

SYSTEM AND METHOD FOR PARALLEL ALIGNMENT OF TWO AXES OF INTEREST USING A POINTED TARGET

BHARAT ELECTRONICS LIMITED
WITH ADDRESS:
OUTER RING ROAD, NAGAVARA, BANGALORE 560045, INDIA

THE FOLLOWING SPECIFICATION PARTICULARLY DESCRIBES THE INVENTION AND THE MANNER IN WHICH IT IS TO BE PERFORMED

TECHNICAL FIELD
The present invention relates generally to parallel alignment. The invention, more particularly, relates to method and system for parallel alignment of two axes of interest.
BACKGROUND

There are a variety of instances in engineering applications where there is a requirement to align/harmonise two axes of interest (AOIs) parallel to each other. For instance, the alignment of an optical axis of an optical device and an axis passing through a laser range finder for surveillance applications. This parallel alignment is generally achieved using bore sighting charts. The bore sighting charts will have plus marks corresponding to the two AOIs separated relatively to each other. This separation distance will be kept the same as the actual physical separation between the two AOIs.
EP0843148 titled “Electro-optical method for static bore sighting of weapon systems and aircrafts” discloses a static harmonisation method using mechanical adapters for reference points, video cameras, and projectors. The static harmonisation method has a mechanical adapter associated with each measuring point of the aircraft and incorporating at least one video camera, for reproduction of real axes for the onboard system used for harmonising the weapon system axes with the aircraft axes. A target reference image is provided in front of the aircraft via one or more projectors, e. g. laser television devices.

The limitations corresponding with this kind of arrangement are as follows: For parallel alignment with bore sighting chart to work accurately, certain conditions need to be met as follows. The distance between plus marks in charts should be the same as the actual physical separation between the two AOIs. The chart plane should be normal for the AOI. Also, the chart should be leveled to prevent rotation about AOI. For AOI to be normal to chart, generally, the “phi1” (F1) degrees of freedom (DOF) to be kept at zero degrees. This is again another restriction with the conventional apparatus and method.
Hence, there is a need a method and a system to overcome the above-said limitations.
SUMMARY

This summary is provided to introduce a method and system for parallel alignment of two axes of interest (AOI). This summary is neither intended to identify essential features of the present invention nor is it intended for use in determining or limiting the scope of the present invention.
For example, various embodiments herein may include one or more systems and methods for parallel alignment of two axes of interest using a pointed target. In one embodiment, the system includes an axis of interest (AOI1) rigidly mounted on a two axis gimbal system (G1), having two degrees of freedom F1 and ?1 respectively. The said axis of interest (AOI1) is rigidly mounted to the centre of the two axis gimbal system G1 achieving two degrees of freedom (DOF), namely the two angles F1 and ?1. Further, the system includes an axis of interest (AOI2) rigidly mounted on a two axis gimbal system G2, having two degrees of freedom F2 and ?2 respectively. Centre of the second axis of interest (AOI2) is at a fixed offset distance from the centre of the two axis gimbal system G2. The system further includes an axis of interest AOI3. The centre of the axis of interest AOI3 and the centre of gimbal system G2, both are at the same point.
The system further includes angle measurement sensors configured to measure the degree of freedom (DOF) F1, ?1 of the axis of interest AOI1, and F2 and ?2 of the axis of interest AOI2 respectively. The axis of interest AOI1 and the axis of interest AOI2 are independently aligned to the pointed target, and further, the values of angle F1, ?1 and F2, and ?2 are measured by the angle measurement sensors and recorded in a memory.
In another embodiment, the present invention discloses a method for parallel alignment of two axes of interest. The method includes storing, by an offset module, a fixed displacement offset values of the axis of interest AOI3 and an axis of interest AOI2 corresponding to an axis of interest AOI1, and an axis of interest AOI3 respectively. The method further includes aligning, simultaneously, the axis of interest AOI1 and the axis of interest AOI2 with a pointed target. The method further includes measuring, by a distance measure module, the distance between the axis of interest AOI1 centre and the pointed target, and the distance between the axis of interest AOI2 centre and the pointed target. The measured values F1, ?1, F2, ?2, the fixed displacement offset values, and the measured distance values, are stored in a memory by a processor. The method further includes computing, by computing module, values of F2offset and ?2offset. The said computing performs, adding of the F2offset and ?2offset values to the F2 and ?2 (DOF) of the axis of interest AOI2.
BRIEF DESCRIPTION OF ACCOMPANYING DRAWINGS
The detailed description is described with reference to the accompanying figures. In the figures, the left-most digit(s) of a reference number identifies the figure in which the reference number first appears. The same numbers are used throughout the drawings to reference like features and modules.
Fig.1 illustrates a schematic diagram depicting a processing system connected to computing devices through a network, according to an embodiment of the present invention.
Fig.2 illustrates a block diagram of the system showing the connection of the angle measurement sensor, according to an embodiment of the present invention.
Fig.3 illustrates a schematic block diagram depicting definitions of Axes of Interest (AOI), according to an embodiment of the present invention.
Fig.4 illustrates a schematic diagram depicting definitions of “phi1” (F1) and “phi2” (F2) degree of freedom (DOF), according to an embodiment of the present invention.
Fig.5 illustrates a schematic diagram depicting definitions of “thi1” (?1) and “thi2” (?2) degree of freedom (DOF), according to an embodiment of the present invention.
Fig.6 illustrates a schematic diagram depicting alignment using a pointed target, according to an embodiment of the present invention.
Fig.7 illustrates a flow chart of parallel alignment/reverse parallelism process, according to an exemplary implementation of the present disclosure.
Fig.8 illustrates a method for parallel alignment of two axes of interest, according to an exemplary implementation of the present invention.
It should be appreciated by those skilled in the art that any block diagrams herein represent conceptual views of illustrative methods embodying the principles of the present disclosure. Similarly, it will be appreciated that any flow charts, flow diagrams, and the like represent various processes which may be substantially represented in a computer-readable medium and so executed by a computer or processor, whether or not such computer or processor is explicitly shown.
DETAILED DESCRIPTION
The various embodiments of the present disclosure describe a method and system for parallel alignment of two axes of interest using a pointed target.
In the following description, for purpose of explanation, specific details are set forth in order to provide an understanding of the present disclosure. It will be apparent, however, to one skilled in the art that the present disclosure may be practiced without these details. One skilled in the art will recognize that embodiments of the present disclosure, some of which are described below, may be incorporated into a number of systems.
However, the systems and methods are not limited to the specific embodiments described herein. Further, structures and devices shown in the figures are illustrative of exemplary embodiments of the present disclosure and are meant to avoid obscuring of the present disclosure.
It should be noted that the description merely illustrates the principles of the present invention. It will thus be appreciated that those skilled in the art will be able to devise various arrangements that, although not explicitly described herein, embody the principles of the present invention. Furthermore, all examples recited herein are principally intended expressly to be only for explanatory purposes to help the reader in understanding the principles of the invention and the concepts contributed by the inventor to furthering the art and are to be construed as being without limitation to such specifically recited examples and conditions. Moreover, all statements herein reciting principles, aspects, and embodiments of the invention, as well as specific examples thereof, are intended to encompass equivalents thereof.
In an embodiment, the claimed subject matter of the present invention discloses a system for parallel alignment of two axes of interest (AOI). An Axis of interest AOI1 is rigidly fixed to a centre of two axis gimbal system (G1) and hence has two degrees of freedom (DOF), namely two angles thi1(?1) and phi1 (F1). Similarly, an axis of interest AOI2 is rigidly fixed to a two axis gimbal system (G2), but not at the centre but with an offset, and also has two degrees of freedom, namely two angles th2 (?2) and phi2 (F1). The said gimbal system G2 is not independent of the said gimbal system G1. Further, the said gimbal system G2 is rigidly mounted on the link corresponding to the th1 (?1) DOF of the said gimbal system G1 with an offset from its centre.
Further, the system includes an axis of interest AOI3 rigidly fixed to an axis gimbal system (G2) at the centre and hence does not have an offset. The AOI3 is a reference axis used for internal computations (not shown here).
In another embodiment, the present invention further includes a plurality of angle measurements sensors. The angle measurement sensors are coupled with a processing system. The said angle measurement sensors are configured to measure the values angles corresponding to the four DOFs (i.e. ?1, F1, ?2, and F1). The objective of the parallel harmonization is that once it is carried out, both the AOIs becomes parallel corresponding to each other when the values corresponding to the four DOFs ?1, F1, ?2, and F1 are each set to zero. The parallel harmonization is achieved with a pointed target, by developing a reverse parallelism technique using vector transformations.
In another embodiment, the present invention discloses a method for parallel alignment of two axes of interest. The method includes storing, by an offset module, a fixed displacement offset values of axis of interest AOI3 and an axis of interest AOI2 corresponding to an axis of interest AOI1, and an axis of interest AOI3 respectively.
The method further includes aligning, simultaneously, the axis of interest AOI1 and the axis of interest AOI2 with a pointed target. Further, the method includes measuring, by angle measurement sensors, a degree of freedom (DOF) F1, ?1 of the axis of interest AOI1 and F2 and ?2 of the axis of interest AOI2 respectively. The method further includes measuring, by a distance measure module, the distance between the axis of interest AOI1 centre and the pointed target, and the distance between the axis of interest AOI2 centre and the pointed target. The fixed displacement offset values, the measured values of F1, ?1, F2, ?2, and the measured distance values are stored by a processor. Further, the values of F2offset and ?2offset are computed by a computing module, and then storing the F2offset and ?2offset values in the memory. The computing process includes adding the F2offset and ?2offset values to the F2 and ?2 (DOF) of the axis of interest AOI2.
It should be noted that the description merely illustrates the principles of the present invention. It will thus be appreciated that those skilled in the art will be able to devise various arrangements that, although not explicitly described herein, embody the principles of the present invention. Furthermore, all examples recited herein are principally intended expressly to be only for explanatory purposes to help the reader in understanding the principles of the invention and the concepts contributed by the inventor to furthering the art and are to be construed as being without limitation to such specifically recited examples and conditions. Moreover, all statements herein reciting principles, aspects, and embodiments of the invention, as well as specific examples thereof, are intended to encompass equivalents thereof.
Fig.1 illustrates a block diagram 100 depicting a processing system (104) connected to a plurality of computing devices (122) through a network (120), according to an exemplary implementation of the present invention. The block diagram (100) includes an angle measurement sensors (102) connected with the processing system (104), a module (108), a memory (116), and database (118), a network (120), and the plurality of computing devices 122 (122-a, 122-b….122n).
The network (120) interconnects the plurality of computing devices (122) and the database (118) with the processing system (104). The network (120) includes wired and wireless networks. Examples of the wired networks include a wide area network (WAN) or a local area network (LAN), a client-server network, a peer-to-peer network, and so forth. Examples of the wireless networks include Wi-Fi, a global system for mobile communications (GSM) network, a general packet radio service (GPRS) network, an enhanced data GSM environment (EDGE) network, 802.5 communication networks, code division multiple access (CDMA) networks, or Bluetooth networks.
In the present implementation, the database (118) may be implemented as an enterprise database, a remote database, local database, and the like. The database (118) may be located within the vicinity of the processing system (104) or maybe located at different geographic locations as compared to that of the processing system (104). Further, the database (118) may themselves be located either within the vicinity of each other or maybe located at different geographic locations. Furthermore, the database (118) may be implemented inside the processing system (104) or the database (118) may be implemented as a single database or a separate unit.
In the present implementation, the processing system (104) includes one or more processors (106). The processor (106) may be implemented as one or more microprocessors, microcomputers, microcontrollers, digital signal processors, central processing units, state machines, logic circuitries, and/or any devices that manipulate signals based on operational instructions. Among other capabilities, at least one processor (106) is configured to fetch and execute computer-readable instructions stored in the memory (116).
The memory (116) may be coupled to the processor (106). The memory (116) can include any computer-readable medium known in the art including, for example, volatile memory, such as static random access memory (SRAM) and dynamic random access memory (DRAM), and/or non-volatile memory, such as read-only memory (ROM), erasable programmable ROM, flash memories, hard disks, optical disks, and magnetic tapes. The memory (116) also includes a cache memory to work with the processing system (104) more effectively.
Further, the processing system (104) includes the modules (108). The modules (108) include routines, programs, objects, components, data structures, etc., which perform tasks or implement particular abstract data types. In one implementation, the module (108) includes an offset value module (110), a distance measure module (112), and a computing module (114).
Furthermore, in the present implementation, the system includes the offset value module (110) which is configured to store the fixed displacement offset values of axis of AOI3 (206) with respect to the AOI1 (202), and the fixed displacement offset values of AOI2 (204) with respect to AOI3 (206). Further, the system includes the distance measure module (112) which is configured to measure the distance between AOI1 centre (216) and the pointed target (402), and the distance between AOI2 centre (208) and the pointed target (402). Furthermore, the system includes the computing module (114) which is configured to compute the value of F2 corrected and ?2 corrected.
Fig.2 illustrates a block diagram (200) of the system showing the connection of the angle measurement sensors (102), according to an exemplary implementation of the present disclosure. The figure includes four angle measurement sensors i.e. angle measurement senor (102-a) for EL2, angle measurement sensor (102-b) for ?2, angle measurement sensor (102-c) for ?1 and angle measurement sensor (102-d) for EL1. The figure further includes an EL joint & TH (?) joint of a gimbal system G2 (214), and El joint & TH (?) joint of a gimbal system G1 (218). The said angle measurement sensors (102) in the present invention are configured to measure a degree of freedom (DOF) F1, ?1 of an axis of interest AOI1 (202), and F2 and ?2 of an axis of interest AOI2 (204) respectively.
Fig.3 illustrates an exemplary block diagram (300) of the system depicting the definitions of Axes of Interest (AOI), according to an exemplary implementation of the present disclosure. The system includes the Axis of Interest AOI1 (202) which is rigidly mounted on the two axis gimbal system G1 (218), having two degrees of freedom (F1 and ?1) respectively. The centre of the said AOI1 (202) and centre of the gimbal system G1 (218) are coincident to each other. Further, the system includes the Axis of Interest AOI2 (102) which is rigidly mounted on the two axis gimbal G2 having two degrees of freedom (F2 and ?2) respectively. The centre of the said AOI2 (204) is at a fixed offset distance from the centre of the gimbal system G2 (214). The system further includes an axis of interest AOI3 (206) which are rigidly fixed to the two axis system G2 (214) at the centre (hence does not have an offset). The centre of the gimbal system G2 (214) and the centre of AOI3 (212) are at the same point. The said AOI3 (206) is a reference axis which is used for internal computations.
Fig.4 illustrates a schematic diagram (400) depicting definitions of “phi1” (F1) and “phi2” (F2) degree of freedom (DOF), according to an exemplary implementation of the present invention. The figure is a side view of the system considered in the present invention. The angle “F1” degree of freedom (DOF) is the angle the “AOI1 (202)” makes with the horizontal plane. It is basically the elevation angle (angle by which AOI are elevated up or depressed down.). The angle measurement sensor (102-d) is fitted in the elevation axis of the gimbal system G1 (218), which measure the “F1” angle. Similarly, the “F2” degree of freedom (DOF) is the angle the “AOI2 (204)” makes with the horizontal plane. The angle measurement sensor (102-a) fitted in the elevation axis of the gimbal system G2 (214), which measures the “F2” angle.
Fig.5 illustrates a schematic diagram (500) depicting definitions of the “thi1” (?1) and the “thi2” (?2) degree of freedom (DOF), according to an exemplary implementation of the present invention. The figure shows a top view of the system considered in the present invention. The angle “?1” degree of freedom (DOF) is the angle the “AOI1 (202)” makes with the vertical plane. It is basically the traverse/azimuth angle (angle by which the AOI are moved left or right.) There is an angle measurement sensor (102-c) fitted in the traverse/azimuth axis of the gimbal system G1 (218), which measure the “?1” angle. Similarly, the “?2” degree of freedom (DOF) is the angle the “AOI2 (204)” makes with the vertical plane. The angle measurement sensor (102-b) fitted in the traverse/azimuth axis of the gimbal system G2 (214), which measure the “?2” angle.
Fig.6 illustrates a schematic diagram (600) depicting alignment using the pointed target (402), according to an exemplary implementation of the present invention. The diagram (600) shows the configuration of the AIO1 (202) and the AIO2 (204) during the process of alignment. This is a onetime process that needs to be performed, at the time the AOI1 (202) and the AOI2 (204) are installed together.
The reverse parallelism process is used to compute two offset values phi2_offset and th2_offset. The said offset values when added to the sensors angles for the “phi2” & “th2” the degree of freedoms of the AOI2 (204), the measurement axes for “ph2” & “th2” DOFs gets translated so that the resulting frame of reference is parallel to the measurement axis for the “phi1” & “th1” degree of freedoms of the AOI1 (202).
The said pointed target (402) is deployed for the alignment purpose. The AOI1 (202) and the AOI2 (204) are independently aligned to the pointed target (402). In this configuration, the DOFs ?1, F1, ?2, and F2 are locked. The distance between the AOI1 centre (216) and the pointed target (402) is measured, by the distance measure module (112) and stored in the memory (116). The values of ?1, F1, ?2, and F2 angles as measured by the angle measurement sensors (102) are stored in the memory (114). The values phi2_corrected and th2_corrected are computed, by the computing module (114). These are the values of th2 and phi2 computed using coordinate geometry taking into account the values of th1, ph1, so that AOI1 (202) and AOI2 (204) are theoretically aligned. The difference between the values phi2_corrected, th2_corrected and the corresponding values as measured by the angle measurement sensors (102) become the two offset values the phi2_offset and the th2_offset.
?(?Ø2?_(offset )= ?Ø2?_corrected-?Ø2?_(sensorangle ) )
?(??2?_offset= ??2?_corrected-??2?_(sensorangle ) )
?Ø2?_(offset ) and ??2?_offset are the zero errors computed.
Further, by adding these constant values as an offset to the angle measurement sensor (102) values corresponding to the “phi2” & “th2” DOF of the AOI2 (204), the resulting measurement axes form a set of reference frames which are parallel aligned to each other. Hence the basic requirement of parallelism for alignment/harmonisation is achieved.
Fig.7 illustrates a flow chart (700) of parallel alignment/reverse parallelism process, according to an exemplary implementation of the present disclosure. The parallel alignment/reverse parallelism process involves the following steps.
At step 702, storing the fixed offset values of the AOI3 (206) with respect to the AOI1 (202) in the memory (116) of the system.
At step 704, storing the fixed offset value of the AOI2 (204) with respect to the AOI3 (206).
At step 706, deployment of the pointed target (402).
At step 708, alignment of AOI1 (202) to the pointed target (402);
At step 710, alignment of AOI2 (204) to the pointed target (402);
At step 712, recording the values of the angles th1, phi1 & th2, phi2;
At step 714, using the reverse parallelism technique to compute the fixed offsets values;
At step 716, storing the fixed offset values in the memory (116) of the system;
At step 718, adding the fixed offsets to the angle measurement (102) sensor outputs to achieve parallelism.
Fig.8 illustrates a method for parallel alignment of the two-axes of interest, according to an exemplary implementation of the present invention.
Referring now to Fig.8 which illustrates a flow chart (800) of a method for parallel alignment of the two axes interest, according to an exemplary implementation of the present invention. The flow chart (800) of Fig.8 is explained below.
At step 802, storing, by the offset module (110), the fixed displacement offset values of the axis of interest AOI3 (206) and the axis of interest AOI2 (204) corresponding to the axis of interest AOI1 (202), and the axis of interest AOI3 (206) respectively;
At step 804, aligning, simultaneously, the axis of interest AOI1 (202) and the axis of interest AOI2 (204) with the pointed target (402);
At step 806, measuring, by the angle measurement sensors (102), the degree of freedom (DOF) F1, ?1 of the axis of interest AOI1 (202) and the F2 and ?2 of the axis of interest AOI2 (204) respectively;
At step 808, measuring, by the distance measure module (112), the distance between the axis of interest AOI1 centre (216) and the pointed target (402), and the distance between the axis of interest AOI2 centre (208) and the pointed target (402);
At step 810, storing, by the processor (106), the measured values of F1, ?1, F2, ?2, the fixed displacement offset values, and the measured distance values in the memory (116);
At step 812, computing, by the computing module (114), the values of F2offset and ?2offset;
At step 814, storing the F2offset and ?2offset values in the memory (116); and
At step 816, computing, by adding the F2offset and ?2offset values to the F2 and ?2 (DOF) of the axis of interest AOI2 (204).
In another exemplary embodiment of the present invention provides the following advantages which are provided below:
The target required for the alignment need not be kept at zero degrees for the “phi1” DOF of AOI 1.
Separate target board with multiple plus markings need not be carried along for the alignment.
The pointed target at any value of th1 DOF and any distance can be identified in the field, or deployed (Could be a pointed pole or Cross mark) and can be used for alignment.
The conditions required to be met while using a target board, like perpendicularity of the AOI with the target board plane, and leveling of the board is eliminated.
The error in alignment due to the error in distance between plus marks in charts is avoided since only a single point is used for alignment.
Separate target board with multiple plus markings need not be carried along for alignment. The error in alignment due to the error in distance between plus marks in charts is avoided since only a single point is used for alignment.
It should be noted that the description merely illustrates the principles of the present invention. It will thus be appreciated that those skilled in the art will be able to devise various arrangements that, although not explicitly described herein, embody the principles of the present invention. Furthermore, all examples recited herein are principally intended expressly to be only for explanatory purposes to help the reader in understanding the principles of the invention and the concepts contributed by the inventor to furthering the art and are to be construed as being without limitation to such specifically recited examples and conditions. Moreover, all statements herein reciting principles, aspects, and embodiments of the invention, as well as specific examples thereof, are intended to encompass equivalents thereof.

It should be noted that the description merely illustrates the principles of the present invention. It will thus be appreciated that those skilled in the art will be able to devise various arrangements that, although not explicitly described herein, embody the principles of the present invention. Furthermore, all examples recited herein are principally intended expressly to be only for explanatory purposes to help the reader in understanding the principles of the invention and the concepts contributed by the inventor to furthering the art and are to be construed as being without limitation to such specifically recited examples and conditions. Moreover, all statements herein reciting principles, aspects, and embodiments of the invention, as well as specific examples thereof, are intended to encompass equivalents thereof.

List of Reference Numerals:
Angle Measurement Sensors: 102 Gimbal System G3: 218
Processing System: 104 Pointed Target: 402
Processor: 106
Module: 108
Offset Value Module: 110
Distance Measure Module: 112
Computing Module: 114
Memory: 116
Database: 118
Network: 120
Computing Devices: 122
Angle Measurement Sensor for EL2: 102-a
Angle measurement Sensor for Th2: 102-b
Angle Measurement Sensor for TH1: 102-c
Angle Measurement Sensor: 102-d
AOI1: 202
AOI2: 204
AOI3: 206
Centre of AOI2: 208
Gimbal System G1: 210
Centre of AOI3: 212
Gimbal System G2: 214
Centre of AOI1: 21
,CLAIMS:We Claim:
1. A system for parallel alignment of two axes of interest (AOI), the system comprising:
an axis of interest AOI1 (202) rigidly mounted on a two-axis gimbal system G1 (218), having two degrees of freedom F1 and ?1 respectively, wherein centre of AOI1 (216) and the gimbal system G1 (218) are coincident to each other;
an axis of interest AOI2 (204) rigidly mounted on a two-axis gimbal system G2 (214), having two degrees of freedom F2 and ?2 respectively, wherein centre of AOI2 (208) is at a fixed offset distance from the centre of gimbal system G2 (214);
an axis of interest AOI3 (206), wherein the centre of gimbal system G2 (214) and centre of AOI3 (212) are at the same point;
an angle measurement sensors (102) configured to measure the degree of freedom (DOF) F1, ?1 of the axis of interest AOI1 (202), and F2 and ?2 of the axis of interest AOI2 (204) respectively;
a pointed target (402), wherein the axis of interest AOI1 (202) and the axis of interest AOI2 (204) are independently aligned to the pointed target (402);
a memory (116) configured to store the measured values of F1, ?1, F2, ?2, fixed displacement offset values, and measured distance values; and
a processing system (104) coupled with the angle measurement sensors (102), the processing system (104) configured to compute F2 offset and ?2 offset,
wherein F2 offset = F2 corrected - F2 sensor angle, and
?2 offset = ?2 corrected - ?2 sensor angle;
wherein the values of F2 offset and ?2 offset are added to the F2 and ?2 degrees of freedom of AOI2 (204), to achieve parallel alignment of the two axis of interest AOI1 (202) and AOI2 (204).
2. The system as claimed in claim1, wherein the processing system (500) comprising:
a processor (106) coupled to the memory (116);
one or more modules (108), wherein the said module (108) comprises an offset value module (110), a distance measurement module (112), and a computing module (114),
wherein the offset value module (110) is configured to store the fixed displacement offset values of axis of AOI3 (206) with respect to the AOI1 (202), and the fixed displacement offset values of AOI2 (204) with respect to AOI3 (206);
wherein the distance measure module (112) is configured to measure the distance between AOI1 centre (216) and the pointed target (402), and the distance between AOI2 centre (208) and the pointed target (402); and
wherein the computing module (114) is configured to compute the value of F2 corrected and ?2 corrected.
3. The system as claimed in claim 1, wherein the F2corrected and ?2 corrected values are the computed values of F2 and ?2.
4. The system as claimed in claim 3, wherein the values of F2corrected and ?2corrected are computed with the help of values of F1 and ?1, the fixed displacement offset values of AOI3 (206) with respect to the AOI1 (202) and the fixed displacement offset value of AOI2 (204) with respect to the AOI3 (206), and the measured distance value of AOI1 centre (216) and the AOI2 centre (208) from the pointed target (402).
5. The system as claimed in claim 1, wherein the difference between the values F2 corrected, ?2 corrected, and the corresponding values as measured by the angle measurement sensor (102) are the two offset values of F2 offset and ?2 offset.
6. The system as claimed in claim 1, wherein the gimbal system G2 (214) is not independent of gimbal system G1 (218).
7. The system as claimed in claim 1, wherein the pointed target (402) need not be kept at zero degrees for the F1 of AOI1 (202).
8. A method for parallel alignment of two-axes of interest, said method comprising:
storing, by an offset module (110), a fixed displacement offset values of axis of interest AOI3 (206) and an axis of interest AOI2 (204) corresponding to an axis of interest AOI1 (202), and the axis of interest AOI3 (206) respectively;
aligning, simultaneously, the axis of interest AOI1 (202) and the axis of interest AOI2 (204) with a pointed target (402);
measuring, by an angle measurement sensors (102), a degree of freedom (DOF) F1, ?1 of the axis of interest AOI1 (202) and F2 and ?2 of the axis of interest AOI2 (204) respectively;
measuring, by a distance measure module (112), the distance between the axis of interest AOI1 centre (216) and the pointed target (402), and the distance between the axis of interest AOI2 centre (208) and the pointed target (402);
storing, by a processor (106), the measured values of F1, ?1, F2, ?2, the fixed displacement offset values, and the measured distance values in a memory (116);
computing, by computing module (114), values of F2offset and ?2offset;
storing the F2offset and ?2offset values in the memory (116); and
computing, by adding the F2offset and ?2offset values to the F2 and ?2 (DOF) of the axis of interest AOI2 (204).

Dated this 15th day of March 2019

FOR BHARAT ELECTRONICS LIMITED
By their Agent

(D. Manoj Kumar) (IN/PA 2110)
KRISHNA & SAURASTRI ASSOCIATES LLP