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Test Support Method And Test Support Device

Abstract: Provided are a test assistance method, a test assistance device (1) and a test assistance program capable of reducing a test load and oversight of a symbol in a test for a monitoring and control system. A test assistance method comprising a step of acquiring an image before a change and an image after the change as images to be displayed on a monitoring and control system, a step of extracting a plurality of symbols in the image after the change having changed from the image before the change, a step of assigning sequence information to the plurality of extracted symbols, and a step of outputting a test image including the plurality of symbols assigned with the sequence information.

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Notices, Deadlines & Correspondence

Patent Information

Application #
Filing Date
22 July 2022
Publication Number
39/2022
Publication Type
INA
Invention Field
COMPUTER SCIENCE
Status
Email
info@krishnaandsaurastri.com
Parent Application
Patent Number
Legal Status
Grant Date
2025-02-10
Renewal Date

Applicants

MITSUBISHI ELECTRIC CORPORATION
7-3, Marunouchi 2-chome, Chiyoda-ku, Tokyo 1008310

Inventors

1. FUJIHARA, Maho
c/o Mitsubishi Electric Corporation, 7-3, Marunouchi 2-chome, Chiyoda-ku, Tokyo 1008310
2. TATEISHI, Daisuke
c/o Mitsubishi Electric Corporation, 7-3, Marunouchi 2-chome, Chiyoda-ku, Tokyo 1008310
3. NAKATA, Hideo
c/o Mitsubishi Electric Corporation, 7-3, Marunouchi 2-chome, Chiyoda-ku, Tokyo 1008310
4. ADACHI, Shiho
c/o Mitsubishi Electric Corporation, 7-3, Marunouchi 2-chome, Chiyoda-ku, Tokyo 1008310
5. SUGIHARA, Keisuke
c/o Mitsubishi Electric Corporation, 7-3, Marunouchi 2-chome, Chiyoda-ku, Tokyo 1008310
6. SHIMAYOSHI, Shota
c/o Mitsubishi Electric Corporation, 7-3, Marunouchi 2-chome, Chiyoda-ku, Tokyo 1008310
7. TAKAMI, Atsushi
c/o Mitsubishi Electric Corporation, 7-3, Marunouchi 2-chome, Chiyoda-ku, Tokyo 1008310

Specification

FORM 2
THE PATENTS ACT, 1970
(39 of 1970)
&
THE PATENTS RULES, 2003
COMPLETE SPECIFICATION
[See section 10, Rule 13]
TEST SUPPORT METHOD, TEST SUPPORT DEVICE,
AND TEST SUPPORT PROGRAM;
MITSUBISHI ELECTRIC CORPORATION, A CORPORATION ORGANISED
AND EXISTING UNDER THE LAWS OF JAPAN, WHOSE ADDRESS IS 7-3,
MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO 1008310, JAPAN
THE FOLLOWING SPECIFICATION PARTICULARLY DESCRIBES THE
INVENTION AND THE MANNER IN WHICH IT IS TO BE PERFORMED

2
DESCRIPTION
Field
[0001] The present disclosure relates to a test support
5 method, a test support device, and a test support program,
each for a monitoring and control system such as a traffic
control system and a power management system.
Background
10 [0002] When, for example, a monitoring and control
system, such as a traffic control system for efficient
train operation in a railroad system, or a power management
system for managing the operation of an electric power
substation, is to be updated or newly constructed, a test
15 needs to be performed in advance to verify satisfactory
operation of the constructed system. This test is
described in test items specified in a test procedure
document or the like. The manufacturer of the monitoring
and control system performs a test on the basis of this
20 test procedure document, and submits a test report that
provides test results to the client.
[0003] A typically wide variety of test items for such a
monitoring and control system imposes a high burden on the
testing person (hereinafter, tester). Thus, task reduction,
25 time reduction, and cost reduction of the test work are
demanded. Known as one means for reducing the burden of a
test of a constructed monitoring and control system is a
test support device that automates some processes of a test,
such as reviewing the test procedures, adjustment of the
30 screen display and of the position of the screen, and the
like (see, e.g., Patent Literature 1).
Citation List

3
Patent Literature
[0004] Patent Literature 1: Japanese Patent Application
Laid-open No. 2014-142875
5 Summary
Technical Problem
[0005] A conventional test support device requires the
tester to visually check whether the display screen of the
constructed monitoring and control system provides a
10 correct display, and operates appropriately in response to
a given signal, and the like. For example, in a case of
verifying appropriate operation of the display screen, a
single display screen may include a large number of symbols
to be tested. The tester is required to extremely
15 carefully check all the symbols needing checking, without
overlooking, but, because of human errors, the tester can
overlook a symbol needing checking.
[0006] The present disclosure has been made to solve the
problems as those described above, and it is an object of
20 the present disclosure to provide a test support method, a
test support device, and a test support program that can
each reduce or prevent overlooking by the tester, and
reduce test burden, in testing of a monitoring and control
system.
25
Solution to Problem
[0007] A test support method according to the present
disclosure comprises: a step of obtaining a pre-change
image and a post-change image, each to be displayed on a
30 monitoring and control system; a step of extracting, from
the post-change image, a plurality of symbols that have
changed from corresponding symbols in the pre-change image;
a step of adding order information to the plurality of the

4
extracted symbols; and a step of outputting a test image in
which the order information is added to the plurality of
symbols.
[0008] A test support device according to the present
5 disclosure comprises: an input unit to obtain a pre-change
image and a post-change image, each to be displayed on a
monitoring and control system; a processing unit to extract,
from the post-change image, a plurality of symbols that
have changed from corresponding symbols in the pre-change
10 image, and to add order information to the extracted
plurality of symbols; and an output unit to output a test
image in which the order information is added to the
plurality of symbols.
[0009] A test support program according to the present
15 disclosure causes a computer to perform: a step of
obtaining a pre-change image and a post-change image, each
to be displayed on a monitoring and control system; a step
of extracting, from the post-change image, a plurality of
symbols that have changed from corresponding symbols in the
20 pre-change image; a step of adding order information to the
extracted plurality of symbols; and a step of outputting a
test image in which the order information is added to the
plurality of symbols.
25 Advantageous Effects of Invention
[0010] According to the present disclosure, a test image
in which order information is added to symbols in an image
after a change (hereinafter, post-change image), which have
changed from corresponding symbols in an image before the
30 change (hereinafter, pre-change image) is output. This
enables the tester to check symbols needing checking, which
have changed from corresponding symbols in the screen
before the change, on the basis of the order information

5
added to the symbols. As a result, the tester can
thoroughly check the symbols needing checking. Thus, test
burden and overlooking of a symbol can be reduced.
5 Brief Description of Drawings
[0011] FIG. 1 is a schematic diagram of a test support
system according to a first embodiment.
FIG. 2 is a flowchart of a test image generation
process performed by the test support device according to
10 the first embodiment.
FIG. 3 is a schematic view of a pre-change image
obtained by the test support device according to the first
embodiment.
FIG. 4 is a schematic view of a post-change image
15 obtained by the test support device according to the first
embodiment.
FIG. 5 is a schematic view of a post-change image with
markings added by the test support device according to the
first embodiment.
20 FIG. 6 is a flowchart of an order information addition
process performed by the test support device according to
the first embodiment.
FIG. 7 is a schematic view of a test image output by
the test support device according to the first embodiment.
25 FIG. 8 is a flowchart of an order information addition
process performed by the test support device according to a
second embodiment.
FIG. 9 is a schematic view of a test image output by
the test support device according to the second embodiment.
30 FIG. 10 is a flowchart of an order information
addition process performed by the test support device
according to a third embodiment.
FIG. 11 is a schematic view of a test image output by

6
the test support device according to the third embodiment.
FIG. 12 is a flowchart of an order information
addition process performed by the test support device
according to a fourth embodiment.
5 FIG. 13 is a diagram illustrating the ratio of changed
symbols in each of divisional zones in the fourth
embodiment.
FIG. 14 is a schematic diagram of the test support
system according to a fifth embodiment.
10 FIG. 15 is a diagram illustrating examples of line of
sight of a tester according to the fifth embodiment.
FIG. 16 is a flowchart of an order information
addition process performed by the test support device
according to the fifth embodiment.
15
Description of Embodiments
[0012] First embodiment.

A configuration of a test support system 100 according
20 to a first embodiment will be described with reference to
FIG. 1. FIG. 1 illustrates a schematic diagram of the test
support system 100 for supporting a test of a constructed
monitoring and control system. The test support system 100
includes a test support device 1, an input device 2, and an
25 output device 3. In addition, the test support system 100
is connected to a network 20 such as, for example, an inhouse local area network (LAN) for communication therewith.
[0013] The test support device 1 is, for example, a
computer installed in an office of the manufacturer that
30 has constructed the monitoring and control system. The
test support device 1 generates a test image to be viewed
by the tester in performing a test of a monitoring and
control system such as a traffic control system or a power

7
management system. The present embodiment is based on the
assumption that the test support device 1 is installed in
an office, but the place of installation of the test
support device 1 is not limited thereto. The test support
5 device 1 may be installed in a server outside the premises
or installed in a cloud.
[0014] The input device 2 is a device for inputting an
operator’s command or data to the test support device 1.
Examples of the device for inputting an operator’s command
10 include a keyboard, a mouse, and a touch panel. In
addition, examples of the device for inputting data include
a hard disk drive (HDD), a solid state drive (SSD), an SD
card, and a USB memory.
[0015] The output device 3 is a device for displaying or
15 printing information output from the test support device 1.
Examples of the device for displaying information include a
liquid crystal display, a plasma display, an organic
electroluminescent (EL) display, a smartphone, and a mobile
tablet device. In addition, examples of the device for
20 printing information include a printer.
[0016] A configuration of the test support device 1 will
next be described in detail. As illustrated in FIG. 1, the
test support device 1 includes an input unit 10, a
processing unit 11, a storage unit 12, and an output unit
25 13.
[0017] The input unit 10 is an input interface for
receiving an operator’s command and/or data from outside
the test support device 1. Examples of the input interface
for receiving an operator’s command include a USB terminal.
30 The input unit 10 is connected to the input device 2 via a
USB cable to receive an operator’s command from the input
device 2. In addition, examples of the input interface for
receiving data include a LAN terminal. The input unit 10

8
is not limited to a LAN terminal, which is a wired network
terminal, but may perform wireless communication using, for
example, a wireless LAN scheme. In addition, the
communication medium is not limited to a LAN, but data may
5 be received via a network such as the Internet.
[0018] The processing unit 11, which is a processor such
as a central processing unit (CPU), is connected to the
input unit 10, the storage unit 12, and the output unit 13.
The processing unit 11 executes a test support program
10 installed in the storage unit 12 to control operations of
the input unit 10, of the storage unit 12, and of the
output unit 13, and to perform computation processing and
the like.
[0019] The processing unit 11 receives and processes
15 data. The output unit 13 is an output interface for
outputting a processing result provided by the processing
unit 11, and the like to outside the test support device 1.
Examples of the output interface include a high-definition
multimedia interface (HDMI) terminal (HDMI is a registered
20 trademark), a digital visual interface (DVI) terminal, a Dsub terminal, and a USB terminal. The output unit 13 is
connected to the output device 3 via one of various types
of cables, and the processing unit 11 transmits various
data to the output device 3 via the output unit 13. This
25 enables the output device 3 to display or print the data
received.
[0020]
A test image generation process of the test support
30 device 1 will next be described with reference to FIG. 2.
FIG. 2 illustrates a flowchart of a test image generation
process performed by the test support device 1.
[0021] At step S101, the test support device 1 obtains a

9
pre-change image and a post-change image as the images to
be tested and displayed in the monitoring and control
system. In this respect, the monitoring and control system
is tested by a tester to check whether a symbol on an image
5 displayed by the monitoring and control system changes as
expected in response to input of a signal. The term “prechange image” refers to an image displayed by the
monitoring and control system before a signal is input, and
the term “post-change image” refers to an image after the
10 display has changed in response to the input of the signal.
[0022] An example of the pre-change image will next be
described with reference to FIG. 3. FIG. 3 illustrates, by
way of example, a schematic view of a pre-change image on a
traffic display screen displayed by a traffic control
15 system. A traffic control system is a system for centrally
monitoring and controlling train operation, and the traffic
display screen displays, for example, traffic information,
various types of anomalous conditions, and the like of
trains on a railroad track. Note that the following
20 description will be provided, by way of example, with
respect to a case in which the test support device supports
a traffic control system.
[0023] An example of the post-change image will next be
described with reference to FIG. 4. FIG. 4 illustrates a
25 schematic view of a post-change image in the traffic
display screen displayed by the traffic control system. To
check whether the constructed traffic control system
displays an appropriate image in various situations during
monitoring and controlling, a signal simulating a signal
30 that will be generated in each situation during the
monitoring and controlling is input to the traffic control
system for a test item corresponding to that situation.
The traffic control system changes the display in the

10
monitoring and control system from a pre-change image to a
post-change image on the basis of the signal that has been
input.
[0024] Prior to performing a test, the tester of the
5 traffic control system generates multiple simulation
signals corresponding to the test items of the test to be
performed, and inputs these simulation signals to the
traffic control system. In this work, the tester captures,
using a screenshot function, a camera, or the like, a pre10 change image and a post-change image that has changed in
response to input of each corresponding one of the multiple
simulation signals, and generates data on a test image set
including the pre-change images and the post-change images
corresponding to the test items. The generated data on the
15 test image set is stored in a server on an office LAN, a
USB memory, or the like. The test support device 1 obtains,
at step S101, the data on the test image set including the
pre-change images and the post-change images generated in
advance, from the server, the USB memory, or the like via
20 the input unit 10. The obtained data on the test image set
is stored in the storage unit 12 of the test support device
1.
[0025] Returning to FIG. 2, the test support device 1
extracts, at step S102, symbols that have changed between
25 the obtained pre-change and post-change images. The test
support device 1 detects an image difference between the
pre-change image and the post-change image to identify
symbols in the post-change image, which have changed from
the corresponding symbols in the pre-change image. A
30 symbol in the post-change image, which has changed from the
corresponding symbol in the pre-change image is referred to
hereinafter as “changed symbol” as appropriate.
[0026] Next, at step S103, the test support device 1

11
adds a marking 30 to the changed symbol. FIG. 5
illustrates a schematic view of a post-change image
provided with markings 30. As illustrated in FIG. 5, the
test support device 1 adds a rectangular box to each of the
5 changed symbols identified at step S102. As a result, a
symbol in the post-change image, which has changed from the
corresponding symbol in the pre-change image, is placed in
a rectangular box, which clearly shows the tester the
position of a symbol that needs checking. This reduces
10 labor and time for seeking a symbol that needs checking,
thereby reducing the test burden. Note that the form of
the marking 30 added to a changed symbol is not limited to
a rectangular box, but can be any form that shows the
position of that symbol to the tester. For example, the
15 marking 30 may be a circular frame, underline the symbol,
change the color of the symbol, or the like. Note also
that despite different dates and times displayed at the top
right corners of the images, i.e., the pre-change image and
the post-change image, no marking 30 has been added. A
20 region where no detection of a change is required such as
the date and time field may be specified in advance to be
set as a region where detection of a change is to be masked.
[0027] Returning again to FIG. 2, the test support
device 1 adds, at step S104, order information to the
25 symbols that have changed. The test support device 1
assigns, for example, sequential numbers different from one
another such as 1, 2, 3, … to the symbols in the postchange image, which have changed from the corresponding
symbols in the pre-change image. This creates a test image
30 including the changed symbols having the order information
added thereto. Note that the order information is not
limited to numbers, but may be, for example, letters of the
alphabet in alphabetical order of A, B, C …. At step S105,

12
the test support device 1 outputs the created test image to
the output device 3 via the output unit 13.
[0028]
5 An order information addition process performed by the
test support device 1 will next be described with reference
to FIGS. 6 and 7. FIG. 6 illustrates a flowchart of an
order information addition process performed by the test
support device 1.
10 [0029] At step S201, the test support device 1 selects a
changed symbol included in the post-change image, on the
basis of a coordinate of the symbol. Specifically, the
test support device 1 selects the symbol positioned at the
smallest x coordinate, from the unselected changed
15 symbol(s). When two or more symbols have the same x
coordinate, one having a smaller y coordinate is
preferentially selected. Next, at step S202, the test
support device 1 adds order information to the changed
symbol selected, in a sequential manner. In this operation,
20 the coordinate of a symbol is a representative coordinate
of the pixels included in the symbol image. There is no
particular limitation on the representative coordinate, and
examples thereof include the center position of the symbol
image, and the center position of the order information
25 added to the symbol.
[0030] At step S203, the test support device 1
determines whether all the multiple changed symbols
extracted at step S102 have been selected. If all the
symbols have not yet been selected (NO at S203), the symbol
30 having the smallest x coordinate is selected from the
unselected changed symbol(s) excluding the symbols that
have already been selected. If all the symbols have been
selected (YES at S204), the order information addition

13
process for the changed symbols is terminated, and the
process proceeds to S105 of FIG. 2. As a result of adding
the pieces of order information to the extracted changed
symbols in the manner as discussed above, the pieces of
5 order information added to the multiple changed symbols are
arranged in one direction in a sequential order.
[0031] FIG. 7 illustrates a schematic view of a test
image generated by the order information addition process
according to the present embodiment. The test image
10 illustrated in FIG. 7 illustrates each pixel using an xcoordinate axis extending in the right direction and a ycoordinate axis extending in the downward direction both
from the origin at the topmost and leftmost pixel of the
pixels included in the test image. As illustrated in FIG.
15 7, the order information is assigned to the multiple
changed symbols in ascending order of x coordinate in the
embodiment, thereby causing the numerals to be sequentially
displayed from left to right in the image.
[0032] Of the pieces of order information added to the
20 multiple changed symbols, the last piece of order
information is preferably displayed differently from the
other pieces of order information. Specifically, the
number “7” is the last number in the example of the present
embodiment, and accordingly, the order information added to
25 the other symbols is displayed with a black text on the
white background, but the order information denoted by the
last number “7” is displayed with a white text on the black
background. This enables the tester to understand at a
glance that the number “7” is the last number, and easily
30 understand that the number of symbols requiring checking on
the test screen is 7. This enables overlooking of a symbol
by the tester to be more effectively reduced or prevented.
[0033] The order information is added to the multiple

14
changed symbols in ascending order of x coordinate in the
present embodiment, but may be added thereto in another
order. For example, the order information may be added in
descending order of x coordinate or in ascending or
5 descending order of y coordinate. In any of these cases,
the pieces of order information added to the extracted
multiple changed symbols can be arranged in one direction
in sequential order.
[0034] According to the configuration of the present
10 embodiment, a test image in which order information is
added to the symbols in the post-change image, which have
changed from the corresponding symbols in the pre-change
image is output. This enables the tester to thoroughly
check the symbols that need checking, by checking, on the
15 basis of the order information added to those symbols, the
symbols that need checking and have changed from the
corresponding symbols in the pre-change screen. Thus, test
burden and overlooking, of a symbol can be reduced.
[0035] Second Embodiment.
20
An order information addition process of the test
support device 1 according to a second embodiment will next
be described with reference to FIGS. 8 and 9. In this
25 respect, unlike the order information addition process in
the first embodiment that adds pieces of order information
such that the added pieces of order information are
arranged in one direction in a sequential order, the order
information addition process in the second embodiment
30 divides the post-change image into multiple zones, and adds
order information to symbols in each zone (hereinafter,
division zones) resulting from the division of the postchange image. The configuration and processes other than

15
the order information addition process performed by the
test support device 1 are similar to those in the first
embodiment.
[0036] FIG. 8 illustrates a flowchart of the order
5 information addition process performed by the test support
device 1. At step S301, the test support device 1 divides
the post-change image into multiple zones. Specifically,
the test support device 1 equally divides the post-change
image into fifths, i.e., five zones, along the y-axis
10 direction. Note that the number of zones to be generated
by dividing the post-change image is determined depending
on the number of the changed symbols extracted at step S102.
Presence of a high number of changed symbols requires the
tester to check carefully in every portion of the screen,
15 in which case the number of the division zones is set to a
larger number accordingly.
[0037] The method of dividing the post-change image is
not limited to the above method, and the post-change image
may be divided into multiple zones along the x-axis
20 direction or bidirectionally along the x-axis and y-axis
directions. In addition, the division may be made to
provide the divisional zones having different sizes rather
than the same size. Moreover, the number of the divisional
zones of the post-change image may be fixed, or the number
25 of the divisional zones may be specified by the tester, and
the post-change image may then be divided on the basis of
that number.
[0038] Next, at step S302, the test support device 1
selects a division zone on the basis of a coordinate of the
30 divisional zone. Specifically, the test support device 1
selects the divisional zone positioned at the smallest y
coordinate, among the unselected divisional zone(s). Next,
at step S303, the test support device 1 assigns a

16
sequential number to the selected divisional zone, in a
sequential manner. The coordinate of a divisional zone is
a representative coordinate of that divisional zone. There
is no particular limitation on the representative
5 coordinate, and examples thereof include the center
position of the divisional zone, and an end point position
of the divisional zone.
[0039] At step S304, the test support device 1
determines whether all the multiple divisional zones
10 resulting from the division of the post-change image at
step S301 have been selected. If all the divisional zones
have not yet been selected (NO at S304), the test support
device 1 selects, in a sequential manner, the divisional
zone having the smallest y coordinate from the unselected
15 divisional zone(s) excluding the divisional zones that have
already been selected, and assigns a sequential number to
the selected divisional zone. If all the divisional zones
have been selected (YES at S304), the process of assigning
sequential numbers to the divisional zones is terminated,
20 and the process proceeds to the flowchart of FIG. 8(b).
Note that as a result of assigning the sequential numbers
to the divisional zones in the manner as described above,
the sequential numbers assigned to the divisional zones are
provided in one direction in a sequential order. In the
25 present embodiment, such assignment of sequential numbers
in ascending order of y coordinate causes the sequential
numbers to be sequentially assigned to the multiple
divisional zones starting from the zone positioned at the
top on the screen.
30 [0040] Dividing the post-change image into multiple
zones causes the multiple changed symbols extracted at step
S102 to be grouped into multiple groups in correspondence
to the zones. Specifically, symbols that belongs to the

17
first zone of the multiple divisional zones are assigned to
the first group, symbols that belong to the second zone are
assigned to the second group, symbols that belong to the
third zone are assigned to the third group, symbols that
5 belong to the fourth zone are assigned to the fourth group,
and symbols that belong to the fifth zone are assigned to
the fifth group. The extracted multiple changed symbols
are thus grouped into the five groups.
[0041] Next, the process proceeds to the flowchart of
10 FIG. 8(b), and the test support device 1 adds order
information to the changed symbols in each of the groups
included in the divisional zones in accordance with the
sequential numbers assigned to the divisional zones. At
step S305, the test support device 1 selects a changed
15 symbol in the first group included in the first zone of the
multiple divisional zones, on the basis of the coordinate
of the symbol. Specifically, the test support device 1
selects the symbol positioned at the smallest x coordinate,
from the unselected changed symbol(s) belonging to the
20 first group. Next, at step S306, the test support device 1
adds order information to the selected changed symbol in a
sequential manner.
[0042] In the present embodiment, the post-change image
is divided along the y-axis, and the operation of addition
25 of the order information to changed symbols is performed
along the x-axis. As described above, the operation of
addition of the order information to changed symbols is
preferably performed in a direction perpendicular to the
direction of division of the post-change image. Dividing
30 the post-change image along the y-axis direction results in
the divisional zones each having a long shape along the xaxis direction. Thus, performing the operation of addition
of the order information to changed symbols in the x-axis

18
direction can improve visual recognizability of the tester.
[0043] At step S307, the test support device 1
determines whether all the multiple changed symbols
included in that divisional zone have been selected. If
5 all the symbols that belong to the first group have not yet
been selected (NO at S307), the symbol having the smallest
x coordinate is selected from the unselected changed
symbol(s) excluding the symbols that have already been
selected. If all the symbols classified as the first group
10 have been selected (YES at S307), the order information
addition process for the changed symbols in the first group
included in the first zone is terminated, and the order
information addition process for the changed symbols in the
second group included in the second zone is then performed.
15 The set of operations from step S305 to step S307 is
repeated until the order information addition process is
completed for all the divisional zones, thereby performing
the order information addition process on all the
divisional zones in order of the sequential numbers of the
20 divisional zones assigned at step S303. The order
information is thus added to the changed symbols included
in all the divisional zones.
[0044] As a result of dividing the changed image into
multiple zones and adding the pieces of order information
25 to the changed symbols on a per-divisional zone basis in
the manner as described above, the pieces of order
information added to the multiple changed symbols included
in each of the divisional zones are arranged in one
direction in a sequential order.
30 [0045] FIG. 9 illustrates a schematic view of a test
image generated by the order information addition process
according to the present embodiment. For clarity of
illustration of the process in the present embodiment, the

19
test image illustrated in FIG. 9 indicates that the five
zones generated by dividing at step S301 are shown in
broken lines. However, no broken lines indicating the
division zones are displayed in the practical test image.
5 As illustrated in FIG. 9, numerals are sequentially
displayed on multiple changed symbols from left to right in
the image for each divisional zone in the present
embodiment.
[0046] The present embodiment has been described as
10 adding the order information to the multiple changed
symbols included in each of the divisional zones in
ascending order of x coordinate, but the order information
may be added to the symbols in another order. For example,
similarly to the first embodiment, the order information
15 may be added in descending order of x coordinate or in
ascending or descending order of y coordinate. In any of
these cases, as a result of adding the pieces of order
information to the extracted multiple changed symbols such
that the pieces of order information in each divisional
20 zone are arranged in one direction in a sequential order,
the added pieces of order information are arranged in a
zigzag in a vertical or horizontal direction.
[0047] According to the configuration of the present
embodiment, a test image in which order information is
25 sequentially added, on a per-divisional zone basis, to the
symbols in the post-change image, that have changed from
the corresponding symbols in the pre-change image is output.
This can reduce eye movement needed for checking symbols
particularly even when the tester is required to check
30 carefully every portion of the test screen in the presence
of a high number of changed symbols. This enables the
tester to check symbols that need checking and have changed
from the corresponding symbols in the pre-change screen, on

20
the basis of the order information added to those symbols,
thereby reducing test burden and overlooking, of a symbol.
[0048] Third Embodiment.

An order information addition process of the test
support device 1 according to a third embodiment will next
be described with reference to FIGS. 10 and 11. In this
respect, unlike the order information addition process in
10 the first embodiment that adds pieces of order information
such that the added pieces of order information are
arranged in one direction in a sequential order, the order
information addition process in the third embodiment
divides the changed symbols extracted at step S102 into
15 multiple groups through a clustering method, and adds the
order information to symbols in each group resulting from
the division of the changed symbols. The configuration and
processes other than the order information addition process
performed by the test support device 1 are similar to those
20 in the first and second embodiments.
[0049] FIG. 10 illustrates a flowchart of an order
information addition process performed by the test support
device 1. At step S401, the test support device 1 divides
the multiple changed symbols extracted at step S102, into
25 multiple clusters. Specifically, using a publicly known
clustering method, the test support device 1 performs
clustering on the basis of reference points of the
respective multiple changed symbols. The reference point
of a changed symbol may be, for example but not limited to,
30 the center coordinate of that symbol. In addition, the
clustering method may be, for example, mean-shift
clustering or k-means clustering. In this respect, meanshift clustering is preferred because of unnecessity for

21
specifying the number of clusters to be used in division of
changed symbols, which in turn enables division of the
changed symbols into as many clusters as is suitable for
the number, or the distribution, of the changed symbols.
5 [0050] Next, at step S402, the test support device 1
selects one of the clusters resulting from the division of
the changed symbols, on the basis of a coordinate of the
cluster. Specifically, the test support device 1 selects
the cluster positioned at the smallest x coordinate, among
10 the unselected cluster(s). Next, at step S403, the test
support device 1 assigns a sequential number to the
selected cluster, in a sequential manner. The coordinate
of a cluster is a representative coordinate of that cluster.
There is no particular limitation on the representative
15 coordinate, and examples thereof include the center-ofgravity position of the cluster, and a coordinate of a
symbol positioned at an edge inside the cluster.
[0051] At step S404, the test support device 1
determines whether all the multiple clusters resulting from
20 the division of the changed symbols at step S401 have been
selected. If all the clusters have not yet been selected
(NO at S404), the test support device 1 selects, in a
sequential manner, the cluster having the smallest y
coordinate from the unselected cluster(s) excluding the
25 clusters that have already been selected, and assigns a
sequential number to the selected cluster. If all the
clusters have been selected (YES at S404), the process of
assigning sequential numbers to the clusters is terminated,
and the process proceeds to the flowchart of FIG. 10(b).
30 Note that as a result of assigning sequential numbers to
the clusters, the sequential numbers assigned to the
multiple clusters are provided in one direction in a
sequential order. In the present embodiment, assignment of

22
sequential numbers in ascending order of x coordinate
causes the sequential numbers to be sequentially assigned
to the multiple divisional zones starting from the cluster
positioned at the left of the screen.
5 [0052] Clustering the multiple changed symbols extracted
at step S102 assigns the changed symbols to multiple groups.
Specifically, symbols that belong to the first cluster of
the multiple clusters are assigned to the first group,
symbols that belong to the second cluster are assigned to
10 the second group, and symbols that belong to the third
cluster are assigned to the third group. The extracted
multiple changed symbols are thus divided into the three
groups.
[0053] Next, the process proceeds to the flowchart of
15 FIG. 10(b), and the test support device 1 adds order
information to the changed symbols in each of the groups
included in the clusters in accordance with the sequential
numbers assigned to the clusters. At step S405, the test
support device 1 selects a changed symbol in the first
20 group included in the first cluster of the multiple
clusters, on the basis of the coordinate of the symbol.
Specifically, the test support device 1 selects the symbol
positioned at the smallest y coordinate, from the
unselected changed symbol(s) belonging to the first group.
25 Next, at step S406, the test support device 1 adds order
information to the selected changed symbol in a sequential
manner.
[0054] At step S407, the test support device 1
determines whether all the multiple changed symbols
30 included in that cluster have been selected. If all the
symbols belonging to the first group have not yet been
selected (NO at S407), the symbol having the smallest y
coordinate is selected from the unselected changed

23
symbol(s) excluding the symbols that have already been
selected. If all the symbols belonging to the first group
have been selected (YES at S407), the order information
addition process for the changed symbols in the first group
5 included in the first cluster is terminated, and the order
information addition process for the changed symbols in the
second group included in the second cluster is then
performed. The set of operations from step S405 to step
S407 is repeated until the order information addition
10 process is completed for all the clusters, thereby
performing the order information addition process on all
the clusters in order of the sequential numbers of the
clusters assigned at step S403. The order information is
thus added to the changed symbols included in all the
15 clusters.
[0055] As a result of dividing the extracted changed
symbols into multiple clusters and adding the pieces of
order information to the changed symbols on a per-cluster
basis in the manner as described above, the pieces of order
20 information added to the multiple changed symbols included
in each of the clusters are arranged in one direction in a
sequential order.
[0056] FIG. 11 illustrates a schematic view of a test
image generated by the order information addition process
25 according to the present embodiment. For clarity of
illustration of the process in the present embodiment, the
test image illustrated in FIG. 11 indicates that the three
clusters generated by clustering at step S401 are shown in
broken lines. However, no broken lines indicating the
30 clusters generated by clustering are displayed in the
practical test image. As illustrated in FIG. 11, numerals
are sequentially displayed on the multiple changed symbols
from top to bottom in the image for each cluster in the

24
present embodiment.
[0057] The present embodiment has been described as
adding the order information to the multiple changed
symbols included in each of the clusters in ascending order
5 of y coordinate, but the order information may be added to
the symbols in another order. For example, similarly to
the first and second embodiments, the order information may
be added in descending order of y coordinate or in
ascending or descending order of x coordinate. In any of
10 these cases, as a result of adding the pieces of order
information to the extracted multiple changed symbols such
that the pieces of order information in each cluster are
arranged in one direction in a sequential order, the added
pieces of order information are grouped together on a per15 cluster basis.
[0058] According to the configuration of the present
embodiment, a test image in which order information is
sequentially added to the symbols in the post-change image,
that have changed from the corresponding symbols in the
20 pre-change image, on a per-cluster basis is output. This
can reduce eye movement needed for checking symbols
particularly even when the distribution of the changed
symbols in the test screen is non-uniform, that is, even
when these changed symbols are centered on multiple
25 locations. This enables the tester to check symbols that
need checking and have changed from the corresponding
symbols in the pre-change screen, on the basis of the order
information added to those symbols, thereby reducing
enabling test burden and overlooking, of a symbol.
30 [0059] Fourth Embodiment.

An order information addition process of the test

25
support device 1 according to a fourth embodiment will next
be described with reference to FIGS. 12 and 13. In this
respect, the order information addition processes in the
first, second, and third embodiments add order information
5 to the changed symbols using respective different fixed
approaches, which are addition of order information in one
direction in a sequential order, addition of order
information using an image zone dividing approach, and
addition of order information using a clustering method.
10 In contrast, the test support device 1 of the fourth
embodiment differs in automatically selecting a suitable
order information addition approach on the basis of
obtained pre-change and a post-change images, and adding
order information to the changed symbols in a dynamic
15 manner. The configuration and processes other than the
order information addition process performed by the test
support device 1 are similar to those in the first, second,
and third embodiments.
[0060] FIG. 12 illustrates a flowchart of an order
20 information addition process performed by the test support
device 1. At step S501, the test support device 1 obtains
information about the number of changed symbols extracted
at step S102, and determines whether the number of changed
symbols included in the post-change image is greater than
25 or equal to a predetermined value. In this regard, the
predetermined value can be, for example but not limited to,
“3”, but may be set to a value ranging from 1 to 5 as
appropriate.
[0061] If the number of extracted changed symbols is
30 less than the predetermined value (NO at S501), the test
support device 1 adds order information to the changed
symbols at step S520 using the method of adding order
information in one direction in a sequential order

26
described in the first embodiment. When the number of
changed symbols on the test screen is less than the
predetermined number, use of any one of the approaches of
adding order information will results in a small variation
5 in distance of movement of the tester’s line-of-sight. For
this reason, the approach of adding order information in
one direction in a sequential order is used to thereby
perform an easy and convenient addition of order
information.
10 [0062] Alternatively, if the number of changed symbols
extracted is greater than or equal to the predetermined
value (YES at S501), the test support device 1 divides, at
step S502, the post-change image into multiple zones.
Specifically, the test support device 1 divides the post15 change image equally into four parts along the x-axis
direction and equally into three parts along the y-axis
direction, that is, divides the post-change image into 12
zones in total. The number of zones to be generated by
dividing the post-change image is not limited to twelve,
20 and may be set as appropriate on the basis of the size of
the screen of the monitoring and control system to be
tested, on the size of the changed symbols, on or the like.
[0063] Next, at step S503, the test support device 1
selects a division zone in a sequential manner. There is
25 no particular limitation on the order of selection. The
division zones can be sequentially selected starting from
the top left portion along the x-axis or the y-axis. At
step S504, the test support device 1 obtains the number of
the changed symbols included in the selected divisional
30 zone, and calculates the ratio of the changed symbols
(hereinafter, changed symbol ratio) in the selected
divisional zone.
[0064] FIG. 13 is a diagram illustrating the ratio of

27
the changed symbols in each of the divisional zones. As
illustrated in FIG. 13, when zone A1 is selected at step
S503, zone A1 includes none of the markings 30 of the
changed symbols extracted at step S103. In this example,
5 this post-change image includes seven changed symbols in
total, which derives the changed symbol ratio of 0/7, i.e.,
0%, in zone A1. Similarly to A1, zone C1, zone D2, zones
A3 and B3, and zone D3 include none of the markings 30 of
the changed symbols, which also derive the changed symbol
10 ratios of about 0%.
[0065] In addition, when zone B1 is selected at step
S503, zone B1 includes one of the markings 30 of the
changed symbols, which derives the changed symbol ratio of
1/7, i.e., about 14.3%, in zone B1. Zone D1, zone B2, zone
15 C2, and zone C3 also each include one of the markings 30 of
the changed symbols, which also derives the changed symbol
ratio of about 14.3%.
[0066] Moreover, when zone A2 is selected at step S503,
zone A2 includes two of the markings 30 of the changed
20 symbols, which derives the changed symbol ratio of 2/7,
i.e., about 28.6%, in zone A2.
[0067] At step S504, the test support device 1
calculates the changed symbol ratio of the selected zone in
this manner, and then determines whether the changed symbol
25 ratio is greater than or equal to a predetermined value.
In this respect, the predetermined value can be, for
example but not limited to, “30%”, but may be set to a
value ranging from 10% to 50% as appropriate.
[0068] If the ratio of the changed symbols extracted is
30 less than the predetermined value (NO at S504), the test
support device 1 determines, at step S510, whether all the
multiple divisional zones resulting from the division of
the post-change image at step 502 have been selected. If

28
all the divisional zones have not yet been selected (NO at
S510), the test support device 1 selects an unselected
divisional zone other than the divisional zones that have
already been selected, in a sequential manner, and then
5 determines whether the changed symbol ratio of the
divisional zone selected is greater than or equal to the
predetermined value.
[0069] If none of the divisional zones has a changed
symbol ratio greater than or equal to the predetermined
10 value, and all the divisional zones have been selected (YES
at S510), the test support device 1 adds order information
to the changed symbols at step S511 using the method of
image zone dividing described in the second embodiment.
When the changed symbol ratios of all the divisional zones
15 are less than the predetermined value, this means that the
distribution of the changed symbols is not highly nonuniform in the test screen. Thus, addition of order
information in a zigzag manner in a vertical or horizontal
direction can reduce eye movement of the tester.
20 [0070] Alternatively, if there is a divisional zone
having a high ratio of the changed symbols at step S504
(YES at S504), the test support device 1 adds order
information to the changed symbols at step S505 using the
clustering method described in the third embodiment. When
25 the changed symbol ratio of a divisional zone is greater
than or equal to the predetermined value, this means that
the distribution of the changed symbols is non-uniform in
the test screen. To address this, a group of pieces of
order information is added on a per-cluster basis to
30 thereby reduce tester’s eye movement needed for checking
symbols.
[0071] According to the configuration of the present
embodiment, a test image in which order information is

29
added using a more appropriate approach on the basis of the
number of the changed symbols included in the post-change
image and non-uniformity of the distribution of the changed
symbols is output. This allows order information to be
5 added in an optimum order in each post-change image even
when different post-change images needing checking are in
different situations. This results in a more effective
reduction in test burden on the tester and tester’s
overlooking.
10 [0072] Fifth Embodiment.

A configuration of the test support system 100
according to a fifth embodiment will next be described with
reference to FIG. 14. As illustrated in FIG. 14, the
15 output device 3 in the test support system 100 of the fifth
embodiment incorporates a camera 31. This camera 31 is
provided at a position where the camera 31 can capture an
image including the eyes of the tester who is looking at
the output device 3. The test support system 100 of the
20 fifth embodiment differs from the test support system 100
according the first, second, third, and fourth embodiments
in acquiring a line-of-sight characteristic of the tester
from the image captured by the camera 31, and adding order
information to the changed symbols on the basis of the
25 acquired line-of-sight characteristic. The configuration
and processes other than the configuration of the output
device 3 and the order information addition process
performed by the test support device 1 are similar to those
in the first, second, third, and fourth embodiments.
30 [0073] The camera 31 needs merely to be capable of
capturing an image including the eyes of the tester, and
examples thereof include a complementary metal-oxide
semiconductor (CMOS) camera and a charge-coupled device

30
(CCD) camera. The camera 31 captures an image of the face
of the tester at predetermined intervals of, for example,
0.5 seconds or the like, and the storage unit 12 of the
test support device 1 stores the images captured by the
5 camera 31. The present embodiment is based on the
assumption that the camera 31 is incorporated in the output
device 3, but the configuration is not limited thereto.
The camera 31 and the output device 3 may be provided
separately. In addition, the camera 31 is not limited to a
10 fixed camera, but instead, an image including the eyes of
the tester may be obtained using a device in a form of a
pair of eyeglasses worn by the tester.
[0074] The test support device 1 analyzes the images
including the eyes of the tester captured by the camera 31
15 and obtains a line-of-sight characteristic of the tester.
The line-of-sight characteristic of the tester can be
obtained by, for example, extracting the pupil area from
the images of the tester, and estimating, from the angle of
the extracted pupil, a temporal change in the line of sight
20 of the tester. Note that there is no particular limitation
on the method of obtaining the line-of-sight characteristic,
and the line-of-sight characteristic may be obtained using
a publicly known method as appropriate. To obtain the
line-of-sight characteristic of the tester, some images out
25 of the multiple test images that are to be actually tested
are prepared, or test images having multiple markings
thereon are prepared rather than the images that are to be
tested, and the tester visually checks, sequentially, the
markings on these prepared images displayed.
30 [0075] Examples of line-of-sight characteristic when the
tester is viewing a test image will be described with
reference to FIG. 15. FIG. 15(a) illustrates an example of
line-of-sight characteristic of a tester. When viewing the

31
test image, this tester moves the line of sight from top
left of the screen in the right direction, and after the
line of sight reaches the right end, moves the line of
sight toward the lower left end, and then in the right
5 direction. It can be seen that this tester has a line-ofsight characteristic of uniformly checking the entire test
image by moving the line of sight in this manner.
[0076] Meanwhile, FIG. 15(b) illustrates an example of
line-of-sight characteristic of another tester. When
10 viewing the test image, this tester moves the line of sight
focusing on a specific portion where changed symbols are
densely distributed. It can be seen that this tester has a
line-of-sight characteristic of checking focusing on a
portion where changed symbols are densely distributed
15 rather than viewing the entire test screen.

Next, an order information addition process of the
test support device 1 based on a line-of-sight
20 characteristic of the tester will be described with
reference to FIG. 16. FIG. 16 illustrates a flowchart of
an order information addition process performed by the test
support device 1. At step S601, the test support device 1
obtains information about the number of changed symbols
25 extracted at step S102, and determines whether the number
of changed symbols included in the post-change image is
greater than or equal to a predetermined value. In this
regard, the predetermined value can be, for example but not
limited to, “3”, but may be set to a value ranging from 1
30 to 5 as appropriate.
[0077] If the number of changed symbols extracted is
less than the predetermined value (NO at S601), the test
support device 1 adds order information to the changed

32
symbols at step S620 using the method of adding order
information in one direction in a sequential order
described in the first embodiment. When the number of
changed symbols on the test screen is less than the
5 predetermined number, use of any one of the approaches of
adding order information will result in a small variation
in distance of movement of the tester’s line-of-sight. For
this reason, the approach of adding order information in
one direction in a sequential order is used to thereby
10 perform an easy and convenience addition of order
information.
[0078] Alternatively, if the number of changed symbols
extracted is greater than or equal to the predetermined
value (YES at S601), the test support device 1 divides, at
15 step S602, the post-change image into multiple zones.
Specifically, the test support device 1 divides the postchange image equally into four parts along the x-axis
direction and equally into three parts along the y-axis
direction, that is, divides the post-change image into 12
20 zones in total. The number of zones resulting from the
division of the post-change image is not limited to twelve,
and may be set as appropriate on the basis of the size of
the screen of the monitoring and control system to be
tested, on the size of the changed symbols, on or the like.
25 [0079] Next, at step S603, the test support device 1
selects a division zone in a sequential manner. There is
no particular limitation on the order of selection. The
division zones can be sequentially selected starting from
the top left portion along the x-axis or the y-axis. At
30 step S604, the test support device 1 obtains the number of
viewpoints of the tester included in the selected
divisional zone, and calculates the ratio of the viewpoints
(hereinafter, viewpoint ratio) of the selected divisional

33
zone.
[0080] If the viewpoint ratio extracted is less than a
predetermined value (NO at S604), the test support device 1
determines, at step S610, whether all the multiple
5 divisional zones resulting from the division of the postchange image at step 602 have been selected. If all the
divisional zones have not yet been selected (NO at S610),
the test support device 1 selects an unselected divisional
zone other than the divisional zones that have already been
10 selected, in a sequential manner, and then determines
whether the viewpoint ratio of the selected divisional zone
is greater than or equal to the predetermined value.
[0081] If none of the divisional zones has a viewpoint
ratio greater than or equal to the predetermined value, and
15 all the divisional zones have been selected (YES at S610),
the test support device 1 adds order information to the
changed symbols at step S611 using the method of image zone
dividing described in the second embodiment. When the
line-of-sight ratios of all the divisional zones are less
20 than the predetermined value, this means that this tester
has a line-of-sight characteristic of uniformly checking
the entire test image. Thus, addition of order information
in a zigzag manner in a vertical or horizontal direction
enables the tester to move the eyes along the order
25 information in an order suitable for the line-of-sight
characteristic of the tester.
[0082] In this respect, when order information is added
to changed symbols using the method of image zone dividing,
the direction in which to divide the screen and the order
30 in which to add the order information to the individual
zones resulting the division of the post-change image may
also be determined on the basis of the obtained tester’s
line-of-sight information. This enables the tester to move

34
the eyes along the order information in an order further
suitable for the line-of-sight characteristic of the tester.
[0083] Alternatively, if there is a divisional zone
having a high ratio of the changed symbols at step S604
5 (YES at S604), the test support device 1 adds order
information to the changed symbols at step S605 using the
clustering method described in the third embodiment. When
the changed symbol ratio of a divisional zone is greater
than or equal to the predetermined value, this means that
10 this tester has a line-of-sight characteristic of checking
focusing on a portion where changed symbols are densely
distributed rather than viewing the entire test screen. To
address this, a group of pieces of order information is
added on a per-cluster basis to thereby allow the tester to
15 move the eyes along the order information in an order
suitable for the line-of-sight characteristic of the tester.
[0084] According to the configuration of the present
embodiment, a test image in which order information is
added using a more appropriate method on the basis of the
20 line-of-sight characteristic of the tester is output. This
allows order information to be added in an order suitable
for the line-of-sight characteristic of that tester even
when a large number of test images are to be checked. This
results in a more effective reduction in test burden on the
25 tester and the tester’s overlooking.
[0085] Note that, in the first through fifth embodiments,
the test support device 1 automatically selects a suitable
order information addition approach, but the selection
method is not limited to those described above. Selection
30 of the order information addition approach may be done by
the tester. In this case, the test support device 1
generates a test image on the basis of the order
information addition approach selected by the tester, and

35
displays the test image on the output device 3.
[0086] In addition, the test support device 1 described
in the embodiments is merely an example, and combination,
modification, and/or omission, as appropriate, of any of
5 the embodiments fall within the scope of technical spirit
illustrated in the embodiments.
Reference Signs List
[0087] 1 test support device; 2 input device; 3
10 output device; 10 input unit; 11 processing unit; 12
storage unit; 13 output unit; 20 network; 30 marking;
100 test support system.

36
We Claim:
1. A test support method comprising:
a step of obtaining a pre-change image and a post5 change image, each to be displayed on a monitoring and
control system;
a step of extracting, from the post-change image, a
plurality of symbols that have changed from corresponding
symbols in the pre-change image;
10 a step of adding order information to the plurality of
the extracted symbols; and
a step of outputting a test image in which the order
information is added to the plurality of symbols.
15 2. The test support method according to claim 1, wherein
Of pieces of the order information added to the
plurality of symbols, a last piece of the order information
is displayed differently from other pieces of the order
information.
20
3. The test support method according to claim 2, further
comprising:
a step of grouping the extracted plurality of symbols,
into a plurality of groups, wherein
25 the step of adding order information includes
adding the order information to symbols belonging to a
first group of the plurality of groups, in order
corresponding to positions of the individual symbols of the
first group, and
30 the addition of the order information to the symbols
belonging to the first group is followed by adding the
order information to symbols belonging to a second group of
the plurality of groups, in order corresponding to

37
positions of the individual symbols of the second group.
4. The test support method according to claim 3, further
comprising:
5 a step of dividing the post-change image into a
plurality of zones, wherein
the step of grouping the plurality of symbols into a
plurality of groups includes
assigning symbols included in a first zone of the
10 plurality of zones to the first group, and
assigning symbols included in a second zone of the
plurality of zones to the second group.
5. The test support method according to claim 4, further
15 comprising:
a step of obtaining the number of the symbols in the
post-change image, the symbols being symbols having changed
from corresponding symbols in the pre-change image, wherein
the post-change image is divided into the plurality of
20 zones when the obtained number of the symbols is greater
than or equal to a predetermined number.
6. The test support method according to claim 4 or 5,
further comprising:
25 a step of obtaining the number of the symbols in the
post-change image, the symbols being symbols having changed
from corresponding symbols in the pre-change image, wherein
the number of the zones into which the post-change
image is divided varies on the basis of the obtained number
30 of the symbols.
7. The test support method according to claim 3, wherein
the step of grouping the plurality of symbols into a

plurality of groups includes grouping the plurality of
symbols into the plurality of groups using a clustering
method.
5 8. The test support method according to claim 7, wherein
the clustering method is k-means clustering.
9. The test support method according to claim 7 or 8,
further comprising:
10 a step of dividing the post-change image into a
plurality of zones; and
a step of obtaining the number of symbols included in
each of the plurality of zones resulting from the division
of the post-change image, the symbols being symbols having
15 changed from corresponding symbols in the pre-change image,
wherein
the step of grouping the plurality of symbols into a
plurality of groups is a step of grouping the plurality of
symbols into the plurality of groups using the clustering
20 method when the number of the symbols having changed from
corresponding symbols in the pre-change image is greater
than a predetermined ratio.
10. The test support method according to any one of claims
25 3 to 9, further comprising:
a step of obtaining a line-of-sight characteristic of
a testing person, wherein
a manner of grouping the plurality of symbols into the
first group and the second group varies on the basis of the
30 obtained line-of-sight characteristic.
11. A test support device comprising:
an input unit to obtain a pre-change image and a post-

change image, each to be displayed on a monitoring and
control system;
a processing unit to extract, from the post-change
image, a plurality of symbols that have changed from
5 corresponding symbols in the pre-change image, and to add
order information to the extracted plurality of symbols;
and
an output unit to output a test image in which the
order information is added to the plurality of symbols.

12. A test support program causing a computer to perform:
a step of obtaining a pre-change image and a postchange image, each to be displayed on a monitoring and
control system;
15 a step of extracting, from the post-change image, a
plurality of symbols that have changed from corresponding
symbols in the pre-change image;
a step of adding order information to the extracted
plurality of symbols; and
20 a step of outputting a test image in which the order
information is added to the plurality of symbols.

Documents

Application Documents

# Name Date
1 202227042154-CLAIMS [13-02-2023(online)].pdf 2023-02-13
1 202227042154-IntimationOfGrant10-02-2025.pdf 2025-02-10
1 202227042154.pdf 2022-07-22
2 202227042154-COMPLETE SPECIFICATION [13-02-2023(online)].pdf 2023-02-13
2 202227042154-PatentCertificate10-02-2025.pdf 2025-02-10
2 202227042154-TRANSLATIOIN OF PRIOIRTY DOCUMENTS ETC. [22-07-2022(online)].pdf 2022-07-22
3 202227042154-CLAIMS [13-02-2023(online)].pdf 2023-02-13
3 202227042154-FER_SER_REPLY [13-02-2023(online)].pdf 2023-02-13
3 202227042154-STATEMENT OF UNDERTAKING (FORM 3) [22-07-2022(online)].pdf 2022-07-22
4 202227042154-REQUEST FOR EXAMINATION (FORM-18) [22-07-2022(online)].pdf 2022-07-22
4 202227042154-FORM 3 [07-02-2023(online)].pdf 2023-02-07
4 202227042154-COMPLETE SPECIFICATION [13-02-2023(online)].pdf 2023-02-13
5 202227042154-PROOF OF RIGHT [22-07-2022(online)].pdf 2022-07-22
5 202227042154-Information under section 8(2) [07-02-2023(online)].pdf 2023-02-07
5 202227042154-FER_SER_REPLY [13-02-2023(online)].pdf 2023-02-13
6 202227042154-POWER OF AUTHORITY [22-07-2022(online)].pdf 2022-07-22
6 202227042154-FORM 3 [07-02-2023(online)].pdf 2023-02-07
6 202227042154-FORM 3 [01-11-2022(online)].pdf 2022-11-01
7 202227042154-Information under section 8(2) [07-02-2023(online)].pdf 2023-02-07
7 202227042154-FORM 18 [22-07-2022(online)].pdf 2022-07-22
7 202227042154-FER.pdf 2022-10-28
8 202227042154-FORM 1 [22-07-2022(online)].pdf 2022-07-22
8 202227042154-FORM 3 [01-11-2022(online)].pdf 2022-11-01
8 Abstract1.jpg 2022-09-24
9 202227042154-2. Marked Copy under Rule 14(2) [27-07-2022(online)].pdf 2022-07-27
9 202227042154-FER.pdf 2022-10-28
9 202227042154-FIGURE OF ABSTRACT [22-07-2022(online)].pdf 2022-07-22
10 202227042154-DRAWINGS [22-07-2022(online)].pdf 2022-07-22
10 202227042154-Retyped Pages under Rule 14(1) [27-07-2022(online)].pdf 2022-07-27
10 Abstract1.jpg 2022-09-24
11 202227042154-2. Marked Copy under Rule 14(2) [27-07-2022(online)].pdf 2022-07-27
11 202227042154-AMMENDED DOCUMENTS [26-07-2022(online)].pdf 2022-07-26
11 202227042154-DECLARATION OF INVENTORSHIP (FORM 5) [22-07-2022(online)].pdf 2022-07-22
12 202227042154-COMPLETE SPECIFICATION [22-07-2022(online)].pdf 2022-07-22
12 202227042154-FORM 13 [26-07-2022(online)].pdf 2022-07-26
12 202227042154-Retyped Pages under Rule 14(1) [27-07-2022(online)].pdf 2022-07-27
13 202227042154-MARKED COPIES OF AMENDEMENTS [26-07-2022(online)].pdf 2022-07-26
13 202227042154-AMMENDED DOCUMENTS [26-07-2022(online)].pdf 2022-07-26
14 202227042154-COMPLETE SPECIFICATION [22-07-2022(online)].pdf 2022-07-22
14 202227042154-FORM 13 [26-07-2022(online)].pdf 2022-07-26
15 202227042154-AMMENDED DOCUMENTS [26-07-2022(online)].pdf 2022-07-26
15 202227042154-DECLARATION OF INVENTORSHIP (FORM 5) [22-07-2022(online)].pdf 2022-07-22
15 202227042154-MARKED COPIES OF AMENDEMENTS [26-07-2022(online)].pdf 2022-07-26
16 202227042154-COMPLETE SPECIFICATION [22-07-2022(online)].pdf 2022-07-22
16 202227042154-DRAWINGS [22-07-2022(online)].pdf 2022-07-22
16 202227042154-Retyped Pages under Rule 14(1) [27-07-2022(online)].pdf 2022-07-27
17 202227042154-FIGURE OF ABSTRACT [22-07-2022(online)].pdf 2022-07-22
17 202227042154-2. Marked Copy under Rule 14(2) [27-07-2022(online)].pdf 2022-07-27
17 202227042154-DECLARATION OF INVENTORSHIP (FORM 5) [22-07-2022(online)].pdf 2022-07-22
18 Abstract1.jpg 2022-09-24
18 202227042154-FORM 1 [22-07-2022(online)].pdf 2022-07-22
18 202227042154-DRAWINGS [22-07-2022(online)].pdf 2022-07-22
19 202227042154-FER.pdf 2022-10-28
19 202227042154-FIGURE OF ABSTRACT [22-07-2022(online)].pdf 2022-07-22
19 202227042154-FORM 18 [22-07-2022(online)].pdf 2022-07-22
20 202227042154-FORM 1 [22-07-2022(online)].pdf 2022-07-22
20 202227042154-FORM 3 [01-11-2022(online)].pdf 2022-11-01
20 202227042154-POWER OF AUTHORITY [22-07-2022(online)].pdf 2022-07-22
21 202227042154-FORM 18 [22-07-2022(online)].pdf 2022-07-22
21 202227042154-Information under section 8(2) [07-02-2023(online)].pdf 2023-02-07
21 202227042154-PROOF OF RIGHT [22-07-2022(online)].pdf 2022-07-22
22 202227042154-FORM 3 [07-02-2023(online)].pdf 2023-02-07
22 202227042154-POWER OF AUTHORITY [22-07-2022(online)].pdf 2022-07-22
22 202227042154-REQUEST FOR EXAMINATION (FORM-18) [22-07-2022(online)].pdf 2022-07-22
23 202227042154-FER_SER_REPLY [13-02-2023(online)].pdf 2023-02-13
23 202227042154-PROOF OF RIGHT [22-07-2022(online)].pdf 2022-07-22
23 202227042154-STATEMENT OF UNDERTAKING (FORM 3) [22-07-2022(online)].pdf 2022-07-22
24 202227042154-COMPLETE SPECIFICATION [13-02-2023(online)].pdf 2023-02-13
24 202227042154-REQUEST FOR EXAMINATION (FORM-18) [22-07-2022(online)].pdf 2022-07-22
24 202227042154-TRANSLATIOIN OF PRIOIRTY DOCUMENTS ETC. [22-07-2022(online)].pdf 2022-07-22
25 202227042154.pdf 2022-07-22
25 202227042154-STATEMENT OF UNDERTAKING (FORM 3) [22-07-2022(online)].pdf 2022-07-22
25 202227042154-CLAIMS [13-02-2023(online)].pdf 2023-02-13
26 202227042154-TRANSLATIOIN OF PRIOIRTY DOCUMENTS ETC. [22-07-2022(online)].pdf 2022-07-22
26 202227042154-PatentCertificate10-02-2025.pdf 2025-02-10
27 202227042154.pdf 2022-07-22
27 202227042154-IntimationOfGrant10-02-2025.pdf 2025-02-10

Search Strategy

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