Claims
1. A test arrangement having:
a test interface configured to provide a plurality of first test signals to an apparatus;
wherein:
the test interface includes a first waveguide, a plurality of second waveguides coupled to the first waveguide and a plurality of first ports corresponding to respective ones of the second waveguides;
the first waveguide is arranged to receive a first input signal through a
first input port;
the first waveguide and the second waveguides are configured to propagate the first input signal; and
the first ports are arranged to output the first input signal propagated in respective ones of the second waveguides as respective first test signals.
2. A test arrangement according to claim l, wherein the test interface includes a first output port configured to output the first input signals propagated in the first waveguide.
3. A test arrangement according to claim 1, wherein:
the first waveguide is arranged to receive a second input signal through a second input port, the second input signal having a different frequency from the first input signal;
the first and second waveguides are configured to propagate the second input signal;
the test interface includes second ports corresponding to respective ones of the second waveguides; and
the second ports are arranged to output the second input signal propagated in respective ones of the second waveguides as respective second test signals for supply to a second apparatus.
4. A test arrangement according to claim 1, wherein:
the test interface includes second ports corresponding to respective ones of the second waveguides;

the second ports are arranged to receive a plurality of second input signals, wherein frequencies of the second input signals are different from the frequency of the first input signal;
the second waveguides are configured to propagate respective ones of the second input signals; and
the first ports are arranged to output respective ones of the second input signals.
5. Atest arrangement according to claim 3 or 4, wherein the test interface is
arranged to output said first test signals and said second test signals
simultaneously, and/or
wherein the test interface includes a first output port configured to output at least one of the first input signal propagated in the first waveguide and the second input signal propagated in the first waveguide.
6. Atest arrangement according to any of the preceding claims, wherein the
apparatus includes an antenna arrangement arranged to produce an output
based on the plurality of first test signals, the test arrangement comprising:
a detector configured to detect spatial variations in a radiation pattern of the antenna arrangement of the apparatus.
7. Atest arrangement according to claim 1, wherein:
the test interface includes second ports corresponding to respective ones of the second waveguides;
the second ports are arranged to receive a plurality of second input signals for propagation in respective ones of the second waveguides and in the first waveguide; and
the first ports are arranged to output respective ones of the second input signals propagated in respective ones of the second waveguides.
8. Atest arrangement according to claim 7, wherein the first interface
includes a first output port, arranged to output at least one of the first input
signal propagated in the first waveguide and a multiplexed signal combining the
second input signals propagated in the first waveguide, and/or
wherein the apparatus includes an antenna arrangement arranged to produce an output based on the plurality of second test signals, the test

arrangement comprising a detector configured to detect spatial variations in a radiation pattern of the antenna arrangement of the apparatus.
9. A test arrangement according to any of the preceding claims, including a
second test interface having a third waveguide arranged to propagate the first
input signal, a plurality of fourth waveguides coupled to the third waveguide and
a second plurality of first ports corresponding to respective ones of the fourth
waveguides, wherein:
the third waveguide is arranged to receive the first input signal from the first waveguide;
the third waveguide and the fourth waveguides are configured to propagate the first input signal; and
the second plurality of first ports are arranged to output the first input signal propagated in respective ones of the fourth waveguides as respective first test signals.
10. Atest arrangement according to any of claims 1to 6, including:
a second test interface configured to receive a plurality of further input signals from the apparatus, the second test interface including a third waveguide and a plurality of fourth waveguides coupled to the first waveguide and a further plurality of first ports corresponding to respective ones of the fourth waveguides; and the fourth waveguides being arranged to propagate respective ones of the plurality of signals, wherein:
the first waveguide is arranged to output a multiplexed signal including
the plurality of further input signals; and/or
the further plurality of first ports is configured to output the further input signals propagated in respective ones of the fourth waveguides.
11. Atest arrangement having:
atest interface configured to receive a plurality of first input signals from an apparatus;
wherein:
the test interface includes a first waveguide, a plurality of second waveguides coupled to the first waveguide and a plurality of first ports corresponding to respective ones of the second waveguides;

the second waveguides are arranged to receive respective ones of the first input signals through respective ones of the first ports;
the second waveguides are configured to propagate the respective ones of the first input signals; and
the first waveguide includes a first port, configured to output a multiplexed signal including the plurality of first input signals.
12. A test arrangement according to claim 11, comprising a plurality of second ports corresponding to respective ones of the second waveguides, wherein the second ports are arranged to output respective ones of the first input signals propagated in respective ones of the second waveguides.
13. A test arrangement according to claim 12, configured to test an apparatus including an antenna arrangement, wherein:
the test arrangement is configured to supply the signals output by the second ports to the antenna arrangement; and
the test arrangement includes a detector configured to detect spatial variations in a radiation pattern of the antenna arrangement.
14. A method comprising:
providing a test interface configured to provide a plurality of test signals to an apparatus, the test interface including a first waveguide, a plurality of second waveguides coupled to the first waveguide and a plurality of first ports corresponding to respective ones of the second waveguides; providing an input signal to the first waveguide; and outputting from the first ports respective ones of the signals propagated in the second waveguides to provide the plurality of test signals.
15. A method comprising:
providing a test interface configured to receive a plurality of signals from an apparatus, the test interface including a first waveguide, a plurality of second waveguides coupled to the first waveguide and a plurality of first ports corresponding to respective ones of the second waveguides;
providing said signals to respective ones of the second waveguides; and outputting from a port of the first waveguide a multiplexed signal including the plurality of signals from the apparatus.