1. Title of Invention

Ultra low radiation electron beam detection sensors

2. Applicant

Name : EESAVYASA TECHONOLOGIES PVT. LTD
Nationality : INDIAN
Address : R&D centre, Plot No: 79, Phase - III, Balanagar, Hyderabad, R.R. District, Andhra Pradesh, Pin - 500037, INDIA.

3. Preamble to the description:

Complete Specification:

Summary:

The present method of inventions is a subtract to radio imaging technology where electron beam x-ray or any other type of wavelength of radiations passed through project or stage undergo complete penetration and corresponding image will be captured over, phosphors made up of metal salts doped with nano particles of corresponding metals. When phosphor emits the relevant image which is captured in a dark region, depending on the intensity of darkness prevailing in chamber, image intensification takes place. The intensified image will be captured through high sensitivity of lenses to image recording camera kind of system; the corresponding image will be captured and can be transmitted to the required display system.

The electron beam source or x-ray source are passed through electromagnetic length for image magnifications, to device electron microscopes. In order to measure or displace the stage consisting of samples, collagen fibres are used as actuators. This technique is also used in scanning, tunnelling electron microscopes.
Due to the inherent ability of proposed design, ultra low radiations can be captured to take forward the image, where no flat panel kind of setup not reguired

4. Description

In present method of invention, chambers are coated inside with visible light absorbing filter media is arranged. Depending on electron beam sensor and its radiation suitable phosphors are selected. The electro luminescent phosphors doped with nano particles of metals is importantant issue that will decide the quality glow emission.

The image capturing devises are carefully chosen depending on darkness prevailing in the chamber.

Appropriate image manipulating software is required to remove the noise specs and for image manipulation. The same captured is sliced by taking the image through splits and computer tomography to get 32 or 64 or 124 and such kind of geometrically progression slices of image can be manipulated.

While constructing scanning electron microscope, electron beam gun is passed through magnetic lenses for image magnifications. The enlarged image will be taken through secondary electron detector explained in the above manner and image will be taken for record.

While measuring nana meter level accuracy of target displacement collagen fabric dissolved in known salt solutions are used in STM (Scanning Tunnelling Microscope).

The proposed invention of design can also used in TEM (Transmission Electron Microscope), SEM (Scanning Electron microscope) Etc.,

Background Invention:

There are several types of flat panel detectors and image intensification devices available which finds applications in enhancing the brightness of the image when electron beam is passed through object. But due to the complexity of image amplification, extraordinary radiation is required as the size and clarity of the image emitted by phosphors screens used.

There are several types of phosphors available and their composition and penetrability through lead panels decides the clarity of the image.

In case of constructing electron microscopes like SEM, TEM constructions where there is no biological tissues damage with living species involvement, excess radiation is obelised. But there is definitely a need for low radiation consuming method of image capture to extend the applications of microscopes and x-ray imagiology.

7. Claims

This method of invention device is used in the following areas

1. The claims includes it applications in imagiology in medical applications
2. In material studies with x-ray diffraction studies
3. In baggage scanning, luggage scanning etc
4. In construction of electron microscopes like SEM, TEM and STM etc.
5. In building computer tomography scanning etc
6. In various types of electron bean intensification image capturing in other applications of medicine, diagnostics and material sciences.