FORM 2
THE PATENT ACT 1970
&
The Patents Rules, 2003
COMPLETE SPECIFICATION
(See section 10 and rule 13)
1. TITLE OF THE INVENTION:
"Wireless Test Kit for tripping of Electronic release of Circuit Breaker"
2. APPLICANT:
(a) NAME: Larsen & Toubro Limited
(b) NATIONALITY: Indian Company registered under the
provisions of the Companies Act-1956.
(c) ADDRESS: Larsen & Toubro Limited
Electrical & Automation North Wing, Gate 7, Level 0, Powai Campus, Saki Vihar Road, Mumbai 400 072, INDIA
COMPLETE
The following specification particularly describes the invention and the manner in which it is to be performed.

Wireless Test Kit for tripping of Electronic release of Circuit Breaker
Field of invention:
The present invention relates to providing a wireless test kit for tripping of electronic release of circuit breaker, which can enable range of selectable voltage levels for inserting in the signal conditioning section of electronic trip units and for testing the electronic release.
Background of the invention:
MCCBs (Moulded Case Circuit Breakers) are one of the primary protection devices used in the switchgear industry. Some of the functions of an MCCB are to sense the current flowing in the circuit, to measure the current flowing in the circuit, to compare the measured current level to its pre-set trip point, to make, break and carry currents, to protect the system against abnormal conditions like overload, short circuit and earth fault and to provide the discrimination to ensure continuous supply to all healthy feeders in case of a fault on one feeder
The test kit is required to electronically trip an electronic trip unit of an MCCB by means of an external power supply. Its function is to check healthiness of the MCCB in case it is in field condition, without passing actual phase currents.
In US Patent no. US4814712 by Thomas D Burton, the process of how a test kit simulates an overcurrent condition and provides verification of the circuit breaker response without de-energizing the circuit breaker or interfering with the circuit breaker's protection functions, is described. The test kit connects with the digital communications circuit within the digital circuit breaker to obtain status information concerning pick-up conditions, trip conditions and fault currents.

In US Patent no. US4803434 by Christopher G. Walker, the process of utilization by a test unit of its three leads connected to the trip unit. One of the leads connects to the voltage source for the trip unit and another lead connects to the ground potential to acquire power from the test unit. The voltage is selectively adjusted within the test unit by resistors and a potentiometer to vary the input voltage which is to be carried by the third lead into the trip unit.
Objects of the invention:
An object of the present invention is to provide wireless test kit for tripping of electronic release of circuit breaker, which provides a platform to the user for checking whether the MCCB is electronically tripping correctly, and can be used at the production stage for identifying whether the electronic trip unit is faulty or not, thereby helping to identify the faulty release.
Another object of the invention is to provide wireless test kit for tripping of electronic release of circuit breaker, which checks tripping of MCCB over a range of overload and checks short circuit settings to enable identification of hardware or software related faults.
Summary of the invention
According to the present invention there is provides a wireless test kit for tripping of electronic release of a circuit breaker. The kit having a wireless module 1; a transceiver 21, a microcontroller 24 and DIP2 switch 27. The wireless module 1 is connected to the test kit signal generation block 2 wirelessly. The transceiver 21 connected to the wireless module 1. The transceiver 21 on receiving singles the wireless module 1 to trigger a signal generation section of the test kit. The microcontroller 24 for giving digital voltage input signals to a DAC 25, the DAC 25 provides analog output to the signal conditioning section 24. Also, the DIP 2 switch 27 connected the DAC 25, the DIP 2 switch 27 enables to select the R, Y

or B phase of the output for which the MCCB ETU 3 has to be tested, and the selected signal is inserted into the release by means of a USB cable.
Brief description of the drawing:
Figure 1 shows a wireless module with microprocessor and display on handheld
device; and
Figure 2 shows a TEST KIT signal generation path.
Detailed description of the invention:
The foregoing objects of the present invention are accomplished and the problems and shortcomings associated with the prior art, techniques and approaches are overcome by the present invention as described below in the preferred embodiments.
The invention provides a range of selectable voltage levels for inserting in the signal conditioning section of the Electronic trip units. It is the use of combination of DIP I (23) and DIP2 (27) switches for selecting voltage level inputs to a DAC (25) section. Also, a wireless Module (1) is used for communicating with the test signal generation section of the test kit. The wireless communications interface enables remote wireless access to the test kit. This wireless module can be IPAD / Tablet / Android based Mobile Phone handheld with touch screen with GUI application for Selecting Test Kit parameters as well measuring trip time as well pickup accuracy.
Following are the parts of the circuit design with respective numerals used hereinafter in the draft:

The invention consists of DAC IC. The DIP switches are used to provide 8 bit DAC inputs to the IC. These voltage levels can be set using combinational DIP switches. The DAC gives an analog output which is fed to the signal conditioning section by means of an USB cable (28). Another position of DIP switch is used to give Rogowski signal inputs to the R, Y and B phases of the electronic trip unit of the MCCB. The user can use this DIP switch to select the phase to which he wants to insert the signal, and thereby test the tripping of the electronic trip unit.
As shown in Fig. 1 and Fig 2, the wireless module I is connected to the test kit signal generation block 2wirelessly. It communicates with the transceiver 21 of the test kit. Once the transceiver receives a signal from the wireless module 1, it triggers the signal generation section of the test kit. The DAC 25 operates on 5 volts obtained from the power supply section 22. Alternatively a microcontroller 24 can also be used for giving digital voltage input signals to the DAC 25.
The DAC 25 will give analog output to the signal conditioning section 24. DIP 2 switch 27 is used for selecting the R, Y or B phase of the output for which the MCCB ETU 3 has to be tested. The selected signal is inserted into the release by means of a USB cable.
Advantages of the present invention:
1. This invention gives a range of settings by which the user can test the electronic release of the MCCB.
2. This invention also provides the option of providing a wireless connection to the release for test.
The foregoing descriptions of specific embodiments of the present invention have been presented for purposes of illustration and description. They are not intended to be exhaustive or to limit the present invention to the precise forms disclosed,

and obviously many modifications and variations are possible in light of the above teaching.
The embodiments were chosen and described in order to best explain the principles of the present invention and its practical application, to thereby enable others skilled in the art to best utilize the present invention and various embodiments with various modifications as are suited to the particular use contemplated. It is understood that various omission and substitutions of equivalents are contemplated as circumstance may suggest or render expedient, but such are intended to cover the application or implementation without departing from the spirit or scope of the present invention.

We Claim:
1. A wireless test kit for tripping of electronic release of a circuit breaker, the
kit comprising:
a wireless module 1 connected to the test kit signal generation block 2 wirelessly;
a transceiver 21 connected to the wireless module 1, upon receiving singles the wireless module I to trigger a signal generation section of the test kit;
a microcontroller 24 for giving digital voltage input signals to a DAC 25, the DAC 25 provides analog output to the signal conditioning section 24;
a DIP 2 switch 27 connected the DAC 25, the DIP 2 switch 27 enables to select the R, Y or B phase of the output for which the MCCB ETU 3 has to be tested, the selected signal is inserted into the release by means of a USB cable.
2. The wireless test kit as claimed in claim 1, wherein the DAC 25 operates
on 5 volts obtained from the power supply section 22,