Provided is a method and a device for measuring a temperature which can recognize the temperature of a semiconductor layer directly with high precision when the semiconductor layer is formed by deposition. The quantity of laser light transmitted a semiconductor layer is monitored by a photodetector by using laser li...

[Problem] Provided are a measuring method and a measuring apparatus whereby a temperature of a semiconductor layer can be directly and highly accurately detected at the time of depositing and film forming the semiconductor layer. [Solution] First wavelength laser light having light transmissivity attenuate in a firs...

[Problem] To provide a method and device for measuring carrier lifetime with which the lifetime of a carrier in a sample such as a semiconductor can be measured. [Solution] Continuous light emitted by an emission laser is modulated by a modulator on the excitation side and excitation light (14) the intensity of whic...