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Method And Apparatus For Measuring Temperature Of Semiconductor Layer

Abstract: [Problem] Provided are a measuring method and a measuring apparatus whereby a temperature of a semiconductor layer can be directly and highly accurately detected at the time of depositing and film forming the semiconductor layer. [Solution] First wavelength laser light having light transmissivity attenuate in a first temperature range (T3 T4) and second wavelength laser light having light transmissivity attenuate in a second temperature range (T5 T6) are applied to a semiconductor layer and light that has passed through the semiconductor layer is received by a light receiving unit. An attenuation range (D4 D3) of the laser light transmissivity can be detected at a time when the temperature of the semiconductor layer is increased and the detection light quantity of the first wavelength laser light is attenuated. After the temperature is increased more and the detection light quantity of the second wavelength laser light exceeds an attenuation start point (g) the temperature of the semiconductor layer can be calculated on the basis of a detection light quantity (Db) at a certain measurement time and the attenuation range (D4 D3).

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Notices, Deadlines & Correspondence

Patent Information

Application #
Filing Date
21 November 2013
Publication Number
47/2014
Publication Type
INA
Invention Field
PHYSICS
Status
Email
ipo@knspartners.com
Parent Application

Applicants

YSystems Ltd.
Tokushima Science Center 209 5 Hiraishi Sumiyoshi Kawauchi cho Tokushima shi Tokushima 7710134

Inventors

1. Yves Lacroix
1502 Alpha States Shinmachi 2 38 1 Higashi Shinmachi Tokushima shi Tokushima 7700912

Specification

Documents

Application Documents

# Name Date
1 9329-CHENP-2013-AbandonedLetter.pdf 2019-03-28
1 Specification.pdf 2013-11-25
2 9329-CHENP-2013-FER.pdf 2018-09-26
2 Form 5.pdf 2013-11-25
3 Form 3.pdf 2013-11-25
3 9329-CHENP-2013 CORRESPONDENCE OTHERS 23-07-2015.pdf 2015-07-23
4 Drawings.pdf 2013-11-25
4 9329-CHENP-2013 FORM-3 23-07-2015.pdf 2015-07-23
5 9329-CHENP-2013 POWER OF ATTORNEY 09-01-2014.pdf 2014-01-09
5 9329-CHENP-2013 FORM-13 14-07-2015.pdf 2015-07-14
6 Covering Letter & Form 1.pdf 2015-07-14
6 9329-CHENP-2013 CORRESPONDENCE OTHERS 09-01-2014.pdf 2014-01-09
7 Form 13.pdf 2015-07-14
7 9329-CHENP-2013.pdf 2014-01-10
8 abstract-9329-CHENP-2013.jpg 2014-10-07
8 9329-CHENP-2013 CORRESPONDENCE OTHERS 21-02-2014.pdf 2014-02-21
9 9329-CHENP-2013 CORRESPONDENCE OTHERS 16-05-2014.pdf 2014-05-16
9 9329-CHENP-2013 FORM-1 21-02-2014.pdf 2014-02-21
10 9329-CHENP-2013 FORM 3 16-05-2014.pdf 2014-05-16
11 9329-CHENP-2013 CORRESPONDENCE OTHERS 16-05-2014.pdf 2014-05-16
11 9329-CHENP-2013 FORM-1 21-02-2014.pdf 2014-02-21
12 9329-CHENP-2013 CORRESPONDENCE OTHERS 21-02-2014.pdf 2014-02-21
12 abstract-9329-CHENP-2013.jpg 2014-10-07
13 9329-CHENP-2013.pdf 2014-01-10
13 Form 13.pdf 2015-07-14
14 9329-CHENP-2013 CORRESPONDENCE OTHERS 09-01-2014.pdf 2014-01-09
14 Covering Letter & Form 1.pdf 2015-07-14
15 9329-CHENP-2013 FORM-13 14-07-2015.pdf 2015-07-14
15 9329-CHENP-2013 POWER OF ATTORNEY 09-01-2014.pdf 2014-01-09
16 9329-CHENP-2013 FORM-3 23-07-2015.pdf 2015-07-23
16 Drawings.pdf 2013-11-25
17 9329-CHENP-2013 CORRESPONDENCE OTHERS 23-07-2015.pdf 2015-07-23
17 Form 3.pdf 2013-11-25
18 9329-CHENP-2013-FER.pdf 2018-09-26
18 Form 5.pdf 2013-11-25
19 Specification.pdf 2013-11-25
19 9329-CHENP-2013-AbandonedLetter.pdf 2019-03-28

Search Strategy

1 9329chenp2013searchstrategy_06-03-2018.pdf