Abstract: In at least one embodiment, the method is for producing a semiconductor device (1) and comprises the following steps in the stated order: A) providing a semiconductor body (2) having a top side (20), the semiconductor body (2) is based on SiC, B) producing a first layer (21) of the semiconductor body (2) next to the top side (20) by doping with a dopant (4), C) applying a carbon-containing layer (3) on the top side (20), D) implanting C into the first layer (21) through the carbon- containing layer (3), and E) performing a temperature treatment of the semiconductor body (2) when the carbon-containing layer (3) is still present on the top side (20).
| # | Name | Date |
|---|---|---|
| 1 | 202547075648-STATEMENT OF UNDERTAKING (FORM 3) [08-08-2025(online)].pdf | 2025-08-08 |
| 2 | 202547075648-REQUEST FOR EXAMINATION (FORM-18) [08-08-2025(online)].pdf | 2025-08-08 |
| 3 | 202547075648-PROOF OF RIGHT [08-08-2025(online)].pdf | 2025-08-08 |
| 4 | 202547075648-FORM 18 [08-08-2025(online)].pdf | 2025-08-08 |
| 5 | 202547075648-FORM 1 [08-08-2025(online)].pdf | 2025-08-08 |
| 6 | 202547075648-DRAWINGS [08-08-2025(online)].pdf | 2025-08-08 |
| 7 | 202547075648-DECLARATION OF INVENTORSHIP (FORM 5) [08-08-2025(online)].pdf | 2025-08-08 |
| 8 | 202547075648-COMPLETE SPECIFICATION [08-08-2025(online)].pdf | 2025-08-08 |
| 9 | 202547075648-Proof of Right [11-08-2025(online)].pdf | 2025-08-11 |
| 10 | 202547075648-FORM-26 [11-08-2025(online)].pdf | 2025-08-11 |