Abstract: The present disclosure relates to a power semiconductor device (100) comprising a silicon carbide semiconductor, SiC, structure (110) comprising a SiC epilayer (112), at least one ohmic contact (120) formed on a first main surface (114) of the SiC structure (110), and at least Schottky barrier contact (130) formed on a second main surface (116) of the SiC structure (110). The at least one Schottky barrier contact (130) comprises a metal layer (136) and a carbon group interlayer (134) arranged between the metal layer (136) and the second main surface (116) of the SiC structure (110). 15 The present disclosure relates to a Schottky barrier diode (400), a vertical field effect transistor, such as a power MOSFET (500), and a method for manufacturing a power semiconductor device (100).
| # | Name | Date |
|---|---|---|
| 1 | 202447014459-STATEMENT OF UNDERTAKING (FORM 3) [28-02-2024(online)].pdf | 2024-02-28 |
| 2 | 202447014459-PROOF OF RIGHT [28-02-2024(online)].pdf | 2024-02-28 |
| 3 | 202447014459-PRIORITY DOCUMENTS [28-02-2024(online)].pdf | 2024-02-28 |
| 4 | 202447014459-FORM 18 [28-02-2024(online)].pdf | 2024-02-28 |
| 5 | 202447014459-FORM 1 [28-02-2024(online)].pdf | 2024-02-28 |
| 6 | 202447014459-DRAWINGS [28-02-2024(online)].pdf | 2024-02-28 |
| 7 | 202447014459-DECLARATION OF INVENTORSHIP (FORM 5) [28-02-2024(online)].pdf | 2024-02-28 |
| 8 | 202447014459-COMPLETE SPECIFICATION [28-02-2024(online)].pdf | 2024-02-28 |
| 9 | 202447014459-FORM-26 [04-05-2024(online)].pdf | 2024-05-04 |
| 10 | 202447014459-FORM 3 [25-07-2024(online)].pdf | 2024-07-25 |