[Class : 9] Computer Hardware; Computer Hardware And Software For Testing, Inspecting, Characterizing, And Predicting Physical And Electrical Properties Of Semiconductors, Integrated Circuits, Microelectronics, Wafers, And Lithographic Masks; Instruments For Testing, Inspecting, And Characterizing Physical Properties Of Semiconductors And Integrated Circuits; Computer Software For Use In Process Control And Yield Management For The Semiconductor, Integrated Circuit And Related Microelectronics Manufacturing Industries; Computer Software For Providing Analytic Data On The Performance Of Inspection And Metrology Tools; Computer Hardware And Software Used For Monitoring, Controlling, And Improving Semiconductor And Integrated Circuit Manufacturing Processes; Computer Hardware And Software Used For Event Prediction In The Manufacturing Of Semiconductors And Integrated Circuits; Reconditioned Computer Hardware Tools, Namely, Inspection, Metrology And Testing Hardware That Are Used In Field Of Semiconductors, Thin Film Heads And Related Industries That Use The Same Manufacturing Technology; Semiconductor And Wafer Defect Inspection Systems Comprised Of Computer Software, Final Test Data And Electrical Data Algorithms, And Inline Defect And Metrology Computer Hardware Equipment; Computer Software For Use In Detecting Defective Semiconductor Electronic Components.