[Class : 9] Inspection System Comprised Of A Laser, Recorded Computer Software, And Computer Hardware For Testing, Inspecting, And Characterizing Physical Properties Of Semiconductor Wafers And Integrated Circuits, Namely, Critical Defects; Instruments For Testing, Inspecting, And Characterizing Physical Properties Of Semiconductor Wafers And Integrated Circuits, Namely, Critical Defects; Computer Hardware And Recorded Software Used For Testing, Inspecting, And Characterizing Physical Properties Of Semiconductor Wafers And Integrated Circuits, Namely, Critical Defects; All Of The Aforesaid Not Including Any Software Relating To Or Connected With Managing Real Estate, Property Management, Property Construction And Development And Performing Of Related Accounting Functions.